US20130264836A1 - Semiconductor Die Collet and Method - Google Patents
Semiconductor Die Collet and Method Download PDFInfo
- Publication number
- US20130264836A1 US20130264836A1 US13/898,615 US201313898615A US2013264836A1 US 20130264836 A1 US20130264836 A1 US 20130264836A1 US 201313898615 A US201313898615 A US 201313898615A US 2013264836 A1 US2013264836 A1 US 2013264836A1
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- die
- collet
- handling
- vacuum
- attach
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
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- H01L2224/75743—Suction holding means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83192—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/0665—Epoxy resin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
Definitions
- the invention relates to electronic semiconductor devices and manufacturing. More particularly, the invention relates to semiconductor device manufacturing and packaging and to die handling apparatus and related methods.
- Typical adhesive die attach processes use curable adhesive, such as epoxy or polyimide, as die attach material to affix the die to a die pad, leadframe, substrate, or socket, for convenience referred to herein generally as the die pad. It is common in the art to dispense die attach material in a controlled amount on a die pad. Die handling equipment used for die attach processes typically employs a pick-and-place tool to lift a die from a wafer tape or other holding mechanism and place it on a die pad. The portion of the die handling equipment that actually makes contact with the die is referred to as a collet.
- the die is placed on the collet, either by surface contact alone or with assistance from a mechanical ejector pin guiding the die onto the collet.
- a vacuum force exerted within the collet holds the die in the collet while the tool moves it into the appropriate position for placement on the pre-applied adhesive on the die pad.
- Die handling presents technical challenges. Particularly for thin dice, which are becoming increasingly common in the arts, handling during die attach requires great care to avoid cracks or other damage.
- Some examples of die attach-related failure mechanisms known in the art include backside tool marks, scratches, or microcracks, which can eventually lead to die cracking.
- Thinner dice are in particular danger from microcracks, which can result from excessive flexing of the die during handling.
- the contact surfaces of die attach collets are sometimes made from relatively soft plastic or elastomeric materials instead of metal in an effort to avoid causing mechanical damage on the die surface.
- the practice of using a vacuum to hold the die in the collet is another example of efforts to avoid inflicting damage to fragile dice.
- the amount and distribution of die attach material between the die and the die pad can be crucial to the secure attachment of the die to the die pad and to the long term reliability of the completed assembly. Achieving the appropriate depth and uniform distribution of the die attach adhesive layer, also called the bond line, is a significant challenge. If the bond line is too thin, the bond may be insufficient to hold the die to the die pad. If the bond line is too thick, curing may be inhibited or prolonged, the bond may tend to weaken over time, thermal performance may suffer, or other problems may result. An uneven bond line resulting from non-uniform adhesive distribution can result in similar problems or in a combination of such problems.
- Voids can lead to failures due to insufficient adhesive coverage or thermally induced stresses, for example.
- a quantity of adhesive is pressed from between the die and the bond pad during die placement.
- the formation of adhesive that builds from the bond pad to the edges of the die is known as the die attach fillet.
- the formation of the fillet can be adversely affected by the excess, lack, or non-uniform distribution of adhesive in the formation of the bond line. Excessive die attach fillet may lead to die attach contamination of the die surface. Too little fillet may reduce the strength of the attachment and lead to eventual problems such as die lifting or die cracking.
- the formation of a proper fillet may be impeded by excessive, inconsistent, or unpredictable die flexion during placement of the die on the adhesive by a die handling collet.
- improved semiconductor die handling collets contribute useful advantages to the art.
- the invention provides apparatus for the handling and placement of semiconductor dice and superior die attach techniques, resulting in improved semiconductor device assemblies.
- a method for attaching a semiconductor die to a die pad includes steps for positioning a die on a bearing surface of a collet and retaining the die on the bearing surface of the collet using a vacuum force.
- a pushing force is exerted on the die adjacent to the applied vacuum force. The pushing force is used to oppose flexion of the die in the direction of the vacuum force.
- the die is placed on the die pad, with die attach adhesive interposed between the die and the die pad, the die is then released from the collet.
- a pushing force is applied to the die in order to bow the central region of the die toward the die pad.
- a collet for handling a semiconductor die includes a body having a bearing surface for receiving the die.
- a chamber in the body has an open side bounded by the bearing surface, with a vacuum groove included in the bearing surface for holding a die against the bearing surface.
