US20070144700A1 - Production method of curved-surface metal mold having fine uneven structure and production method of optical element using this metal mold - Google Patents
Production method of curved-surface metal mold having fine uneven structure and production method of optical element using this metal mold Download PDFInfo
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- US20070144700A1 US20070144700A1 US10/594,154 US59415405A US2007144700A1 US 20070144700 A1 US20070144700 A1 US 20070144700A1 US 59415405 A US59415405 A US 59415405A US 2007144700 A1 US2007144700 A1 US 2007144700A1
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- metal mold
- curved
- mold
- silicon
- film
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- 229910052751 metal Inorganic materials 0.000 title claims abstract description 109
- 239000002184 metal Substances 0.000 title claims abstract description 109
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 36
- 230000003287 optical effect Effects 0.000 title claims description 34
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 171
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 84
- 239000000758 substrate Substances 0.000 claims abstract description 46
- 235000012239 silicon dioxide Nutrition 0.000 claims abstract description 45
- 238000005530 etching Methods 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims description 15
- 230000003667 anti-reflective effect Effects 0.000 claims description 11
- 238000004544 sputter deposition Methods 0.000 claims description 8
- 229920002120 photoresistant polymer Polymers 0.000 claims description 4
- 238000001746 injection moulding Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 15
- 238000000465 moulding Methods 0.000 description 21
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 12
- 238000001020 plasma etching Methods 0.000 description 12
- 238000010894 electron beam technology Methods 0.000 description 10
- 239000011347 resin Substances 0.000 description 9
- 229920005989 resin Polymers 0.000 description 9
- 239000000088 plastic resin Substances 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 229910052759 nickel Inorganic materials 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 238000004380 ashing Methods 0.000 description 4
- 238000000059 patterning Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000011651 chromium Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 238000004528 spin coating Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- QDOXWKRWXJOMAK-UHFFFAOYSA-N dichromium trioxide Chemical compound O=[Cr]O[Cr]=O QDOXWKRWXJOMAK-UHFFFAOYSA-N 0.000 description 2
- RWRIWBAIICGTTQ-UHFFFAOYSA-N difluoromethane Chemical compound FCF RWRIWBAIICGTTQ-UHFFFAOYSA-N 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XPDWGBQVDMORPB-UHFFFAOYSA-N Fluoroform Chemical compound FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 1
- 229910002319 LaF3 Inorganic materials 0.000 description 1
- -1 MgF3 Chemical compound 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229910052950 sphalerite Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- BYMUNNMMXKDFEZ-UHFFFAOYSA-K trifluorolanthanum Chemical compound F[La](F)F BYMUNNMMXKDFEZ-UHFFFAOYSA-K 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D17/00—Pressure die casting or injection die casting, i.e. casting in which the metal is forced into a mould under high pressure
- B22D17/20—Accessories: Details
- B22D17/22—Dies; Die plates; Die supports; Cooling equipment for dies; Accessories for loosening and ejecting castings from dies
- B22D17/2245—Dies; Die plates; Die supports; Cooling equipment for dies; Accessories for loosening and ejecting castings from dies having walls provided with means for marking or patterning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22C—FOUNDRY MOULDING
- B22C9/00—Moulds or cores; Moulding processes
- B22C9/06—Permanent moulds for shaped castings
- B22C9/061—Materials which make up the mould
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
- B29C45/263—Moulds with mould wall parts provided with fine grooves or impressions, e.g. for record discs
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/38—Moulds or cores; Details thereof or accessories therefor characterised by the material or the manufacturing process
- B29C33/3842—Manufacturing moulds, e.g. shaping the mould surface by machining
- B29C33/3857—Manufacturing moulds, e.g. shaping the mould surface by machining by making impressions of one or more parts of models, e.g. shaped articles and including possible subsequent assembly of the parts
- B29C33/3878—Manufacturing moulds, e.g. shaping the mould surface by machining by making impressions of one or more parts of models, e.g. shaped articles and including possible subsequent assembly of the parts used as masters for making successive impressions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2011/00—Optical elements, e.g. lenses, prisms
- B29L2011/0016—Lenses
Definitions
- This invention relates to a method for manufacturing curved-surface metal molds having a fine uneven structure serving as an antireflection structure or the like, a method for manufacturing the curved-surface metal molds having the fine uneven structure by using easily workable materials to form a curved surface, and a method for manufacturing optical elements with the metal mold.
- optical elements such as optical pickups and aspherical lenses made of glass, plastic or other light-transmitting materials are subjected to a surface treatment to prevent light reflection on the light incident surface of a substrate.
- This surface treatment includes a method in which a multilayer film composed of laminated thin dielectric films is formed on a surface of a light-transmitting substrate by vacuum deposition or the like and a method in which fine, dense unevenness are provided on a surface of an optical element.
- An antireflection structure of fine, dense uneven shape formed on the surface of the optical element is known to be formed by molding plastic with a metal mold (e.g. Japanese unexamined patent publication No. 62-96902).
- the metal mold for forming the optical element having the antireflection structure of fine, dense uneven shape is formed with a substrate made from quartz or silicon.
- the substrate is subjected to an etching process to form a specified antireflection structure thereon and plated to form the metal mold.
- a predetermined treatment is required to form a curved surface on the quartz or silicon which will be a substrate.
- This invention is made to solve the above-discussed conventional problems and has an object to provide a method for readily manufacturing metal molds to add the fine, dense uneven shape to a lens having complex surface shapes such as an aspherical lens.
- this invention has an object to provide a method for readily manufacturing optical elements, including the lens having complex surface shapes such as an aspherical lens, with the fine, dense uneven shape provided on the surface of the optical elements.
- a production method of the metal mold having the fine uneven structure according to the invention is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; etching the silicon-base film with a mask to form a specified shape of a fine uneven pattern; bonding metal used for the metal mold on the silicon-base film with the pattern of the fine uneven structure formed thereon; and removing the silicon-base film after the pattern of the fine uneven structure is transferred to the metal used for the metal mold to form the metal mold with the fine uneven structure on a surface thereof.
- the pattern of the fine uneven structure is characterized by being an antireflection pattern.
- the mask is made of a photoresist and an antireflective film may be formed between the curved-surface base substrate and silicon-base film.
- a mold release material film may be formed between the curved-surface base substrate and silicon-base film.
- the silicon-base film can be a silicon dioxide film formed by a sputtering method.
- a production method of the metal mold having the fine uneven structure is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; providing a mask on this silicon-base film, the mask having a specified shaped fine uneven pattern on an effective area part of the mask and the uneven pattern changing its volume percent toward the outside; etching the silicon-base film using this mask to form a fine pattern composed of fine unevenness gradually becoming deeper from the outer region to the inner region and having a predetermined depth and shape on the effective area; bonding metal used for the metal mold to the substrate with the uneven pattern formed thereon; and releasing the metal used for the metal mold from the substrate to form a metal mold after the uneven pattern is transferred to the metal used for the metal mold.
- a production method of an optical element is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; etching the silicon-base film using a mask to form a pattern of a specified shaped fine uneven structure; bonding metal used for the metal mold to the silicon-base film with the pattern of fine uneven structure formed thereon; removing the silicon-base film after the pattern of the fine uneven structure is transferred to the metal used for the metal mold to form a metal mold having the fine uneven structure on the curved surface; attaching the metal mold to at least either of a stationary mold or moving mold; and performing an injection molding with the stationary mold and moving mold to manufacture the optical element having the fine uneven structure on at least one of surfaces thereof.
