US20060061017A1 - Method for synthesis of colloidal nanoparticles - Google Patents
Method for synthesis of colloidal nanoparticles Download PDFInfo
- Publication number
- US20060061017A1 US20060061017A1 US10/945,053 US94505304A US2006061017A1 US 20060061017 A1 US20060061017 A1 US 20060061017A1 US 94505304 A US94505304 A US 94505304A US 2006061017 A1 US2006061017 A1 US 2006061017A1
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- nanoparticles
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- iii
- heating
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- 238000000034 method Methods 0.000 title claims abstract description 42
- 230000015572 biosynthetic process Effects 0.000 title abstract description 18
- 238000003786 synthesis reaction Methods 0.000 title abstract description 13
- 239000010415 colloidal nanoparticle Substances 0.000 title abstract description 4
- 239000002105 nanoparticle Substances 0.000 claims abstract description 65
- 238000010438 heat treatment Methods 0.000 claims abstract description 52
- 239000004065 semiconductor Substances 0.000 claims abstract description 15
- 238000006243 chemical reaction Methods 0.000 claims description 64
- 239000002904 solvent Substances 0.000 claims description 31
- 239000002243 precursor Substances 0.000 claims description 28
- 239000000470 constituent Substances 0.000 claims description 27
- -1 passivants Substances 0.000 claims description 24
- 238000001816 cooling Methods 0.000 claims description 22
- 150000002894 organic compounds Chemical class 0.000 claims description 14
- 230000002194 synthesizing effect Effects 0.000 claims description 8
- 239000011541 reaction mixture Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 6
- 229910010272 inorganic material Inorganic materials 0.000 claims description 3
- 239000012212 insulator Substances 0.000 claims description 2
- 230000000087 stabilizing effect Effects 0.000 claims description 2
- 150000002484 inorganic compounds Chemical class 0.000 claims 1
- 238000002360 preparation method Methods 0.000 abstract description 10
- 230000008569 process Effects 0.000 abstract description 10
- 230000005855 radiation Effects 0.000 abstract description 4
- 150000001875 compounds Chemical class 0.000 description 36
- 229910052798 chalcogen Inorganic materials 0.000 description 29
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- GQEZCXVZFLOKMC-UHFFFAOYSA-N 1-hexadecene Chemical compound CCCCCCCCCCCCCCC=C GQEZCXVZFLOKMC-UHFFFAOYSA-N 0.000 description 22
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- 125000000524 functional group Chemical group 0.000 description 12
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- 150000004820 halides Chemical class 0.000 description 11
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- CCCMONHAUSKTEQ-UHFFFAOYSA-N octadecene Natural products CCCCCCCCCCCCCCCCC=C CCCMONHAUSKTEQ-UHFFFAOYSA-N 0.000 description 8
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- 235000010299 hexamethylene tetramine Nutrition 0.000 description 6
- VKYKSIONXSXAKP-UHFFFAOYSA-N hexamethylenetetramine Chemical compound C1N(C2)CN3CN1CN2C3 VKYKSIONXSXAKP-UHFFFAOYSA-N 0.000 description 6
- 229910052742 iron Inorganic materials 0.000 description 6
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- 150000003254 radicals Chemical class 0.000 description 6
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 6
- 229910052714 tellurium Inorganic materials 0.000 description 6
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- 150000001335 aliphatic alkanes Chemical class 0.000 description 5
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- VQOXUMQBYILCKR-UHFFFAOYSA-N 1-Tridecene Chemical compound CCCCCCCCCCCC=C VQOXUMQBYILCKR-UHFFFAOYSA-N 0.000 description 4
- HFDVRLIODXPAHB-UHFFFAOYSA-N 1-tetradecene Chemical compound CCCCCCCCCCCCC=C HFDVRLIODXPAHB-UHFFFAOYSA-N 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 4
- VEQPNABPJHWNSG-UHFFFAOYSA-N Nickel(2+) Chemical compound [Ni+2] VEQPNABPJHWNSG-UHFFFAOYSA-N 0.000 description 4
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
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- 229910052785 arsenic Inorganic materials 0.000 description 4
- UFMZWBIQTDUYBN-UHFFFAOYSA-N cobalt dinitrate Chemical compound [Co+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O UFMZWBIQTDUYBN-UHFFFAOYSA-N 0.000 description 4
- XLJKHNWPARRRJB-UHFFFAOYSA-N cobalt(2+) Chemical compound [Co+2] XLJKHNWPARRRJB-UHFFFAOYSA-N 0.000 description 4
- 230000007547 defect Effects 0.000 description 4
- DCAYPVUWAIABOU-UHFFFAOYSA-N hexadecane Chemical compound CCCCCCCCCCCCCCCC DCAYPVUWAIABOU-UHFFFAOYSA-N 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- KBJMLQFLOWQJNF-UHFFFAOYSA-N nickel(ii) nitrate Chemical compound [Ni+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O KBJMLQFLOWQJNF-UHFFFAOYSA-N 0.000 description 4
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- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 4
- GPNDARIEYHPYAY-UHFFFAOYSA-N palladium(ii) nitrate Chemical compound [Pd+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O GPNDARIEYHPYAY-UHFFFAOYSA-N 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
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- 230000035484 reaction time Effects 0.000 description 4
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- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 4
- MDDUHVRJJAFRAU-YZNNVMRBSA-N tert-butyl-[(1r,3s,5z)-3-[tert-butyl(dimethyl)silyl]oxy-5-(2-diphenylphosphorylethylidene)-4-methylidenecyclohexyl]oxy-dimethylsilane Chemical compound C1[C@@H](O[Si](C)(C)C(C)(C)C)C[C@H](O[Si](C)(C)C(C)(C)C)C(=C)\C1=C/CP(=O)(C=1C=CC=CC=1)C1=CC=CC=C1 MDDUHVRJJAFRAU-YZNNVMRBSA-N 0.000 description 4
- 238000004627 transmission electron microscopy Methods 0.000 description 4
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 4
- ZAKSIRCIOXDVPT-UHFFFAOYSA-N trioctyl(selanylidene)-$l^{5}-phosphane Chemical compound CCCCCCCCP(=[Se])(CCCCCCCC)CCCCCCCC ZAKSIRCIOXDVPT-UHFFFAOYSA-N 0.000 description 4
- RMZAYIKUYWXQPB-UHFFFAOYSA-N trioctylphosphane Chemical compound CCCCCCCCP(CCCCCCCC)CCCCCCCC RMZAYIKUYWXQPB-UHFFFAOYSA-N 0.000 description 4
- PSCMQHVBLHHWTO-UHFFFAOYSA-K Indium trichloride Inorganic materials Cl[In](Cl)Cl PSCMQHVBLHHWTO-UHFFFAOYSA-K 0.000 description 3
- 235000021314 Palmitic acid Nutrition 0.000 description 3
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 3
- 229920006362 Teflon® Polymers 0.000 description 3
- 150000003973 alkyl amines Chemical class 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
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- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical group [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- RLECCBFNWDXKPK-UHFFFAOYSA-N bis(trimethylsilyl)sulfide Chemical compound C[Si](C)(C)S[Si](C)(C)C RLECCBFNWDXKPK-UHFFFAOYSA-N 0.000 description 3
- 229910052793 cadmium Inorganic materials 0.000 description 3
- 150000001768 cations Chemical class 0.000 description 3
- 150000004770 chalcogenides Chemical class 0.000 description 3
- 239000003153 chemical reaction reagent Substances 0.000 description 3
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- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
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- 229910052763 palladium Inorganic materials 0.000 description 3
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- 239000000047 product Substances 0.000 description 3
- 238000010791 quenching Methods 0.000 description 3
- 230000000171 quenching effect Effects 0.000 description 3
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- VPQBLCVGUWPDHV-UHFFFAOYSA-N sodium selenide Chemical compound [Na+].[Na+].[Se-2] VPQBLCVGUWPDHV-UHFFFAOYSA-N 0.000 description 3
- 229910052979 sodium sulfide Inorganic materials 0.000 description 3
- GRVFOGOEDUUMBP-UHFFFAOYSA-N sodium sulfide (anhydrous) Chemical compound [Na+].[Na+].[S-2] GRVFOGOEDUUMBP-UHFFFAOYSA-N 0.000 description 3
- 230000006641 stabilisation Effects 0.000 description 3
- 238000011105 stabilization Methods 0.000 description 3
- QPBYLOWPSRZOFX-UHFFFAOYSA-J tin(iv) iodide Chemical compound I[Sn](I)(I)I QPBYLOWPSRZOFX-UHFFFAOYSA-J 0.000 description 3
- FQVPFGDPYSIWTM-UHFFFAOYSA-N tributyl(sulfanylidene)-$l^{5}-phosphane Chemical compound CCCCP(=S)(CCCC)CCCC FQVPFGDPYSIWTM-UHFFFAOYSA-N 0.000 description 3
- FKIZDWBGWFWWOV-UHFFFAOYSA-N trimethyl(trimethylsilylselanyl)silane Chemical compound C[Si](C)(C)[Se][Si](C)(C)C FKIZDWBGWFWWOV-UHFFFAOYSA-N 0.000 description 3
- PIOZWDBMINZWGJ-UHFFFAOYSA-N trioctyl(sulfanylidene)-$l^{5}-phosphane Chemical compound CCCCCCCCP(=S)(CCCCCCCC)CCCCCCCC PIOZWDBMINZWGJ-UHFFFAOYSA-N 0.000 description 3
- OUMZKMRZMVDEOF-UHFFFAOYSA-N tris(trimethylsilyl)phosphane Chemical compound C[Si](C)(C)P([Si](C)(C)C)[Si](C)(C)C OUMZKMRZMVDEOF-UHFFFAOYSA-N 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 239000011701 zinc Substances 0.000 description 3
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- ZSSWXNPRLJLCDU-UHFFFAOYSA-N 1-diethylphosphorylethane Chemical compound CCP(=O)(CC)CC ZSSWXNPRLJLCDU-UHFFFAOYSA-N 0.000 description 2
- CRSBERNSMYQZNG-UHFFFAOYSA-N 1-dodecene Chemical compound CCCCCCCCCCC=C CRSBERNSMYQZNG-UHFFFAOYSA-N 0.000 description 2
- JRZJOMJEPLMPRA-UHFFFAOYSA-N 1-nonene Chemical compound CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 2
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- DCTOHCCUXLBQMS-UHFFFAOYSA-N 1-undecene Chemical compound CCCCCCCCCC=C DCTOHCCUXLBQMS-UHFFFAOYSA-N 0.000 description 2
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 2
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical compound S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 2
- QMMFVYPAHWMCMS-UHFFFAOYSA-N Dimethyl sulfide Chemical compound CSC QMMFVYPAHWMCMS-UHFFFAOYSA-N 0.000 description 2
- 229910003771 Gold(I) chloride Inorganic materials 0.000 description 2
- CPELXLSAUQHCOX-UHFFFAOYSA-N Hydrogen bromide Chemical compound Br CPELXLSAUQHCOX-UHFFFAOYSA-N 0.000 description 2
- 238000005481 NMR spectroscopy Methods 0.000 description 2
- ABLZXFCXXLZCGV-UHFFFAOYSA-N Phosphorous acid Chemical group OP(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 239000007983 Tris buffer Substances 0.000 description 2
- 150000001350 alkyl halides Chemical class 0.000 description 2
- 150000001450 anions Chemical class 0.000 description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 2
- 229910000074 antimony hydride Inorganic materials 0.000 description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 2
