US20090277795A1 - Process for fabricating molding stamp - Google Patents
Process for fabricating molding stamp Download PDFInfo
- Publication number
- US20090277795A1 US20090277795A1 US12/242,586 US24258608A US2009277795A1 US 20090277795 A1 US20090277795 A1 US 20090277795A1 US 24258608 A US24258608 A US 24258608A US 2009277795 A1 US2009277795 A1 US 2009277795A1
- Authority
- US
- United States
- Prior art keywords
- photo resist
- resist layer
- metal seed
- substrate
- seed film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000000465 moulding Methods 0.000 title claims abstract description 18
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 47
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 36
- 239000000758 substrate Substances 0.000 claims abstract description 33
- 238000005323 electroforming Methods 0.000 claims abstract description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 238000005530 etching Methods 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 238000003698 laser cutting Methods 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000008213 purified water Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/10—Moulds; Masks; Masterforms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0017—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means
Definitions
- the present invention relates to a process for fabricating a molding stamp, and particularly, relates to a process for fabricating a molding stamp having a pattern for shaping a number of microlenses.
- a conventional process for making a molding core typically includes the following steps: depositing a photo resist on a substrate; exposing the photo resist under light and developing the photo resist; etching the substrate to form a pattern and removing the photoresist; forming a seed layer on the patterned substrate; electroforming a body on the substrate; and separating the electroformed body from the substrate to obtain the molding core.
- the seed layer is mostly remained on the electroformed body, i.e. the molding core, after the electroformed body is separated from the substrate.
- An attachment between the seed layer and the molding core is not strong enough that the seed layer is easily stripped off, which results in an increased surface roughness of the molding core and an increased defect rate of final products.
- An exemplary process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
- FIG. 1 is a schematic view for describing a process for fabricating a molding stamp, according to an embodiment of the present invention.
- FIGS. 2 to 10 are sectional views showing successive stages of the process for fabricating a molding stamp shown in FIG. 1 .
- the process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
- the substrate 10 is made of light transmitting materials, such as glass, quartz.
- the substrate 10 may be made of opaque materials, such as aluminum, iron, gold, or silver.
- a metal seed film 20 made of copper is disposed on the substrate 10 by sputtering.
- the metal seed film 20 is configured for attachment and crystal growth of an electroformed body for following processes.
- the metal seed film 20 may be formed on the substrate 10 by evaporation or spraying.
- the metal seed film 20 may be made of other kinds of metal, such as nickel.
- a photo resist layer 30 is placed on the metal seed film 20 .
- a photo resist substance is first placed on the metal seed film 20 and then laminated by a pressure laminating device to form the photo resist layer 30 on the metal seed film 20 .
- a pressure laminating device to form the photo resist layer 30 on the metal seed film 20 .
- other coating methods can also be utilized, such as spraying, or spin coating.
- a thickness of the photo resist layer 30 is predetermined as desired.
- the photo resist layer 30 is exposed to light by performing a direct laser writing method to form a number of first exposed regions 301 and two second exposed regions 303 thereon.
- the first exposed regions 301 do not reach the metal seed layer 20 in depth, and configured for forming a predetermined pattern including a number of microlens structures.
- the two second exposed regions 303 are connected with the metal seed layer 20 , and configured for forming through holes therein. Accordingly, when exposing the photo resist layer 30 to light, a laser power or an exposure time may be adjusted as desired. Electric beam direct writing can be also used as an alternative embodiment.
- the photo resist layer 30 is then developed in a developer, and then rinsed. In the embodiment the 30 is rinsed with purified water. When rinsed, unexposed region of the photo resist layer 30 dissolves and then rinsed off the substrate 10 . The first exposed regions 301 and two second exposed regions 303 remain on the substrate 10 .
- the first exposed regions 301 are patterned to form a number of microlens structures 305 thereon.
- the two second exposed regions 303 are patterned to form two through holes 307 defined therein and exposed parts of the metal seed film 20 .
- the substrate 10 may be placed in a clean oven and the photo resist layer 30 is baked in a temperature ranging from 70 degree Celsius to 100 degrees Celsius for a time period of about 4 minutes to about 8 minutes.