- a curved-surface base substrate having a specified curved surface shape can be readily formed even if it has a complex shape such as a spherical surface and axisymmetric aspherical surface.
- a metal mold having a specified curved-surface with a fine, dense uneven structure can be formed even if it has a complex shape such as a spherical surface and axisymmetric aspherical surface.
- the provision of the antireflective film allows the resist to be pattered more densely, thereby being able to form the curved-surface metal mold having the antireflection structure of further fine, dense uneven shape.
- the use of the mold release material film facilitates the separation between the metal mold side and substrate side.
- the use of the curved-surface metal mold having the antireflection function gradually becoming deeper from the outer region to the inner region and the antireflection structure with the unevenness of conical shape formed at a predetermined pitch on the effective area allows the filled resin to be readily peeled off from the outer region, thereby eliminating the possible breakage of the metal mold (stamper) and molded articles.
- FIGS. 1A-1H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the first embodiment of this invention.
- FIGS. 2A-2I are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the second embodiment of this invention.
- FIGS. 3A-3J are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the third embodiment of this invention.
- FIGS. 4A-4H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the fourth embodiment of this invention.
- FIG. 5 is a plan view illustrating an exposure process to gradually deepen the antireflection function of the optical element from the outer region toward inner region.
- FIG. 6 illustrates the relation of adherability between the metal mold and molded article in each area of the optical elements manufactured according to this invention.
- FIG. 7 is a cross-sectional side view illustrating configuration and structure of a molding tool used for the manufacturing method of the optical element according to this invention.
- FIGS. 1A-1H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure composed of dense, fine unevenness according to the first embodiment of this invention.
- a curved-surface base substrate 1 with a specified curved surface such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared.
- This curved-surface base substrate 1 is made of a metal substrate which can be easily curved, a resin substrate formed by the metal mold or a glass substrate.
- good cuttable aluminum alloy or carbon free copper are polished with a rotating diamond tool of an ultra precision microfabrication equipment to have a mirror-finished specified curved-surface like a spherical surface or axisymmetric aspherical surface.
- a silicon dioxide film (SiO 2 ) film 2 with a thickness of approximately 500 nm to 1 ⁇ m is formed as a silicon-base film on the specified curved surface of the curved-surface base substrate 1 by a sputtering method.
- a silicon dioxide film (SiO 2 ) film 2 with a thickness of 900 nm is formed by an RF magnetron sputter using a SiO 2 target. The film is formed under the conditions: with the SiO 2 target; a substrate temperature of 200 degrees C.; an argon (Ar) gas flow rate of 20 sccm; and a pressure of 1.36 Pa.
- a resist is then applied on the silicon dioxide film (SiO 2 ) film 2 .
- This resist application is performed by spin-coating a resist, for example, the trade name “TDUR-P009” manufactured by TOKYO OHKA KOGYO CO., LTD., at 4000 rpm to consequently form a resist film 3 having a thickness of 600 nm.
- the applied resist film 3 is exposed to light and developed to form a resist pattern 30 .
- the silicon dioxide film (SiO 2 ) film 2 is patterned using the above-discussed resist pattern 30 as a mask by reactive ion etching (RIE).
- RIE reactive ion etching
- the trade name “NLD-800” manufactured by ULVAC, Inc. is used as an RIE etching system.
- Conical grooves 21 with a processed depth of 500 nm are formed using a mixed gas of C 4 Fs and CH 2 F 2 as an etching gas, an antenna power source of 1500 W and a bias power source of 400 W, at an etching rate of the silicon dioxide film (SiO 2 ) of 12 nm/sec.
- removal of the resist film making up the resist pattern 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO 2 ) and provided with fine, dense conical unevenness thereon.
- a metal layer 4 to be a metal mold is formed on the antireflection structure 2 a made of the silicon dioxide film (SiO 2 ).
- the metal layer 4 is formed as follows: a nickel (Ni) seed layer is formed by sputtering; a nickel layer is formed on the nickel seed layer by electrolytic plating; and the rear surface is polished.
- the metal layer 4 having a predetermined thickness is thus formed to be a mold (stamper).
- the curved-surface metal mold 4 a according to the embodiment is obtained having the antireflection structure with the fine, dense conical unevenness formed at a pitch of 250 nm.
- the curved-surface base substrate 1 having a specified curved surface even if the specified curved surface is complicated in shape like a spherical surface and axisymmetric aspherical surface, can be readily formed by the ultra precision microfabrication equipment.
- the curved-surface metal mold 4 a having a specified curved surface and an antireflection structure of fine, dense uneven shape can be formed even if the curved surface is complicated in shape like a spherical surface and axisymmetric aspherical surface.
- FIGS. 2A-2I are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the second embodiment of this invention.
- the same components as those in the first embodiment are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition.
- a curved-surface base substrate 1 having a specified curved surface shape such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared.
- an antireflective material 11 is provided on the specified curved surface of the curved-surface base substrate 1 .
- a chromium (Cr) film with a thickness of 100 nm is formed first, and a chrome-oxide (CrO) film with a thickness of 100 nm is formed on the chromium film as the antireflective material 11 by a sputtering method.
- the antireflective material 11 can be Al 2 O 3 , CeO 2 , LaF 3 , MgF 3 , TiO 2 , TiN, ZnS, ZrO 2 or the like.
- a silicon dioxide film (SiO 2 ) film 2 having a thickness from approximately 500 nm to 1 ⁇ m is formed on the antireflective material 11 formed on the curved-surface base substrate 1 by the sputtering method.
- the silicon dioxide film (SiO 2 ) film 2 formed in this embodiment has a thickness of 900 nm. This silicon dioxide film (SiO 2 ) film 2 is formed under the same conditions as the first embodiment.
- a resist film 3 with a thickness of 600 nm is formed on the silicon dioxide film (SiO 2 ) film 2 .
- This resist film 3 is also the same resist film used in the first embodiment.
- the applied resist film 3 is exposed to light and developed, in the same manner as the first embodiment, to form a resist pattern 30 with a multitude of conical projections formed at a pitch of 250 nm.
- the silicon dioxide film (SiO 2 ) film 2 is patterned, in the same manner as the first embodiment, using the above resist pattern 30 as a mask by reactive ion etching (RIE).
- RIE reactive ion etching
- This patterning forms conical grooves 21 each having a processed depth of 500 nm. This patterning is also performed under the same conditions as the first embodiment.
- removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO 2 ) and provided with fine, dense conical unevenness on the surface.
- a metal layer 4 to be a mold is formed on the antireflection structure 2 a made of the silicon dioxide film (SiO 2 ).
- the curved-surface metal mold 4 a according to the embodiment is obtained having an antireflection structure with conical unevenness formed at a pitch of 250 nm.
- the antireflective material 11 allows the resist to be patterned more densely, thereby being able to form the curved-surface metal mold 4 a having the antireflection structure of finer, denser uneven shape.
- FIGS. 3A-3J are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the third embodiment of this invention.
- the same components as those in the first and second embodiments are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition.
- a curved-surface base substrate 1 having a specified curved surface shape such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared just as with the first embodiment.
- a mold release material 12 having an antireflection function is provided on the specified curved surface of the curved-surface base substrate 1 .
- a resist having an antireflection function against ultraviolet rays is applied and hard-baked to be used as the mold release material 12 .
- the trade name “SWK-248DTr” manufactured by TOKYO OHKA KOGYO CO., LTD. is used as the resist and hard-baked at 180 degrees C.
- a silicon dioxide film (SiO 2 ) film 2 having a thickness of approximately from 500 nm to 1 ⁇ m is formed on the mold release material 12 formed on the curved-surface base substrate 1 by the sputtering method.