- 238000004630 atomic force microscopy Methods 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- ILAHWRKJUDSMFH-UHFFFAOYSA-N boron tribromide Chemical compound BrB(Br)Br ILAHWRKJUDSMFH-UHFFFAOYSA-N 0.000 description 2
- IYYIVELXUANFED-UHFFFAOYSA-N bromo(trimethyl)silane Chemical compound C[Si](C)(C)Br IYYIVELXUANFED-UHFFFAOYSA-N 0.000 description 2
- 239000008364 bulk solution Substances 0.000 description 2
- KPWJBEFBFLRCLH-UHFFFAOYSA-L cadmium bromide Chemical compound Br[Cd]Br KPWJBEFBFLRCLH-UHFFFAOYSA-L 0.000 description 2
- YKYOUMDCQGMQQO-UHFFFAOYSA-L cadmium dichloride Chemical compound Cl[Cd]Cl YKYOUMDCQGMQQO-UHFFFAOYSA-L 0.000 description 2
- OKIIEJOIXGHUKX-UHFFFAOYSA-L cadmium iodide Chemical compound [Cd+2].[I-].[I-] OKIIEJOIXGHUKX-UHFFFAOYSA-L 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 150000001734 carboxylic acid salts Chemical class 0.000 description 2
- 125000002091 cationic group Chemical group 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- IJOOHPMOJXWVHK-UHFFFAOYSA-N chlorotrimethylsilane Chemical compound C[Si](C)(C)Cl IJOOHPMOJXWVHK-UHFFFAOYSA-N 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- GVPFVAHMJGGAJG-UHFFFAOYSA-L cobalt dichloride Chemical compound [Cl-].[Cl-].[Co+2] GVPFVAHMJGGAJG-UHFFFAOYSA-L 0.000 description 2
- AVWLPUQJODERGA-UHFFFAOYSA-L cobalt(2+);diiodide Chemical compound [Co+2].[I-].[I-] AVWLPUQJODERGA-UHFFFAOYSA-L 0.000 description 2
- BZRRQSJJPUGBAA-UHFFFAOYSA-L cobalt(ii) bromide Chemical compound Br[Co]Br BZRRQSJJPUGBAA-UHFFFAOYSA-L 0.000 description 2
- FCEOGYWNOSBEPV-FDGPNNRMSA-N cobalt;(z)-4-hydroxypent-3-en-2-one Chemical compound [Co].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O FCEOGYWNOSBEPV-FDGPNNRMSA-N 0.000 description 2
- XTVVROIMIGLXTD-UHFFFAOYSA-N copper(II) nitrate Chemical compound [Cu+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O XTVVROIMIGLXTD-UHFFFAOYSA-N 0.000 description 2
- VBXWCGWXDOBUQZ-UHFFFAOYSA-K diacetyloxyindiganyl acetate Chemical compound [In+3].CC([O-])=O.CC([O-])=O.CC([O-])=O VBXWCGWXDOBUQZ-UHFFFAOYSA-K 0.000 description 2
- AIUKDTSFILEWTF-UHFFFAOYSA-J dichloro(diiodo)stannane Chemical compound Cl[Sn](Cl)(I)I AIUKDTSFILEWTF-UHFFFAOYSA-J 0.000 description 2
- ATZBPOVXVPIOMR-UHFFFAOYSA-N dimethylmercury Chemical compound C[Hg]C ATZBPOVXVPIOMR-UHFFFAOYSA-N 0.000 description 2
- ORMNPSYMZOGSSV-UHFFFAOYSA-N dinitrooxymercury Chemical compound [Hg+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O ORMNPSYMZOGSSV-UHFFFAOYSA-N 0.000 description 2
- VDCSGNNYCFPWFK-UHFFFAOYSA-N diphenylsilane Chemical compound C=1C=CC=CC=1[SiH2]C1=CC=CC=C1 VDCSGNNYCFPWFK-UHFFFAOYSA-N 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- FDWREHZXQUYJFJ-UHFFFAOYSA-M gold monochloride Chemical compound [Cl-].[Au+] FDWREHZXQUYJFJ-UHFFFAOYSA-M 0.000 description 2
- 229910021480 group 4 element Inorganic materials 0.000 description 2
- 229910021478 group 5 element Inorganic materials 0.000 description 2
- 229910021476 group 6 element Inorganic materials 0.000 description 2
- 229910021474 group 7 element Inorganic materials 0.000 description 2
- 229910021472 group 8 element Inorganic materials 0.000 description 2
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical compound I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 description 2
- 229910000037 hydrogen sulfide Inorganic materials 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- CBFCDTFDPHXCNY-UHFFFAOYSA-N icosane Chemical compound CCCCCCCCCCCCCCCCCCCC CBFCDTFDPHXCNY-UHFFFAOYSA-N 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 239000000543 intermediate Substances 0.000 description 2
- 229910052740 iodine Inorganic materials 0.000 description 2
- GYCHYNMREWYSKH-UHFFFAOYSA-L iron(ii) bromide Chemical compound [Fe+2].[Br-].[Br-] GYCHYNMREWYSKH-UHFFFAOYSA-L 0.000 description 2
- BQZGVMWPHXIKEQ-UHFFFAOYSA-L iron(ii) iodide Chemical compound [Fe+2].[I-].[I-] BQZGVMWPHXIKEQ-UHFFFAOYSA-L 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- LWJROJCJINYWOX-UHFFFAOYSA-L mercury dichloride Chemical compound Cl[Hg]Cl LWJROJCJINYWOX-UHFFFAOYSA-L 0.000 description 2
- VAMFXQBUQXONLZ-UHFFFAOYSA-N n-alpha-eicosene Natural products CCCCCCCCCCCCCCCCCCC=C VAMFXQBUQXONLZ-UHFFFAOYSA-N 0.000 description 2
- 239000011234 nano-particulate material Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 2
- IPLJNQFXJUCRNH-UHFFFAOYSA-L nickel(2+);dibromide Chemical compound [Ni+2].[Br-].[Br-] IPLJNQFXJUCRNH-UHFFFAOYSA-L 0.000 description 2
- BFSQJYRFLQUZKX-UHFFFAOYSA-L nickel(ii) iodide Chemical compound I[Ni]I BFSQJYRFLQUZKX-UHFFFAOYSA-L 0.000 description 2
- RZJRJXONCZWCBN-UHFFFAOYSA-N octadecane Chemical compound CCCCCCCCCCCCCCCCCC RZJRJXONCZWCBN-UHFFFAOYSA-N 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- NWAHZABTSDUXMJ-UHFFFAOYSA-N platinum(2+);dinitrate Chemical compound [Pt+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O NWAHZABTSDUXMJ-UHFFFAOYSA-N 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 238000000634 powder X-ray diffraction Methods 0.000 description 2
- 150000003141 primary amines Chemical class 0.000 description 2
- 229910000058 selane Inorganic materials 0.000 description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000010944 silver (metal) Substances 0.000 description 2
- ADZWSOLPGZMUMY-UHFFFAOYSA-M silver bromide Chemical compound [Ag]Br ADZWSOLPGZMUMY-UHFFFAOYSA-M 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 229910052950 sphalerite Inorganic materials 0.000 description 2
- OUULRIDHGPHMNQ-UHFFFAOYSA-N stibane Chemical compound [SbH3] OUULRIDHGPHMNQ-UHFFFAOYSA-N 0.000 description 2
- 229910000059 tellane Inorganic materials 0.000 description 2
- VJHDVMPJLLGYBL-UHFFFAOYSA-N tetrabromogermane Chemical compound Br[Ge](Br)(Br)Br VJHDVMPJLLGYBL-UHFFFAOYSA-N 0.000 description 2
- IEXRMSFAVATTJX-UHFFFAOYSA-N tetrachlorogermane Chemical compound Cl[Ge](Cl)(Cl)Cl IEXRMSFAVATTJX-UHFFFAOYSA-N 0.000 description 2
- 229940095068 tetradecene Drugs 0.000 description 2
- 238000002411 thermogravimetry Methods 0.000 description 2
- 150000003573 thiols Chemical class 0.000 description 2
- AXZWODMDQAVCJE-UHFFFAOYSA-L tin(II) chloride (anhydrous) Chemical compound [Cl-].[Cl-].[Sn+2] AXZWODMDQAVCJE-UHFFFAOYSA-L 0.000 description 2
- ZSUXOVNWDZTCFN-UHFFFAOYSA-L tin(ii) bromide Chemical compound Br[Sn]Br ZSUXOVNWDZTCFN-UHFFFAOYSA-L 0.000 description 2
- JTDNNCYXCFHBGG-UHFFFAOYSA-L tin(ii) iodide Chemical compound I[Sn]I JTDNNCYXCFHBGG-UHFFFAOYSA-L 0.000 description 2
- LTSUHJWLSNQKIP-UHFFFAOYSA-J tin(iv) bromide Chemical compound Br[Sn](Br)(Br)Br LTSUHJWLSNQKIP-UHFFFAOYSA-J 0.000 description 2
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 2
- IYMHCKVVJXJPDB-UHFFFAOYSA-N tributyl(selanylidene)-$l^{5}-phosphane Chemical compound CCCCP(=[Se])(CCCC)CCCC IYMHCKVVJXJPDB-UHFFFAOYSA-N 0.000 description 2
- YNPPZRROCXADAX-UHFFFAOYSA-N trihexyl(selanylidene)-lambda5-phosphane Chemical compound CCCCCCP(=[Se])(CCCCCC)CCCCCC YNPPZRROCXADAX-UHFFFAOYSA-N 0.000 description 2
- YYUMUXVIMGKOQE-UHFFFAOYSA-N trihexyl(sulfanylidene)-$l^{5}-phosphane Chemical compound CCCCCCP(=S)(CCCCCC)CCCCCC YYUMUXVIMGKOQE-UHFFFAOYSA-N 0.000 description 2
- RMUKCGUDVKEQPL-UHFFFAOYSA-K triiodoindigane Chemical compound I[In](I)I RMUKCGUDVKEQPL-UHFFFAOYSA-K 0.000 description 2
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 2
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 2
- CSRZQMIRAZTJOY-UHFFFAOYSA-N trimethylsilyl iodide Chemical compound C[Si](C)(C)I CSRZQMIRAZTJOY-UHFFFAOYSA-N 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- VNDYJBBGRKZCSX-UHFFFAOYSA-L zinc bromide Chemical compound Br[Zn]Br VNDYJBBGRKZCSX-UHFFFAOYSA-L 0.000 description 2
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 2
- UAYWVJHJZHQCIE-UHFFFAOYSA-L zinc iodide Chemical compound I[Zn]I UAYWVJHJZHQCIE-UHFFFAOYSA-L 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- 229910052984 zinc sulfide Inorganic materials 0.000 description 2
- NMLXKNNXODLJIN-UHFFFAOYSA-M zinc;carbanide;chloride Chemical compound [CH3-].[Zn+]Cl NMLXKNNXODLJIN-UHFFFAOYSA-M 0.000 description 2
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 1
- KLFRPGNCEJNEKU-FDGPNNRMSA-L (z)-4-oxopent-2-en-2-olate;platinum(2+) Chemical compound [Pt+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O KLFRPGNCEJNEKU-FDGPNNRMSA-L 0.000 description 1
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 1
- QRFDIEMZNYYUIL-UHFFFAOYSA-N 1-di(nonyl)phosphorylnonane Chemical compound CCCCCCCCCP(=O)(CCCCCCCCC)CCCCCCCCC QRFDIEMZNYYUIL-UHFFFAOYSA-N 0.000 description 1
- MNZAKDODWSQONA-UHFFFAOYSA-N 1-dibutylphosphorylbutane Chemical compound CCCCP(=O)(CCCC)CCCC MNZAKDODWSQONA-UHFFFAOYSA-N 0.000 description 1
- KNFWHHCXXKWASF-UHFFFAOYSA-N 1-diheptylphosphorylheptane Chemical compound CCCCCCCP(=O)(CCCCCCC)CCCCCCC KNFWHHCXXKWASF-UHFFFAOYSA-N 0.000 description 1
- 229940106006 1-eicosene Drugs 0.000 description 1
- FIKTURVKRGQNQD-UHFFFAOYSA-N 1-eicosene Natural products CCCCCCCCCCCCCCCCCC=CC(O)=O FIKTURVKRGQNQD-UHFFFAOYSA-N 0.000 description 1
- GCZWLZBNDSJSQF-UHFFFAOYSA-N 2-isothiocyanatohexane Chemical compound CCCCC(C)N=C=S GCZWLZBNDSJSQF-UHFFFAOYSA-N 0.000 description 1
- ZSZQAJUEIMYKCN-UHFFFAOYSA-N 3-amino-6-methylthieno[2,3-b]pyridine-2-carboxylic acid Chemical compound CC1=CC=C2C(N)=C(C(O)=O)SC2=N1 ZSZQAJUEIMYKCN-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- 229910017115 AlSb Inorganic materials 0.000 description 1
- 229910017000 As2Se3 Inorganic materials 0.000 description 1
- 229910002899 Bi2Te3 Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- NFBPCQSTZITERU-UHFFFAOYSA-N C1CCCCC1[Zn]C1CCCCC1 Chemical compound C1CCCCC1[Zn]C1CCCCC1 NFBPCQSTZITERU-UHFFFAOYSA-N 0.000 description 1
- JUOCTSZRGAFSKS-UHFFFAOYSA-N CCCCCC[Zn]CCCCCC Chemical compound CCCCCC[Zn]CCCCCC JUOCTSZRGAFSKS-UHFFFAOYSA-N 0.000 description 1
- RCAVZYVZFDBOLH-UHFFFAOYSA-N CCCC[In]CCCC Chemical compound CCCC[In]CCCC RCAVZYVZFDBOLH-UHFFFAOYSA-N 0.000 description 1
- QQTGJVBUIOTPGZ-UHFFFAOYSA-N CCC[Zn]CCC Chemical compound CCC[Zn]CCC QQTGJVBUIOTPGZ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- FHWQTHKSPYIEAT-UHFFFAOYSA-N ClC([Au])=O Chemical compound ClC([Au])=O FHWQTHKSPYIEAT-UHFFFAOYSA-N 0.000 description 1
- 229910021580 Cobalt(II) chloride Inorganic materials 0.000 description 1
- 229910021584 Cobalt(II) iodide Inorganic materials 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- 229910021595 Copper(I) iodide Inorganic materials 0.000 description 1
- GUUVPOWQJOLRAS-UHFFFAOYSA-N Diphenyl disulfide Chemical compound C=1C=CC=CC=1SSC1=CC=CC=C1 GUUVPOWQJOLRAS-UHFFFAOYSA-N 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910002546 FeCo Inorganic materials 0.000 description 1
- 229910005335 FePt Inorganic materials 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910005542 GaSb Inorganic materials 0.000 description 1