- a port is provided for transmitting an expelled gas to the chamber.
- the parts are arranged so that the vacuum force is adapted for holding the die surface against the bearing surface and the expelled gas is adapted for pushing the center of the die out from the interior of the chamber.
- a collet wherein an expelled gas may be applied for pushing outward on the center of a die held therein such that the die extends outward beyond the plane of the bearing surface.
- a preferred embodiment of a collet includes a flexible skin attached to the body of the collet and situated for supporting a die held by the collet during handling.
- a preferred embodiment of a semiconductor die attach system includes a collet having a die bearing surface.
- the collet is configured for retaining the die on the bearing surface using a vacuum force and also for applying a pushing force to an adjacent portion of the die in opposition to inward flexion of the die in the direction of the vacuum force.
- the system also includes a handling tool for moving the collet to a die pad, and placing the die on the die pad.
- a collet system features an arrangement whereby a pushing force may be applied to cause outward flexion of a die held by the collet such that a handling tool may bring the center region of the die into contact with a die pad in advance of the periphery.
- a collet system includes provisions for using pressurized gas for applying a pushing force to the center region of a die held to the collet by a vacuum force.
- a semiconductor device assembly of the invention includes a flexed die with a cured bond line formed with the central region of the die thinner than the periphery.
- the invention has advantages including but not limited to providing methods, apparatus, and systems offering improvements in die handling capabilities useful in the manufacture of semiconductor device packages.
- FIG. 1 is a bottom view of a die handling collet according to an example of a preferred embodiment of the invention
- FIG. 2A is a cutaway side view of the die handling collet according to the example of a preferred embodiment of the invention of FIG. 1 shown in the context of a die attach system and method;
- FIG. 2B is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention of FIG. 2A shown in the context of a die attach system and method;
- FIG. 2C is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention of FIGS. 2A and 2B shown in the context of a die attach system and method;
- FIG. 3 is a bottom view of a die handling collet according to an example of an alternative preferred embodiment of the invention.
- FIG. 4A is a cutaway side view of the die handling collet according to the example of a preferred embodiment of the invention of FIG. 3 shown in the context of a die attach system and method;
- FIG. 4B is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention of FIG. 4A shown in the context of a die attach system and method;
- FIG. 4C is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention of FIGS. 4A and 4B shown in the context of a die attach system and method for implementing a preferred embodiment of a semiconductor device assembly of the invention.
- the invention provides a die handling collet and related systems and methods for improved die handling in semiconductor device manufacturing processes, particularly die attach processes.
- FIG. 1 and FIG. 2A a bottom view ( FIG. 1 ) and cutaway side view ( FIG. 2A ) of a collet 10 according to a preferred embodiment of the invention is described.
- a body 12 preferably made from plastic, metal, or other suitably rigid material, is capable of receiving a die 14 ( FIG. 2A ).
- a vacuum groove 16 is provided at the edge of the body 12 .
- the vacuum groove 16 is incorporated into a die-bearing surface 18 of the body 12 , preferably entirely around the periphery.
- the vacuum groove 16 is in communication with vacuum ports 20 for transmitting a vacuum force, indicated by arrow 22 , generated by a suitable mechanism such as a pump (not shown).
- the vacuum groove 16 preferably distributes the vacuum force around the periphery of the die-bearing surface 18 for holding a die 14 during handling and placement.
- a chamber 24 is incorporated within the body 12 and is preferably encompassed by the die-bearing surface 18 .
- One side of the chamber 24 is open such that a die 14 placed on the bearing surface 18 completes the enclosure.
- a port 26 is provided for expelling pressurized gas, preferably air, indicated by arrow 28 .
- the expelled gas 28 pressurizes the chamber 24 , exerting a pushing force on the adjacent surface of the die 14 .
- the pushing force preferably opposes the die flexion which tends to occur due to the application of the vacuum force 22 , preventing or reducing the temporary formation of a concavity on the outer surface of the die 14 due to flexing.
- the chamber 24 is sufficiently pressurized to cause the die 14 to bow outward slightly in a position convex to the adjacent die pad 32 or intervening die attach adhesive 30 ( FIG. 2A ).
- the collet 10 is shown in the context of further steps in a die attach method according to preferred embodiments of the invention.