- the substrate 10 is attached to a cathode of an electroforming device, thereby electroforming a body 40 thereon.
- the electroformed body 40 covers the microlens structures 305 of the photo resist layer 30 and includes a number of molding surfaces 401 corresponding to the microlens structures 305 . Further, the electroformed body 40 includes two extending portions 402 connected with the metal seed film 20 via the through holes 307 .
- the body 40 is made of nickel.
- the photo resist layer 30 is removed from the substrate 10 .
- the electroformed body 40 is separated from the substrate 10 by etching the metal seed layer 20 .
- the metal seed layer 20 and the electroformed body 40 are both made of nickel, and the electroformed body 40 is separated from the metal seed layer 20 and the substrate 10 by laser cutting.
- the extending portions 402 of the electroformed body 40 are removed from the electroformed body 40 by abrading, thereby, yielding a desired molding stamp 60 having a number of microlens patterns is thereby obtained.
- the number of the second exposed regions 305 could be modified, such as one, three, four or the other as desired.
- the number of the extending portions 402 of the electroformed body 40 is also changed.
- the distribution of the second exposed regions 305 may be also modified as desired, and not limited by the above embodiment.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Theoretical Computer Science (AREA)
- Materials Engineering (AREA)
- Electrochemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
A process for fabricating a molding stamp mainly includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern made of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
Description
- 1. Technical Field
- The present invention relates to a process for fabricating a molding stamp, and particularly, relates to a process for fabricating a molding stamp having a pattern for shaping a number of microlenses.
- 2. Description of Related Art
- A conventional process for making a molding core typically includes the following steps: depositing a photo resist on a substrate; exposing the photo resist under light and developing the photo resist; etching the substrate to form a pattern and removing the photoresist; forming a seed layer on the patterned substrate; electroforming a body on the substrate; and separating the electroformed body from the substrate to obtain the molding core.
- However, the seed layer is mostly remained on the electroformed body, i.e. the molding core, after the electroformed body is separated from the substrate. An attachment between the seed layer and the molding core is not strong enough that the seed layer is easily stripped off, which results in an increased surface roughness of the molding core and an increased defect rate of final products.
- Therefore, a new process for fabricating a molding stamp is desired to overcome the above mentioned problems.
- An exemplary process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
- Many aspects of the embodiments can be better understood with references to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
-
FIG. 1 is a schematic view for describing a process for fabricating a molding stamp, according to an embodiment of the present invention; and -
FIGS. 2 to 10 are sectional views showing successive stages of the process for fabricating a molding stamp shown inFIG. 1 . - Embodiments will now be described in detail below with reference to the drawings.
- Referring to
FIG. 1 , a process for fabricating a molding stamp diagram is shown according to a first embodiment of the present invention. The process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate. - In detail, referring to
FIG. 2 , aclean substrate 10 to be treated is provided. In the present embodiment, thesubstrate 10 is made of light transmitting materials, such as glass, quartz. Selectively, thesubstrate 10 may be made of opaque materials, such as aluminum, iron, gold, or silver. - Referrring to
FIG. 3 , ametal seed film 20 made of copper, is disposed on thesubstrate 10 by sputtering. Themetal seed film 20 is configured for attachment and crystal growth of an electroformed body for following processes. Themetal seed film 20 may be formed on thesubstrate 10 by evaporation or spraying. Themetal seed film 20 may be made of other kinds of metal, such as nickel. - Referring to
FIG. 4 , aphoto resist layer 30 is placed on themetal seed film 20. In particular, a photo resist substance is first placed on themetal seed film 20 and then laminated by a pressure laminating device to form thephoto resist layer 30 on themetal seed film 20. It is indisputable that other coating methods can also be utilized, such as spraying, or spin coating. A thickness of thephoto resist layer 30 is predetermined as desired. - Referring to
