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US20090277795A1 - Process for fabricating molding stamp - Google Patents

Process for fabricating molding stamp Download PDF

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Publication number
US20090277795A1
US20090277795A1 US12/242,586 US24258608A US2009277795A1 US 20090277795 A1 US20090277795 A1 US 20090277795A1 US 24258608 A US24258608 A US 24258608A US 2009277795 A1 US2009277795 A1 US 2009277795A1
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US
United States
Prior art keywords
photo resist
resist layer
metal seed
substrate
seed film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US12/242,586
Inventor
Tai-Cherng Yu
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Hon Hai Precision Industry Co Ltd
Original Assignee
Hon Hai Precision Industry Co Ltd
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Filing date
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Assigned to HON HAI PRECISION INDUSTRY CO., LTD. reassignment HON HAI PRECISION INDUSTRY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YU, TAI-CHERNG
Publication of US20090277795A1 publication Critical patent/US20090277795A1/en
Abandoned legal-status Critical Current

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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/10Moulds; Masks; Masterforms
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0017Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor for the production of embossing, cutting or similar devices; for the production of casting means

Definitions

  • the present invention relates to a process for fabricating a molding stamp, and particularly, relates to a process for fabricating a molding stamp having a pattern for shaping a number of microlenses.
  • a conventional process for making a molding core typically includes the following steps: depositing a photo resist on a substrate; exposing the photo resist under light and developing the photo resist; etching the substrate to form a pattern and removing the photoresist; forming a seed layer on the patterned substrate; electroforming a body on the substrate; and separating the electroformed body from the substrate to obtain the molding core.
  • the seed layer is mostly remained on the electroformed body, i.e. the molding core, after the electroformed body is separated from the substrate.
  • An attachment between the seed layer and the molding core is not strong enough that the seed layer is easily stripped off, which results in an increased surface roughness of the molding core and an increased defect rate of final products.
  • An exemplary process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
  • FIG. 1 is a schematic view for describing a process for fabricating a molding stamp, according to an embodiment of the present invention.
  • FIGS. 2 to 10 are sectional views showing successive stages of the process for fabricating a molding stamp shown in FIG. 1 .
  • the process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
  • the substrate 10 is made of light transmitting materials, such as glass, quartz.
  • the substrate 10 may be made of opaque materials, such as aluminum, iron, gold, or silver.
  • a metal seed film 20 made of copper is disposed on the substrate 10 by sputtering.
  • the metal seed film 20 is configured for attachment and crystal growth of an electroformed body for following processes.
  • the metal seed film 20 may be formed on the substrate 10 by evaporation or spraying.
  • the metal seed film 20 may be made of other kinds of metal, such as nickel.
  • a photo resist layer 30 is placed on the metal seed film 20 .
  • a photo resist substance is first placed on the metal seed film 20 and then laminated by a pressure laminating device to form the photo resist layer 30 on the metal seed film 20 .
  • a pressure laminating device to form the photo resist layer 30 on the metal seed film 20 .
  • other coating methods can also be utilized, such as spraying, or spin coating.
  • a thickness of the photo resist layer 30 is predetermined as desired.
  • the photo resist layer 30 is exposed to light by performing a direct laser writing method to form a number of first exposed regions 301 and two second exposed regions 303 thereon.
  • the first exposed regions 301 do not reach the metal seed layer 20 in depth, and configured for forming a predetermined pattern including a number of microlens structures.
  • the two second exposed regions 303 are connected with the metal seed layer 20 , and configured for forming through holes therein. Accordingly, when exposing the photo resist layer 30 to light, a laser power or an exposure time may be adjusted as desired. Electric beam direct writing can be also used as an alternative embodiment.
  • the photo resist layer 30 is then developed in a developer, and then rinsed. In the embodiment the 30 is rinsed with purified water. When rinsed, unexposed region of the photo resist layer 30 dissolves and then rinsed off the substrate 10 . The first exposed regions 301 and two second exposed regions 303 remain on the substrate 10 .
  • the first exposed regions 301 are patterned to form a number of microlens structures 305 thereon.
  • the two second exposed regions 303 are patterned to form two through holes 307 defined therein and exposed parts of the metal seed film 20 .
  • the substrate 10 may be placed in a clean oven and the photo resist layer 30 is baked in a temperature ranging from 70 degree Celsius to 100 degrees Celsius for a time period of about 4 minutes to about 8 minutes.
  • the substrate 10 is attached to a cathode of an electroforming device, thereby electroforming a body 40 thereon.
  • the electroformed body 40 covers the microlens structures 305 of the photo resist layer 30 and includes a number of molding surfaces 401 corresponding to the microlens structures 305 . Further, the electroformed body 40 includes two extending portions 402 connected with the metal seed film 20 via the through holes 307 .
  • the body 40 is made of nickel.
  • the photo resist layer 30 is removed from the substrate 10 .
  • the electroformed body 40 is separated from the substrate 10 by etching the metal seed layer 20 .
  • the metal seed layer 20 and the electroformed body 40 are both made of nickel, and the electroformed body 40 is separated from the metal seed layer 20 and the substrate 10 by laser cutting.
  • the extending portions 402 of the electroformed body 40 are removed from the electroformed body 40 by abrading, thereby, yielding a desired molding stamp 60 having a number of microlens patterns is thereby obtained.
  • the number of the second exposed regions 305 could be modified, such as one, three, four or the other as desired.
  • the number of the extending portions 402 of the electroformed body 40 is also changed.
  • the distribution of the second exposed regions 305 may be also modified as desired, and not limited by the above embodiment.