- the expelled air 28 within the chamber 24 is preferably used to flex the die 14 in order to present a convex surface to the die attach material 30 pre-applied to the die pad 32 .
- the convex surface of the die 14 as indicated by arrows 34 , tends to expel air from between the die 14 and die attach adhesive 30 during the ultimate placement of the die, reducing the frequency and magnitude of void formation.
- the die may be flexed by the expelled air 28 by an amount adapted to counter any inward flexion caused by the vacuum 22 , and calculated to prevent the outward flexion of the die 14 .
- This implementation may be preferred for example with particularly delicate dice, preventing or attenuating flexion and presenting a substantially flat die surface to the die pad 32 and the intervening die attach adhesive 30 , promoting a uniform thickness of die attach material 30 .
- die attach processes using die adhesive film may also advantageously use the invention. As depicted in FIG. 2C , as the collet 10 brings the die 14 into position on the die attach adhesive 30 , the pushing and vacuum forces may be reduced or eliminated, ultimately enabling the collet 10 to be removed after the die 14 is placed.
- FIG. 3 An alternative preferred embodiment of a collet 40 of the invention is depicted in a bottom view in FIG. 3 , and in corresponding cutaway side views in FIG. 4A through 4C showing an example of a system and method for its use.
- the collet 40 has a body 12 preferably made from plastic, metal, or like material and is capable of receiving a die 14 as shown.
- a vacuum groove 16 is incorporated into the die-bearing surface 18 of the collet 40 , preferably at the edge of the body 12 and around its periphery.
- the vacuum groove 16 is provided with a vacuum force 22 through suitable vacuum ports 20 .
- the vacuum groove 16 preferably evenly distributes the vacuum force 22 around the periphery of the die-bearing surface 18 for holding a die 14 during handling and placement.
- An interior chamber 24 is incorporated within the die-bearing surface 18 of the body 12 .
- a port 26 is provided for expelling pressurized air or other gas 28 into the chamber 24 .
- the expelled air 28 pressurizes the chamber 24 to prevent the formation of a concavity in the outer surface of an adjacent die 14 due to flexion in response to the application of the vacuum force 22 .
- the chamber 24 is sufficiently pressurized to cause the die to bow outward slightly in a position convex to the adjacent die attach adhesive 30 as shown in FIG. 4A and FIG. 4B .
- the collet 40 also includes a support skin 42 .
- the support skin 42 is preferably permanently attached to the die bearing surface 18 of the collet body 12 .
- the support skin 42 is made from a flexible material such as, for example, a thin film of Teflon, Mylar, (both registered trademarks of DuPont Corporation), polymer, or the like.
- Teflon, Mylar both registered trademarks of DuPont Corporation
- polymer or the like.
- the bowed center region of the die 14 die contacts the die attach adhesive 30 first and then spreads outward toward the periphery as it is moved toward the die pad and as the pushing force on the die 14 is diminished.
- This sequence avoids the trapping of air during die attach, helps to form the die attach adhesive into a bond line 30 of uniform thickness, and fosters the formation of suitable fillets 36 .
- the outward pressure 28 may be regulated to hold the die 14 substantially flat relative to the die pad 32 and attach adhesive 30 .
- the invention may be used for regulating the shape of the die surface presented to the die attach locale, balancing against inward flexion exerted by the vacuum force 22 , but refraining from bowing the die 14 outward in order to prevent inducing stress on the die 14 in cases where increased gentleness is required.
- the bond line 30 is cured with a “smile” profile as shown, preferably uniformly thinner in the central region of the die 14 and progressively thicker approaching the periphery.
- preferred embodiments of the invention contribute one or more useful advantages to the art.
- the invention provides advantages including but not limited to improved die handling capabilities and reductions in damage during die attach in microelectronic semiconductor device package assembly. While the invention has been described with reference to certain illustrative embodiments, the methods, apparatus, and systems described are not intended to be construed in a limiting sense. Various modifications and combinations of the illustrative embodiments as well as other advantages and embodiments of the invention will be apparent to persons skilled in the art upon reference to the description, drawings, and claims.
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Die Bonding (AREA)
Abstract
A system comprises a collet is configured for holding a die surface against the bearing surface and for simultaneously pushing outward on the center region of the die so held.