- 229910005543 GaSe Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910005829 GeS Inorganic materials 0.000 description 1
- 229910005866 GeSe Inorganic materials 0.000 description 1
- 229910005900 GeTe Inorganic materials 0.000 description 1
- 229910004262 HgTe Inorganic materials 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 229910000673 Indium arsenide Inorganic materials 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- GLFNIEUTAYBVOC-UHFFFAOYSA-L Manganese chloride Chemical compound Cl[Mn]Cl GLFNIEUTAYBVOC-UHFFFAOYSA-L 0.000 description 1
- OPVVCGMNWAJDCV-UHFFFAOYSA-N N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.[Co+2] Chemical compound N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.[Co+2] OPVVCGMNWAJDCV-UHFFFAOYSA-N 0.000 description 1
- RLRGQNCJOBWXJE-UHFFFAOYSA-N N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.[Pt+2] Chemical compound N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.N1=CC=CC=C1.[Pt+2] RLRGQNCJOBWXJE-UHFFFAOYSA-N 0.000 description 1
- 229910021585 Nickel(II) bromide Inorganic materials 0.000 description 1
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 1
- 229910021588 Nickel(II) iodide Inorganic materials 0.000 description 1
- 229910021605 Palladium(II) bromide Inorganic materials 0.000 description 1
- 229910021606 Palladium(II) iodide Inorganic materials 0.000 description 1
- 229910002665 PbTe Inorganic materials 0.000 description 1
- 229910017629 Sb2Te3 Inorganic materials 0.000 description 1
- 229910021607 Silver chloride Inorganic materials 0.000 description 1
- 229910005642 SnTe Inorganic materials 0.000 description 1
- GNVMUORYQLCPJZ-UHFFFAOYSA-M Thiocarbamate Chemical compound NC([S-])=O GNVMUORYQLCPJZ-UHFFFAOYSA-M 0.000 description 1
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical group C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 1
- 229910052776 Thorium Inorganic materials 0.000 description 1
- 229910003092 TiS2 Inorganic materials 0.000 description 1
- 229910008644 TlTe Inorganic materials 0.000 description 1
- 238000005411 Van der Waals force Methods 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- 229910006247 ZrS2 Inorganic materials 0.000 description 1
- IPEWZDADFHXCHO-UHFFFAOYSA-L [Br-].[Br-].Br.[In+2] Chemical compound [Br-].[Br-].Br.[In+2] IPEWZDADFHXCHO-UHFFFAOYSA-L 0.000 description 1
- OOULTEVOQWLHLN-UHFFFAOYSA-M [Cl-].[Cd+]C Chemical compound [Cl-].[Cd+]C OOULTEVOQWLHLN-UHFFFAOYSA-M 0.000 description 1
- OTPQCSIMYFOPRJ-UHFFFAOYSA-L [Cl-].[Cl-].CCCC[In++] Chemical compound [Cl-].[Cl-].CCCC[In++] OTPQCSIMYFOPRJ-UHFFFAOYSA-L 0.000 description 1
- IWAMTNPLBGULMY-UHFFFAOYSA-M [I-].[Zn+]C Chemical compound [I-].[Zn+]C IWAMTNPLBGULMY-UHFFFAOYSA-M 0.000 description 1
- PEGHITPVRNZWSI-UHFFFAOYSA-N [[bis(trimethylsilyl)amino]-dimethylsilyl]methane Chemical compound C[Si](C)(C)N([Si](C)(C)C)[Si](C)(C)C PEGHITPVRNZWSI-UHFFFAOYSA-N 0.000 description 1
- 238000004847 absorption spectroscopy Methods 0.000 description 1
- GPWHDDKQSYOYBF-UHFFFAOYSA-N ac1l2u0q Chemical compound Br[Br-]Br GPWHDDKQSYOYBF-UHFFFAOYSA-N 0.000 description 1
- 229910052946 acanthite Inorganic materials 0.000 description 1
- ZOIORXHNWRGPMV-UHFFFAOYSA-N acetic acid;zinc Chemical compound [Zn].CC(O)=O.CC(O)=O ZOIORXHNWRGPMV-UHFFFAOYSA-N 0.000 description 1
- CUJRVFIICFDLGR-UHFFFAOYSA-N acetylacetonate Chemical compound CC(=O)[CH-]C(C)=O CUJRVFIICFDLGR-UHFFFAOYSA-N 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 125000005157 alkyl carboxy group Chemical group 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PQLAYKMGZDUDLQ-UHFFFAOYSA-K aluminium bromide Chemical compound Br[Al](Br)Br PQLAYKMGZDUDLQ-UHFFFAOYSA-K 0.000 description 1
- CECABOMBVQNBEC-UHFFFAOYSA-K aluminium iodide Chemical compound I[Al](I)I CECABOMBVQNBEC-UHFFFAOYSA-K 0.000 description 1
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 150000001449 anionic compounds Chemical class 0.000 description 1
- 125000000129 anionic group Chemical group 0.000 description 1
- FAPDDOBMIUGHIN-UHFFFAOYSA-K antimony trichloride Chemical compound Cl[Sb](Cl)Cl FAPDDOBMIUGHIN-UHFFFAOYSA-K 0.000 description 1
- RPJGYLSSECYURW-UHFFFAOYSA-K antimony(3+);tribromide Chemical compound Br[Sb](Br)Br RPJGYLSSECYURW-UHFFFAOYSA-K 0.000 description 1
- KWQLUUQBTAXYCB-UHFFFAOYSA-K antimony(3+);triiodide Chemical compound I[Sb](I)I KWQLUUQBTAXYCB-UHFFFAOYSA-K 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- JMBNQWNFNACVCB-UHFFFAOYSA-N arsenic tribromide Chemical compound Br[As](Br)Br JMBNQWNFNACVCB-UHFFFAOYSA-N 0.000 description 1
- OEYOHULQRFXULB-UHFFFAOYSA-N arsenic trichloride Chemical compound Cl[As](Cl)Cl OEYOHULQRFXULB-UHFFFAOYSA-N 0.000 description 1
- IKIBSPLDJGAHPX-UHFFFAOYSA-N arsenic triiodide Chemical compound I[As](I)I IKIBSPLDJGAHPX-UHFFFAOYSA-N 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- JHXKRIRFYBPWGE-UHFFFAOYSA-K bismuth chloride Chemical compound Cl[Bi](Cl)Cl JHXKRIRFYBPWGE-UHFFFAOYSA-K 0.000 description 1
- TXKAQZRUJUNDHI-UHFFFAOYSA-K bismuth tribromide Chemical compound Br[Bi](Br)Br TXKAQZRUJUNDHI-UHFFFAOYSA-K 0.000 description 1
- YMEKEHSRPZAOGO-UHFFFAOYSA-N boron triiodide Chemical compound IB(I)I YMEKEHSRPZAOGO-UHFFFAOYSA-N 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- JMGGAKBXNQCMQZ-UHFFFAOYSA-L bromo(iodo)cadmium Chemical compound Br[Cd]I JMGGAKBXNQCMQZ-UHFFFAOYSA-L 0.000 description 1
- WWWSJCXNNVUYBN-UHFFFAOYSA-L bromo(iodo)mercury Chemical compound [Br-].[I-].[Hg+2] WWWSJCXNNVUYBN-UHFFFAOYSA-L 0.000 description 1
- URWMXDGZHXQAPZ-UHFFFAOYSA-L bromo(iodo)zinc Chemical compound Br[Zn]I URWMXDGZHXQAPZ-UHFFFAOYSA-L 0.000 description 1
- ODWXUNBKCRECNW-UHFFFAOYSA-M bromocopper(1+) Chemical compound Br[Cu+] ODWXUNBKCRECNW-UHFFFAOYSA-M 0.000 description 1
- SHOVVTSKTTYFGP-UHFFFAOYSA-L butylaluminum(2+);dichloride Chemical compound CCCC[Al](Cl)Cl SHOVVTSKTTYFGP-UHFFFAOYSA-L 0.000 description 1
- LHQLJMJLROMYRN-UHFFFAOYSA-L cadmium acetate Chemical compound [Cd+2].CC([O-])=O.CC([O-])=O LHQLJMJLROMYRN-UHFFFAOYSA-L 0.000 description 1
- 229940075417 cadmium iodide Drugs 0.000 description 1
- XIEPJMXMMWZAAV-UHFFFAOYSA-N cadmium nitrate Inorganic materials [Cd+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O XIEPJMXMMWZAAV-UHFFFAOYSA-N 0.000 description 1
- QOYRNHQSZSCVOW-UHFFFAOYSA-N cadmium nitrate tetrahydrate Chemical compound O.O.O.O.[Cd+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O QOYRNHQSZSCVOW-UHFFFAOYSA-N 0.000 description 1
- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 description 1
- VQNPSCRXHSIJTH-UHFFFAOYSA-N cadmium(2+);carbanide Chemical compound [CH3-].[CH3-].[Cd+2] VQNPSCRXHSIJTH-UHFFFAOYSA-N 0.000 description 1
- UJYLYGDHTIVYRI-UHFFFAOYSA-N cadmium(2+);ethane Chemical compound [Cd+2].[CH2-]C.[CH2-]C UJYLYGDHTIVYRI-UHFFFAOYSA-N 0.000 description 1
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical compound [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 description 1
- VTVGIKWOUWIHQX-UHFFFAOYSA-N cadmium;2-ethylhexanoic acid Chemical compound [Cd].CCCCC(CC)C(O)=O VTVGIKWOUWIHQX-UHFFFAOYSA-N 0.000 description 1
- DKVNPHBNOWQYFE-UHFFFAOYSA-M carbamodithioate Chemical compound NC([S-])=S DKVNPHBNOWQYFE-UHFFFAOYSA-M 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001735 carboxylic acids Chemical class 0.000 description 1
- 150000001787 chalcogens Chemical class 0.000 description 1
- 239000013626 chemical specie Substances 0.000 description 1
- CNUMVOKZXKCVEW-UHFFFAOYSA-L chloro(iodo)cadmium Chemical compound Cl[Cd]I CNUMVOKZXKCVEW-UHFFFAOYSA-L 0.000 description 1
- ULOBUFRAARTHEP-UHFFFAOYSA-L chloro(iodo)mercury Chemical compound Cl[Hg]I ULOBUFRAARTHEP-UHFFFAOYSA-L 0.000 description 1
- PLLXEKMEQAMQEP-UHFFFAOYSA-L chloro(iodo)zinc Chemical compound Cl[Zn]I PLLXEKMEQAMQEP-UHFFFAOYSA-L 0.000 description 1
- 235000012000 cholesterol Nutrition 0.000 description 1
- 150000001841 cholesterols Chemical class 0.000 description 1
- PPUZYFWVBLIDMP-UHFFFAOYSA-K chromium(3+);triiodide Chemical compound I[Cr](I)I PPUZYFWVBLIDMP-UHFFFAOYSA-K 0.000 description 1
- UZDWIWGMKWZEPE-UHFFFAOYSA-K chromium(iii) bromide Chemical compound [Cr+3].[Br-].[Br-].[Br-] UZDWIWGMKWZEPE-UHFFFAOYSA-K 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- HPZPCZHHCCTDIB-UHFFFAOYSA-L cobalt(2+);dicarbamodithioate Chemical compound [Co+2].NC([S-])=S.NC([S-])=S HPZPCZHHCCTDIB-UHFFFAOYSA-L 0.000 description 1
- ZUNZYZCPTFQNHF-UHFFFAOYSA-L cobalt(2+);dodecyl sulfate Chemical compound [Co+2].CCCCCCCCCCCCOS([O-])(=O)=O.CCCCCCCCCCCCOS([O-])(=O)=O ZUNZYZCPTFQNHF-UHFFFAOYSA-L 0.000 description 1
- ULSLPDGHJIVDAV-UHFFFAOYSA-K cobalt(3+) hexadecanoate Chemical compound C(CCCCCCCCCCCCCCC)(=O)[O-].[Co+3].C(CCCCCCCCCCCCCCC)(=O)[O-].C(CCCCCCCCCCCCCCC)(=O)[O-] ULSLPDGHJIVDAV-UHFFFAOYSA-K 0.000 description 1
- QAHREYKOYSIQPH-UHFFFAOYSA-L cobalt(II) acetate Chemical compound [Co+2].CC([O-])=O.CC([O-])=O QAHREYKOYSIQPH-UHFFFAOYSA-L 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- BERDEBHAJNAUOM-UHFFFAOYSA-N copper(I) oxide Inorganic materials [Cu]O[Cu] BERDEBHAJNAUOM-UHFFFAOYSA-N 0.000 description 1
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 1
- LSXDOTMGLUJQCM-UHFFFAOYSA-M copper(i) iodide Chemical compound I[Cu] LSXDOTMGLUJQCM-UHFFFAOYSA-M 0.000 description 1
- OPQARKPSCNTWTJ-UHFFFAOYSA-L copper(ii) acetate Chemical compound [Cu+2].CC([O-])=O.CC([O-])=O OPQARKPSCNTWTJ-UHFFFAOYSA-L 0.000 description 1
- ZKXWKVVCCTZOLD-UHFFFAOYSA-N copper;4-hydroxypent-3-en-2-one Chemical compound [Cu].CC(O)=CC(C)=O.CC(O)=CC(C)=O ZKXWKVVCCTZOLD-UHFFFAOYSA-N 0.000 description 1
- KGGZTXSNARMULX-UHFFFAOYSA-L copper;dicarbamodithioate Chemical compound [Cu+2].NC([S-])=S.NC([S-])=S KGGZTXSNARMULX-UHFFFAOYSA-L 0.000 description 1
- GBRBMTNGQBKBQE-UHFFFAOYSA-L copper;diiodide Chemical compound I[Cu]I GBRBMTNGQBKBQE-UHFFFAOYSA-L 0.000 description 1
- QXPQHPAJDGRSQA-UHFFFAOYSA-L copper;dodecyl sulfate Chemical compound [Cu+2].CCCCCCCCCCCCOS([O-])(=O)=O.CCCCCCCCCCCCOS([O-])(=O)=O QXPQHPAJDGRSQA-UHFFFAOYSA-L 0.000 description 1
- GYPBUYJSHBFNEJ-UHFFFAOYSA-L copper;hexadecanoate Chemical compound [Cu+2].CCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCC([O-])=O GYPBUYJSHBFNEJ-UHFFFAOYSA-L 0.000 description 1
- SZDVDUDLIIZMKX-UHFFFAOYSA-N copper;pyridine Chemical compound [Cu].C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1 SZDVDUDLIIZMKX-UHFFFAOYSA-N 0.000 description 1
- KRFJLUBVMFXRPN-UHFFFAOYSA-N cuprous oxide Chemical compound [O-2].[Cu+].[Cu+] KRFJLUBVMFXRPN-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 150000001983 dialkylethers Chemical class 0.000 description 1
- PHOPMVDFIWHLQK-UHFFFAOYSA-N dibenzylmercury Chemical compound C=1C=CC=CC=1C[Hg]CC1=CC=CC=C1 PHOPMVDFIWHLQK-UHFFFAOYSA-N 0.000 description 1