FIG. 5 , thephoto resist layer 30 is exposed to light by performing a direct laser writing method to form a number of first exposedregions 301 and two second exposedregions 303 thereon. The first exposedregions 301 do not reach themetal seed layer 20 in depth, and configured for forming a predetermined pattern including a number of microlens structures. The two second exposedregions 303 are connected with themetal seed layer 20, and configured for forming through holes therein. Accordingly, when exposing the photo resistlayer 30 to light, a laser power or an exposure time may be adjusted as desired. Electric beam direct writing can be also used as an alternative embodiment. - The
photo resist layer 30 is then developed in a developer, and then rinsed. In the embodiment the 30 is rinsed with purified water. When rinsed, unexposed region of thephoto resist layer 30 dissolves and then rinsed off thesubstrate 10. The first exposedregions 301 and two second exposedregions 303 remain on thesubstrate 10. - Referring to
FIG. 6 , the first exposedregions 301 are patterned to form a number ofmicrolens structures 305 thereon. The two second exposedregions 303 are patterned to form two throughholes 307 defined therein and exposed parts of themetal seed film 20. - In addition, in the present embodiment, between the steps of exposing and developing the
photo resist layer 30, thesubstrate 10 may be placed in a clean oven and thephoto resist layer 30 is baked in a temperature ranging from 70 degree Celsius to 100 degrees Celsius for a time period of about 4 minutes to about 8 minutes. - Referring to
FIG. 7 , thesubstrate 10 is attached to a cathode of an electroforming device, thereby electroforming abody 40 thereon. Theelectroformed body 40 covers themicrolens structures 305 of thephoto resist layer 30 and includes a number ofmolding surfaces 401 corresponding to themicrolens structures 305. Further, theelectroformed body 40 includes two extendingportions 402 connected with themetal seed film 20 via the throughholes 307. In the present embodiment, thebody 40 is made of nickel. - Referring to
FIG. 8 , thephoto resist layer 30 is removed from thesubstrate 10. - Referring to
FIG. 9 , theelectroformed body 40 is separated from thesubstrate 10 by etching themetal seed layer 20. In an alternative embodiment, themetal seed layer 20 and theelectroformed body 40 are both made of nickel, and theelectroformed body 40 is separated from themetal seed layer 20 and thesubstrate 10 by laser cutting. Referring toFIG. 10 , the extendingportions 402 of theelectroformed body 40 are removed from theelectroformed body 40 by abrading, thereby, yielding a desiredmolding stamp 60 having a number of microlens patterns is thereby obtained. - It should be noted that the number of the second exposed
regions 305 could be modified, such as one, three, four or the other as desired. Correspondingly, the number of the extendingportions 402 of theelectroformed body 40 is also changed. In addition, the distribution of the second exposedregions 305 may be also modified as desired, and not limited by the above embodiment. - While certain embodiments have been described and exemplified above, various other embodiments from the foregoing disclosure will be apparent to those skilled in the art. The present invention is not limited to the particular embodiments described and exemplified but is capable of considerable variation and modification without departure from the scope of the appended claims.
Claims (7)
1. A process for fabricating a molding stamp, comprising:
forming a metal seed film on a substrate;
forming a photo resist layer on the metal seed film;
exposing the photo resist layer using a direct writing method,
developing the photo resist layer thereby forming the photo resist layer into a patterned photo resist layer, the patterned photo resist layer comprising a plurality of microlens structures and a through hole exposing a portion of the metal seed film therefrom;
electroforming a metallic body on the substrate to cover the patterned photo resist layer, the metallic body having an extending portion extending through the through hole of the photo resist layer and connected with the exposed portion of the metal seed film;
removing the photo resist layer from the substrate; and
separating the metallic body from the metal seed layer.
2. The process of claim 1 , wherein the direct writing method is a direct laser writing method or an electric beam direct writing method.
3. The process of claim 1 , further comprising baking the photo resist layer at a temperature in a range from 70 to 100 Celsius degree for a period of time of about 4 to about 8 minutes.