- the silicon dioxide film (SiO 2 ) film 2 formed in this embodiment has a thickness of 900 nm.
- This silicon dioxide film (SiO 2 ) film 2 is formed under the same conditions as the first embodiment.
- a resist film 3 with a thickness of 600 nm is formed on the silicon dioxide film (SiO 2 ) film 2 .
- This resist film 3 is the same used in the first embodiment.
- the applied resist film 3 is exposed to light and developed in the same manner as the first embodiment, to form a resist pattern 30 with a multitude of conical projections formed at a pitch of 250 nm.
- the silicon dioxide film (SiO 2 ) film 2 is patterned, in the same manner as the first embodiment, using the above-described resist pattern 30 as a mask by reactive ion etching (RIE).
- RIE reactive ion etching
- This patterning forms conical grooves 21 each having a processed depth of 500 nm. This patterning is performed under the same conditions as the first embodiment.
- removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO 2 ) and provided with fine, dense conical unevenness on the surface.
- a metal layer 4 to be a mold is formed on the antireflection structure 2 a of the silicon dioxide film (SiO 2 ).
- the mold (stamper) 4 a is mechanically released together with the silicon dioxide film (SiO 2 ) from the boundary of the mold release material 12 and silicon dioxide film (SiO 2 ).
- the resist for releasing the mold, which adheres to the mold (stamper) side is removed by oxygen plasma, and only the silicon dioxide film (SiO 2 ) 2 a is then removed by reactive ion etching (RIE).
- Etching gas used is CHF 3 .
- the separation between the mold (stamper) side and base substrate 1 side can be readily achieved.
- this fourth embodiment is made for decreasing the load upon the release.
- the unevenness of the antireflection function are gradually deepened from the outer region of the optical element toward the inner region to gradually increase the load upon the release, thereby readily releasing the filled resin from the outer region.
- FIG. 4A-4H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the fourth embodiment of this invention
- FIG. 5 is a plan view illustrating an exposing process for gradually deepening the unevenness of the antireflection function of the optical element from the outer region of the optical element toward the inner region.
- the same components as those in the first, second and third embodiments are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition.
- a curved-surface base substrate 1 having a specified curved surface shape such as a spherical surface, axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens or other lenses, is prepared.
- a silicon dioxide film (SiO 2 ) film 2 with a thickness of 900 nm is formed on the specified curved surface formed on the curved-surface base substrate 1 by an RF magnetron sputter.
- This silicon dioxide film (SiO 2 ) film 2 is formed under the same conditions as the first embodiment.
- a resist is applied on the silicon dioxide film (SiO 2 ) film 2 .
- This resist application is performed by spin-coating a negative resist used with electron beams at 3000 rpm.
- the negative resist is, for example, the trade name “NEB22” manufactured by Sumitomo Chemical Co., Ltd.
- a resist film 3 a with a thickness of 600 nm is formed.
- an electron beam is irradiated to the applied resist film 3 a using an electron beam (EB) lithography system.
- the irradiation energy is increased toward the outer region.
- the electron beam is irradiated by one-hundred micro meter square for printing.
- An effective area 30 a is irradiated with the electron beam at energy of 10 ⁇ C/cm 2 ; an area 30 b 1 outside the effective area 30 a is irradiated with the electron beam at energy of 12 ⁇ C/cm 2 ; an area 30 b 2 outside the area 30 b 1 is irradiated with the electron beam at energy of 14 ⁇ C/cm 2 ; and the outermost area 30 b 3 is irradiated with the electron beam at energy of 16 ⁇ C/cm 2 .
- the resist film 3 a is post-exposure baked (PEB) at 110 degrees C. by a hot plate for two minutes, and then developed for two minutes with developer No.
- PEB post-exposure baked
- a resist pattern 31 is formed having a multitude of conical projections formed at a pitch of 250 nm on the effective area 30 a and formed on the areas 30 b so as to be wider toward the outside.
- This resist pattern 31 is a mask with a volume ratio of the uneven pattern changing from the effective area toward the outside.
- the silicon dioxide film (SiO 2 ) film 2 is patterned using the above-described resist pattern 31 as a mask by reactive ion etching (RIE).
- RIE reactive ion etching
- the trade name “NLD-800” manufactured by ULVAC, Inc. is used for the RIE etcher; a mixed gas of C 4 F 8 and CH 2 F 2 is used as etching gas; the antenna power source is 1500 W; the bias power source is 400 W; and the etching rate of the silicon dioxide film (SiO 2 ) is 12 nm/sec to form grooves 21 with a processed depth of 500 nm on the effective area.
- a pattern is formed so that the antireflection-functional grooves are gradually deepened from the outer region toward the inner region in the areas outside the effective area 30 a.
- removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 b of the silicon dioxide film (SiO 2 ) having the antireflective function gradually deepening from the outer region toward the inner region in the areas outside the effective area 30 a and the specified fine, dense unevenness in the effective area 30 a.
- SiO 2 silicon dioxide film
- a metal layer 4 to be a mold is formed on the antireflection structure 2 b made of the silicon dioxide film (SiO 2 ).
- the metal layer 4 is formed as follows: a nickel (Ni) seed layer is formed by sputtering; a nickel layer is formed on the seed layer by electrolytic plating; and the rear surface is polished.
- the metal layer 4 having a predetermined thickness is thus formed to be a mold (stamper).
- the curved-surface metal mold 4 b according to this embodiment is obtained having the antireflection structure with the conical unevenness formed at a pitch of 250 nm on the effective area 30 a and the antireflective grooves gradually deepening from the outer region toward the inner region in the areas outside the effective area 30 a.
- the curved-surface metal mold 4 b having the antireflection structure with the antireflective function gradually deepening from the outer region toward the inner region in the areas outside the effective area 30 a and the conical unevenness formed at a predetermined pitch in the effective area 30 a , allows the filled resin to be easily peeled off from the outer region, thereby eliminating the possible breakage of the stamper and molded articles.
- a molded article is formed using the metal mold with the antireflection structure formed at a uniform depth as shown in FIG. 1 .
- a molded article is formed using the metal mold as shown in FIG. 4 .
- the adherability diminishes in an area 11 b positioned from the outer region to the outer edge. Consequently, according to the fourth embodiment of this invention, when the resin is filled in the mold, the resin can be readily peeled off from the outer region of the mold, thereby eliminating the possible breakage of the stamper and molded articles.
- the structure of this fourth embodiment can provide the same effect even if the structure is applied to the above-discussed second and third embodiments.
- silicon dioxide film (SiO 2 ) film is used as a silicon-base film in the above embodiments, a silicon (Si) film, silicon nitride (SiN) film and other films are also available. Further, an SOG film formed by spin-coating organic silane or the like is also available as the silicon-base film.
- FIG. 7 is a cross-sectional side view illustrating configuration and structure of a molding tool used for manufacturing the optical elements according to this invention.
- This molding tool comprises a stationary mold 60 and a moving mold 70 .
- a cavity 80 is created between the molds 60 and 70 .
- a gate 81 linking to the cavity 80 is formed. Molten plastic resin is supplied to this cavity 80 through the gate 81 to fill up the inside of the cavity 80 .
- the stationary mold 60 includes a first member 61 in the middle and a second member 62 on the periphery side, and both are made from steel and fixed in a mutually integrated manner.