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Theoretical Computer Science (AREA)
  • Materials Engineering (AREA)
  • Electrochemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Abstract

A process for fabricating a molding stamp mainly includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern made of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.

Description

    BACKGROUND
  • 1. Technical Field
  • The present invention relates to a process for fabricating a molding stamp, and particularly, relates to a process for fabricating a molding stamp having a pattern for shaping a number of microlenses.
  • 2. Description of Related Art
  • A conventional process for making a molding core typically includes the following steps: depositing a photo resist on a substrate; exposing the photo resist under light and developing the photo resist; etching the substrate to form a pattern and removing the photoresist; forming a seed layer on the patterned substrate; electroforming a body on the substrate; and separating the electroformed body from the substrate to obtain the molding core.
  • However, the seed layer is mostly remained on the electroformed body, i.e. the molding core, after the electroformed body is separated from the substrate. An attachment between the seed layer and the molding core is not strong enough that the seed layer is easily stripped off, which results in an increased surface roughness of the molding core and an increased defect rate of final products.
  • Therefore, a new process for fabricating a molding stamp is desired to overcome the above mentioned problems.
  • SUMMARY
  • An exemplary process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • Many aspects of the embodiments can be better understood with references to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the several views.
  • FIG. 1 is a schematic view for describing a process for fabricating a molding stamp, according to an embodiment of the present invention; and
  • FIGS. 2 to 10 are sectional views showing successive stages of the process for fabricating a molding stamp shown in FIG. 1.
  • DETAILED DESCRIPTION OF THE EMBODIMENTS
  • Embodiments will now be described in detail below with reference to the drawings.
  • Referring to FIG. 1, a process for fabricating a molding stamp diagram is shown according to a first embodiment of the present invention. The process for fabricating a molding stamp includes the steps of: forming a metal seed film on a substrate; forming a photo resist layer on the metal seed film; exposing the photo resist layer by a direct writing method, and developing the photo resist layer thereby forming a pattern of the photo resist layer, the pattern comprised of a number of microlens structures and a through hole configured for exposing a portion of the metal seed film therefrom; electroforming a body on the substrate to cover the pattern of the photo resist layer, the body having an extending portion being connected with the metal seed film via the through hole of the photo resist layer; removing the photo resist layer from the substrate; and separating the electroformed body from the substrate.
  • In detail, referring to FIG. 2, a clean substrate 10 to be treated is provided. In the present embodiment, the substrate 10 is made of light transmitting materials, such as glass, quartz. Selectively, the substrate 10 may be made of opaque materials, such as aluminum, iron, gold, or silver.
  • Referrring to FIG. 3, a metal seed film 20 made of copper, is disposed on the substrate 10 by sputtering. The metal seed film 20 is configured for attachment and crystal growth of an electroformed body for following processes. The metal seed film 20 may be formed on the substrate 10 by evaporation or spraying. The metal seed film 20 may be made of other kinds of metal, such as nickel.