Description
- This application is a divisional of application Ser. No. 12/844,937 filed Jul. 28, 2010, which is a divisional of application Ser. No. 11/690,808 filed Mar. 24, 2007, the contents of both are herein incorporated by reference in its entirety.
- The invention relates to electronic semiconductor devices and manufacturing. More particularly, the invention relates to semiconductor device manufacturing and packaging and to die handling apparatus and related methods.
- In conventional semiconductor device assembly, it is known to use adhesive to permanently mount a semiconductor die to a mounting pad or substrate. Typical adhesive die attach processes use curable adhesive, such as epoxy or polyimide, as die attach material to affix the die to a die pad, leadframe, substrate, or socket, for convenience referred to herein generally as the die pad. It is common in the art to dispense die attach material in a controlled amount on a die pad. Die handling equipment used for die attach processes typically employs a pick-and-place tool to lift a die from a wafer tape or other holding mechanism and place it on a die pad. The portion of the die handling equipment that actually makes contact with the die is referred to as a collet. The die is placed on the collet, either by surface contact alone or with assistance from a mechanical ejector pin guiding the die onto the collet. A vacuum force exerted within the collet holds the die in the collet while the tool moves it into the appropriate position for placement on the pre-applied adhesive on the die pad.
- Die handling presents technical challenges. Particularly for thin dice, which are becoming increasingly common in the arts, handling during die attach requires great care to avoid cracks or other damage. Some examples of die attach-related failure mechanisms known in the art include backside tool marks, scratches, or microcracks, which can eventually lead to die cracking. Thinner dice are in particular danger from microcracks, which can result from excessive flexing of the die during handling. The contact surfaces of die attach collets are sometimes made from relatively soft plastic or elastomeric materials instead of metal in an effort to avoid causing mechanical damage on the die surface. The practice of using a vacuum to hold the die in the collet is another example of efforts to avoid inflicting damage to fragile dice. The use of a prior art vacuum collet, however, tends to cause a thin die to flex forming a concavity during die placement, which can cause further problems. Damage to the surface of the die can also occur, particularly in the central region, due to contact with the collet.
- The amount and distribution of die attach material between the die and the die pad can be crucial to the secure attachment of the die to the die pad and to the long term reliability of the completed assembly. Achieving the appropriate depth and uniform distribution of the die attach adhesive layer, also called the bond line, is a significant challenge. If the bond line is too thin, the bond may be insufficient to hold the die to the die pad. If the bond line is too thick, curing may be inhibited or prolonged, the bond may tend to weaken over time, thermal performance may suffer, or other problems may result. An uneven bond line resulting from non-uniform adhesive distribution can result in similar problems or in a combination of such problems. One of the most threatening problems a non-uniform distribution of adhesive can create is the formation of voids in the adhesive between the die and the die pad. Voids can lead to failures due to insufficient adhesive coverage or thermally induced stresses, for example. The formation of a concavity in the die surface, caused by the flexing of a thin die placed in a vacuum collet common in the arts, can induce these and other problems.
- Generally, in addition to the formation of the bond line, a quantity of adhesive is pressed from between the die and the bond pad during die placement. The formation of adhesive that builds from the bond pad to the edges of the die is known as the die attach fillet. The formation of the fillet can be adversely affected by the excess, lack, or non-uniform distribution of adhesive in the formation of the bond line. Excessive die attach fillet may lead to die attach contamination of the die surface. Too little fillet may reduce the strength of the attachment and lead to eventual problems such as die lifting or die cracking. The formation of a proper fillet may be impeded by excessive, inconsistent, or unpredictable die flexion during placement of the die on the adhesive by a die handling collet.
- Due to these and other problems, it would be useful and advantageous to provide semiconductor die handling apparatus and manufacturing methods with improved die handling capabilities, particularly for use with relatively thin and delicate dice.
- In carrying out the principles of the present invention, using methods and equipment compatible with established manufacturing processes, improved semiconductor die handling collets contribute useful advantages to the art. The invention provides apparatus for the handling and placement of semiconductor dice and superior die attach techniques, resulting in improved semiconductor device assemblies.
- According to one aspect of the invention, a method for attaching a semiconductor die to a die pad includes steps for positioning a die on a bearing surface of a collet and retaining the die on the bearing surface of the collet using a vacuum force. A pushing force is exerted on the die adjacent to the applied vacuum force. The pushing force is used to oppose flexion of the die in the direction of the vacuum force. In further steps, the die is placed on the die pad, with die attach adhesive interposed between the die and the die pad, the die is then released from the collet.