- the first member 61 includes a smooth concave molding surface 61 a facing the moving mold 70
- the second member 61 includes a molding surface 61 b , which is a ring-shaped groove, arranged on the periphery of the molding surface 61 a
- the molding surface 61 a of the first member 61 corresponds to one surface of a lens (not shown) which is a molded article
- the molding surface 62 a of the second member 62 corresponds to a flange provided on the periphery of the lens.
- the moving mold 70 includes a pushing part 71 which is a molding member in the middle and a main body 72 supporting the pushing part 71 at its periphery.
- the mold (stamper) 4 a manufactured by any one of the above-discussed methods according to the first to fourth embodiments of this invention is attached.
- the metal mold 4 a is formed to have a concave surface corresponding to the other surface of the lens and includes the antireflection structure 40 a made of the fine, dense uneven surface on the concave surface.
- the peripheral molding surface 72 a defined by the main body 72 corresponds to the flange on the periphery.
- the pushing part 71 is fitted in a hole 72 b provided in the main body 72 so as to slide in the axial (X) direction. After mold opening, which means both molds 60 and 70 are disengaged from each other, this pushing part 71 is moved toward the stationary mold 60 with respect to the main body 72 , thereby releasing the lens laid on the moving mold 70 side.
- the moving mold 70 is engaged with the stationary mold 60 to close the molding tool.
- the stationary mold 60 and moving mold 70 are aligned using an alignment mechanism such as a fitting pin (not shown) and then secured.
- Such mold closing creates the cavity 80 , in the shape made by closing and joining the molding surfaces 61 a , 61 b of the stationary mold 60 and the molding surface 40 a , 72 a of the moving mold 70 , between the molds 60 and 70 .
- molten plastic resin is injected into the cavity 80 created between the molds 60 and 70 .
- the molten plastic resin is introduced through the gate 81 to the cavity 80 between molds 60 and 70 to fill up the cavity 80 .
- the molten plastic resin filled in the cavity 80 dissipates heat and is cooled down.
- the molten plastic resin injected into the cavity 80 usually has a temperature of 200 to 300 degrees C. and therefore is cooled and cured upon contact with the molding surfaces 40 a , 72 a , 61 a , 61 b of the molds 60 , 70 which are maintained at generally 100 to 180 degrees C.
- the molten plastic resin almost completely penetrates into the fine uneven pattern formed on the molding surface 40 a of the pushing part 71 .
- the molten plastic resin filled in the cavity 80 waits to be completely cured. After all, a lens corresponding to the shape of the cavity 80 is obtained.
- One surface of the lens is a smooth convex surface corresponding to the molding surface 61 a
- the other surface of the lens is a convex surface having the antireflection structure corresponding to the molding surface 40 a .
- a flange is formed on the periphery of the lens, corresponding to the molding surfaces 61 b and 72 a.
- the mold opening is performed to disengage the moving mold 70 from the stationary mold 60 .
- the molded article stays on the side of the moving mold 70 , but is separated from the stationary mold 60 .
- the pushing part 71 accommodated in the main body 72 is driven toward the stationary mold 60 by a driving device (not shown).
- This driving process completely demolds, in other words, separates the lens from the moving mold 71 .
- the metal mold with the fine uneven pattern is attached to the moving mold 70 in the above embodiment, the metal mold can be attached to the stationary mold 60 and moving mold 70 as appropriate based on the design of the optical element to be manufactured, for example, either of the stationary mold 60 or moving mold 70 , or both.
- the antireflection structure is cited as an example use of the fine, dense uneven shape in the above embodiment
- the present invention can be applied to any cases to manufacture the optical-element pattern structure having the other functions as long as the optical elements require the fine, dense uneven shape.
- the present invention is applicable to manufacture fine patterns included in wave plates and diffraction gratings.
- This invention is applicable to the method for manufacturing diffraction gratings for optical pickup, wave plates for optical pickups, lenses for optical pickups, display covers for cellular phones and other optical elements to provide the antireflection structure on surfaces of these elements.
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Abstract
A method of easily manufacturing a metal mold able to add an antireflection structure to a lens or the like having a complicated surface shape such as an aspherical lens. The method comprises the steps of forming a silicon dioxide film (SiO2) film (2) on a curved-surface base substrate (1) formed in a specified shape, etching the silicon dioxide film (SiO2) film (2) using a resist mask (3) to form a specified shaped antireflection structure pattern, bonding a metal used for the metal mold (4) onto a silicon dioxide film (SiO2) film (21) on which this antireflection film pattern is formed to transfer the antireflection film pattern onto the metal used for the metal mold (4), and then re-moving the silicon dioxide film (SiO2) film to form a metal mold (4 a) having an antireflection structure on the curved surface.
Description
- This invention relates to a method for manufacturing curved-surface metal molds having a fine uneven structure serving as an antireflection structure or the like, a method for manufacturing the curved-surface metal molds having the fine uneven structure by using easily workable materials to form a curved surface, and a method for manufacturing optical elements with the metal mold.
- Conventionally, optical elements such as optical pickups and aspherical lenses made of glass, plastic or other light-transmitting materials are subjected to a surface treatment to prevent light reflection on the light incident surface of a substrate. This surface treatment includes a method in which a multilayer film composed of laminated thin dielectric films is formed on a surface of a light-transmitting substrate by vacuum deposition or the like and a method in which fine, dense unevenness are provided on a surface of an optical element.
- An antireflection structure of fine, dense uneven shape formed on the surface of the optical element is known to be formed by molding plastic with a metal mold (e.g. Japanese unexamined patent publication No. 62-96902).
- The metal mold for forming the optical element having the antireflection structure of fine, dense uneven shape is formed with a substrate made from quartz or silicon. The substrate is subjected to an etching process to form a specified antireflection structure thereon and plated to form the metal mold.
- By the way, in order to provide the above-mentioned antireflection structure on a lens, such as a lens for optical pickups, having a specified curvature, a predetermined treatment is required to form a curved surface on the quartz or silicon which will be a substrate.
- In the case of a lens having a complex surface shape like an aspherical lens, it is difficult to work on the substrate to form the metal mold. In other words, the quartz or silicon used as a substrate is unworkable and often subjected to fractures and chips in the course of manufacture of the substrate. Therefore, the manufacture of the metal mold is time consuming and expensive.
- This invention is made to solve the above-discussed conventional problems and has an object to provide a method for readily manufacturing metal molds to add the fine, dense uneven shape to a lens having complex surface shapes such as an aspherical lens.
- In addition, this invention has an object to provide a method for readily manufacturing optical elements, including the lens having complex surface shapes such as an aspherical lens, with the fine, dense uneven shape provided on the surface of the optical elements.
- A production method of the metal mold having the fine uneven structure according to the invention is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; etching the silicon-base film with a mask to form a specified shape of a fine uneven pattern; bonding metal used for the metal mold on the silicon-base film with the pattern of the fine uneven structure formed thereon; and removing the silicon-base film after the pattern of the fine uneven structure is transferred to the metal used for the metal mold to form the metal mold with the fine uneven structure on a surface thereof.
- The pattern of the fine uneven structure is characterized by being an antireflection pattern.
- The mask is made of a photoresist and an antireflective film may be formed between the curved-surface base substrate and silicon-base film.
- A mold release material film may be formed between the curved-surface base substrate and silicon-base film.
- In addition, the silicon-base film can be a silicon dioxide film formed by a sputtering method.