- RSYIWJSAWJHKCG-UHFFFAOYSA-L dibromo(methyl)stibane Chemical compound C[Sb](Br)Br RSYIWJSAWJHKCG-UHFFFAOYSA-L 0.000 description 1
- RJYMRRJVDRJMJW-UHFFFAOYSA-L dibromomanganese Chemical compound Br[Mn]Br RJYMRRJVDRJMJW-UHFFFAOYSA-L 0.000 description 1
- VJRUISVXILMZSL-UHFFFAOYSA-M dibutylalumanylium;chloride Chemical compound CCCC[Al](Cl)CCCC VJRUISVXILMZSL-UHFFFAOYSA-M 0.000 description 1
- ZUPJYXNLGBILSW-UHFFFAOYSA-L dichloro(methyl)bismuthane Chemical compound C[Bi](Cl)Cl ZUPJYXNLGBILSW-UHFFFAOYSA-L 0.000 description 1
- DZNXXVGIRUXVCD-UHFFFAOYSA-L dichloro(methyl)stibane Chemical compound C[Sb](Cl)Cl DZNXXVGIRUXVCD-UHFFFAOYSA-L 0.000 description 1
- LJSQFQKUNVCTIA-UHFFFAOYSA-N diethyl sulfide Chemical compound CCSCC LJSQFQKUNVCTIA-UHFFFAOYSA-N 0.000 description 1
- JJSGABFIILQOEY-UHFFFAOYSA-M diethylalumanylium;bromide Chemical compound CC[Al](Br)CC JJSGABFIILQOEY-UHFFFAOYSA-M 0.000 description 1
- PPQUYYAZSOKTQD-UHFFFAOYSA-M diethylalumanylium;iodide Chemical compound CC[Al](I)CC PPQUYYAZSOKTQD-UHFFFAOYSA-M 0.000 description 1
- YNLAOSYQHBDIKW-UHFFFAOYSA-M diethylaluminium chloride Chemical compound CC[Al](Cl)CC YNLAOSYQHBDIKW-UHFFFAOYSA-M 0.000 description 1
- SPIUPAOJDZNUJH-UHFFFAOYSA-N diethylmercury Chemical compound CC[Hg]CC SPIUPAOJDZNUJH-UHFFFAOYSA-N 0.000 description 1
- HQWPLXHWEZZGKY-UHFFFAOYSA-N diethylzinc Chemical compound CC[Zn]CC HQWPLXHWEZZGKY-UHFFFAOYSA-N 0.000 description 1
- KRUPDERPRQHDBC-UHFFFAOYSA-N dihydrochloride hydroiodide Chemical compound Cl.Cl.I KRUPDERPRQHDBC-UHFFFAOYSA-N 0.000 description 1
- NTTUNWNRVVDXKR-UHFFFAOYSA-L diiodo(methyl)stibane Chemical compound C[Sb](I)I NTTUNWNRVVDXKR-UHFFFAOYSA-L 0.000 description 1
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- FRLYMSHUDNORBC-UHFFFAOYSA-N diisopropylzinc Chemical compound [Zn+2].C[CH-]C.C[CH-]C FRLYMSHUDNORBC-UHFFFAOYSA-N 0.000 description 1
- WQOXQRCZOLPYPM-UHFFFAOYSA-N dimethyl disulfide Chemical compound CSSC WQOXQRCZOLPYPM-UHFFFAOYSA-N 0.000 description 1
- JGHYBJVUQGTEEB-UHFFFAOYSA-M dimethylalumanylium;chloride Chemical compound C[Al](C)Cl JGHYBJVUQGTEEB-UHFFFAOYSA-M 0.000 description 1
- AXAZMDOAUQTMOW-UHFFFAOYSA-N dimethylzinc Chemical compound C[Zn]C AXAZMDOAUQTMOW-UHFFFAOYSA-N 0.000 description 1
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- HWMTUNCVVYPZHZ-UHFFFAOYSA-N diphenylmercury Chemical compound C=1C=CC=CC=1[Hg]C1=CC=CC=C1 HWMTUNCVVYPZHZ-UHFFFAOYSA-N 0.000 description 1
- 239000012990 dithiocarbamate Substances 0.000 description 1
- 229940069096 dodecene Drugs 0.000 description 1
- MOTZDAYCYVMXPC-UHFFFAOYSA-N dodecyl hydrogen sulfate Chemical compound CCCCCCCCCCCCOS(O)(=O)=O MOTZDAYCYVMXPC-UHFFFAOYSA-N 0.000 description 1
- 229940043264 dodecyl sulfate Drugs 0.000 description 1
- LLDIZGVRYGOOLU-UHFFFAOYSA-L dodecyl sulfate;iron(2+) Chemical compound [Fe+2].CCCCCCCCCCCCOS([O-])(=O)=O.CCCCCCCCCCCCOS([O-])(=O)=O LLDIZGVRYGOOLU-UHFFFAOYSA-L 0.000 description 1
- IXMPNXKIVRPCEQ-UHFFFAOYSA-L dodecyl sulfate;nickel(2+) Chemical compound [Ni+2].CCCCCCCCCCCCOS([O-])(=O)=O.CCCCCCCCCCCCOS([O-])(=O)=O IXMPNXKIVRPCEQ-UHFFFAOYSA-L 0.000 description 1
- MHHVJJJZOHAUBH-UHFFFAOYSA-L dodecyl sulfate;platinum(2+) Chemical compound [Pt+2].CCCCCCCCCCCCOS([O-])(=O)=O.CCCCCCCCCCCCOS([O-])(=O)=O MHHVJJJZOHAUBH-UHFFFAOYSA-L 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000002296 dynamic light scattering Methods 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- DJYALRJDNXBDCR-UHFFFAOYSA-M ethane;iodozinc(1+) Chemical compound [CH2-]C.I[Zn+] DJYALRJDNXBDCR-UHFFFAOYSA-M 0.000 description 1
- ZOOODBUHSVUZEM-UHFFFAOYSA-N ethoxymethanedithioic acid Chemical compound CCOC(S)=S ZOOODBUHSVUZEM-UHFFFAOYSA-N 0.000 description 1
- NARCMUVKZHPJHP-UHFFFAOYSA-L ethyl(diiodo)alumane Chemical compound [I-].[I-].CC[Al+2] NARCMUVKZHPJHP-UHFFFAOYSA-L 0.000 description 1
- GKTLYDPRULCMKW-UHFFFAOYSA-L ethyl(diiodo)bismuthane Chemical compound CC[Bi](I)I GKTLYDPRULCMKW-UHFFFAOYSA-L 0.000 description 1
- ODGBGXYHMPZPHN-UHFFFAOYSA-L ethyl(diiodo)stibane Chemical compound C(C)[Sb](I)I ODGBGXYHMPZPHN-UHFFFAOYSA-L 0.000 description 1
- JFICPAADTOQAMU-UHFFFAOYSA-L ethylaluminum(2+);dibromide Chemical compound CC[Al](Br)Br JFICPAADTOQAMU-UHFFFAOYSA-L 0.000 description 1
- UAIZDWNSWGTKFZ-UHFFFAOYSA-L ethylaluminum(2+);dichloride Chemical compound CC[Al](Cl)Cl UAIZDWNSWGTKFZ-UHFFFAOYSA-L 0.000 description 1
- HJUFTIJOISQSKQ-UHFFFAOYSA-N fenoxycarb Chemical compound C1=CC(OCCNC(=O)OCC)=CC=C1OC1=CC=CC=C1 HJUFTIJOISQSKQ-UHFFFAOYSA-N 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- UPWPDUACHOATKO-UHFFFAOYSA-K gallium trichloride Chemical compound Cl[Ga](Cl)Cl UPWPDUACHOATKO-UHFFFAOYSA-K 0.000 description 1
- CULSIAXQVSZNSV-UHFFFAOYSA-N germanium(4+) Chemical compound [Ge+4] CULSIAXQVSZNSV-UHFFFAOYSA-N 0.000 description 1
- 150000002334 glycols Chemical class 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910021505 gold(III) hydroxide Inorganic materials 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910021436 group 13–16 element Inorganic materials 0.000 description 1
- IPCSVZSSVZVIGE-UHFFFAOYSA-M hexadecanoate Chemical compound CCCCCCCCCCCCCCCC([O-])=O IPCSVZSSVZVIGE-UHFFFAOYSA-M 0.000 description 1
- GIFIIAHOGINLJV-UHFFFAOYSA-K hexadecanoate;iron(3+) Chemical compound [Fe+3].CCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCC([O-])=O GIFIIAHOGINLJV-UHFFFAOYSA-K 0.000 description 1
- LXHKZDOLHOQBTR-UHFFFAOYSA-L hexadecanoate;nickel(2+) Chemical compound [Ni+2].CCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCC([O-])=O LXHKZDOLHOQBTR-UHFFFAOYSA-L 0.000 description 1
- PHGQUBXWJYVCPS-UHFFFAOYSA-L hexadecanoate;platinum(2+) Chemical compound [Pt+2].CCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCC([O-])=O PHGQUBXWJYVCPS-UHFFFAOYSA-L 0.000 description 1
- 150000004677 hydrates Chemical class 0.000 description 1
- FLTNAARZMRHWHG-UHFFFAOYSA-N hydrobromide dihydrochloride Chemical compound Cl.Cl.Br FLTNAARZMRHWHG-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910000042 hydrogen bromide Inorganic materials 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 1
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 1
- 229910000043 hydrogen iodide Inorganic materials 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 1
- TXYCBWIERJQWGL-UHFFFAOYSA-K indium(3+) dichloride iodide Chemical compound [I-].[Cl-].[Cl-].[In+3] TXYCBWIERJQWGL-UHFFFAOYSA-K 0.000 description 1
- FFSAMSOGQOPVML-UHFFFAOYSA-L indium(3+);dichloride Chemical compound [Cl-].[Cl-].[In+3] FFSAMSOGQOPVML-UHFFFAOYSA-L 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 239000002608 ionic liquid Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 description 1
- NMCUIPGRVMDVDB-UHFFFAOYSA-L iron dichloride Chemical compound Cl[Fe]Cl NMCUIPGRVMDVDB-UHFFFAOYSA-L 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- BZZORYDPNKSSOZ-UHFFFAOYSA-L iron(2+);dicarbamodithioate Chemical compound [Fe+2].NC([S-])=S.NC([S-])=S BZZORYDPNKSSOZ-UHFFFAOYSA-L 0.000 description 1
- MVFCKEFYUDZOCX-UHFFFAOYSA-N iron(2+);dinitrate Chemical compound [Fe+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O MVFCKEFYUDZOCX-UHFFFAOYSA-N 0.000 description 1
- AQBLLJNPHDIAPN-LNTINUHCSA-K iron(3+);(z)-4-oxopent-2-en-2-olate Chemical compound [Fe+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O AQBLLJNPHDIAPN-LNTINUHCSA-K 0.000 description 1
- PVFSDGKDKFSOTB-UHFFFAOYSA-K iron(3+);triacetate Chemical compound [Fe+3].CC([O-])=O.CC([O-])=O.CC([O-])=O PVFSDGKDKFSOTB-UHFFFAOYSA-K 0.000 description 1
- HEJPGFRXUXOTGM-UHFFFAOYSA-K iron(3+);triiodide Chemical compound [Fe+3].[I-].[I-].[I-] HEJPGFRXUXOTGM-UHFFFAOYSA-K 0.000 description 1
- TUXQDUONHPXHBR-UHFFFAOYSA-N iron;pyridine Chemical compound [Fe].C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1.C1=CC=NC=C1 TUXQDUONHPXHBR-UHFFFAOYSA-N 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- 150000002540 isothiocyanates Chemical class 0.000 description 1
- 238000010667 large scale reaction Methods 0.000 description 1
- 239000003446 ligand Substances 0.000 description 1
- BLQJIBCZHWBKSL-UHFFFAOYSA-L magnesium iodide Chemical compound [Mg+2].[I-].[I-] BLQJIBCZHWBKSL-UHFFFAOYSA-L 0.000 description 1
- 229910001641 magnesium iodide Inorganic materials 0.000 description 1
- KJJBSBKRXUVBMX-UHFFFAOYSA-N magnesium;butane Chemical compound [Mg+2].CCC[CH2-].CCC[CH2-] KJJBSBKRXUVBMX-UHFFFAOYSA-N 0.000 description 1
- NXPHGHWWQRMDIA-UHFFFAOYSA-M magnesium;carbanide;bromide Chemical compound [CH3-].[Mg+2].[Br-] NXPHGHWWQRMDIA-UHFFFAOYSA-M 0.000 description 1
- CCERQOYLJJULMD-UHFFFAOYSA-M magnesium;carbanide;chloride Chemical compound [CH3-].[Mg+2].[Cl-] CCERQOYLJJULMD-UHFFFAOYSA-M 0.000 description 1
- VXWPONVCMVLXBW-UHFFFAOYSA-M magnesium;carbanide;iodide Chemical compound [CH3-].[Mg+2].[I-] VXWPONVCMVLXBW-UHFFFAOYSA-M 0.000 description 1
- DLPASUVGCQPFFO-UHFFFAOYSA-N magnesium;ethane Chemical compound [Mg+2].[CH2-]C.[CH2-]C DLPASUVGCQPFFO-UHFFFAOYSA-N 0.000 description 1
- GWGVDNZFTPIGDY-UHFFFAOYSA-M magnesium;ethyne;chloride Chemical compound [Mg+2].[Cl-].[C-]#C GWGVDNZFTPIGDY-UHFFFAOYSA-M 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- ZKBPKAMYOFLNMN-UHFFFAOYSA-L manganese(3+) diiodide Chemical compound [Mn+3].[I-].[I-] ZKBPKAMYOFLNMN-UHFFFAOYSA-L 0.000 description 1
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- BRMYZIKAHFEUFJ-UHFFFAOYSA-L mercury diacetate Chemical compound CC(=O)O[Hg]OC(C)=O BRMYZIKAHFEUFJ-UHFFFAOYSA-L 0.000 description 1
- NGYIMTKLQULBOO-UHFFFAOYSA-L mercury dibromide Chemical compound Br[Hg]Br NGYIMTKLQULBOO-UHFFFAOYSA-L 0.000 description 1
- 239000002082 metal nanoparticle Substances 0.000 description 1
- YSTQWZZQKCCBAY-UHFFFAOYSA-L methylaluminum(2+);dichloride Chemical compound C[Al](Cl)Cl YSTQWZZQKCCBAY-UHFFFAOYSA-L 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 238000007144 microwave assisted synthesis reaction Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052961 molybdenite Inorganic materials 0.000 description 1
- CWQXQMHSOZUFJS-UHFFFAOYSA-N molybdenum disulfide Chemical compound S=[Mo]=S CWQXQMHSOZUFJS-UHFFFAOYSA-N 0.000 description 1
- 229910052982 molybdenum disulfide Inorganic materials 0.000 description 1
- OYMJNIHGVDEDFX-UHFFFAOYSA-J molybdenum tetrachloride Chemical compound Cl[Mo](Cl)(Cl)Cl OYMJNIHGVDEDFX-UHFFFAOYSA-J 0.000 description 1
- QKKCMWPOASMDQR-UHFFFAOYSA-J molybdenum(4+);tetraiodide Chemical compound I[Mo](I)(I)I QKKCMWPOASMDQR-UHFFFAOYSA-J 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- LIKMAJRDDDTEIG-UHFFFAOYSA-N n-hexene Natural products CCCCC=C LIKMAJRDDDTEIG-UHFFFAOYSA-N 0.000 description 1