- According to another aspect of the invention, in a method for attaching a semiconductor die to a die pad using a preferred embodiment of a collet, a pushing force is applied to the die in order to bow the central region of the die toward the die pad.
- According to another aspect of the invention, a collet for handling a semiconductor die includes a body having a bearing surface for receiving the die. A chamber in the body has an open side bounded by the bearing surface, with a vacuum groove included in the bearing surface for holding a die against the bearing surface. A port is provided for transmitting an expelled gas to the chamber. The parts are arranged so that the vacuum force is adapted for holding the die surface against the bearing surface and the expelled gas is adapted for pushing the center of the die out from the interior of the chamber.
- According to yet another aspect of the invention, in a preferred embodiment, a collet is provided wherein an expelled gas may be applied for pushing outward on the center of a die held therein such that the die extends outward beyond the plane of the bearing surface.
- According to another aspect of the invention, a preferred embodiment of a collet includes a flexible skin attached to the body of the collet and situated for supporting a die held by the collet during handling.
- According to still another aspect of the invention, a preferred embodiment of a semiconductor die attach system includes a collet having a die bearing surface. The collet is configured for retaining the die on the bearing surface using a vacuum force and also for applying a pushing force to an adjacent portion of the die in opposition to inward flexion of the die in the direction of the vacuum force. The system also includes a handling tool for moving the collet to a die pad, and placing the die on the die pad.
- According to another aspect of the invention, a collet system features an arrangement whereby a pushing force may be applied to cause outward flexion of a die held by the collet such that a handling tool may bring the center region of the die into contact with a die pad in advance of the periphery.
- According to another aspect of the invention, a collet system includes provisions for using pressurized gas for applying a pushing force to the center region of a die held to the collet by a vacuum force.
- According to still another aspect of the invention, a semiconductor device assembly of the invention includes a flexed die with a cured bond line formed with the central region of the die thinner than the periphery.
- The invention has advantages including but not limited to providing methods, apparatus, and systems offering improvements in die handling capabilities useful in the manufacture of semiconductor device packages. These and other features, advantages, and benefits of the present invention can be understood by one of ordinary skill in the arts upon careful consideration of the detailed description of representative embodiments of the invention in connection with the accompanying drawings.
- The present invention will be more clearly understood from consideration of the following detailed description and drawings in which:
-
FIG. 1 is a bottom view of a die handling collet according to an example of a preferred embodiment of the invention; -
FIG. 2A is a cutaway side view of the die handling collet according to the example of a preferred embodiment of the invention ofFIG. 1 shown in the context of a die attach system and method; -
FIG. 2B is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention ofFIG. 2A shown in the context of a die attach system and method; -
FIG. 2C is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention ofFIGS. 2A and 2B shown in the context of a die attach system and method; -
FIG. 3 is a bottom view of a die handling collet according to an example of an alternative preferred embodiment of the invention; -
FIG. 4A is a cutaway side view of the die handling collet according to the example of a preferred embodiment of the invention ofFIG. 3 shown in the context of a die attach system and method; -
FIG. 4B is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention ofFIG. 4A shown in the context of a die attach system and method; and -
FIG. 4C is a cutaway side view of the die handling collet in a continuation of the example of a preferred embodiment of the invention ofFIGS. 4A and 4B shown in the context of a die attach system and method for implementing a preferred embodiment of a semiconductor device assembly of the invention. - References in the detailed description correspond to like references in the various drawings unless otherwise noted. Descriptive and directional terms used in the written description such as first, second, top, bottom, upper, lower, side, and so forth, refer to the drawings themselves as laid out on the paper and not to physical limitations of the invention unless specifically noted. The drawings are not to scale, and some features of embodiments shown and discussed are simplified or amplified for illustrating the principles, features, and advantages of the invention.
