US20130301365A1 - Dedicated reference voltage generation circuit for memory - Google Patents
Dedicated reference voltage generation circuit for memory Download PDFInfo
- Publication number
- US20130301365A1 US20130301365A1 US13/680,059 US201213680059A US2013301365A1 US 20130301365 A1 US20130301365 A1 US 20130301365A1 US 201213680059 A US201213680059 A US 201213680059A US 2013301365 A1 US2013301365 A1 US 2013301365A1
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- US
- United States
- Prior art keywords
- reference voltage
- resistor
- capacitor
- generation circuit
- voltage generation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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- 239000003990 capacitor Substances 0.000 claims description 48
- 230000005540 biological transmission Effects 0.000 description 4
- 230000008054 signal transmission Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Definitions
- the disclosure generally relates to reference voltage generation circuits, and particularly to a reference voltage generation circuit for a memory.
- the motherboard further includes a microchip to generate a first reference voltage for a data pin of the memory and a second reference voltage for an address pin of the memory.
- the first reference voltage and the second reference voltage may be distorted in a transmission process from the motherboard to the memory.
- the electronic devices may incur increased costs because of use of the microchip.
- the FIGURE is a circuit view of a reference voltage generation circuit for a memory, according to an exemplary embodiment.
- the FIGURE shows a reference voltage generation circuit 100 , which can be used in an electronic device such as personal computer, server.
- the electronic device includes a motherboard (not shown) and a memory 200 .
- the reference voltage generation circuit 100 is integrated on the memory 200 .
- the motherboard supplies a power supply PVDDQ of about 1.5V.
- the memory 200 further includes a data pin DQ and an address pin CA.
- the data pin DQ is configured to receive/transmit data signals
- the address pin CA is configured to receive/transmit address signals.
- the reference voltage generation circuit 100 includes a first reference voltage generation circuit 10 and a second reference voltage generation circuit 30 .
- the first reference voltage generation circuit 10 supplies a first reference voltage to the data pin DQ.
- the first reference voltage generation circuit 10 includes a first resistor R 1 , a second resistor R 2 , a first capacitor C 1 , and a second capacitor C 2 .
- the first resistor R 1 and the second resistor R 2 are electronically connected in series between the power supply PVDDQ and ground.
- the resistance value of the first resistor R 1 and the second resistor R 2 is about 100 ⁇ 0.5% ohms
- the data pin DQ is electronically connected between the first resistor R 1 and the second resistor R 2 , thus the first reference voltage generation circuit 10 supplies the first reference voltage of about 0.75V to the data pin DQ.
- the first capacitor C 1 is electronically connected to the second capacitor C 2 in parallel.
- a first end of the first capacitor C 1 is electronically connected between the first resistor R 1 and the second resistor R 2 , and a second end of the first capacitor C 1 is connected to ground.
- a first end of the second capacitor C 2 is electronically connected between the first resistor R 1 and the second resistor R 2 , and a second end of the second capacitor C 2 is connected to ground.
- any ripple of the first reference voltage is filtered by the first capacitor C 1 and the second capacitor C 2 .
- the first reference voltage generation circuit 10 is integrated on the memory 200 , and is adjacent to the data pin DQ. Thus, signal transmission length from the motherboard to the memory 200 is reduced, and it is less likely that the first reference voltage will be interfered with and distorted in the transmission process from the first reference voltage generation circuit 10 to the data pin DQ.
- the second reference voltage generation circuit 30 supplies a second reference voltage to the address pin CA.
- the second reference voltage generation circuit 30 includes a third resistor R 3 , a fourth resistor R 4 , a third capacitor C 3 , and a fourth capacitor C 4 .
- the third resistor R 3 and the fourth resistor R 4 are electronically connected in series between the power supply PVDDQ and ground.
- the resistance value of the third resistor R 3 and the fourth resistor R 4 is about 100 ⁇ 0.5% ohms
- the address pin CA is electronically connected between the third resistor R 3 and the fourth resistor R 4 , thus the second reference voltage generation circuit 30 supplies the second reference voltage of about 0.75V to the address pin CA.
- the third capacitor C 3 is electronically connected to the fourth capacitor C 4 in parallel.
- a first end the third capacitor C 3 is electronically connected between the third resistor R 3 and the fourth resistor R 4 , and a second end of the third capacitor C 3 is connected to ground.