- 239000002159 nanocrystal Substances 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 238000001956 neutron scattering Methods 0.000 description 1
- BMGNSKKZFQMGDH-FDGPNNRMSA-L nickel(2+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ni+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O BMGNSKKZFQMGDH-FDGPNNRMSA-L 0.000 description 1
- BQHTWZRFOSRCCH-UHFFFAOYSA-L nickel(2+);dicarbamodithioate Chemical compound [Ni+2].NC([S-])=S.NC([S-])=S BQHTWZRFOSRCCH-UHFFFAOYSA-L 0.000 description 1
- AIYYMMQIMJOTBM-UHFFFAOYSA-L nickel(ii) acetate Chemical compound [Ni+2].CC([O-])=O.CC([O-])=O AIYYMMQIMJOTBM-UHFFFAOYSA-L 0.000 description 1
- 125000005245 nitryl group Chemical group [N+](=O)([O-])* 0.000 description 1
- 239000012454 non-polar solvent Substances 0.000 description 1
- 229940038384 octadecane Drugs 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229910052958 orpiment Inorganic materials 0.000 description 1
- MPQXHAGKBWFSNV-UHFFFAOYSA-N oxidophosphanium Chemical class [PH3]=O MPQXHAGKBWFSNV-UHFFFAOYSA-N 0.000 description 1
- LXNAVEXFUKBNMK-UHFFFAOYSA-N palladium(II) acetate Substances [Pd].CC(O)=O.CC(O)=O LXNAVEXFUKBNMK-UHFFFAOYSA-N 0.000 description 1
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 1
- YJVFFLUZDVXJQI-UHFFFAOYSA-L palladium(ii) acetate Chemical compound [Pd+2].CC([O-])=O.CC([O-])=O YJVFFLUZDVXJQI-UHFFFAOYSA-L 0.000 description 1
- JKDRQYIYVJVOPF-FDGPNNRMSA-L palladium(ii) acetylacetonate Chemical compound [Pd+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O JKDRQYIYVJVOPF-FDGPNNRMSA-L 0.000 description 1
- INIOZDBICVTGEO-UHFFFAOYSA-L palladium(ii) bromide Chemical compound Br[Pd]Br INIOZDBICVTGEO-UHFFFAOYSA-L 0.000 description 1
- HNNUTDROYPGBMR-UHFFFAOYSA-L palladium(ii) iodide Chemical compound [Pd+2].[I-].[I-] HNNUTDROYPGBMR-UHFFFAOYSA-L 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- NMHMNPHRMNGLLB-UHFFFAOYSA-N phloretic acid Chemical compound OC(=O)CCC1=CC=C(O)C=C1 NMHMNPHRMNGLLB-UHFFFAOYSA-N 0.000 description 1
- 150000003003 phosphines Chemical class 0.000 description 1
- 238000000628 photoluminescence spectroscopy Methods 0.000 description 1
- CLSUSRZJUQMOHH-UHFFFAOYSA-L platinum dichloride Chemical compound Cl[Pt]Cl CLSUSRZJUQMOHH-UHFFFAOYSA-L 0.000 description 1
- QCSGLAMXZCLSJW-UHFFFAOYSA-L platinum(2+);diacetate Chemical compound [Pt+2].CC([O-])=O.CC([O-])=O QCSGLAMXZCLSJW-UHFFFAOYSA-L 0.000 description 1
- KGRJUMGAEQQVFK-UHFFFAOYSA-L platinum(2+);dibromide Chemical compound Br[Pt]Br KGRJUMGAEQQVFK-UHFFFAOYSA-L 0.000 description 1
- JJUSNMQWUXAGAD-UHFFFAOYSA-L platinum(2+);dicarbamodithioate Chemical compound [Pt+2].NC([S-])=S.NC([S-])=S JJUSNMQWUXAGAD-UHFFFAOYSA-L 0.000 description 1
- ZXDJCKVQKCNWEI-UHFFFAOYSA-L platinum(2+);diiodide Chemical compound [I-].[I-].[Pt+2] ZXDJCKVQKCNWEI-UHFFFAOYSA-L 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 239000005297 pyrex Substances 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000005070 ripening Effects 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- CQLFBEKRDQMJLZ-UHFFFAOYSA-M silver acetate Chemical compound [Ag+].CC([O-])=O CQLFBEKRDQMJLZ-UHFFFAOYSA-M 0.000 description 1
- MSFPLIAKTHOCQP-UHFFFAOYSA-M silver iodide Chemical compound I[Ag] MSFPLIAKTHOCQP-UHFFFAOYSA-M 0.000 description 1
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 1
- YPNVIBVEFVRZPJ-UHFFFAOYSA-L silver sulfate Chemical compound [Ag+].[Ag+].[O-]S([O-])(=O)=O YPNVIBVEFVRZPJ-UHFFFAOYSA-L 0.000 description 1
- 229910000367 silver sulfate Inorganic materials 0.000 description 1
- FSJWWSXPIWGYKC-UHFFFAOYSA-M silver;silver;sulfanide Chemical compound [SH-].[Ag].[Ag+] FSJWWSXPIWGYKC-UHFFFAOYSA-M 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 229910052959 stibnite Inorganic materials 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- WGPCGCOKHWGKJJ-UHFFFAOYSA-N sulfanylidenezinc Chemical group [Zn]=S WGPCGCOKHWGKJJ-UHFFFAOYSA-N 0.000 description 1
- 150000003462 sulfoxides Chemical class 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- MISXNQITXACHNJ-UHFFFAOYSA-I tantalum(5+);pentaiodide Chemical compound [I-].[I-].[I-].[I-].[I-].[Ta+5] MISXNQITXACHNJ-UHFFFAOYSA-I 0.000 description 1
- GCPVYIPZZUPXPB-UHFFFAOYSA-I tantalum(v) bromide Chemical compound Br[Ta](Br)(Br)(Br)Br GCPVYIPZZUPXPB-UHFFFAOYSA-I 0.000 description 1
- OEIMLTQPLAGXMX-UHFFFAOYSA-I tantalum(v) chloride Chemical compound Cl[Ta](Cl)(Cl)(Cl)Cl OEIMLTQPLAGXMX-UHFFFAOYSA-I 0.000 description 1
- OCGWQDWYSQAFTO-UHFFFAOYSA-N tellanylidenelead Chemical compound [Pb]=[Te] OCGWQDWYSQAFTO-UHFFFAOYSA-N 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- WWJBJTBTXOHQAZ-UHFFFAOYSA-J tetrabromomolybdenum Chemical compound Br[Mo](Br)(Br)Br WWJBJTBTXOHQAZ-UHFFFAOYSA-J 0.000 description 1
- YXPHMGGSLJFAPL-UHFFFAOYSA-J tetrabromotungsten Chemical compound Br[W](Br)(Br)Br YXPHMGGSLJFAPL-UHFFFAOYSA-J 0.000 description 1
- BIEFSHWAGDHEIT-UHFFFAOYSA-J tetrabromovanadium Chemical compound [V+4].[Br-].[Br-].[Br-].[Br-] BIEFSHWAGDHEIT-UHFFFAOYSA-J 0.000 description 1
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 1
- YOUIDGQAIILFBW-UHFFFAOYSA-J tetrachlorotungsten Chemical compound Cl[W](Cl)(Cl)Cl YOUIDGQAIILFBW-UHFFFAOYSA-J 0.000 description 1
- CUDGTZJYMWAJFV-UHFFFAOYSA-N tetraiodogermane Chemical compound I[Ge](I)(I)I CUDGTZJYMWAJFV-UHFFFAOYSA-N 0.000 description 1
- MMCXETIAXNXKPE-UHFFFAOYSA-J tetraiodotungsten Chemical compound I[W](I)(I)I MMCXETIAXNXKPE-UHFFFAOYSA-J 0.000 description 1
- JYHZWKLCYKMFOD-UHFFFAOYSA-J tetraiodovanadium Chemical compound [V+4].[I-].[I-].[I-].[I-] JYHZWKLCYKMFOD-UHFFFAOYSA-J 0.000 description 1
- GBECUEIQVRDUKB-UHFFFAOYSA-M thallium monochloride Chemical compound [Tl]Cl GBECUEIQVRDUKB-UHFFFAOYSA-M 0.000 description 1
- SYRHIZPPCHMRIT-UHFFFAOYSA-N tin(4+) Chemical compound [Sn+4] SYRHIZPPCHMRIT-UHFFFAOYSA-N 0.000 description 1
- UBZYKBZMAMTNKW-UHFFFAOYSA-J titanium tetrabromide Chemical compound Br[Ti](Br)(Br)Br UBZYKBZMAMTNKW-UHFFFAOYSA-J 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
- NLLZTRMHNHVXJJ-UHFFFAOYSA-J titanium tetraiodide Chemical compound I[Ti](I)(I)I NLLZTRMHNHVXJJ-UHFFFAOYSA-J 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- JKNHZOAONLKYQL-UHFFFAOYSA-K tribromoindigane Chemical compound Br[In](Br)Br JKNHZOAONLKYQL-UHFFFAOYSA-K 0.000 description 1
- FEONEKOZSGPOFN-UHFFFAOYSA-K tribromoiron Chemical compound Br[Fe](Br)Br FEONEKOZSGPOFN-UHFFFAOYSA-K 0.000 description 1
- SQBBHCOIQXKPHL-UHFFFAOYSA-N tributylalumane Chemical compound CCCC[Al](CCCC)CCCC SQBBHCOIQXKPHL-UHFFFAOYSA-N 0.000 description 1
- MTWZZHCSSCNQBI-UHFFFAOYSA-N tributylbismuthane Chemical compound CCCC[Bi](CCCC)CCCC MTWZZHCSSCNQBI-UHFFFAOYSA-N 0.000 description 1
- QIVLHVRZYONPSZ-UHFFFAOYSA-N tributylindigane Chemical compound CCCC[In](CCCC)CCCC QIVLHVRZYONPSZ-UHFFFAOYSA-N 0.000 description 1
- BXJWDOYMROEHEN-UHFFFAOYSA-N tributylstibane Chemical compound CCCC[Sb](CCCC)CCCC BXJWDOYMROEHEN-UHFFFAOYSA-N 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- VOITXYVAKOUIBA-UHFFFAOYSA-N triethylaluminium Chemical compound CC[Al](CC)CC VOITXYVAKOUIBA-UHFFFAOYSA-N 0.000 description 1
- FPYOWXFLVWSKPS-UHFFFAOYSA-N triethylbismuthane Chemical compound CC[Bi](CC)CC FPYOWXFLVWSKPS-UHFFFAOYSA-N 0.000 description 1
- OTRPZROOJRIMKW-UHFFFAOYSA-N triethylindigane Chemical compound CC[In](CC)CC OTRPZROOJRIMKW-UHFFFAOYSA-N 0.000 description 1
- KKOFCVMVBJXDFP-UHFFFAOYSA-N triethylstibane Chemical compound CC[Sb](CC)CC KKOFCVMVBJXDFP-UHFFFAOYSA-N 0.000 description 1
- ORYGRKHDLWYTKX-UHFFFAOYSA-N trihexylalumane Chemical compound CCCCCC[Al](CCCCCC)CCCCCC ORYGRKHDLWYTKX-UHFFFAOYSA-N 0.000 description 1
- WRTMQOHKMFDUKX-UHFFFAOYSA-N triiodide Chemical compound I[I-]I WRTMQOHKMFDUKX-UHFFFAOYSA-N 0.000 description 1
- KOECRLKKXSXCPB-UHFFFAOYSA-K triiodobismuthane Chemical compound I[Bi](I)I KOECRLKKXSXCPB-UHFFFAOYSA-K 0.000 description 1
- AYDYYQHYLJDCDQ-UHFFFAOYSA-N trimethylbismuthane Chemical compound C[Bi](C)C AYDYYQHYLJDCDQ-UHFFFAOYSA-N 0.000 description 1
- WXRGABKACDFXMG-UHFFFAOYSA-N trimethylborane Chemical compound CB(C)C WXRGABKACDFXMG-UHFFFAOYSA-N 0.000 description 1
- PORFVJURJXKREL-UHFFFAOYSA-N trimethylstibine Chemical compound C[Sb](C)C PORFVJURJXKREL-UHFFFAOYSA-N 0.000 description 1
- LFXVBWRMVZPLFK-UHFFFAOYSA-N trioctylalumane Chemical compound CCCCCCCC[Al](CCCCCCCC)CCCCCCCC LFXVBWRMVZPLFK-UHFFFAOYSA-N 0.000 description 1
- ZMPKTELQGVLZTD-UHFFFAOYSA-N tripropylborane Chemical compound CCCB(CCC)CCC ZMPKTELQGVLZTD-UHFFFAOYSA-N 0.000 description 1
- OFQPGOWZSZOUIV-UHFFFAOYSA-N tris(trimethylsilyl)arsane Chemical compound C[Si](C)(C)[As]([Si](C)(C)C)[Si](C)(C)C OFQPGOWZSZOUIV-UHFFFAOYSA-N 0.000 description 1
- JTJFQBNJBPPZRI-UHFFFAOYSA-J vanadium tetrachloride Chemical compound Cl[V](Cl)(Cl)Cl JTJFQBNJBPPZRI-UHFFFAOYSA-J 0.000 description 1
- WSJLOGNSKRVGAD-UHFFFAOYSA-L vanadium(ii) bromide Chemical compound [V+2].[Br-].[Br-] WSJLOGNSKRVGAD-UHFFFAOYSA-L 0.000 description 1
- ITAKKORXEUJTBC-UHFFFAOYSA-L vanadium(ii) chloride Chemical compound Cl[V]Cl ITAKKORXEUJTBC-UHFFFAOYSA-L 0.000 description 1
- 239000004246 zinc acetate Substances 0.000 description 1
- 229940102001 zinc bromide Drugs 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- ABIAVOPWHAWUGT-UHFFFAOYSA-N zinc;2-methanidylpropane Chemical compound [Zn+2].CC(C)[CH2-].CC(C)[CH2-] ABIAVOPWHAWUGT-UHFFFAOYSA-N 0.000 description 1
- HEPBQSXQJMTVFI-UHFFFAOYSA-N zinc;butane Chemical compound [Zn+2].CCC[CH2-].CCC[CH2-] HEPBQSXQJMTVFI-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B6/00—Heating by electric, magnetic or electromagnetic fields
- H05B6/64—Heating using microwaves
- H05B6/80—Apparatus for specific applications
- H05B6/806—Apparatus for specific applications for laboratory use
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J13/00—Colloid chemistry, e.g. the production of colloidal materials or their solutions, not otherwise provided for; Making microcapsules or microballoons
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J19/12—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
- B01J19/122—Incoherent waves
- B01J19/126—Microwaves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/00002—Chemical plants
- B01J2219/00042—Features relating to reactants and process fluids
- B01J2219/00047—Ionic liquids
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J2219/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J2219/0871—Heating or cooling of the reactor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
Definitions
- the invention is related to chemical synthesis of nanoparticles, and more particularly, to the large-scale, safe, convenient, reproducible, energy-conserving synthesis of highly-dispersive inorganic nanoparticles with narrow size distribution.
