US20060236495A1

US20060236495A1 - Method and apparatus for non-contact cleaning of electronics

Info

Publication number: US20060236495A1
Application number: US11/113,790
Authority: US
Inventors: Romi Mayder; Ethan Daley
Original assignee: Agilent Technologies Inc
Current assignee: Verigy Singapore Pte Ltd
Priority date: 2005-04-25
Filing date: 2005-04-25
Publication date: 2006-10-26
Also published as: JP2006310306A; CN1853805A

Abstract

A UV light source and a specially adapted vacuum fitting for visualizing and non-contact cleaning of dust contaminants from XZIF connections and test head electronics in a clean room environment is presented.

Description

BACKGROUND

Dust and other particulates can damage or degrade sensitive electronics. This is of particular concern with such contaminants on the performance of zero insertion force (XZIF) connectors used in the Agilent Technologies, Inc. V5400 test heads. A typical test head has thirty-six zer0-insertion force connectors between the PEFPIF boards on the PE modules and the edge cards on a probe card. In order to preserve signal integrity, it is crucial that the contacts on the zero-insertion force flex circuit stay clean. These connectors are designed for use in class 10000 clean rooms. However, during the course of manufacturing, shipping, integration and probe card replacement, dust and other particulates can contaminate these components.
Previously, dust was typically detected by the naked eye and a blast of air was used to try to remove any dust from the electronics and the connectors. Unfortunately, dust is very difficult to see, especially on low contrast surfaces, so users often are not able to discern contamination until the degree of contamination is substantial, by which time the electronics may have suffered damage or performance degradation. Another visualization approach in the past has been to use a microscope to get a closer look at dust contamination. However, removing thirty-six XZIF connectors individually to view under a microscope is not practical during test system installation and maintenance.
Further, the blast of air to remove dust and contaminants method tends to blow dust further into the testhead and XZIF connectors, further exacerbating the problem, rather than solving it. Therefore, there is a need for a method to better visualize and clean dust and other contaminants from electronics generally and XZIF connectors and testheads in particular.

BRIEF DESCRIPTION OF THE DRAWINGS

An understanding of the present teachings can be gained from the following detailed description, taken in conjunction with the accompanying drawings of which:
FIG. 1 illustrates a connector between a testhead and a device under test.
FIG. 2 illustrates a top, perspective view of a non-contact vacuum adapter.
FIG. 3 illustrates a bottom, perspective view of a non-contact vacuum adapter.
FIG. 4 illustrates a non-contact vacuum adapter seated on an XZIF connector clamp.
FIG. 5 illustrates a non-contact vacuum adapter aligned with an XZIF connector contact.
FIG. 6 illustrates an XZIF clamp under ambient light.
FIG. 7 illustrates an XZIF clamp under a UV lamp.
FIG. 8 shows a flow chart for a method of non-contact cleaning of texthead electronic connectors.