- a first end of the fourth capacitor C 4 is electronically connected between the third resistor R 3 and the fourth resistor R 4 , and a second end of the fourth capacitor C 4 is connected to ground.
- any ripple of the second reference voltage is filtered by the third capacitor C 3 and the fourth capacitor C 4 .
- the second reference voltage generation circuit 30 is integrated on the memory 200 , and is adjacent to the address pin CA. Thus, signal transmission length from the motherboard to the memory 200 is reduced, and the second reference voltage is less likely to be interfered with and distorted in the transmission process from the second reference voltage generation circuit 30 to the address pin CA.
- first reference voltage and the second reference voltage can be sourced by the reference voltage generation circuit 100 , and a microchip integrated on the motherboard to generate the first and second reference voltage is not needed.
- the memory 200 has, integrated within itself, the first reference voltage generation circuit 10 and the second reference voltage generation circuit 30 to supply the first reference voltage for the data pin DQ and the second reference voltage for the address pin CA respectively.
- the transmission distances of the first reference voltage and the second reference voltage are decreased to stabilize the first reference voltage and the second reference voltage. Therefore, the memory 200 with these features is both efficient and low in cost.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Dram (AREA)
- Read Only Memory (AREA)
Abstract
A memory includes a data pin, an address pin, and a reference voltage generation circuit. The reference voltage generation circuit includes a first reference voltage generation circuit and a second reference voltage generation circuit. The first reference voltage generation circuit is electronically connected to the data pin, and supplies a reliable first reference voltage to the data pin. The second reference voltage generation circuit is electronically connected to the address pin, and supplies a reliable second reference voltage to the address pin.
Description
- 1. Technical Field
- The disclosure generally relates to reference voltage generation circuits, and particularly to a reference voltage generation circuit for a memory.
- 2. Description of the Related Art
- Many electronic devices, such as servers, comprise a motherboard and a memory positioned on the motherboard. The motherboard further includes a microchip to generate a first reference voltage for a data pin of the memory and a second reference voltage for an address pin of the memory. However, the first reference voltage and the second reference voltage may be distorted in a transmission process from the motherboard to the memory. Additionally, the electronic devices may incur increased costs because of use of the microchip.
- Therefore, there is room for improvement within the art.
- Many aspects of the present disclosure can be better understood with reference to the drawing. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments.
- The FIGURE is a circuit view of a reference voltage generation circuit for a memory, according to an exemplary embodiment.
- The FIGURE shows a reference
voltage generation circuit 100, which can be used in an electronic device such as personal computer, server. The electronic device includes a motherboard (not shown) and amemory 200. The referencevoltage generation circuit 100 is integrated on thememory 200. In one exemplary embodiment, the motherboard supplies a power supply PVDDQ of about 1.5V. - The
memory 200 further includes a data pin DQ and an address pin CA. The data pin DQ is configured to receive/transmit data signals, and the address pin CA is configured to receive/transmit address signals. - The reference
voltage generation circuit 100 includes a first referencevoltage generation circuit 10 and a second referencevoltage generation circuit 30. - The first reference
voltage generation circuit 10 supplies a first reference voltage to the data pin DQ. In one exemplary embodiment, the first referencevoltage generation circuit 10 includes a first resistor R1, a second resistor R2, a first capacitor C1, and a second capacitor C2. The first resistor R1 and the second resistor R2 are electronically connected in series between the power supply PVDDQ and ground. In one exemplary embodiment, the resistance value of the first resistor R1 and the second resistor R2 is about 100±0.5% ohms The data pin DQ is electronically connected between the first resistor R1 and the second resistor R2, thus the first referencevoltage generation circuit 10 supplies the first reference voltage of about 0.75V to the data pin DQ. The first capacitor C1 is electronically connected to the second capacitor C2 in parallel. A first end of the first capacitor C1 is electronically connected between the first resistor R1 and the second resistor R2, and a second end of the first capacitor C1 is connected to ground. A first end of the second capacitor C2 is electronically connected between the first resistor R1 and the second resistor R2, and a second end of the second capacitor C2 is connected to ground. Thus, any ripple of the first reference voltage is filtered by the first capacitor C1 and the second capacitor C2. - The first reference
voltage generation circuit 10 is integrated on thememory 200, and is adjacent to the data pin DQ. Thus, signal transmission length from the motherboard to thememory 200 is reduced, and it is less likely that the first reference voltage will be interfered with and distorted in the transmission process from the first referencevoltage generation circuit 10 to the data pin DQ. - The second reference