- the general synthetic approach for preparation of colloidal semiconductor nanoparticles employs a bulky reaction flask under continuous Ar flow with a heating mantle operating in excess of 240° C.
- the reaction is initiated by rapid injection of the precursors, which are the source materials for the nanoparticles, at high temperatures and growth is controlled by the addition of a strongly coordinating ligand to control kinetics.
- domestic microwave ovens have been used to synthesize nanoparticles.
- the present invention describes methods of chemical synthesis of nanoparticles, such as quantum dots, comprising a high temperature ramp process, warranting large-scale, safe, convenient, reproducible, and energy-efficient production.
- inorganic nanoparticles are synthesized by a scheme that comprises heating of the reaction system. It has been found that the above mentioned limitation can be overcome by including a heating process with high ramping rate. Hence, the critical issues that distinguish the present invention are:
- FIG. 1 is a graph that illustrates the absorption and photoluminescence for 4.5 nm and 5.5 nm CdSe;
- FIG. 2 is a graph that illustrates the absorption and photoluminescence for 4.6 nm CdSe
- FIGS. 3A and 3B are graphs that illustrate the absorption and photoluminescence of InGaP nanocrystals synthesized with hexadecene (HDE) and octadecene as the non-coordinating solvents;
- FIG. 4 is a graph that illustrates the absorption and photoluminescence of InGaP showing the dependence of crystallinity on power
- FIG. 5 is a flowchart that illustrates the processing steps used in the preferred embodiment of the present invention.
- FIG. 6 is an illustration of the processing steps used in the preferred embodiment of the present invention.
- nanoparticles are synthesized by heating the reaction system from room temperature to elevated temperatures.
- the reaction system herein is a closed system that consists of materials that are necessary for the synthetic reaction. Each of these materials will hereafter be called a constituent element.
- the sole constituent element is the precursor.
- the constituent elements are solvent and precursor.
- the solvent can be a mixture of plural solvents, and also the precursor can be a mixture of plural precursors. These elements can either be dispersed homogeneously or inhomogeneously.
- the constituent elements of the reaction system are mixed at or near room temperature and heated for nanoparticle synthesis.
- near room temperature is below 100° C.
- the temperature of the reaction system is typically monitored by devices such as thermometer, pyrometer, or thermocouples.
- the reaction described in the present invention comprise one or more of each of the (1) heating at a high heating rate, (2) stabilization at elevated temperature, and (3) cooling at a high cooling rate.
- heating of the reaction system is performed by microwave irradiation.
- the heating of the reaction system can either be achieved by sole use of microwave or with the aid of other heat sources such as oil-bath, mantle-heater, or burners.
- the frequency of the microwave is typically 2.45 GHz but not limited. Use of focused microwave is preferred over unfocused, and single-mode is preferred over multimode for efficient heating.
- Ramping the temperature of the reaction system up is done solely by microwave irradiation or microwave irradiation with the use of additional heat sources, during which the heating rate can be controlled by the input power of the microwave by a continuous or pulsed power supply.
- the average heating rate during each process of the synthesis is defined as: (Temperature at the end of heating(° C.) ⁇ Temperature at the beginning of heating(° C.))/(Duration of heating (min))
- the synthetic scheme described in the present invention comprises one or more stages of high heating rate.
- high heating rate refers to a rate of 30° C./min or higher, more preferably 32° C./min or higher, most favorably 34° C./min or higher.
- average heating rate is below 30° C./min, synthesis may result in nanoparticulate materials with unfavorable properties such as lower dispersibility or wider size distribution.
- stable temperature refers to processes in which the temperature change is 5° C./min or less.
- Cool-down of the reaction system can be achieved by removing heat from the system by standard means such as air, water, ice, oil or cryogenic gas. Microwave irradiation with or without other heat sources can be used to control this cool-down process.
- the average cooling rate of each cool-down process is defined as: (Temperature at the beginning of cooling(° C.) ⁇ Temperature at the end of cooling(° C.))/(Duration of cooling (min))
- the synthetic scheme described in the present invention comprises one or more stages of high cooling rate.
- high cooling rate refers to a rate of 80° C./min or higher, more preferably 85° C./min or higher, most favorably 90° C./min or higher.
- this high rate cooling process may be referred to as quenching.
- the simplest embodiment of the present invention for synthesizing nanoparticles comprise of three stages that are high-rate heating, temperature stabilization, and high-rate cooling.
- additives can be intentionally introduced to the system as a constituent element.
- the additives can either be dispersed homogeneously or inhomogeneously in the reaction system.
- the additives can be present in the reaction system from the beginning of the process or can be introduced during the course of the reaction. Examples of such additives are: graphite, silicon carbide, glycols, ionic liquids, tetrabutylammonium bromide and cholesterols.
- the reaction system comprises one or more constituent elements.
- the main constituent element is the element with the largest molar equivalent.
- the dielectric constant of the main constituent element is 20 or less, preferably 18 or less, more preferably 16 or less, and most preferably 14 or less. If the dielectric constant is over 20, it may result in loss of stability of the precursors in the system due to the exceedingly high polarity of the main constituent element. Additives can be introduced into the system before or during the course of reaction as long as their amounts are less than the main constituent element in molar equivalent.
- the nanoparticles synthesized by the method described in the present invention comprise mainly inorganic materials, and their diameters are on the order of nanometers (nm).
- the main crystal may be single crystal, polycrystal, alloys with or without phase separation due to stoichiometric variations, or core-shell structures that will be described later.
- the average diameter of such crystals are 0.5 ⁇ 100 nm, preferably 1 ⁇ 20nm in order to warrant dispersibility, more preferably 2 ⁇ 12nm, most preferably 2 ⁇ 10nm.
- Such diameters can be determined through characterization by transmission electron microscopy (TEM).
- micrographs cannot be obtained with sufficient contrast to make such determination of the diameter, for instance when the constituent atoms are those of low atomic numbers, techniques such as matrix assisted laser desorption ionization spectroscopy, atomic force microscopy (AFM), or for colloidal solutions, dynamic light scattering or neutron scattering can often be used instead.
- FAM atomic force microscopy
- the standard deviation is ⁇ 20%, preferably ⁇ 15%, more preferably ⁇ 10%, and most preferably ⁇ 5%.
- the nanoparticles will often not exhibit their desired physical and chemical properties to their best performance.
- Methods that are typically used to characterize the crystallinity of the nanoparticles are dark field transmission electron microscopy which is used to look for glide plane defects and/or twinning. Powder x-ray diffraction, which reveals the approximate diameters and shapes of the crystallites through peak intensities and scherrer broadening of the reflection peaks.
- z-contrast transmission electron microscopy is used to image the dopant ion in nanoparticle alloys.
- the crystals that form the main body of the nanoparticles of the present invention can be the so-called core-shell structure in which the crystals comprise inner-core and outer-shell for modification of their physical and chemical properties.
- Such shells are preferably metal, semiconductor, or insulator.
- III-V compound semiconductors such as BN, BAs, or GaN
- II-VI compound semiconductors such as ZnO, ZnS, ZnSe, CdS
- compounds of Group 12 and Group 16 elements such as MgS, or MgSe.
- minute amounts of additives can be intentionally doped for modification of the physical and chemical properties of the nanoparticles.
- doping materials are Al, Mn, Cu, Zn, Ag, Cl, Ce, Eu, Th, Er, or Tm.
- the nanoparticles synthesized by the method described in the present invention can have organic compounds attached to their surface.
- the attachment of organic compounds to the surface is defined as the state in which the organic compound is chemically bonded to the surface. While there is no limitation in the form of bonding between the organic compound and the nanoparticle surface, examples are coordination bond, covalent bond, relatively strong bonds such as ionic bond, or through relatively weak interaction such as van der Waals force, hydrogen bond, hydrophobic-hydrophobic interaction, or entanglement of molecular chains.
- the organic compounds can be a single species or a mixture of two or more.
- organic compounds consist of the following coordinating functional groups that form bonds to the nanoparticle surface.
- coordinating functional groups that comprise Group 15 or Group 16 elements constitute the above mentioned organic compounds.
- functional groups are, primary amines, secondary amines, tertiary amines, radicals containing nitrogen multiple bonds, such as nitryl, or isocyanate, nitrogen containing radicals such as nitric aromatics, such as pyridine or triazine, functional groups containing Group 15 element such as phosphorus containing radicals, such as primary phosphine, secondary phosphine, tertiary phosphine, primary phosphine oxide, secondary phosphine oxide, tertiary phosphine oxide, primary phosphine selenide, secondary phosphine selenide, tertiary phosphine selenide, or phosphonic acid, oxygen containing radicals, such as hydroxyl, ether,
- functional groups containing nitrogen such as pyridine rings
- functional groups containing Group 15 elements such as phosphorus, such as primary amine, tertiary phosphine, tertiary phosphine oxide, tertiary phosphine selenide, or phosphonic acid
- functional groups containing oxygen such as hydroxyl, ether, or carboxyl
- functional groups containing Group 16 elements such as sulfur, such as thiol or methylsulfide, are used preferably.
- trialkylphosphines trialkylphosphine oxides, alkane sulfonic acids, alkane phosphonic acids, alkyl amines, dialkylsulfoxides, dialkylether, and alkylcarboxyl acids are such examples.
- the amount of organic compounds present at the surface depends on the kind of nanoparticles and their surface area, such as their size, after proper separation, among the total weight of the nanoparticles and the organic compounds, is typically 1 to 90% of the weight, and for chemical stability and in order to disperse them into organic matrices such as solvents or resin binders that are practically important preferably. 5 ⁇ 80%, more preferably, 10 ⁇ 70%, and most preferably 15 ⁇ 60%.
- the above mentioned organic composition can be determined, for example, by the various elemental analyses or thermogravimetric analysis (TGA).
- TGA thermogravimetric analysis
- information regarding the chemical species and environment can be obtained by infrared (IR) spectroscopy or nuclear magnetic resonance (NMR).
- cationic materials that can be chosen from elements in Group 2 ⁇ 15 and anionic materials that can be chosen from elements in Group 15 ⁇ 17 can be used as precursors.
- they may be mixed prior to the synthetic reaction or may be separately introduced into the reaction system.