  • Referring to FIG. 4, a photo resist layer 30 is placed on the metal seed film 20. In particular, a photo resist substance is first placed on the metal seed film 20 and then laminated by a pressure laminating device to form the photo resist layer 30 on the metal seed film 20. It is indisputable that other coating methods can also be utilized, such as spraying, or spin coating. A thickness of the photo resist layer 30 is predetermined as desired.
  • Referring to FIG. 5, the photo resist layer 30 is exposed to light by performing a direct laser writing method to form a number of first exposed regions 301 and two second exposed regions 303 thereon. The first exposed regions 301 do not reach the metal seed layer 20 in depth, and configured for forming a predetermined pattern including a number of microlens structures. The two second exposed regions 303 are connected with the metal seed layer 20, and configured for forming through holes therein. Accordingly, when exposing the photo resist layer 30 to light, a laser power or an exposure time may be adjusted as desired. Electric beam direct writing can be also used as an alternative embodiment.
  • The photo resist layer 30 is then developed in a developer, and then rinsed. In the embodiment the 30 is rinsed with purified water. When rinsed, unexposed region of the photo resist layer 30 dissolves and then rinsed off the substrate 10. The first exposed regions 301 and two second exposed regions 303 remain on the substrate 10.
  • Referring to FIG. 6, the first exposed regions 301 are patterned to form a number of microlens structures 305 thereon. The two second exposed regions 303 are patterned to form two through holes 307 defined therein and exposed parts of the metal seed film 20.
  • In addition, in the present embodiment, between the steps of exposing and developing the photo resist layer 30, the substrate 10 may be placed in a clean oven and the photo resist layer 30 is baked in a temperature ranging from 70 degree Celsius to 100 degrees Celsius for a time period of about 4 minutes to about 8 minutes.
  • Referring to FIG. 7, the substrate 10 is attached to a cathode of an electroforming device, thereby electroforming a body 40 thereon. The electroformed body 40 covers the microlens structures 305 of the photo resist layer 30 and includes a number of molding surfaces 401 corresponding to the microlens structures 305. Further, the electroformed body 40 includes two extending portions 402 connected with the metal seed film 20 via the through holes 307. In the present embodiment, the body 40 is made of nickel.
  • Referring to FIG. 8, the photo resist layer 30 is removed from the substrate 10.
  • Referring to FIG. 9, the electroformed body 40 is separated from the substrate 10 by etching the metal seed layer 20. In an alternative embodiment, the metal seed layer 20 and the electroformed body 40 are both made of nickel, and the electroformed body 40 is separated from the metal seed layer 20 and the substrate 10 by laser cutting. Referring to FIG. 10, the extending portions 402 of the electroformed body 40 are removed from the electroformed body 40 by abrading, thereby, yielding a desired molding stamp 60 having a number of microlens patterns is thereby obtained.
  • It should be noted that the number of the second exposed regions 305 could be modified, such as one, three, four or the other as desired. Correspondingly, the number of the extending portions 402 of the electroformed body 40 is also changed. In addition, the distribution of the second exposed regions 305 may be also modified as desired, and not limited by the above embodiment.
  • While certain embodiments have been described and exemplified above, various other embodiments from the foregoing disclosure will be apparent to those skilled in the art. The present invention is not limited to the particular embodiments described and exemplified but is capable of considerable variation and modification without departure from the scope of the appended claims.