- In addition, a production method of the metal mold having the fine uneven structure according to this invention is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; providing a mask on this silicon-base film, the mask having a specified shaped fine uneven pattern on an effective area part of the mask and the uneven pattern changing its volume percent toward the outside; etching the silicon-base film using this mask to form a fine pattern composed of fine unevenness gradually becoming deeper from the outer region to the inner region and having a predetermined depth and shape on the effective area; bonding metal used for the metal mold to the substrate with the uneven pattern formed thereon; and releasing the metal used for the metal mold from the substrate to form a metal mold after the uneven pattern is transferred to the metal used for the metal mold.
- In addition, a production method of an optical element, according to this invention, is characterized by: forming a silicon-base film on a curved-surface base substrate formed in a specified shape; etching the silicon-base film using a mask to form a pattern of a specified shaped fine uneven structure; bonding metal used for the metal mold to the silicon-base film with the pattern of fine uneven structure formed thereon; removing the silicon-base film after the pattern of the fine uneven structure is transferred to the metal used for the metal mold to form a metal mold having the fine uneven structure on the curved surface; attaching the metal mold to at least either of a stationary mold or moving mold; and performing an injection molding with the stationary mold and moving mold to manufacture the optical element having the fine uneven structure on at least one of surfaces thereof.
- As discussed above, according to this invention, a curved-surface base substrate having a specified curved surface shape can be readily formed even if it has a complex shape such as a spherical surface and axisymmetric aspherical surface. Based on the curved surface of this curved-surface base substrate, a metal mold having a specified curved-surface with a fine, dense uneven structure can be formed even if it has a complex shape such as a spherical surface and axisymmetric aspherical surface.
- In addition, the provision of the antireflective film allows the resist to be pattered more densely, thereby being able to form the curved-surface metal mold having the antireflection structure of further fine, dense uneven shape.
- The use of the mold release material film facilitates the separation between the metal mold side and substrate side.
- In addition, the use of the curved-surface metal mold having the antireflection function gradually becoming deeper from the outer region to the inner region and the antireflection structure with the unevenness of conical shape formed at a predetermined pitch on the effective area allows the filled resin to be readily peeled off from the outer region, thereby eliminating the possible breakage of the metal mold (stamper) and molded articles.
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FIGS. 1A-1H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the first embodiment of this invention. -
FIGS. 2A-2I are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the second embodiment of this invention. -
FIGS. 3A-3J are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the third embodiment of this invention. -
FIGS. 4A-4H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the fourth embodiment of this invention. -
FIG. 5 is a plan view illustrating an exposure process to gradually deepen the antireflection function of the optical element from the outer region toward inner region. -
FIG. 6 illustrates the relation of adherability between the metal mold and molded article in each area of the optical elements manufactured according to this invention. -
FIG. 7 is a cross-sectional side view illustrating configuration and structure of a molding tool used for the manufacturing method of the optical element according to this invention. -
- 1 curved-surface base substrate
- 2 a silicon dioxide film (SiO2) film
- 3 resist film
- 4 metal layer
- 4 a,4 b metal mold (stamper)
- The following is a description of embodiments of this invention with reference to drawings.
FIGS. 1A-1H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure composed of dense, fine unevenness according to the first embodiment of this invention. - As shown in
FIG. 1A , a curved-surface base substrate 1 with a specified curved surface, such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared. This curved-surface base substrate 1 is made of a metal substrate which can be easily curved, a resin substrate formed by the metal mold or a glass substrate. In this embodiment, good cuttable aluminum alloy or carbon free copper are polished with a rotating diamond tool of an ultra precision microfabrication equipment to have a mirror-finished specified curved-surface like a spherical surface or axisymmetric aspherical surface. - Subsequently, as shown in
FIG. 1B , a silicon dioxide film (SiO2)film 2 with a thickness of approximately 500 nm to 1 μm is formed as a silicon-base film on the specified curved surface of the curved-surface base substrate 1 by a sputtering method. In this embodiment, a silicon dioxide film (SiO2)film 2 with a thickness of 900 nm is formed by an RF magnetron sputter using a SiO2 target. The film is formed under the conditions: with the SiO2 target; a substrate temperature of 200 degrees C.; an argon (Ar) gas flow rate of 20 sccm; and a pressure of 1.36 Pa. - As shown in
FIG. 1C , a resist is then applied on the silicon dioxide film (SiO2)film 2. This resist application is performed by spin-coating a resist, for example, the trade name “TDUR-P009” manufactured by TOKYO OHKA KOGYO CO., LTD., at 4000 rpm to consequently form aresist film 3 having a thickness of 600 nm. - Subsequently, as shown in
FIG. 1D , the appliedresist film 3 is exposed to light and developed to form aresist pattern 30. In this embodiment, a two-beam interference exposure system (wavelength λ=266 nm) is used as an exposure system. The first exposure is made with an exposure power of 750 mJ, and then a multi-exposure is made with an exposure power of 750 mJ after the substrate is turned at 90 degrees. Then, development is made with the trade name “NMD-W” manufactured by TOKYO OHKA KOGYO CO., LTD. to form a resistpattern 30 with a multitude of conical projections at a pitch of 250 nm. - Next, as shown in
FIG. 1E , the silicon dioxide film (SiO2)film 2 is patterned using the above-discussed resistpattern 30 as a mask by reactive ion etching (RIE). In this embodiment, the trade name “NLD-800” manufactured by ULVAC, Inc. is used as an RIE etching system.Conical grooves 21 with a processed depth of 500 nm are formed using a mixed gas of C4Fs and CH2F2 as an etching gas, an antenna power source of 1500 W and a bias power source of 400 W, at an etching rate of the silicon dioxide film (SiO2) of 12 nm/sec. - After that, as shown in
FIG. 1F , removal of the resist film making up the resistpattern 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO2) and provided with fine, dense conical unevenness thereon. - Then, as shown in
FIG. 1G , ametal layer 4 to be a metal mold (stamper) is formed on theantireflection structure 2 a made of the silicon dioxide film (SiO2). Themetal layer 4 is formed as follows: a nickel (Ni) seed layer is formed by sputtering; a nickel layer is formed on the nickel seed layer by electrolytic plating; and the rear surface is polished. Themetal layer 4 having a predetermined thickness is thus formed to be a mold (stamper). - At last, as shown in
FIG. 1H , by mechanically releasing the mold (stamper) 4 a from the boundary of the silicon dioxide film (SiO2) andmetal layer 4, the curved-surface metal mold 4 a according to the embodiment is obtained having the antireflection structure with the fine, dense conical unevenness formed at a pitch of 250 nm. - According to the above-described embodiment, the curved-
surface base substrate 1 having a specified curved surface, even if the specified curved surface is complicated in shape like a spherical surface and axisymmetric aspherical surface, can be readily formed by the ultra precision microfabrication equipment. By undergoing the above steps B-H along the curved surface of the curved-surface base substrate 1, the curved-surface metal mold 4 a having a specified curved surface and an antireflection structure of fine, dense uneven shape can be formed even if the curved surface is complicated in shape like a spherical surface and axisymmetric aspherical surface. - Next description will be made on the second embodiment of this invention with reference to
FIGS. 2A-2I .FIGS. 2A-2I are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the second embodiment of this invention. The same components as those in the first embodiment are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition. - Just as with the first embodiment, as shown in
FIG. 2A , a curved-surface base substrate 1, having a specified curved surface shape such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared. - Subsequently, as shown in