- Examples of the precursors for semiconductors that contain cationic elements are, dialkylated compounds of Group 2 elements, such as diethyl magnesium, or di-n-butyl magnesium; alkyl halides of Group 2 elements, such as methyl magnesium chloride, methyl magnesium bromide, methyl magnesium iodide, ethynyl magnesium chloride; dihalides, such as magnesium iodide; halides of Group 4 elements, such as titanium (IV) tetrachloride, titanium (IV) tetrabromide, or titanium (IV) tetraiodide; halides of Group 5 elements, such as vanadium (II) dichloride, vanadium (IV) tetrachloride, vanadium (II) dibromide, vanadium (IV) tetrabromide, vanadium (II) diiodide, vanadium (IV) tetraiodide, tantalum (V) pentachloride, tanta
- halides of Group 14 elements such as germanium (IV) tetrachloride, germanium (IV) tetrabromide, germanium (IV) tetraibdide, tin (II) dichloride, tin (IV) tetrachloride, tin (II) dibromide, tin (IV) tetrabromide, tin (II) diiodide, tin (IV) diiodide, tin (IV) dichloride diiodide, tin (IV) tetraiodide, lead (II) dichloride, lead (II) dibromide, and lead (II) diiodide; or hydrides and/or alkylated compounds of Group 14 elements, such as diphenyl silane, can be used as precursors.
- Group 14 elements such as germanium (IV) tetrachloride, germanium (IV) tetrabromide, germanium
- anionic compounds that can be used as precursors for semiconductors are, elements of Groups 15 ⁇ 17, such as N, P, As, Sb, Bi, O, S, Se, Te, F, Cl, Br, and I; hydrides of Group 15 elements, such as ammonia, phosphine (PH 3 ), arsine (AsH 3 ), and stibine (SbH 3 ); silylated compounds of elements of Group 15 of the periodic table, such as tris(trimethylsilyl) amine, tris(trimethylsilyl) phosphine, and tris(trimethylsilyl) arsine; hydrides of Group 16 elements, such as hydrogen sulfide, hydrogen selenide, and hydrogen telluride; silylated compounds of Group 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide, alkaline metal salts of Group 16 elements, such as sodium sulfide and sodium selenide; trialkylphos
- the preferred materials are, elemental materials in Groups 15 ⁇ 17, such as phosphorus, arsenic, antimony, bismuth, sulfur, selenium, tellurium, and iodine; silylated compounds of Group 15 elements, such as tris(trimethylsilyl) phospine and tri(trimethylsilyl) arsine; hydrides of Group 16 elements, such as hydrogen sulfide, hydrogen selenide and hydrogen telluride; silylated compounds of Group 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide; alkaline metal salts of Group 16 elements, such as sodium sulfide and sodium selenide; trialkylphosphine chalcogenides such as, tributylphosphine sulfide, trihexylphosphine sulfide, trioctylphosphine sul
- more preferably used materials are, elemental materials in Groups 15 and 16, such as phosphorus, arsenic, antimony, sulfur, and selenium; silylated compounds of Group 15 elements, such as tris(trimethylsilyl) phospine and tri(trimethylsilyl) arsine; silylated compounds of Group 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide; alkaline metal salts of Group 16 elements, such as sodium sulfide and sodium selenide; trialkylphosphine chalcogenides such as, tributylphosphine sulfide, trioctylphosphine sulfide, tributylphosphine selenide, and trioctylphosphine selenide; etc.
- elemental materials in Groups 15 and 16 such as phosphorus, arsenic, antimony, sulfur, and selenium
- Examples of precursors for metal nanoparticles for group 4 through 13 including Au, Ag, Fe, Ni, Co, Pt, Pd, Cu, Hg, In, NiPt, FePt, FeCo are: Gold: auric acid, chlorocarbonyl gold (I, and gold (I) chloride; Silver: silver (I) acetate, silver (I) nitrate, silver (I) chloride, silver (I) bromide, silver (I) iodide, and silver sulfate; Iron (either as II or III oxidation state): iron chloride, iron bromide, iron iodide, iron (0) carbonyl, iron acetate, iron acetyl acetonate, iron hexapyridine, iron hexamine, iron sterate, iron palmitate, iron sulfonate, iron nitrate, iron dithiocarbamate, iron dodecylsulfate, and iron tetrafluroborate; Nickel: nickel (II)
- the solvent effect for nanoparticle formation under dielectric heating is twofold: (1) it provides the matrix for which the reactants form products; and (2) they have the ability to absorb microwaves to intrinsically heat the reaction matrix.
- the matrix effect can be noncoordinating or coordinating in nature. Noncoordinating implies that the solvent does not form bonds to the precursor molecules or intermediate complexes during nanoparticle formation (it usually does not have functional groups). Coordinating implies the solvent forms bonds to the precursor molecules and intermediates during nanoparticle formation.
- Noncoordinating solvents used for nanoparticle formation usually consist of long chain, high boiling alkanes and alkenes such as hexadecane, octadecane, eicosane, 1-hexadecene, 1-octadecene and 1-eicosene.
- Typical coordinating solvents consist of long chain (backbone of 6 to 20 carbons) alkyl amines (primary, secondary and tertiary), carboxylic acids, sulfonic acids phosphonic acids, phosphines and phosphine oxides.
- the ability for a solvent to absorb microwaves is highly dependant on its dipole moment.
- the dipole moment is defined as the product of the distance between two charges and the magnitude of the charge; hence, when a coordinating solvent is used as the solvent, it has a higher propencity of heating the bulk solution faster than a noncoordinating solvent that has a lower dipole moment by definition.
- trioctylphosphineoxide 760° C./min
- 1-aminohexadecane (30° C./min)
- trioctylphosphineoxide converts electric energy to heat more efficiently. Comparing these to the heating rate of tetradecene (12° C./min) shows that the choice of solvents has a substantial influence on the rate at which the heat is transferred to the bulk solution.
- solvent dielectric heating rates for nanoparticle synthesis will depend on several factors: the dielectric constant, the volume of solvent, and its boiling point.
- the heating rates are slow for 5 ml of solvent at 300 W of incident power.
- super-heated noncoordinating technical grade octane plateaus at 147° C. after 15 minutes of heating at 300 W with 10 atm of pressure.
- super-heating octane can reach nanoparicle formation temperatures as high as 250° C. in 6 minutes with 15 atm of pressure with 300 W of incident microwave power.
- the lower boiling point alkanes will have a lower plateau temperature in terms of the maximum sustained temperature at high pressure.
- the higher boiling alkanes can achieve higher temperatures in a shorter period of time when compared to alkanes.
- 5 ml of technical grade tetradecene is dielectrically heated at 300 W, it can reach 250° C. in 13 min.
- Coordinating solvents typically heat faster at lower pressure due to their higher boiling points and functional groups.
- 5 ml of technical grade hexadecylamine can be dielectrically heated at 300 W to 280° C. in 11 minutes with 1 atm of pressure.
- trioctylphosphine oxide can be dielectrically heated to 280° C. in 15 seconds with 1 atm of pressure.
- the duration of nanoparticle reactions have been optimized to 15 minutes at a maximum temperature of 280° C. It is shown that under the influence of microwave radiation, the crystallinity becomes dependant on the power of the radiation in concert with the temperature of the reaction.
- the microwave reactor allows the precursors to be prepared at or near room temperature (RT) and loaded into a reaction vessel prior to its introduction into an RT chamber of the microwave reactor. The reaction vessel is then heated to temperatures between 200° C. and 300° C. with active cooling.
- the microwave reactor operates at 2.45 GHz and can be adapted to a continuous flow or autosampler system. Incorporation of integrated absorption and fluorescent detectors allow the reaction stream to be continuously monitored for applications where high throughput, high volume preparation of colloidal semiconductor nanoparticles is desired.
- the reactants are mixed in a high-pressure reaction vessel and placed in the RT chamber of the microwave reactor.
- the reaction is controlled by a predetermined program that controls and monitors reaction time, temperature, pressure, and microwave power (wattage) in real time. These reaction parameters control material size, purity, crystallinity, and dispersity.
- the synthetic protocol allows reproducible production of materials.
- the isolation and storage of the materials can be done directly inside the high-pressure reaction vessel, thereby eliminating the step of material transfer that potentially exposes the materials to contaminants such as oxygen and water.
- the Teflon liner in the chamber of the microwave reactor was re-designed from typical commercial specifications in order to tolerate high temperatures for extended periods of time.
- the reaction vessel comprises a 5 ml vial with a high-pressure aluminum crimp top with Teflon septa. All glassware was dried prior to use. All reagents were manipulated by standard airless techniques.
- the reactants are placed in a standard round bottom flask (Kirmax, Pyrex or Chemglass) and placed in a RT chamber and irradiated with continuous or pulsed power with dual magnetrons until the desired temperature is reached.
- Increasing the microwave power to 250 Watts for 60 minutes at 230° C. can yield sizes larger than 4.5 nm, e.g., 5.5 nm, as shown in FIG. 1 , wherein traces 10 and 12 represent the absorption and photoluminescence, respectively, of 4.5 nm CdSe synthesized at 230° C. and 230W, while traces 14 and 16 represent the absorption and photoluminescence, respectively, of 5.5 nm CdSe grown at 230° C. and 250W.
- the cation solution was prepared by dissolving 435 mg of cadmium nitrate tetrahydrate in 9.6 ml of trioctylphosphine (TOP). This solution was heated to 100° C. under vacuum for 30 minutes. The reaction mixture was purged with Ar three times and then cooled to room temperature for later use. The anion solution was prepard by mixing 182 mg of 200 mesh Se powder in 2.8 ml TOP The coordinating solvent, trioctyphosphine oxide (TOPO), was degassed under vacuum at 110° C. three times and back filled with Ar over a two hour period.
- TOP trioctylphosphine
- the Cd (0.5 ml) and Se (0.6 ml) were mixed in a teflon sealed reaction vial, and diluted with 3.9 ml molten TOPO (approximately 65° C.) to make a 5 ml solution.
- the reaction vessel was placed in the chamber of the microwave reactor at room temperature. 300 Watts were applied for several seconds, at which time the temperature spiked from 40° C. to 230° C. in 15 seconds. The power was reduced to 40 Watts to stabilize the temperature at 250° C. for 8 minutes. At 8 minutes, the power was turned off and the reaction was quenched. This resulted in a 4.6 nm CdSe nanoparticle, approximated by the excitonic peak position, as shown in FIG. 2 , wherein traces 18 and 20 represent the absorption and photoluminescence, respectively, of CdSe grown from cadmium nitrate and trioctylphosphineselenide. Note that nanoparticle diameter can be tuned by reaction temperature.
- the preparation of the stock precursor solutions was done according to literature methods, such as those in [9].
- a solution of indium acetate and hexadecanoic acid was prepared in hexadecene.
- the mole ratio of In to hexadecanoic acid was adjusted to a 1 to 3.
- the salts were dissolved at 100° C. to make a 15.6 mM solution in In.
- the solution was degassed at this temperature for 1 hour and purged with Ar three times.
- a stock solution of tris(trimethylsilyl) phosphine at 86.1 mM was prepared in dry hexadecene.
- the In and P precursors were mixed at 50° C. in a 10 ml sealed reaction vessel in a 2:1 ratio to make a total volume of 5 ml precursor solution.
- the reaction vessel was irradiated with 300 watts of power until the solution reached a temperature of 280° C. The power was reduced to maintain 280 watts. This temperature and power was maintained for 15 minutes, at which time the reaction was rapidly quenched.
- the stock solution was prepared by a modification of literature methods [9]. Indium III acetate (0.700 mmol), gallium III 2,4-pentanedionate (0.070 mmol) and hexadecanoic acid (2.30 mmol) were mixed with 50 ml either octadecene or hexadecene. The mixture was heated to 160° C. until the solution turned clear. The temperature of the stock solution was reduced to 110° C. under vacuum and purged with Ar three times.
- the cation stock solution was prepared with octadecene and mixed with tris(trimethylsilyl)phosphine in the reaction vessel via syringe at 50° C. with a cation: anion mole ratio of 2:1. 5 ml of the stock solution was placed in a 10 ml sealed reactor vial (CEM). The 2.3 nm quantum dots were prepared in the same fashion, but the stock solution was prepared in hexadecene.
- Reactor temperature and pressures were monitored continuously to ensure safety, with pressures not exceeding 1.7 atm during the course of the reaction.
- the power level of the ramp was 300 watts.
- the hold temperature was 280° C. for 15 min., with a constant power level of 280 watts during the reaction.
- the reaction vessel was rapidly cooled, via a quenching Oswald Ripening process, from 280° C. to 95° C. over a period of 2 min using compressed air.
- the ramp rate to achieve the hold temperature ranged from 4-6 minutes with the more dilute samples taking longer, due to the heating arising from direct dielectric heating of the precursors, rather then the thermal heating of the solvent. Size control for these materials was achieved by controlling the concentration of the constituent elements in the reactant.
- FIG. 3A illustrates the absorption and FIG. 3B illustrates the photoluminescence of InGaP nanoparticles synthesized at 280° C. for 15 minutes at 280 Watts.
- Traces 22 and 26 represent InGaP synthesized with hexadecene (HDE) as the non-coordinating solvent
- traces 24 and 28 represent InGaP synthesized with octadecene as the non-coordinating solvent.
- FIG. 4 illustrates the absorption and photoluminescence of InGaP showing the dependence of crystallinity on power, wherein trace 30 represents the absorption for InGaP and trace 32 represents the photoluminescence for InGaP that were synthesized with a constant power of 230 watts, while trace 34 represents the absorption for InGaP and trace 36 represents the photoluminescence for InGaP that were synthesized at a constant power of 270 watts.
- the defect emission can be attributed to surface vacancies or glide plane defects. It is clear that not only high temperature is important for high quality material, but high power is needed as well.
- the structural characterization of the material exhibits the zinc blende structure of bulk InP.
- FIG. 5 is a flowchart that illustrates the processing steps for synthesizing nanoparticles used in the preferred embodiment of the present invention. These steps are typically performed using a single reaction vessel, continuous flow reactor or stopped flow reactor.
- Block 38 represents the step of preparing one or more constituent elements at or near room temperature, wherein the room temperature is below 100° C.
- a dielectric constant of a main one of the constituent elements is 20 or higher.