Claims (7)

1. A process for fabricating a molding stamp, comprising:
forming a metal seed film on a substrate;
forming a photo resist layer on the metal seed film;
exposing the photo resist layer using a direct writing method,
developing the photo resist layer thereby forming the photo resist layer into a patterned photo resist layer, the patterned photo resist layer comprising a plurality of microlens structures and a through hole exposing a portion of the metal seed film therefrom;
electroforming a metallic body on the substrate to cover the patterned photo resist layer, the metallic body having an extending portion extending through the through hole of the photo resist layer and connected with the exposed portion of the metal seed film;
removing the photo resist layer from the substrate; and
separating the metallic body from the metal seed layer.
2. The process of claim 1, wherein the direct writing method is a direct laser writing method or an electric beam direct writing method.
3. The process of claim 1, further comprising baking the photo resist layer at a temperature in a range from 70 to 100 Celsius degree for a period of time of about 4 to about 8 minutes.
4. The process of claim 1, wherein the metal seed film is comprised of copper, the metallic body is comprised of nickel,
5. The process of claim 1, wherein the metallic body is separated from the metal seed layer by etching.
6. The process of claim 1, wherein both the metal seed film and the metallic body are comprised of nickel.
7. The process of claim 1, wherein the metallic body is separated from the metal seed layer by laser cutting.
US12/242,586 2008-05-06 2008-09-30 Process for fabricating molding stamp Abandoned US20090277795A1 (en)

Applications Claiming Priority (2)

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CN200810301420.8 2008-05-06
CN200810301420A CN101576712B (en) 2008-05-06 2008-05-06 Cavity manufacturing method

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110484938A (en) * 2019-09-16 2019-11-22 中国电子科技集团公司第十二研究所 A kind of processing method of the interaction circuit components resistant to high temperature of vacuum device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5385660A (en) * 1993-12-20 1995-01-31 Xerox Corporation Dendritic growth assisted electroform separation
US20020045105A1 (en) * 2000-07-05 2002-04-18 Brown David R. High quality lithographic processing
US6451510B1 (en) * 2001-02-21 2002-09-17 International Business Machines Corporation Developer/rinse formulation to prevent image collapse in resist
US6719930B2 (en) * 2001-07-24 2004-04-13 Litek Opto-Electronics Co., Ltd. Light guide and stamper production method
US20040108210A1 (en) * 1998-07-29 2004-06-10 Canon Kabushiki Kaisha Method for fabricating a mold for a microlens
US20050157396A1 (en) * 2000-10-10 2005-07-21 Canon Kabushiki Kaisha Microstructure array, mold for forming a microstructure array, and method of fabricating the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100529962C (en) * 2003-08-16 2009-08-19 鸿富锦精密工业(深圳)有限公司 Light guide board module core manufacturing method
CN1590593A (en) * 2003-08-30 2005-03-09 鸿富锦精密工业(深圳)有限公司 Model manufacturing method
KR100590727B1 (en) * 2004-02-24 2006-06-19 한국기계연구원 Microcontact Printing Technique Using Imprinted Nanostructures and Their Nanostructures
KR100603082B1 (en) * 2004-10-18 2006-08-09 한국기계연구원 Manufacturing Method of Nanostructured Nickel Stamper Using Exposure Mask

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5385660A (en) * 1993-12-20 1995-01-31 Xerox Corporation Dendritic growth assisted electroform separation
US20040108210A1 (en) * 1998-07-29 2004-06-10 Canon Kabushiki Kaisha Method for fabricating a mold for a microlens
US20020045105A1 (en) * 2000-07-05 2002-04-18 Brown David R. High quality lithographic processing
US20050157396A1 (en) * 2000-10-10 2005-07-21 Canon Kabushiki Kaisha Microstructure array, mold for forming a microstructure array, and method of fabricating the same
US6451510B1 (en) * 2001-02-21 2002-09-17 International Business Machines Corporation Developer/rinse formulation to prevent image collapse in resist
US6719930B2 (en) * 2001-07-24 2004-04-13 Litek Opto-Electronics Co., Ltd. Light guide and stamper production method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110484938A (en) * 2019-09-16 2019-11-22 中国电子科技集团公司第十二研究所 A kind of processing method of the interaction circuit components resistant to high temperature of vacuum device

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CN101576712B (en) 2012-09-19

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