FIG. 2B , anantireflective material 11 is provided on the specified curved surface of the curved-surface base substrate 1. In the second embodiment, a chromium (Cr) film with a thickness of 100 nm is formed first, and a chrome-oxide (CrO) film with a thickness of 100 nm is formed on the chromium film as theantireflective material 11 by a sputtering method. In addition to the above materials, theantireflective material 11 can be Al2O3, CeO2, LaF3, MgF3, TiO2, TiN, ZnS, ZrO2 or the like. - After that, as shown in
FIG. 2C , a silicon dioxide film (SiO2)film 2 having a thickness from approximately 500 nm to 1 μm is formed on theantireflective material 11 formed on the curved-surface base substrate 1 by the sputtering method. The silicon dioxide film (SiO2)film 2 formed in this embodiment has a thickness of 900 nm. This silicon dioxide film (SiO2)film 2 is formed under the same conditions as the first embodiment. - Then, as shown in
FIG. 2D , a resistfilm 3 with a thickness of 600 nm is formed on the silicon dioxide film (SiO2)film 2. This resistfilm 3 is also the same resist film used in the first embodiment. - Subsequently, as shown in
FIG. 2E , the applied resistfilm 3 is exposed to light and developed, in the same manner as the first embodiment, to form a resistpattern 30 with a multitude of conical projections formed at a pitch of 250 nm. - Next, as shown in
FIG. 2F , the silicon dioxide film (SiO2)film 2 is patterned, in the same manner as the first embodiment, using the above resistpattern 30 as a mask by reactive ion etching (RIE). This patterning formsconical grooves 21 each having a processed depth of 500 nm. This patterning is also performed under the same conditions as the first embodiment. - After that, as shown in
FIG. 2G , removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO2) and provided with fine, dense conical unevenness on the surface. - Then, as shown in
FIG. 2H , ametal layer 4 to be a mold (stamper) is formed on theantireflection structure 2 a made of the silicon dioxide film (SiO2). - At last, as shown in
FIG. 2I , by mechanically releasing a mold (stamper) 4 a from a boundary of the silicon dioxide film (SiO2) andmetal layer 4, the curved-surface metal mold 4 a according to the embodiment is obtained having an antireflection structure with conical unevenness formed at a pitch of 250 nm. - In the above-described second embodiment, in addition to the effect of the first embodiment, the
antireflective material 11 allows the resist to be patterned more densely, thereby being able to form the curved-surface metal mold 4 a having the antireflection structure of finer, denser uneven shape. - Next description will be made on the third embodiment of this invention with reference to
FIGS. 3A-3J .FIGS. 3A-3J are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the third embodiment of this invention. The same components as those in the first and second embodiments are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition. - As shown in
FIG. 3A , a curved-surface base substrate 1, having a specified curved surface shape such as a spherical surface and axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens and other lenses, is prepared just as with the first embodiment. - Subsequently, as shown in
FIG. 3B , amold release material 12 having an antireflection function is provided on the specified curved surface of the curved-surface base substrate 1. In the third embodiment, a resist having an antireflection function against ultraviolet rays is applied and hard-baked to be used as themold release material 12. In this embodiment, the trade name “SWK-248DTr” manufactured by TOKYO OHKA KOGYO CO., LTD. is used as the resist and hard-baked at 180 degrees C. - After that, as shown in
FIG. 3C , a silicon dioxide film (SiO2)film 2 having a thickness of approximately from 500 nm to 1 μm is formed on themold release material 12 formed on the curved-surface base substrate 1 by the sputtering method. The silicon dioxide film (SiO2)film 2 formed in this embodiment has a thickness of 900 nm. This silicon dioxide film (SiO2)film 2 is formed under the same conditions as the first embodiment. - Then, as shown in
FIG. 3D , a resistfilm 3 with a thickness of 600 nm is formed on the silicon dioxide film (SiO2)film 2. This resistfilm 3 is the same used in the first embodiment. - Subsequently, as shown in
FIG. 3E , the applied resistfilm 3 is exposed to light and developed in the same manner as the first embodiment, to form a resistpattern 30 with a multitude of conical projections formed at a pitch of 250 nm. - Next, as shown in
FIG. 3F , the silicon dioxide film (SiO2)film 2 is patterned, in the same manner as the first embodiment, using the above-described resistpattern 30 as a mask by reactive ion etching (RIE). This patterning formsconical grooves 21 each having a processed depth of 500 nm. This patterning is performed under the same conditions as the first embodiment. - After that, as shown in
FIG. 3G , removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 a made of silicon dioxide film (SiO2) and provided with fine, dense conical unevenness on the surface. - Then, as shown in
FIG. 3H , ametal layer 4 to be a mold (stamper) is formed on theantireflection structure 2 a of the silicon dioxide film (SiO2). - After that, as shown in
FIG. 3I , the mold (stamper) 4 a is mechanically released together with the silicon dioxide film (SiO2) from the boundary of themold release material 12 and silicon dioxide film (SiO2). - Subsequently, as shown in
FIG. 3J , the resist for releasing the mold, which adheres to the mold (stamper) side is removed by oxygen plasma, and only the silicon dioxide film (SiO2) 2 a is then removed by reactive ion etching (RIE). Etching gas used is CHF3. Thus, a curved-surface metal mold 4 a having the antireflection structure with conical unevenness formed at a pitch of 250 nm according to this embodiment is obtained. - In the above-described third embodiment, the separation between the mold (stamper) side and
base substrate 1 side can be readily achieved. - By the way, when optical elements are formed by filling resin into the above-described metal mold with the antireflection structure of the fine unevenness formed, the resin is filled into the fine pattern having a high aspect. This increases a load upon release of the metal mold from the resin. Especially, adherability significantly increases at the boundary between the non-patterned area and patterned area, and therefore causes breakage of the stamper and molded article. Hence, this fourth embodiment is made for decreasing the load upon the release. For this purpose, the unevenness of the antireflection function are gradually deepened from the outer region of the optical element toward the inner region to gradually increase the load upon the release, thereby readily releasing the filled resin from the outer region. The following description is on the fourth embodiment with reference to
FIGS. 4A-4H and 5. -
FIG. 4A-4H are cross-sectional views illustrating a step-by-step manufacturing process of a curved-surface metal mold having an antireflection structure according to the fourth embodiment of this invention, whileFIG. 5 is a plan view illustrating an exposing process for gradually deepening the unevenness of the antireflection function of the optical element from the outer region of the optical element toward the inner region. The same components as those in the first, second and third embodiments are denoted with the same reference numbers and their detailed descriptions are omitted to avoid repetition. - As shown in
FIG. 4A , a curved-surface base substrate 1, having a specified curved surface shape such as a spherical surface, axisymmetric aspherical surface used in an objective lens for optical pickups, collimating lens or other lenses, is prepared. - Subsequently, as shown in
FIG. 4B , a silicon dioxide film (SiO2)film 2 with a thickness of 900 nm is formed on the specified curved surface formed on the curved-surface base substrate 1 by an RF magnetron sputter. This silicon dioxide film (SiO2)film 2 is formed under the same conditions as the first embodiment. - Then, as shown in
FIG. 4C , a resist is applied on the silicon dioxide film (SiO2)film 2. This resist application is performed by spin-coating a negative resist used with electron beams at 3000 rpm. The negative resist is, for example, the trade name “NEB22” manufactured by Sumitomo Chemical Co., Ltd. Thus a resistfilm 3 a with a thickness of 600 nm is formed. - Subsequently, as shown in
FIG. 4D andFIG. 5 , an electron beam is irradiated to the applied resistfilm 3 a using an electron beam (EB) lithography system. The irradiation energy is increased toward the outer region. For example, as shown inFIG. 5 , the electron beam is irradiated by one-hundred micro meter square for printing. Aneffective area 30 a is irradiated with the electron beam at energy of 10 μC/cm2; anarea 30b 1 outside theeffective area 30 a is irradiated with the electron beam at energy of 12 μC/cm2; anarea 30b 2 outside thearea 30b 1 is irradiated with the electron beam at energy of 14 μC/cm2; and theoutermost area 30b 3 is irradiated with the electron beam at energy of 16 μC/cm2. After being printed by the EB, the resistfilm 3 a is post-exposure baked (PEB) at 110 degrees C. by a hot plate for two minutes, and then developed for two minutes with developer No. “MF CD-26” manufactured by Shipley Far East, Ltd. As a result, a resistpattern 31 is formed having a multitude of conical projections formed at a pitch of 250 nm on theeffective area 30 a and formed on theareas 30 b so as to be wider toward the outside. This resistpattern 31 is a mask with a volume ratio of the uneven pattern changing from the effective area toward the outside. - Next, as shown in