DETAILED DESCRIPTION

FIG. 1 illustrates a high-speed connection assembly 100 for use between a device under test and automatic test equipment, such as an XZIF connector for use between a DUT board and a V5400 testheads. An exemplary high-speed connector is taught in U.S. Pat. No. 6,33,696 entitled Methods and Apparatus for Creating a High Speed Connection Between A Device Under Test And Automatic Test Equipment by Roger Sinsheimer et al. An exemplary automatic test equipment is the V5400 by Agilent Technologies, Inc. of Palo Alto, Calif. High-speed connection assembly 100 may include a DUT assembly 102 for translating electrical signals from a board 104 via a plurality of connector flex circuits 105 to a connection mechanism 106 with a plurality of clamping connectors 108 radially disposed around the connection mechanism to align with connector flex circuits 105 on the DUT assembly 102. The life expectancy and quality of connectors, such as the XZIF connector are very susceptible to dust and other contaminants.
FIGS. 2 and 3 illustrate an adapter fitting 200 for a class 10000 clean room compatible, ESD safe vacuum cleaner hose (not shown), which permits non-contact cleaning of fragile XZIF connector clamps. An exemplary clean room vacuum cleaner may be the Metro Datavac Pro 3, a powerful model that is class 10000 clean room compatible and features a high degree of filtration was well as static safe hoses. The adapter fitting 200 may have a housing 206 with a vacuum cleaner hose coupling 208, which may comprise a large chamfered hole into which the vacuum cleaner hose end is fitted on one side, as shown in FIG. 3. Adapter fitting 200 may have an stand-off feature 212, including a fillet 210 with bevels that may be inserted into the XZIF clamp 108, ensuring proper alignment and maintaining the clamping connectors 108 in an open position, as shown in FIG. 4. The adapter fitting 200 stand-off feature 212 may also comprise a window 202 for alignment with connector flex circuits 105, as shown in FIG. 5. The adapter fitting 200 may comprise holes along the stand-off feature 212 permitting air flow throw the adapter fitting 200.
As will be readily apparent, the clean room adapter fitting 200 permits non-contact cleaning of XZIF connectors with proper alignment and therefore does not risk damaging the fragile contacts of the XZIF clamp 108 and the corresponding connector flex circuit spines 105. Moreover, the vacuum cleaner adapter is quick, inexpensive, highly portable, and can be used within a clean room on a test floor, such that XZIF connectors do not need to be removed from the test floor to be cleaned. The adapter fitting 200 may be made of aluminum, static safe ABS plastic or any known clean room compatible, static safe material.
FIG. 6 illustrates an XZIF clamp 108 under ambient light. FIG. 7 illustrates the same XZIF clamp 108 under ambient room light and UV light. As will be readily apparent, dust particles 404 and hair 402 are readily visible under the UV light that are not visible under just ambient light in FIG. 6. The inventors have determined that UV light is a very effective means to identify dust and other contaminants in XZIF connectors and V5400 testhead electronics. Dust exposed to UV light appears to glow and is thus far easier for the user to see, even on low contrast surfaces like the V5400 XZIF flex circuit 105. The fluorescence permits the user to effectively assess the degree of contamination and monitor removal efforts during vacuuming.
UV light source may be any handheld, inexpensive, portable UV light source (not shown), such as UV tubes and handheld fixtures sold at hardware stores. The UV light source may be between the wavelengths of 110-400 nanometers on the electromagnetic spectrum, such as a craftsman model number 83976 and an 18 inch 15 watt black light, such as a GE part number F15T8. The portability of a hand held fluorescent, UV light source permits dust to be seen in the clean room environment in situ.
FIG. 8 shows a flow chart for a method 500 of cleaning testhead electronic connectors in a non-contact manner. A user may illuminate 502 a connector clamp 108 or a connector flex circuit spine 105 with a UV light source. A vacuum adapter fitting 200 is positioned 504 into the clamp 108 (as shown in FIG. 4) or over the flex circuit spine 105 (as shown in FIG. 5). Dust particles and other contaminants are vacuumed 506 from the clamp 108 or flex circuit spine 105.
While the invention has been particularly shown and described with reference to specific embodiments thereof, it will be understood by those skilled in the art that changes in the form and details of the disclosed embodiments may be made without departing from the spirit or scope of the invention. For example, some of the descriptions of embodiments herein imply a certain orientation of various assemblies of which the system is constructed. It will be understood, however, that the principles of the present invention may be employed in systems having a variety of spatial orientations and that therefore the invention should not be limited to the specific orientations shown.

Claims

1. A means for cleaning contaminants from electronic connectors comprising:

a UV light source for visualizing dust contaminants on the electronic connectors; and

a vacuum cleaner having a hose with a non-contact adapter fitting for bringing vacuum cleaner hose into non-contact close proximity with electronic connector components, the non-contact adapter fitting having a first side and a second side.

2. The means for cleaning contaminants from electronic connectors according to claim 1, wherein the first side of the non-contact adapter fitting includes a stand-off feature with a fillet and bevels for alignment within a clamp of a testhead connector assembly.

3. The means for cleaning contaminants from electronic connectors according to claim 1, wherein the first side of the non-contact adapter fitting includes a stand-off means with a window for alignment with a flex circuit spine of a testhead connector assembly.

4. The means for cleaning contaminants from electronic connectors according to claim 1, wherein the second side of the non-contact adapter fitting includes a chamfered hole for mating with the vacuum cleaner hose.

5. The means for cleaning contaminants from electronic connectors according to claim 1, wherein the non-contact adapter fitting comprises a static safe material.

6. A method for cleaning contaminants from an electronic connector assembly comprising:

a) illuminating the electronic connector assembly with a UV light source;

b) positioning a non-contact adapter fitting of a vacuum hose onto a predetermined section of the electronic connector assembly; and

c) vacuuming contaminants from the predetermined section of the electronic connector assembly.