- In general, the invention provides a die handling collet and related systems and methods for improved die handling in semiconductor device manufacturing processes, particularly die attach processes. Referring primarily to
FIG. 1 andFIG. 2A , a bottom view (FIG. 1 ) and cutaway side view (FIG. 2A ) of acollet 10 according to a preferred embodiment of the invention is described. Abody 12, preferably made from plastic, metal, or other suitably rigid material, is capable of receiving a die 14 (FIG. 2A ). Avacuum groove 16 is provided at the edge of thebody 12. Thevacuum groove 16 is incorporated into a die-bearingsurface 18 of thebody 12, preferably entirely around the periphery. Thevacuum groove 16 is in communication withvacuum ports 20 for transmitting a vacuum force, indicated byarrow 22, generated by a suitable mechanism such as a pump (not shown). Thevacuum groove 16 preferably distributes the vacuum force around the periphery of the die-bearingsurface 18 for holding a die 14 during handling and placement. Achamber 24 is incorporated within thebody 12 and is preferably encompassed by the die-bearingsurface 18. One side of thechamber 24 is open such that a die 14 placed on the bearingsurface 18 completes the enclosure. Within thechamber 24, aport 26 is provided for expelling pressurized gas, preferably air, indicated byarrow 28. The expelledgas 28 pressurizes thechamber 24, exerting a pushing force on the adjacent surface of thedie 14. The pushing force preferably opposes the die flexion which tends to occur due to the application of thevacuum force 22, preventing or reducing the temporary formation of a concavity on the outer surface of thedie 14 due to flexing. Preferably, during die attach, thechamber 24 is sufficiently pressurized to cause the die 14 to bow outward slightly in a position convex to theadjacent die pad 32 or intervening die attach adhesive 30 (FIG. 2A ). - Now referring primarily to
FIG. 2B , thecollet 10 is shown in the context of further steps in a die attach method according to preferred embodiments of the invention. As illustrated, using the preferred embodiment of thecollet 10 shown and described above, the expelledair 28 within thechamber 24 is preferably used to flex the die 14 in order to present a convex surface to the die attachmaterial 30 pre-applied to thedie pad 32. The convex surface of the die 14, as indicated byarrows 34, tends to expel air from between the die 14 and die attach adhesive 30 during the ultimate placement of the die, reducing the frequency and magnitude of void formation. Although the use of a convex surface is preferred, in an alternative embodiment, the die may be flexed by the expelledair 28 by an amount adapted to counter any inward flexion caused by thevacuum 22, and calculated to prevent the outward flexion of thedie 14. This implementation may be preferred for example with particularly delicate dice, preventing or attenuating flexion and presenting a substantially flat die surface to thedie pad 32 and the intervening die attach adhesive 30, promoting a uniform thickness of die attachmaterial 30. It should be appreciated by those skilled in the arts that other alternative embodiments are possible without departure from the invention, for example, die attach processes using die adhesive film may also advantageously use the invention. As depicted inFIG. 2C , as thecollet 10 brings the die 14 into position on the die attach adhesive 30, the pushing and vacuum forces may be reduced or eliminated, ultimately enabling thecollet 10 to be removed after thedie 14 is placed. - An alternative preferred embodiment of a
collet 40 of the invention is depicted in a bottom view inFIG. 3 , and in corresponding cutaway side views inFIG. 4A through 4C showing an example of a system and method for its use. As described elsewhere herein, thecollet 40 has abody 12 preferably made from plastic, metal, or like material and is capable of receiving a die 14 as shown. Avacuum groove 16 is incorporated into the die-bearingsurface 18 of thecollet 40, preferably at the edge of thebody 12 and around its periphery. Thevacuum groove 16 is provided with avacuum force 22 throughsuitable vacuum ports 20. Thevacuum groove 16 preferably evenly distributes thevacuum force 22 around the periphery of the die-bearingsurface 18 for holding a die 14 during handling and placement. Aninterior chamber 24 is incorporated within the die-bearingsurface 18 of thebody 12. Aport 26 is provided for expelling pressurized air orother gas 28 into thechamber 24. As in the other preferred embodiment described, the expelledair 28 pressurizes thechamber 24 to prevent the formation of a concavity in the outer surface of anadjacent die 14 due to flexion in response to the application of thevacuum force 22. Preferably, during die attach thechamber 24 is sufficiently pressurized to cause the die to bow outward slightly in a position convex to the adjacent die attach adhesive 30 as shown inFIG. 