FIG. 4E , the silicon dioxide film (SiO2)film 2 is patterned using the above-described resistpattern 31 as a mask by reactive ion etching (RIE). In this embodiment, the trade name “NLD-800” manufactured by ULVAC, Inc. is used for the RIE etcher; a mixed gas of C4F8 and CH2F2 is used as etching gas; the antenna power source is 1500 W; the bias power source is 400 W; and the etching rate of the silicon dioxide film (SiO2) is 12 nm/sec to formgrooves 21 with a processed depth of 500 nm on the effective area. As a result, a pattern is formed so that the antireflection-functional grooves are gradually deepened from the outer region toward the inner region in the areas outside theeffective area 30 a. - After that, as shown in
FIG. 4F , removal of the resist 30 by oxygen plasma ashing brings a specified curved-surface antireflection structure 2 b of the silicon dioxide film (SiO2) having the antireflective function gradually deepening from the outer region toward the inner region in the areas outside theeffective area 30 a and the specified fine, dense unevenness in theeffective area 30 a. - Then, as shown in
FIG. 4G , ametal layer 4 to be a mold (stamper) is formed on theantireflection structure 2 b made of the silicon dioxide film (SiO2). Themetal layer 4 is formed as follows: a nickel (Ni) seed layer is formed by sputtering; a nickel layer is formed on the seed layer by electrolytic plating; and the rear surface is polished. Themetal layer 4 having a predetermined thickness is thus formed to be a mold (stamper). - At last, as shown in
FIG. 4F , by mechanically releasing a mold (stamper) 4 a from the boundary of the silicon dioxide film (SiO2) andmetal layer 4, the curved-surface metal mold 4 b according to this embodiment is obtained having the antireflection structure with the conical unevenness formed at a pitch of 250 nm on theeffective area 30 a and the antireflective grooves gradually deepening from the outer region toward the inner region in the areas outside theeffective area 30 a. - As discussed above, the curved-
surface metal mold 4 b, having the antireflection structure with the antireflective function gradually deepening from the outer region toward the inner region in the areas outside theeffective area 30 a and the conical unevenness formed at a predetermined pitch in theeffective area 30 a, allows the filled resin to be easily peeled off from the outer region, thereby eliminating the possible breakage of the stamper and molded articles. - A molded article is formed using the metal mold with the antireflection structure formed at a uniform depth as shown in
FIG. 1 . In addition, a molded article is formed using the metal mold as shown inFIG. 4 . Comparison was made in respect to adherability of the molded articles to the metal mold shown inFIG. 1 and the metal mold shown inFIG. 4 . As a result, as shown inFIG. 6 , according to this invention, the adherability diminishes in anarea 11 b positioned from the outer region to the outer edge. Consequently, according to the fourth embodiment of this invention, when the resin is filled in the mold, the resin can be readily peeled off from the outer region of the mold, thereby eliminating the possible breakage of the stamper and molded articles. - The structure of this fourth embodiment can provide the same effect even if the structure is applied to the above-discussed second and third embodiments.
- Although the silicon dioxide film (SiO2) film is used as a silicon-base film in the above embodiments, a silicon (Si) film, silicon nitride (SiN) film and other films are also available. Further, an SOG film formed by spin-coating organic silane or the like is also available as the silicon-base film.
- Next, the manufacture of optical elements using the metal mold according to this invention will be described with reference to
FIG. 7 .FIG. 7 is a cross-sectional side view illustrating configuration and structure of a molding tool used for manufacturing the optical elements according to this invention. This molding tool comprises astationary mold 60 and a movingmold 70. When the movingmold 70 is pushed against thestationary mold 60, acavity 80 is created between themolds cavity 80, agate 81 linking to thecavity 80 is formed. Molten plastic resin is supplied to thiscavity 80 through thegate 81 to fill up the inside of thecavity 80. - The
stationary mold 60 includes afirst member 61 in the middle and asecond member 62 on the periphery side, and both are made from steel and fixed in a mutually integrated manner. Thefirst member 61 includes a smoothconcave molding surface 61 a facing the movingmold 70, while thesecond member 61 includes amolding surface 61 b, which is a ring-shaped groove, arranged on the periphery of themolding surface 61 a. Themolding surface 61 a of thefirst member 61 corresponds to one surface of a lens (not shown) which is a molded article, while the molding surface 62 a of thesecond member 62 corresponds to a flange provided on the periphery of the lens. - The moving
mold 70 includes a pushingpart 71 which is a molding member in the middle and amain body 72 supporting the pushingpart 71 at its periphery. On the end of the pushingpart 71, the mold (stamper) 4 a manufactured by any one of the above-discussed methods according to the first to fourth embodiments of this invention is attached. Themetal mold 4 a is formed to have a concave surface corresponding to the other surface of the lens and includes theantireflection structure 40 a made of the fine, dense uneven surface on the concave surface. Theperipheral molding surface 72 a defined by themain body 72 corresponds to the flange on the periphery. - The pushing
part 71 is fitted in ahole 72 b provided in themain body 72 so as to slide in the axial (X) direction. After mold opening, which means bothmolds part 71 is moved toward thestationary mold 60 with respect to themain body 72, thereby releasing the lens laid on the movingmold 70 side. - Next, lens molding using the molding tool shown in
FIG. 7 will be described in brief. First, the movingmold 70 is engaged with thestationary mold 60 to close the molding tool. At this time, thestationary mold 60 and movingmold 70 are aligned using an alignment mechanism such as a fitting pin (not shown) and then secured. Such mold closing creates thecavity 80, in the shape made by closing and joining the molding surfaces 61 a, 61 b of thestationary mold 60 and themolding surface mold 70, between themolds - Next, molten plastic resin is injected into the
cavity 80 created between themolds gate 81 to thecavity 80 betweenmolds cavity 80. - Subsequently, the molten plastic resin filled in the
cavity 80 dissipates heat and is cooled down. The molten plastic resin injected into thecavity 80 usually has a temperature of 200 to 300 degrees C. and therefore is cooled and cured upon contact with the molding surfaces 40 a, 72 a, 61 a, 61 b of themolds molding surface 40 a of the pushingpart 71. - Next, the molten plastic resin filled in the
cavity 80 waits to be completely cured. After all, a lens corresponding to the shape of thecavity 80 is obtained. One surface of the lens is a smooth convex surface corresponding to themolding surface 61 a, while the other surface of the lens is a convex surface having the antireflection structure corresponding to themolding surface 40 a. In addition, a flange is formed on the periphery of the lens, corresponding to the molding surfaces 61 b and 72 a. - After that, the mold opening is performed to disengage the moving
mold 70 from thestationary mold 60. As a result, the molded article stays on the side of the movingmold 70, but is separated from thestationary mold 60. - Then, the pushing
part 71 accommodated in themain body 72 is driven toward thestationary mold 60 by a driving device (not shown). This driving process completely demolds, in other words, separates the lens from the movingmold 71. - Thus obtained lens is applicable to an optical pickup device and so forth. Although the metal mold with the fine uneven pattern is attached to the moving
mold 70 in the above embodiment, the metal mold can be attached to thestationary mold 60 and movingmold 70 as appropriate based on the design of the optical element to be manufactured, for example, either of thestationary mold 60 or movingmold 70, or both. - Although the antireflection structure is cited as an example use of the fine, dense uneven shape in the above embodiment, the present invention can be applied to any cases to manufacture the optical-element pattern structure having the other functions as long as the optical elements require the fine, dense uneven shape. For example, the present invention is applicable to manufacture fine patterns included in wave plates and diffraction gratings.