voltage generation circuit 30 supplies a second reference voltage to the address pin CA. In one exemplary embodiment, the second referencevoltage generation circuit 30 includes a third resistor R3, a fourth resistor R4, a third capacitor C3, and a fourth capacitor C4. The third resistor R3 and the fourth resistor R4 are electronically connected in series between the power supply PVDDQ and ground. In one exemplary embodiment, the resistance value of the third resistor R3 and the fourth resistor R4 is about 100±0.5% ohms The address pin CA is electronically connected between the third resistor R3 and the fourth resistor R4, thus the second referencevoltage generation circuit 30 supplies the second reference voltage of about 0.75V to the address pin CA. The third capacitor C3 is electronically connected to the fourth capacitor C4 in parallel. A first end the third capacitor C3 is electronically connected between the third resistor R3 and the fourth resistor R4, and a second end of the third capacitor C3 is connected to ground. A first end of the fourth capacitor C4 is electronically connected between the third resistor R3 and the fourth resistor R4, and a second end of the fourth capacitor C4 is connected to ground. Thus, any ripple of the second reference voltage is filtered by the third capacitor C3 and the fourth capacitor C4. - The second reference
voltage generation circuit 30 is integrated on thememory 200, and is adjacent to the address pin CA. Thus, signal transmission length from the motherboard to thememory 200 is reduced, and the second reference voltage is less likely to be interfered with and distorted in the transmission process from the second referencevoltage generation circuit 30 to the address pin CA. - Additionally, the first reference voltage and the second reference voltage can be sourced by the reference
voltage generation circuit 100, and a microchip integrated on the motherboard to generate the first and second reference voltage is not needed. - Thus the
memory 200 has, integrated within itself, the first referencevoltage generation circuit 10 and the second referencevoltage generation circuit 30 to supply the first reference voltage for the data pin DQ and the second reference voltage for the address pin CA respectively. The transmission distances of the first reference voltage and the second reference voltage are decreased to stabilize the first reference voltage and the second reference voltage. Therefore, thememory 200 with these features is both efficient and low in cost. - Although numerous characteristics and advantages of the exemplary embodiments have been set forth in the foregoing description, together with details of the structures and functions of the exemplary embodiments, the disclosure is illustrative only, and changes may be made in detail, especially in the matters of arrangement of parts within the principles of disclosure to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Claims (10)
1. A reference voltage generation circuit integrated on a memory, the memory comprising a data pin and an address pin, the reference voltage generation circuit comprising:
a first reference voltage generation circuit electronically connected to the data pin and supplying a first reference voltage to the data pin; and
a second reference voltage generation circuit electronically connected to the address pin and supplying a second reference voltage to the address pin.
2. The reference voltage generation circuit as claimed in claim 1 , wherein the first reference voltage generation circuit includes a first resistor and a second resistor, the first resistor and the second resistor are electronically connected in series between a power supply and ground, and the data pin is electronically connected to a node between the first resistor and the second resistor.
3. The reference voltage generation circuit as claimed in claim 2 , wherein the reference voltage generation circuit further includes a first capacitor and a second capacitor electronically connected to the first capacitor in parallel, a first end of the first capacitor electronically connected to the node between the first resistor and the second resistor, and a second end of the first capacitor is connected to ground, a first end of the second capacitor is electronically connected to the node between the first resistor and the second resistor, and a second end of the second capacitor connected to ground.
4. The reference voltage generation circuit as claimed in claim 1 , wherein the second reference voltage generation circuit includes a third resistor and a fourth resistor, the third resistor and the fourth resistor are electronically connected in series between a power supply and ground, and the address pin is electronically connected to a node between the third resistor and the fourth resistor.
5. The reference voltage generation circuit as claimed in claim 4 , wherein the reference voltage generation circuit further includes a third capacitor and a fourth capacitor electronically connected to the third capacitor in parallel, a first end of the third capacitor is electronically connected to the node between the third resistor and the fourth resistor, and a second end of the third capacitor is connected to ground, a first end of the fourth capacitor is electronically connected to the node between the third resistor and the fourth resistor, and a second end of the fourth capacitor is connected to ground.