4. The process of claim 1 , wherein the metal seed film is comprised of copper, the metallic body is comprised of nickel,
5. The process of claim 1 , wherein the metallic body is separated from the metal seed layer by etching.
6. The process of claim 1 , wherein both the metal seed film and the metallic body are comprised of nickel.
7. The process of claim 1 , wherein the metallic body is separated from the metal seed layer by laser cutting.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200810301420.8 | 2008-05-06 | ||
CN200810301420A CN101576712B (en) | 2008-05-06 | 2008-05-06 | Cavity manufacturing method |
Publications (1)
Publication Number | Publication Date |
---|---|
US20090277795A1 true US20090277795A1 (en) | 2009-11-12 |
Family
ID=41266002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/242,586 Abandoned US20090277795A1 (en) | 2008-05-06 | 2008-09-30 | Process for fabricating molding stamp |
Country Status (2)
Country | Link |
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US (1) | US20090277795A1 (en) |
CN (1) | CN101576712B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110484938A (en) * | 2019-09-16 | 2019-11-22 | 中国电子科技集团公司第十二研究所 | A kind of processing method of the interaction circuit components resistant to high temperature of vacuum device |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5385660A (en) * | 1993-12-20 | 1995-01-31 | Xerox Corporation | Dendritic growth assisted electroform separation |
US20020045105A1 (en) * | 2000-07-05 | 2002-04-18 | Brown David R. | High quality lithographic processing |
US6451510B1 (en) * | 2001-02-21 | 2002-09-17 | International Business Machines Corporation | Developer/rinse formulation to prevent image collapse in resist |
US6719930B2 (en) * | 2001-07-24 | 2004-04-13 | Litek Opto-Electronics Co., Ltd. | Light guide and stamper production method |
US20040108210A1 (en) * | 1998-07-29 | 2004-06-10 | Canon Kabushiki Kaisha | Method for fabricating a mold for a microlens |
US20050157396A1 (en) * | 2000-10-10 | 2005-07-21 | Canon Kabushiki Kaisha | Microstructure array, mold for forming a microstructure array, and method of fabricating the same |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100529962C (en) * | 2003-08-16 | 2009-08-19 | 鸿富锦精密工业(深圳)有限公司 | Light guide board module core manufacturing method |
CN1590593A (en) * | 2003-08-30 | 2005-03-09 | 鸿富锦精密工业(深圳)有限公司 | Model manufacturing method |
KR100590727B1 (en) * | 2004-02-24 | 2006-06-19 | 한국기계연구원 | Microcontact Printing Technique Using Imprinted Nanostructures and Their Nanostructures |
KR100603082B1 (en) * | 2004-10-18 | 2006-08-09 | 한국기계연구원 | Manufacturing Method of Nanostructured Nickel Stamper Using Exposure Mask |
-
2008
- 2008-05-06 CN CN200810301420A patent/CN101576712B/en not_active Expired - Fee Related
- 2008-09-30 US US12/242,586 patent/US20090277795A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5385660A (en) * | 1993-12-20 | 1995-01-31 | Xerox Corporation | Dendritic growth assisted electroform separation |
US20040108210A1 (en) * | 1998-07-29 | 2004-06-10 | Canon Kabushiki Kaisha | Method for fabricating a mold for a microlens |
US20020045105A1 (en) * | 2000-07-05 | 2002-04-18 | Brown David R. | High quality lithographic processing |
US20050157396A1 (en) * | 2000-10-10 | 2005-07-21 | Canon Kabushiki Kaisha | Microstructure array, mold for forming a microstructure array, and method of fabricating the same |
US6451510B1 (en) * | 2001-02-21 | 2002-09-17 | International Business Machines Corporation | Developer/rinse formulation to prevent image collapse in resist |
US6719930B2 (en) * | 2001-07-24 | 2004-04-13 | Litek Opto-Electronics Co., Ltd. | Light guide and stamper production method |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110484938A (en) * | 2019-09-16 | 2019-11-22 | 中国电子科技集团公司第十二研究所 | A kind of processing method of the interaction circuit components resistant to high temperature of vacuum device |
Also Published As
Publication number | Publication date |
---|---|
CN101576712A (en) | 2009-11-11 |
CN101576712B (en) | 2012-09-19 |
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Owner name: HON HAI PRECISION INDUSTRY CO., LTD., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:YU, TAI-CHERNG;REEL/FRAME:021612/0169 Effective date: 20080924 |
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