- It should be understood that the embodiments disclosed herein are to be taken as examples and are not limited. The scope of the present invention is defined not by the above described embodiments but by the following claims. All changes that fall within meets and bounds of the claims, or equivalence of such meets and bounds are intended to be embraced by the claims.
- This invention is applicable to the method for manufacturing diffraction gratings for optical pickup, wave plates for optical pickups, lenses for optical pickups, display covers for cellular phones and other optical elements to provide the antireflection structure on surfaces of these elements.
Claims (7)
1. A production method of a curved-surface metal mold having a fine uneven structure characterized by comprising:
forming a silicon-base film on a curved-surface base substrate formed in a specified shape;
etching the silicon-base film with a mask to form a specified shaped fine uneven structure pattern;
bonding a metal used for the metal mold on the silicon-base film with the fine uneven structure pattern formed thereon; and
removing the silicon-base film after the fine uneven structure pattern is transferred to the metal used for the metal mold to form the metal mold having the fine uneven structure on the curved surface thereof.
2. The production method of the curved-surface metal mold having the fine uneven structure according to claim 1 characterized in that said fine uneven structure pattern is an antireflection pattern.
3. The production method of the curved-surface metal mold having the fine uneven structure according to claim 1 or 2 characterized in that said mask is made from a photoresist, and an antireflective film is formed between said curved-surface base substrate and silicon-base film.
4. The production method of the curved-surface metal mold having the fine uneven structure according to claim 1 or 2 characterized in that a mold release material film is formed between said curved-surface base substrate and silicon-base film.
5. The production method of the curved-surface metal mold having the fine uneven structure according to claim 1 or 2 characterized in that said silicon-base film is a silicon dioxide film formed by a sputtering method.
6. A production method of a metal mold having a fine uneven structure characterized by comprising:
forming a silicon-base film on a curved-surface base substrate formed in a specified shape;
providing a mask on the silicon-base film, the mask having a specified shaped fine uneven pattern on an effective area part of the mask, and the uneven pattern changing its volume percent toward the outside of the mask;
etching the silicon-base film using the mask to form a fine pattern composed of fine unevenness gradually becoming deeper from the outer region to the inner region and having a predetermined depth and shape on the effective area;
bonding metal used for the metal mold to the substrate with the uneven pattern formed thereon; and
releasing the metal used for the metal mold from the substrate to form a metal mold after the uneven pattern is transferred to the metal used for the metal mold.
7. A production method of an optical element characterized by:
forming a silicon-base film on a curved-surface base substrate formed in a specified shape;
etching the silicon-base film using a mask to form a pattern of a specified shaped fine uneven structure;
bonding metal used for the metal mold to the silicon-base film with the pattern of fine uneven structure formed thereon;
removing the silicon-base film after the pattern of the fine uneven structure is transferred to the metal used for the metal mold to form a metal mold having the fine uneven structure on the curved surface of the metal mold;
attaching the metal mold to at least either of a stationary mold or moving mold; and
performing an injection molding with the stationary mold and moving mold to manufacture the optical element having the fine uneven structure on at least one of surfaces thereof.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2004089859 | 2004-03-25 | ||
JP2004-089859 | 2004-03-25 | ||
PCT/JP2005/005012 WO2005092588A1 (en) | 2004-03-25 | 2005-03-18 | Production method of curved-surface metal mold having fine uneven structure and production method of optical element using this metal mold |
Publications (1)
Publication Number | Publication Date |
---|---|
US20070144700A1 true US20070144700A1 (en) | 2007-06-28 |
Family
ID=35056056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/594,154 Abandoned US20070144700A1 (en) | 2004-03-25 | 2005-03-18 | Production method of curved-surface metal mold having fine uneven structure and production method of optical element using this metal mold |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070144700A1 (en) |
JP (1) | JP4404898B2 (en) |
CN (1) | CN1956829A (en) |
WO (1) | WO2005092588A1 (en) |
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US20060215280A1 (en) * | 2005-03-24 | 2006-09-28 | Katsuhiko Hayashi | Optical lens having antireflective structure |
US20080180824A1 (en) * | 2007-01-18 | 2008-07-31 | Sony Corporation | Optical device, method of manufacturing the same, replica substrate for producing optical device, and method of producing the same |
US20080317980A1 (en) * | 2007-06-19 | 2008-12-25 | Fujitsu Component Limited | Decorative casing and manufacturing method thereof |
WO2009004119A1 (en) * | 2007-07-04 | 2009-01-08 | Theta Optics Ltd Oy | Method and equipment for producing an optical piece |
US20100128350A1 (en) * | 2008-11-25 | 2010-05-27 | Stmicroelectronics (Research & Development) Limited | Imaging assembly |
US20130148206A1 (en) * | 2011-02-22 | 2013-06-13 | Panasonic Corporation | Optical component |
US9310528B2 (en) | 2012-02-06 | 2016-04-12 | Panasonic Intellectual Property Management Co., Ltd. | Optical element, imaging apparatus including the same, and method for fabricating the same |
US11029451B2 (en) * | 2014-02-26 | 2021-06-08 | Samsung Display Co., Ltd. | Cover window and display device having the same |
CN113106403A (en) * | 2020-01-09 | 2021-07-13 | 昆山微电子技术研究院 | Coating method for inner curved surface of optical device |
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JP4945460B2 (en) * | 2008-01-04 | 2012-06-06 | 株式会社東芝 | Method for forming antireflection structure and antireflection structure |
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JP2010152411A (en) * | 2010-04-05 | 2010-07-08 | Sony Corp | Optical element and its manufacturing method, and replicate substrate for manufacturing optical element and its manufacturing method |
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KR20170038824A (en) * | 2014-08-04 | 2017-04-07 | 제이엑스 에네루기 가부시키가이샤 | Method for manufacturing member having irregular pattern |
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US7545583B2 (en) * | 2005-03-24 | 2009-06-09 | Panasonic Corporation | Optical lens having antireflective structure |
US20080180824A1 (en) * | 2007-01-18 | 2008-07-31 | Sony Corporation | Optical device, method of manufacturing the same, replica substrate for producing optical device, and method of producing the same |
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US9268067B2 (en) * | 2011-02-22 | 2016-02-23 | Panasonic Intellectual Property Management Co., Ltd. | Optical component having antireflection structure |
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CN113106403A (en) * | 2020-01-09 | 2021-07-13 | 昆山微电子技术研究院 | Coating method for inner curved surface of optical device |
Also Published As
Publication number | Publication date |
---|---|
JPWO2005092588A1 (en) | 2008-02-07 |
CN1956829A (en) | 2007-05-02 |
WO2005092588A1 (en) | 2005-10-06 |
JP4404898B2 (en) | 2010-01-27 |
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