4A andFIG. 4B . In this alternative embodiment, thecollet 40 also includes asupport skin 42. Thesupport skin 42 is preferably permanently attached to thedie bearing surface 18 of thecollet body 12. Thesupport skin 42 is made from a flexible material such as, for example, a thin film of Teflon, Mylar, (both registered trademarks of DuPont Corporation), polymer, or the like. In operation, while thevacuum 22 exerted in thevacuum groove 16 holds the die 14, the pushing force ofair 28 expelled into thecavity 24 pressurizes thesupport skin 42. As a result, the center region of the die 14 may be caused to bow outward in a shape convex relative to the die attach adhesive 30. As with the above-described embodiments, using this preferred method, the bowed center region of the die 14 die contacts the die attach adhesive 30 first and then spreads outward toward the periphery as it is moved toward the die pad and as the pushing force on thedie 14 is diminished. This sequence avoids the trapping of air during die attach, helps to form the die attach adhesive into abond line 30 of uniform thickness, and fosters the formation ofsuitable fillets 36. Alternatively, for example in cases where the die 14 may be particularly susceptible to damage from flexing, theoutward pressure 28 may be regulated to hold the die 14 substantially flat relative to thedie pad 32 and attach adhesive 30. Thus the invention may be used for regulating the shape of the die surface presented to the die attach locale, balancing against inward flexion exerted by thevacuum force 22, but refraining from bowing the die 14 outward in order to prevent inducing stress on the die 14 in cases where increased gentleness is required. In another alternative embodiment, illustrated in the final position of the die 14 inFIG. 4C , thebond line 30 is cured with a “smile” profile as shown, preferably uniformly thinner in the central region of thedie 14 and progressively thicker approaching the periphery. - As shown and described herein, preferred embodiments of the invention contribute one or more useful advantages to the art. The invention provides advantages including but not limited to improved die handling capabilities and reductions in damage during die attach in microelectronic semiconductor device package assembly. While the invention has been described with reference to certain illustrative embodiments, the methods, apparatus, and systems described are not intended to be construed in a limiting sense. Various modifications and combinations of the illustrative embodiments as well as other advantages and embodiments of the invention will be apparent to persons skilled in the art upon reference to the description, drawings, and claims.
Claims (5)
1-8. (canceled)
9. A system comprising:
a collet configured for retaining a semiconductor die on a bearing surface using a vacuum force applied to a portion of a first surface of the die, the collet also configured for applying a pushing force in a direction opposite the vacuum force to a portion of the first surface of the retained die.
10. A system according to claim 9 whereby the pushing force causes outward flexion of the retained die held by the collet such that a handling tool may bring the outwardly flexed region of the second surface of the die into contact with the die pad before the periphery of the second surface of the die contacts the die pad.
11. A system according to claim 9 further comprising means for applying the pushing force using pressurized gas.
12. A system according to claim 9 further comprising a flexible skin attached to the bearing surface of the collet.
Priority Applications (1)
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US13/898,615 US20130264836A1 (en) | 2007-03-24 | 2013-05-21 | Semiconductor Die Collet and Method |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US11/690,808 US7790507B2 (en) | 2007-03-24 | 2007-03-24 | Semiconductor die collet and method |
US12/844,937 US8465619B2 (en) | 2007-03-24 | 2010-07-28 | Semiconductor die collet |
US13/898,615 US20130264836A1 (en) | 2007-03-24 | 2013-05-21 | Semiconductor Die Collet and Method |
Related Parent Applications (1)