6. A memory, comprising:
a data pin;
an address pin; and
a reference voltage generation circuit comprising:
a first reference voltage generation circuit electronically connected to the data pin and supplying a first reference voltage to the data pin; and
a second reference voltage generation circuit electronically connected to the address pin and supplying a second reference voltage to the address pin.
7. The memory as claimed in claim 6 , wherein the first reference voltage generation circuit includes a first resistor and a second resistor, the first resistor and the second resistor are electronically connected in series between a power supply and ground, and the data pin is electronically connected to a node between the first resistor and the second resistor.
8. The memory as claimed in claim 7 , wherein the reference voltage generation circuit further includes a first capacitor and a second capacitor electronically connected to the first capacitor in parallel, a first end of the first capacitor is electronically connected to the node between the first resistor and the second resistor, and a second end of the first capacitor is connected to ground, a first end of the second capacitor is electronically connected to the node between the first resistor and the second resistor, and a second end of the second capacitor is connected to ground.
9. The memory as claimed in claim 6 , wherein the second reference voltage generation circuit includes a third resistor and a fourth resistor, the third resistor and the fourth resistor are electronically connected in series between a power supply and ground, and the address pin is electronically connected to a node between the third resistor and the fourth resistor.
10. The memory as claimed in claim 9 , wherein the reference voltage generation circuit further includes a third capacitor and a fourth capacitor electronically connected to the third capacitor in parallel, a first end of the third capacitor is electronically connected to the node between the third resistor and the fourth resistor, and a second end of the third capacitor is connected to ground, a first end of the fourth capacitor is electronically connected to the node between the third resistor and the fourth resistor, and a second end of the fourth capacitor is connected to ground.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201210029439 CN103247322A (en) | 2012-02-10 | 2012-02-10 | Memory bank and its reference voltage generation circuit |
CN201210029439.8 | 2012-02-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
US20130301365A1 true US20130301365A1 (en) | 2013-11-14 |
Family
ID=48926798
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/680,059 Abandoned US20130301365A1 (en) | 2012-02-10 | 2012-11-18 | Dedicated reference voltage generation circuit for memory |
Country Status (3)
Country | Link |
---|---|
US (1) | US20130301365A1 (en) |
CN (1) | CN103247322A (en) |
TW (1) | TW201333968A (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5732028A (en) * | 1995-11-29 | 1998-03-24 | Samsung Electronics Co., Ltd. | Reference voltage generator made of BiMOS transistors |
US6646945B1 (en) * | 2000-06-13 | 2003-11-11 | Micron Technology, Inc. | Reference voltage filter for memory modules |
US7889584B2 (en) * | 2005-10-14 | 2011-02-15 | Elpida Memory Inc. | Semiconductor memory device having input first-stage circuit |
US8248880B2 (en) * | 2010-03-29 | 2012-08-21 | Micron Technology, Inc. | Voltage regulators, amplifiers, memory devices and methods |
-
2012
- 2012-02-10 CN CN 201210029439 patent/CN103247322A/en active Pending
- 2012-02-13 TW TW101104604A patent/TW201333968A/en unknown
- 2012-11-18 US US13/680,059 patent/US20130301365A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5732028A (en) * | 1995-11-29 | 1998-03-24 | Samsung Electronics Co., Ltd. | Reference voltage generator made of BiMOS transistors |
US6646945B1 (en) * | 2000-06-13 | 2003-11-11 | Micron Technology, Inc. | Reference voltage filter for memory modules |
US7889584B2 (en) * | 2005-10-14 | 2011-02-15 | Elpida Memory Inc. | Semiconductor memory device having input first-stage circuit |
US8248880B2 (en) * | 2010-03-29 | 2012-08-21 | Micron Technology, Inc. | Voltage regulators, amplifiers, memory devices and methods |
Also Published As
Publication number | Publication date |
---|---|
CN103247322A (en) | 2013-08-14 |
TW201333968A (en) | 2013-08-16 |
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Legal Events
Date | Code | Title | Description |
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AS | Assignment |
Owner name: HON HAI PRECISION INDUSTRY CO., LTD., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:TIAN, BO;WU, KANG;REEL/FRAME:029333/0392 Effective date: 20121105 Owner name: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:TIAN, BO;WU, KANG;REEL/FRAME:029333/0392 Effective date: 20121105 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |