US20060179931A1 - Electrode in a measurement tube of a magnetic-inductive flowmeter - Google Patents
Electrode in a measurement tube of a magnetic-inductive flowmeter Download PDFInfo
- Publication number
- US20060179931A1 US20060179931A1 US11/335,585 US33558506A US2006179931A1 US 20060179931 A1 US20060179931 A1 US 20060179931A1 US 33558506 A US33558506 A US 33558506A US 2006179931 A1 US2006179931 A1 US 2006179931A1
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- United States
- Prior art keywords
- thin film
- electrode according
- mount
- vapour deposition
- measurement tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 31
- 239000010409 thin film Substances 0.000 claims abstract description 33
- 239000010408 film Substances 0.000 claims abstract description 29
- 238000005299 abrasion Methods 0.000 claims abstract description 7
- 238000005260 corrosion Methods 0.000 claims abstract description 7
- 230000007797 corrosion Effects 0.000 claims abstract description 7
- 230000000737 periodic effect Effects 0.000 claims abstract description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 17
- 238000005229 chemical vapour deposition Methods 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 14
- 229910052697 platinum Inorganic materials 0.000 claims description 9
- 238000004544 sputter deposition Methods 0.000 claims description 8
- 238000000151 deposition Methods 0.000 claims description 7
- 230000008021 deposition Effects 0.000 claims description 7
- 238000004070 electrodeposition Methods 0.000 claims description 7
- 229910001220 stainless steel Inorganic materials 0.000 claims description 5
- 239000010935 stainless steel Substances 0.000 claims description 5
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 239000010931 gold Substances 0.000 claims description 4
- 238000000608 laser ablation Methods 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims 1
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 claims 1
- 238000000034 method Methods 0.000 description 11
- 239000000126 substance Substances 0.000 description 9
- 238000004140 cleaning Methods 0.000 description 7
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 6
- 239000012530 fluid Substances 0.000 description 5
- 239000010410 layer Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000009434 installation Methods 0.000 description 3
- 238000000576 coating method Methods 0.000 description 2
- 239000007772 electrode material Substances 0.000 description 2
- 238000011031 large-scale manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004659 sterilization and disinfection Methods 0.000 description 2
- BTBUEUYNUDRHOZ-UHFFFAOYSA-N Borate Chemical compound [O-]B([O-])[O-] BTBUEUYNUDRHOZ-UHFFFAOYSA-N 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 238000003763 carbonization Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000001954 sterilising effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/56—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects
- G01F1/58—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects by electromagnetic flowmeters
- G01F1/584—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects by electromagnetic flowmeters constructions of electrodes, accessories therefor
Definitions
- the invention relates to an electrode in an internally lined measurement tube of a magnetic-inductive flowmeter, having an electrically conductive mount which can be loaded mechanically, according to the precharacterizing clause of Claim 1 .
- Magnetic-inductive meters can be used only for measurement of the flow of electrically conductive fluid substances.
- Magnetic-inductive flowmeters can be operated with a conductive signal tap. They then have at least one pair of signal sensing electrodes, which are installed in the internal lining of the measurement tube wall and make contact on the inside of the measurement tube with the fluid flowing through the tube.
- Electrodes are generally used as signal sensing electrodes in the prior art.
- DE 4105311C2 describes electrodes of this generic type which have an electrode mount which can be highly loaded mechanically and is provided at least on its side facing the interior of the measurement tube with a film composed of an electrode material that is highly resistant to corrosion and abrasion, with the film being formed from a silicate, a carbide, a borate or a nitride.
- the film is applied by spraying or soldering, with the film then being relatively thick and with a large amount of material being consumed for its production, or it is produced by borating, nitriding or carbonization of the electrode surface, which is likewise highly complex.
- the object of the present invention is thus to provide an electrode in an internally lined measurement tube of a magnetic-inductive flowmeter, which can be produced easily and at low cost, while at the same time having a long life.
- the mount is provided at least on its side facing the measurement tube interior with a multilayer film, comprising at least one first electrically conductive thin film composed of an element of the first or the eighth group in the fourth, fifth or sixth period of the periodic table of the elements, as well as a second electrically conductive thin film, which covers the first film and has good resistance to abrasion and corrosion.
- a thin film means an amorphous, polycrystalline or monocrystalline film of a solid substance, whose thickness is in the order of magnitude of 1 nanometer to a few micrometers, based on the definition in the German-Language Technical Dictionary “Der Brockhaus Naturwissenschaft undtechnik, Band 1 A-Gd, Spektrum Akademischer Verlag GmbH, Heidelberg, 2003”, [Brockhaus—Science and Engineering, Volume 1 A-Gd] under the keyword “thin films”.
- the elements in the first or eighth group in the fourth, fifth or sixth period of the periodic table of the elements, as used for the first film according to the invention include elements which are suitable for electrodes in magnetic-inductive flowmeters for widely differing applications, in particular including critical applications such as the foodstuffs industry. These are the elements Fe, Co, Ni, Ru, Rh, Pd, Ir, Pt, Au; Cu, Ag, Au.
- the first film is in this case composed of gold or platinum.
- the advantage of the use of a thin film composed of one of the stated materials as the first film of the electrode according to the invention is the saving of expensive materials, and thus low productions costs.
- the second thin film, which covers the first film according to the invention, ensures that the first thin film is protected against abrasive and corrosive wear during practical operation of the magnetic-inductive flowmeter, so that a long life can be achieved in operation despite the film being only very thin.
- the second film is composed of a thin film of an electrically conductive ceramic, for example composed of AlTiN or TiN.
- Thin films composed of these materials are particularly resistant to mechanical abrasion and chemical corrosion, can be produced easily using known coating methods, and adhere well to thin first layers composed of the stated materials.
- the material of the first thin film can be applied to the mount epitaxially or by vapour deposition, sputtering or laser ablation, electrochemical deposition or chemical vapour deposition (CVD).
- the material of the second thin film can be applied to the first thin film by vapour deposition, sputtering, electrochemical deposition or by chemical vapour deposition (CVD).
- vapour deposition sputtering, electrochemical deposition or by chemical vapour deposition (CVD).
- the mount may itself be composed of stainless steel, which is a widely used cost-effective material with high mechanical stability.
- the electrode is fitted in a hermetically sealed form into the internal lining of the measurement tube.
- the single FIGURE shows a schematic cross section of a part of a measurement tube 1 of a magnetic-inductive flowmeter for measurement of the flow of electrically conductive fluid substances, for example water.
- the tube wall 2 of the measurement tube 1 is composed of metal, as is normal for magnetic-inductive flowmeters. It is lined with a tube internal lining 6 towards the internal area 4 through which the fluid flows.
- the lining 6 on the inside of the tube is composed of an electrically insulating, chemically highly resistant plastic material, for example Teflon.
- Teflon electrically insulating, chemically highly resistant plastic material
- the part of the measurement tube illustrated in the FIGURE has an opening 10 in the measurement tube, in which an electrode 8 is held.
- the electrode 8 comprises a mount 9 composed of stainless steel, with a T-shaped form.
- the longitudinal mount bar 12 is guided in an electrically insulated manner in the opening 10 , although the isolation layer is not shown here.
- the transverse mount bar 14 is held in a corresponding recess in the lining 6 on the inside of the tube, in such a way that that surface 16 of the electrode 8 which points towards the inside of the measurement tube ends flush and hermetically sealed with the inner face of the lining 6 on the inside of the tube.
- the transverse mount bar 14 for the electrode 8 is provided with a two-layer film composed of two thin films. First of all, a thin film 18 composed of platinum is applied to the transverse mount bar 14 as the first film, over which a second thin film 20 composed of TiN is then applied. Both films are electrically conductive.
- the vapour deposition process is used for production of the first thin film 18 composed of platinum.
- the first film 18 is a thin film with a film thickness between a few nanometers and a few micrometers.
- the production of thin platinum films such as these on stainless steel mounts is known from the prior art. It is also used for large-scale production, using so-called batch methods, by way of example for the production of platinum films on silicon chips for semiconductor purposes.
- the platinum film can also be deposited by sputtering, by laser ablation, or by chemical vapour deposition (so-called CVD process), epitaxially or by electrochemical deposition.
- the second film 20 composed of TiN is likewise a thin film and is produced by sputtering, although it could also be produced by later ablation or by chemical vapour deposition (so-called CVD processes).
- the application of TiN films is also known from the prior art, for example for semiconductor purposes, where it is also used for large-scale production. The coating method can thus be carried out highly cost-effectively.
- the TiN film 20 is used as a protective layer against corrosion and abrasion for the first measurement electrode film 18 .
- the two-layer system shown in the FIGURE comprising the platinum film 18 and the TiN film 20 , allows the electrode 8 to be used even in critical applications, in particular in the foodstuffs industry or in the pharmaceutical industry where the inner surfaces of the magnetic-inductive meters which touch the substance being measured are subjected to particularly stringent requirements, especially with regard to hygiene and cleaning capability.
- the fitting and installation of the electrode 8 according to the invention and its installation in the tube wall 2 of the magnetic-inductive meter, as illustrated in the FIGURE, allow the magnetic-inductive meter to be cleaned without removing it from the process pipeline, using a so-called CIP (Cleaning in Place) process.
- a generally highly alkaline, hot cleaning solution is passed through the process pipeline system, including all of the fittings and meters installed there which carry the measurement substance, instead of the measurement fluid at particularly regularly recurring intervals, thus removing organic and inorganic contamination.
- the inner surfaces of the process pipeline system which touch the measurement substance can then also be subjected to hot-steam sterilization. All of these cleaning and disinfection steps result in very stringent requirements for the corrosion and abrasion resistance of the measurement electrodes, and these requirements can be satisfied by a two-layer structure according to the invention.
- the embodiment shown in the FIGURE is, of course, not the only possible embodiment for electrodes according to the invention. All other types of electrode mounts and their installation in magnetic-inductive meters are also covered by the invention, provided only that these electrodes are provided with a multilayer structure according to the invention on their side facing the measurement tube interior.
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Fluid Mechanics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Volume Flow (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
- The invention relates to an electrode in an internally lined measurement tube of a magnetic-inductive flowmeter, having an electrically conductive mount which can be loaded mechanically, according to the precharacterizing clause of
Claim 1. - The basic design and method of operation of magnetic-inductive meters are described, for example, in the German-Language Dictionary of Measurement and Automation, published by Elmar Schrufer, VDI-Verlag, Dusseldorf 1992, pages 262-263. By virtue of the principle of operation, magnetic-inductive meters can be used only for measurement of the flow of electrically conductive fluid substances. Magnetic-inductive flowmeters can be operated with a conductive signal tap. They then have at least one pair of signal sensing electrodes, which are installed in the internal lining of the measurement tube wall and make contact on the inside of the measurement tube with the fluid flowing through the tube.
- Metal electrodes are generally used as signal sensing electrodes in the prior art. DE 4105311C2 describes electrodes of this generic type which have an electrode mount which can be highly loaded mechanically and is provided at least on its side facing the interior of the measurement tube with a film composed of an electrode material that is highly resistant to corrosion and abrasion, with the film being formed from a silicate, a carbide, a borate or a nitride. The film is applied by spraying or soldering, with the film then being relatively thick and with a large amount of material being consumed for its production, or it is produced by borating, nitriding or carbonization of the electrode surface, which is likewise highly complex.
- For many applications, for example in the foodstuffs industry, it is also necessary to use a noble and thus expensive material as the electrode material, for reasons of hygiene, cleaning capability, chemical resistance and durability.
- The object of the present invention is thus to provide an electrode in an internally lined measurement tube of a magnetic-inductive flowmeter, which can be produced easily and at low cost, while at the same time having a long life.
- The object is achieved by an electrode of this generic type having the characterizing features of
Claim 1. - Thus, according to the invention, the mount is provided at least on its side facing the measurement tube interior with a multilayer film, comprising at least one first electrically conductive thin film composed of an element of the first or the eighth group in the fourth, fifth or sixth period of the periodic table of the elements, as well as a second electrically conductive thin film, which covers the first film and has good resistance to abrasion and corrosion.
- In this case, the expression a thin film means an amorphous, polycrystalline or monocrystalline film of a solid substance, whose thickness is in the order of magnitude of 1 nanometer to a few micrometers, based on the definition in the German-Language Technical Dictionary “Der Brockhaus Naturwissenschaft und Technik,
Band 1 A-Gd, Spektrum Akademischer Verlag GmbH, Heidelberg, 2003”, [Brockhaus—Science and Engineering,Volume 1 A-Gd] under the keyword “thin films”. - The elements in the first or eighth group in the fourth, fifth or sixth period of the periodic table of the elements, as used for the first film according to the invention, include elements which are suitable for electrodes in magnetic-inductive flowmeters for widely differing applications, in particular including critical applications such as the foodstuffs industry. These are the elements Fe, Co, Ni, Ru, Rh, Pd, Ir, Pt, Au; Cu, Ag, Au. In one particularly advantageous embodiment of the invention, the first film is in this case composed of gold or platinum.
- The advantage of the use of a thin film composed of one of the stated materials as the first film of the electrode according to the invention is the saving of expensive materials, and thus low productions costs. The second thin film, which covers the first film according to the invention, ensures that the first thin film is protected against abrasive and corrosive wear during practical operation of the magnetic-inductive flowmeter, so that a long life can be achieved in operation despite the film being only very thin.
- In one highly advantageous embodiment, the second film is composed of a thin film of an electrically conductive ceramic, for example composed of AlTiN or TiN. Thin films composed of these materials are particularly resistant to mechanical abrasion and chemical corrosion, can be produced easily using known coating methods, and adhere well to thin first layers composed of the stated materials.
- The material of the first thin film can be applied to the mount epitaxially or by vapour deposition, sputtering or laser ablation, electrochemical deposition or chemical vapour deposition (CVD).
- The material of the second thin film can be applied to the first thin film by vapour deposition, sputtering, electrochemical deposition or by chemical vapour deposition (CVD).
- In one advantageous embodiment, the mount may itself be composed of stainless steel, which is a widely used cost-effective material with high mechanical stability.
- In one advantageous embodiment of the invention, the electrode is fitted in a hermetically sealed form into the internal lining of the measurement tube. This creates a measurement tube with an electrode according to the invention in particular for applications in the foodstuffs industry, or in pharmacy, which can be cleaned by means of normal chemical and/or biological cleaning methods, in particular also including so-called “Clean in Place” or CIP methods without removal of the measurement tube during the cleaning process.
- The invention as well as further advantageous refinements and improvements of the invention will be explained and described in more detail with reference to the drawing, which illustrates one exemplary embodiment of the invention.
- The single FIGURE shows a schematic cross section of a part of a
measurement tube 1 of a magnetic-inductive flowmeter for measurement of the flow of electrically conductive fluid substances, for example water. Thetube wall 2 of themeasurement tube 1 is composed of metal, as is normal for magnetic-inductive flowmeters. It is lined with a tubeinternal lining 6 towards theinternal area 4 through which the fluid flows. Thelining 6 on the inside of the tube is composed of an electrically insulating, chemically highly resistant plastic material, for example Teflon. The relationships between the dimensions of themeasurement tube wall 2, thelining 6 on the inside of the tube and theelectrode 8 in the FIGURE are not to scale, but are illustrated only schematically. - The part of the measurement tube illustrated in the FIGURE has an
opening 10 in the measurement tube, in which anelectrode 8 is held. Theelectrode 8 comprises amount 9 composed of stainless steel, with a T-shaped form. Thelongitudinal mount bar 12 is guided in an electrically insulated manner in theopening 10, although the isolation layer is not shown here. Thetransverse mount bar 14 is held in a corresponding recess in thelining 6 on the inside of the tube, in such a way that thatsurface 16 of theelectrode 8 which points towards the inside of the measurement tube ends flush and hermetically sealed with the inner face of thelining 6 on the inside of the tube. - The
transverse mount bar 14 for theelectrode 8 is provided with a two-layer film composed of two thin films. First of all, athin film 18 composed of platinum is applied to thetransverse mount bar 14 as the first film, over which a secondthin film 20 composed of TiN is then applied. Both films are electrically conductive. - By way of example, the vapour deposition process is used for production of the first
thin film 18 composed of platinum. Thefirst film 18 is a thin film with a film thickness between a few nanometers and a few micrometers. The production of thin platinum films such as these on stainless steel mounts is known from the prior art. It is also used for large-scale production, using so-called batch methods, by way of example for the production of platinum films on silicon chips for semiconductor purposes. As an alternative to vapour deposition, the platinum film can also be deposited by sputtering, by laser ablation, or by chemical vapour deposition (so-called CVD process), epitaxially or by electrochemical deposition. - The
second film 20 composed of TiN is likewise a thin film and is produced by sputtering, although it could also be produced by later ablation or by chemical vapour deposition (so-called CVD processes). The application of TiN films is also known from the prior art, for example for semiconductor purposes, where it is also used for large-scale production. The coating method can thus be carried out highly cost-effectively. The TiNfilm 20 is used as a protective layer against corrosion and abrasion for the firstmeasurement electrode film 18. - The two-layer system shown in the FIGURE, comprising the
platinum film 18 and the TiNfilm 20, allows theelectrode 8 to be used even in critical applications, in particular in the foodstuffs industry or in the pharmaceutical industry where the inner surfaces of the magnetic-inductive meters which touch the substance being measured are subjected to particularly stringent requirements, especially with regard to hygiene and cleaning capability. The fitting and installation of theelectrode 8 according to the invention and its installation in thetube wall 2 of the magnetic-inductive meter, as illustrated in the FIGURE, allow the magnetic-inductive meter to be cleaned without removing it from the process pipeline, using a so-called CIP (Cleaning in Place) process. In this case, as is known, a generally highly alkaline, hot cleaning solution is passed through the process pipeline system, including all of the fittings and meters installed there which carry the measurement substance, instead of the measurement fluid at particularly regularly recurring intervals, thus removing organic and inorganic contamination. The inner surfaces of the process pipeline system which touch the measurement substance can then also be subjected to hot-steam sterilization. All of these cleaning and disinfection steps result in very stringent requirements for the corrosion and abrasion resistance of the measurement electrodes, and these requirements can be satisfied by a two-layer structure according to the invention. - The embodiment shown in the FIGURE is, of course, not the only possible embodiment for electrodes according to the invention. All other types of electrode mounts and their installation in magnetic-inductive meters are also covered by the invention, provided only that these electrodes are provided with a multilayer structure according to the invention on their side facing the measurement tube interior.
- The present application claims priority under 35 USC §119 to
German application number 10 2005 002 904 3, the disclosure of which is hereby incorporated by reference in its entirety.
Claims (12)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005002904.3 | 2005-01-21 | ||
DE102005002904A DE102005002904A1 (en) | 2005-01-21 | 2005-01-21 | Electrode in a measuring tube of a magnetic-inductive flowmeter |
Publications (1)
Publication Number | Publication Date |
---|---|
US20060179931A1 true US20060179931A1 (en) | 2006-08-17 |
Family
ID=36144271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/335,585 Abandoned US20060179931A1 (en) | 2005-01-21 | 2006-01-20 | Electrode in a measurement tube of a magnetic-inductive flowmeter |
Country Status (3)
Country | Link |
---|---|
US (1) | US20060179931A1 (en) |
EP (1) | EP1684053A1 (en) |
DE (2) | DE202005021645U1 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011044457A1 (en) * | 2009-10-09 | 2011-04-14 | Hemlock Semiconductor Corporation | Manufacturing apparatus for depositing a material and an electrode for use therein |
WO2011044441A1 (en) * | 2009-10-09 | 2011-04-14 | Hemlock Semiconductor Corporation | Cvd apparatus with electrode |
CN102686774A (en) * | 2009-10-09 | 2012-09-19 | 赫姆洛克半导体公司 | Cvd apparatus |
US20180164139A1 (en) * | 2015-07-23 | 2018-06-14 | Endress + Hauser Flowtec Ag | Magneto-inductive flow measuring device for measuring flow velocity or volume flow rate of media in a pipeline and method for manufacturing such a flow measuring device |
WO2018159443A1 (en) * | 2017-03-02 | 2018-09-07 | アズビル株式会社 | Electrode structure of electromagnetic flowmeter |
US20200003592A1 (en) * | 2016-11-30 | 2020-01-02 | Endress+Hauser Flowtec Ag | Magnetically inductive flow meter |
CN112577556A (en) * | 2019-09-27 | 2021-03-30 | 西门子股份公司 | Rod-shaped measuring electrode for a magnetically inductive flow meter |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2383548A1 (en) * | 2010-04-29 | 2011-11-02 | Zylum Beteiligungsgesellschaft mbH & Co. Patente II KG | Measuring device and method for measuring the flow speed of a medium flowing through a measuring tube |
DE102013010170B4 (en) * | 2013-06-19 | 2015-01-08 | Krohne Messtechnik Gmbh | gauge |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4517846A (en) * | 1983-06-13 | 1985-05-21 | Flowmetering Instruments Limited | Electromagnetic flowmeter |
US4782709A (en) * | 1985-08-19 | 1988-11-08 | Yamatake-Honeywell Co., Ltd. | Electromagnetic flowmeter |
US5247837A (en) * | 1991-09-25 | 1993-09-28 | Rosemount Inc. | Magnetic flowmeter electrode |
US5981416A (en) * | 1996-12-25 | 1999-11-09 | National Industrial Research Institute Of Nagoya | Titanium nitride aluminum based sintered material and its production method |
US6662825B2 (en) * | 2001-02-16 | 2003-12-16 | Wabco Gmbh & Co. Ohg | Control device for pressurized fluids |
US6799812B2 (en) * | 2000-05-11 | 2004-10-05 | Continental Teves Ag & Co. Ohg | Integrated pressure sensor module |
US7011380B2 (en) * | 2001-08-13 | 2006-03-14 | Continental Teves Ag & Co. Ohg | Electrohydraulic pressure regulating device |
US7221013B2 (en) * | 2003-08-28 | 2007-05-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4105311C2 (en) * | 1991-02-20 | 2001-09-27 | Fischer & Porter Gmbh | Electrode in a measuring tube of an inductive flow meter |
DE19722977C1 (en) * | 1997-06-02 | 1999-02-11 | Danfoss As | Electromagnetic flow meter |
-
2005
- 2005-01-21 DE DE202005021645U patent/DE202005021645U1/en not_active Expired - Lifetime
- 2005-01-21 DE DE102005002904A patent/DE102005002904A1/en not_active Ceased