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US12/844,937 Division US8465619B2 (en) | 2007-03-24 | 2010-07-28 | Semiconductor die collet |
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US20130264836A1 true US20130264836A1 (en) | 2013-10-10 |
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US11/690,808 Active 2028-02-24 US7790507B2 (en) | 2007-03-24 | 2007-03-24 | Semiconductor die collet and method |
US12/844,937 Active 2028-02-21 US8465619B2 (en) | 2007-03-24 | 2010-07-28 | Semiconductor die collet |
US13/898,615 Abandoned US20130264836A1 (en) | 2007-03-24 | 2013-05-21 | Semiconductor Die Collet and Method |
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US11/690,808 Active 2028-02-24 US7790507B2 (en) | 2007-03-24 | 2007-03-24 | Semiconductor die collet and method |
US12/844,937 Active 2028-02-21 US8465619B2 (en) | 2007-03-24 | 2010-07-28 | Semiconductor die collet |
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Families Citing this family (8)
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US9230862B2 (en) | 2013-05-14 | 2016-01-05 | Texas Instruments Incorporated | Wafer die separation |
US9257321B2 (en) * | 2013-06-13 | 2016-02-09 | Taiwan Semiconductor Manufacturing Company Ltd. | Singulation apparatus and method |
US9711485B1 (en) * | 2014-02-04 | 2017-07-18 | Amkor Technology, Inc. | Thin bonded interposer package |
KR102231293B1 (en) * | 2014-02-10 | 2021-03-23 | 삼성전자주식회사 | Die bonding apparatus |
JP7137571B2 (en) * | 2017-03-02 | 2022-09-14 | エーファウ・グループ・エー・タルナー・ゲーエムベーハー | Method and apparatus for bonding chips |
US11062933B2 (en) * | 2018-07-17 | 2021-07-13 | Intel Corporation | Die placement and coupling apparatus |
CN113544834A (en) * | 2019-03-18 | 2021-10-22 | 磁共振谱成像系统有限公司 | Die bonding system with heated automatic chuck changer |
US11887921B2 (en) * | 2020-08-28 | 2024-01-30 | Stmicroelectronics S.R.L. | Method of producing semiconductor devices and corresponding semiconductor device |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4990051A (en) * | 1987-09-28 | 1991-02-05 | Kulicke And Soffa Industries, Inc. | Pre-peel die ejector apparatus |
US5169196A (en) * | 1991-06-17 | 1992-12-08 | Safabakhsh Ali R | Non-contact pick-up head |
US6344402B1 (en) * | 1999-07-28 | 2002-02-05 | Disco Corporation | Method of dicing workpiece |
US20040089415A1 (en) * | 2002-11-07 | 2004-05-13 | Byun Young Sang | Structure for loading substrate in substrate bonding apparatus for fabricating liquid crystal display device |
US20040238112A1 (en) * | 2003-06-02 | 2004-12-02 | Asm Assembly Automation Ltd. | Pick and place assembly for transporting a film of material |
US6916686B2 (en) * | 2002-02-08 | 2005-07-12 | Renesas Technology Corporation | Method of manufacturing a semiconductor device |
US20050221582A1 (en) * | 2003-12-31 | 2005-10-06 | Chippac, Inc. | Bonding tool for mounting semiconductor chips |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6261492B1 (en) * | 1996-10-10 | 2001-07-17 | Samsung Electronics Co., Ltd. | Method for fitting a semiconductor chip |
JP2005322815A (en) * | 2004-05-11 | 2005-11-17 | Matsushita Electric Ind Co Ltd | Manufacturing apparatus and manufacturing method of semiconductor apparatus |
-
2007
- 2007-03-24 US US11/690,808 patent/US7790507B2/en active Active
-
2010
- 2010-07-28 US US12/844,937 patent/US8465619B2/en active Active
-
2013
- 2013-05-21 US US13/898,615 patent/US20130264836A1/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4990051A (en) * | 1987-09-28 | 1991-02-05 | Kulicke And Soffa Industries, Inc. | Pre-peel die ejector apparatus |
US5169196A (en) * | 1991-06-17 | 1992-12-08 | Safabakhsh Ali R | Non-contact pick-up head |
US6344402B1 (en) * | 1999-07-28 | 2002-02-05 | Disco Corporation | Method of dicing workpiece |
US6916686B2 (en) * | 2002-02-08 | 2005-07-12 | Renesas Technology Corporation | Method of manufacturing a semiconductor device |
US20040089415A1 (en) * | 2002-11-07 | 2004-05-13 | Byun Young Sang | Structure for loading substrate in substrate bonding apparatus for fabricating liquid crystal display device |
US20040238112A1 (en) * | 2003-06-02 | 2004-12-02 | Asm Assembly Automation Ltd. | Pick and place assembly for transporting a film of material |
US20050221582A1 (en) * | 2003-12-31 | 2005-10-06 | Chippac, Inc. | Bonding tool for mounting semiconductor chips |
Also Published As
Publication number | Publication date |
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US7790507B2 (en) | 2010-09-07 |
US20080233680A1 (en) | 2008-09-25 |
US20100289159A1 (en) | 2010-11-18 |
US8465619B2 (en) | 2013-06-18 |
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