-
2006
- 2006-01-11 EP EP06000439A patent/EP1684053A1/en not_active Withdrawn
- 2006-01-20 US US11/335,585 patent/US20060179931A1/en not_active Abandoned
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4517846A (en) * | 1983-06-13 | 1985-05-21 | Flowmetering Instruments Limited | Electromagnetic flowmeter |
US4782709A (en) * | 1985-08-19 | 1988-11-08 | Yamatake-Honeywell Co., Ltd. | Electromagnetic flowmeter |
US5247837A (en) * | 1991-09-25 | 1993-09-28 | Rosemount Inc. | Magnetic flowmeter electrode |
US5981416A (en) * | 1996-12-25 | 1999-11-09 | National Industrial Research Institute Of Nagoya | Titanium nitride aluminum based sintered material and its production method |
US6799812B2 (en) * | 2000-05-11 | 2004-10-05 | Continental Teves Ag & Co. Ohg | Integrated pressure sensor module |
US6662825B2 (en) * | 2001-02-16 | 2003-12-16 | Wabco Gmbh & Co. Ohg | Control device for pressurized fluids |
US7011380B2 (en) * | 2001-08-13 | 2006-03-14 | Continental Teves Ag & Co. Ohg | Electrohydraulic pressure regulating device |
US7221013B2 (en) * | 2003-08-28 | 2007-05-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device |
Cited By (15)
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JP2013507522A (en) * | 2009-10-09 | 2013-03-04 | ヘムロック・セミコンダクター・コーポレーション | CVD apparatus having electrodes |
JP2013507524A (en) * | 2009-10-09 | 2013-03-04 | ヘムロック・セミコンダクター・コーポレーション | CVD equipment |
CN102666915A (en) * | 2009-10-09 | 2012-09-12 | 赫姆洛克半导体公司 | CVD apparatus with electrode |
CN102666916A (en) * | 2009-10-09 | 2012-09-12 | 赫姆洛克半导体公司 | Manufacturing apparatus for depositing a material and an electrode for use therein |
CN102686774A (en) * | 2009-10-09 | 2012-09-19 | 赫姆洛克半导体公司 | Cvd apparatus |
JP2013507523A (en) * | 2009-10-09 | 2013-03-04 | ヘムロック・セミコンダクター・コーポレーション | Manufacturing apparatus for depositing materials and electrodes used in the manufacturing apparatus |
WO2011044441A1 (en) * | 2009-10-09 | 2011-04-14 | Hemlock Semiconductor Corporation | Cvd apparatus with electrode |
CN102666915B (en) * | 2009-10-09 | 2014-04-23 | 赫姆洛克半导体公司 | CVD apparatus with electrode |
WO2011044457A1 (en) * | 2009-10-09 | 2011-04-14 | Hemlock Semiconductor Corporation | Manufacturing apparatus for depositing a material and an electrode for use therein |
US20180164139A1 (en) * | 2015-07-23 | 2018-06-14 | Endress + Hauser Flowtec Ag | Magneto-inductive flow measuring device for measuring flow velocity or volume flow rate of media in a pipeline and method for manufacturing such a flow measuring device |
US20200003592A1 (en) * | 2016-11-30 | 2020-01-02 | Endress+Hauser Flowtec Ag | Magnetically inductive flow meter |
US11747179B2 (en) * | 2016-11-30 | 2023-09-05 | Endress+Hauser Flowtec Ag | Magnetic inductive flow meter having an insulated electrode |
WO2018159443A1 (en) * | 2017-03-02 | 2018-09-07 | アズビル株式会社 | Electrode structure of electromagnetic flowmeter |
CN110383012A (en) * | 2017-03-02 | 2019-10-25 | 阿自倍尔株式会社 | Electrode structure of electromagnetic flowmeter |
CN112577556A (en) * | 2019-09-27 | 2021-03-30 | 西门子股份公司 | Rod-shaped measuring electrode for a magnetically inductive flow meter |
Also Published As
Publication number | Publication date |
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EP1684053A1 (en) | 2006-07-26 |
DE102005002904A1 (en) | 2006-07-27 |
DE202005021645U1 (en) | 2009-02-19 |
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