- Block 40 represents the step of heating the prepared constituent elements to an elevated temperature using high-rate heating, in order to create a reaction mixture.
- the heating step is performed using microwave irradiation, and the high heating rate comprises a rate of 30° C./min or higher.
- Block 42 represents the step of stabilizing the reaction mixture at the elevated temperature.
- the elevated temperature is greater than 240° C.
- Block 44 represents the step of cooling the stabilized reaction mixture to a reduced temperature using high-rate cooling.
- the high cooling rate comprises a rate of 125° C./min or higher.
- FIG. 6 is an illustration of the processing steps for synthesizing nanoparticles used in the preferred embodiment of the present invention.
- the reactor 46 typically comprises a single reaction vessel, continuous flow reactor or stopped flow reactor.
- the reactant 48 includes the consituent elements, such as one or more precursors 50 and 52 that contain elements that turn into nanoparticles, passivants 54 , and/or solvents 56 .
- Arrow 58 represents the heating/cooling process that creates the nanoparticles 60 .
- colloidal nanoparticles can be rapidly synthesized under high power microwave radiation to provide industrial scalability with no sacrifice to structural integrity or optical quality.
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Abstract
Description
- 1. Field of the Invention
- The invention is related to chemical synthesis of nanoparticles, and more particularly, to the large-scale, safe, convenient, reproducible, energy-conserving synthesis of highly-dispersive inorganic nanoparticles with narrow size distribution.
- 2. Description of the Related Art
- (Note: This application references a number of different publications as indicated throughout the specification by one or more reference numbers within brackets, e.g., [x]. A list of these different publications ordered according to these reference numbers can be found below in the section entitled “References.” Each of these publications is incorporated by reference herein.)
- Over the past decade, numerous advances have been made in the synthetic procedures for formation and isolation of high quality inorganic nanoparticles. These materials are finding applications in a wide range of disciplines, including optoelectronic devices, biological tagging, optical switching, solid-state lighting, and solar cell applications. [1-11]
- One of the major hurdles for industrialization of these materials has been the development of a reproducible, high quantity synthetic methodology that is adaptable to high throughput automation for preparation of quantities of >100's of grams of single size (<5% RMS) crystalline quantum dots of various composition to be isolated. [12-13]
- The general synthetic approach for preparation of colloidal semiconductor nanoparticles employs a bulky reaction flask under continuous Ar flow with a heating mantle operating in excess of 240° C. The reaction is initiated by rapid injection of the precursors, which are the source materials for the nanoparticles, at high temperatures and growth is controlled by the addition of a strongly coordinating ligand to control kinetics. And to a more limited extent, domestic microwave ovens have been used to synthesize nanoparticles. [14-19] The high temperature method imposes a limiting factor for industrial scalability and rapid nanomaterial discovery for several reasons: (1) random batch-to-batch irregularities such as temperature ramping rates and thermal instability; (2) time and cost required for preparation for each individual reaction; and (3) low product yield for device applications.
- While recent advances in the field have developed better reactants, including inorganic single source precursors, metal salts, and oxides; better passivants, such as amines and non-coordinating solvents; and better reaction technologies, such as thermal flow reactors; the reactions are still limited by reproducibility. Coupled to this problem is the lack of control over reaction times, which require continuous monitoring. In the case of III-V compound semiconductors, the synthetic pathways have rates of growth on the order of days, while in the case of II-VI's, size control is very difficult and depends on the ability to rapidly cool the reaction. In these cases, the reaction depends on heating rate, heat uniformity over the reaction vessel, stirring and rapid and uniform cool-down.
- To overcome the limitation in the prior art described above, and to overcome other limitations that will become apparent upon reading and understanding the present specification, the present invention describes methods of chemical synthesis of nanoparticles, such as quantum dots, comprising a high temperature ramp process, warranting large-scale, safe, convenient, reproducible, and energy-efficient production.
- In the present invention, inorganic nanoparticles are synthesized by a scheme that comprises heating of the reaction system. It has been found that the above mentioned limitation can be overcome by including a heating process with high ramping rate. Hence, the critical issues that distinguish the present invention are:
- (1) a method for synthesizing nanoparticles that comprises a high temperature ramping rate during heating,
- (2) the above mentioned method wherein microwave irradiation is used for the heating process,
- (3) the above mentioned method wherein the dielectric constant of the main constituent element, which is the element that dominates the largest amount of molar ratio among the entire reactant, is 20 or lower, and
- (4) high crystallinity of the nanoparticles that is often achieved by employing the results of the present invention.
- Referring now to the drawings in which like reference numbers represent corresponding parts throughout:
-
FIG. 1 is a graph that illustrates the absorption and photoluminescence for 4.5 nm and 5.5 nm CdSe; -
FIG. 2 is a graph that illustrates the absorption and photoluminescence for 4.6 nm CdSe; -
FIGS. 3A and 3B are graphs that illustrate the absorption and photoluminescence of InGaP nanocrystals synthesized with hexadecene (HDE) and octadecene as the non-coordinating solvents; -
FIG. 4 is a graph that illustrates the absorption and photoluminescence of InGaP showing the dependence of crystallinity on power; -
FIG. 5 is a flowchart that illustrates the processing steps used in the preferred embodiment of the present invention; and -
FIG. 6 is an illustration of the processing steps used in the preferred embodiment of the present invention. - In the following description of the preferred embodiment, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration a specific embodiment in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present invention.
- 1. The Reaction System
- In the present invention, nanoparticles are synthesized by heating the reaction system from room temperature to elevated temperatures. The reaction system herein is a closed system that consists of materials that are necessary for the synthetic reaction. Each of these materials will hereafter be called a constituent element. In the most primitive reaction system, the sole constituent element is the precursor. However, in general, the constituent elements are solvent and precursor. The solvent can be a mixture of plural solvents, and also the precursor can be a mixture of plural precursors. These elements can either be dispersed homogeneously or inhomogeneously.
- The constituent elements of the reaction system are mixed at or near room temperature and heated for nanoparticle synthesis. Here, near room temperature is below 100° C.
- 2. Heating and Cooling of the Reaction System
- In the present invention, the temperature of the reaction system is typically monitored by devices such as thermometer, pyrometer, or thermocouples. The reaction described in the present invention comprise one or more of each of the (1) heating at a high heating rate, (2) stabilization at elevated temperature, and (3) cooling at a high cooling rate.
- As a specific feature in one of the preferred embodiments, heating of the reaction system is performed by microwave irradiation. [20-23] The heating of the reaction system can either be achieved by sole use of microwave or with the aid of other heat sources such as oil-bath, mantle-heater, or burners. The frequency of the microwave is typically 2.45 GHz but not limited. Use of focused microwave is preferred over unfocused, and single-mode is preferred over multimode for efficient heating. Ramping the temperature of the reaction system up is done solely by microwave irradiation or microwave irradiation with the use of additional heat sources, during which the heating rate can be controlled by the input power of the microwave by a continuous or pulsed power supply. The average heating rate during each process of the synthesis is defined as:
(Temperature at the end of heating(° C.)−Temperature at the beginning of heating(° C.))/(Duration of heating (min)) - The synthetic scheme described in the present invention comprises one or more stages of high heating rate. Here, high heating rate refers to a rate of 30° C./min or higher, more preferably 32° C./min or higher, most favorably 34° C./min or higher. When the average heating rate is below 30° C./min, synthesis may result in nanoparticulate materials with unfavorable properties such as lower dispersibility or wider size distribution.
- During the stage where the temperature is stable at elevated temperature, heating by microwave irradiation with or without other heat sources is performed together with cooling by using means as flow of air or water, ice, oil or cryogenic gas, to balance the input/output of heat to/from the system to hold the temperature constant. When the heat capacitance of the reaction system is large enough such that the change in the temperature can be ignored, temperature stabilization may be achieved by merely leaving the system free of any heat input/output. Here, stable temperature refers to processes in which the temperature change is 5° C./min or less.
- Cool-down of the reaction system can be achieved by removing heat from the system by standard means such as air, water, ice, oil or cryogenic gas. Microwave irradiation with or without other heat sources can be used to control this cool-down process. The average cooling rate of each cool-down process is defined as:
(Temperature at the beginning of cooling(° C.)−Temperature at the end of cooling(° C.))/(Duration of cooling (min)) - The synthetic scheme described in the present invention comprises one or more stages of high cooling rate. Here, high cooling rate refers to a rate of 80° C./min or higher, more preferably 85° C./min or higher, most favorably 90° C./min or higher. When the average cooling rate is below 80° C./min, synthesis may result in nanoparticulate materials with unfavorable properties such as lower dispersibility or wider size distribution. Hereinafter, this high rate cooling process may be referred to as quenching. Hence, the simplest embodiment of the present invention for synthesizing nanoparticles comprise of three stages that are high-rate heating, temperature stabilization, and high-rate cooling.
- 3. Additives to the Reaction System
- In order to control the heating and cooling rates of the reaction system, additives can be intentionally introduced to the system as a constituent element. In general, there is no limitation to the nature of such additives, and can be either organic or inorganic materials. The additives can either be dispersed homogeneously or inhomogeneously in the reaction system. Moreover, the additives can be present in the reaction system from the beginning of the process or can be introduced during the course of the reaction. Examples of such additives are: graphite, silicon carbide, glycols, ionic liquids, tetrabutylammonium bromide and cholesterols.
- Furthermore, for synthesizing the same or different nanoparticles, in addition to the precursors that exist in the reaction system, one may further introduce the same or different precursors during the course of reaction.
- 4. The Main Constituent Elements of the Reaction System
- As described above, the reaction system comprises one or more constituent elements. The main constituent element is the element with the largest molar equivalent. In the present invention, the dielectric constant of the main constituent element is 20 or less, preferably 18 or less, more preferably 16 or less, and most preferably 14 or less. If the dielectric constant is over 20, it may result in loss of stability of the precursors in the system due to the exceedingly high polarity of the main constituent element. Additives can be introduced into the system before or during the course of reaction as long as their amounts are less than the main constituent element in molar equivalent.
- 5. Nanoparticles
- The nanoparticles synthesized by the method described in the present invention comprise mainly inorganic materials, and their diameters are on the order of nanometers (nm). The main crystal may be single crystal, polycrystal, alloys with or without phase separation due to stoichiometric variations, or core-shell structures that will be described later. The average diameter of such crystals are 0.5˜100 nm, preferably 1˜20nm in order to warrant dispersibility, more preferably 2˜12nm, most preferably 2˜10nm. Such diameters can be determined through characterization by transmission electron microscopy (TEM). When the micrographs cannot be obtained with sufficient contrast to make such determination of the diameter, for instance when the constituent atoms are those of low atomic numbers, techniques such as matrix assisted laser desorption ionization spectroscopy, atomic force microscopy (AFM), or for colloidal solutions, dynamic light scattering or neutron scattering can often be used instead.
- While there is no limitation in the size distribution of the above mentioned nanoparticles, in general, the standard deviation is ±20%, preferably ±15%, more preferably ±10%, and most preferably ±5%. When the size distribution exceeds the above, the nanoparticles will often not exhibit their desired physical and chemical properties to their best performance. Methods that are typically used to characterize the crystallinity of the nanoparticles are dark field transmission electron microscopy which is used to look for glide plane defects and/or twinning. Powder x-ray diffraction, which reveals the approximate diameters and shapes of the crystallites through peak intensities and scherrer broadening of the reflection peaks. Finally, z-contrast transmission electron microscopy is used to image the dopant ion in nanoparticle alloys.
- 6. The Composition of Semiconductor Nanoparticles
- When the nanoparticles synthesized by the method described in the present invention are semiconductor, there is no limitation in their composition, but typical examples are single substances of Group 14 elements, such as C, Si, Ge, or Sn, single substances of Group 15 elements, such as P (black phosphorus), single substances of Group 16 elements, such as Se or Te, compounds of Group 14 elements, such as SiC, compounds of Group 14 and Group 16 elements, such as GeS, GeSe, GeTe, SnS, SnSe, SnTe, PbS, PbSe, or PbTe, and their ternary and quaternary alloys, such as GexSn1-xSySe1-y (x=0˜1, y=0˜1), compounds of Group 13 and Group 15 elements, such as AlN, AlP, AlAs, AlSb, GaN, GaP, GaAs, GaSb, InN, InP, InAs, or InSb, and their ternary and quaternary alloys, such as GaxIn1-xPyAs1-y (x=0˜1, y=0˜1), compounds of Group 13 and Group 16 elements or their alloys, such as GaS, GaSe, GaTe, InS, InSe, InTe, TlS, TlSe, TlTe, and their ternary and quaternary alloys, such as Gaxin1-xSySe1-y (x=0˜1, y=0˜1), compounds of Group 13 and Group 17 elements, such as TlCl, TIBr, TlI, compounds of Group 12 and Group 16 elements, such as ZnS, ZnSe, ZnTe, CdS, CdSe, CdTe, HgS, HgSe, HgTe, and their ternary and quaternary alloys, such as ZnxCd1-xSySe1-y (x=0˜1, y=0˜1), compounds of Group 15 and Group 16 elements, such as As2S3, As4S4, As2Se3, As2Te3, Sb2S3, Sb2Se3, Sb2Te3, Bi2S3, Bi2Se3, Bi2Te3, and their ternary and quaternary alloys, compounds of Group 11 and Group 16 elements, such as CuO, Cu2O, Ag2S and CuSe, compounds of Group 11 and Group 17 elements, such as CuCl, AgBr and AuCl, ccompounds of Group 10 and Group 16 elements, such as NiS2, PdS and PtSe, compounds of Group 9 and Group 16 elements, such as CoSe, RhS and IrSe, compounds of Group 8 and Group 16 elements, such as FeO, FeS, FeSe and RuS, compounds of Group 7 and Group 16 elements, such as MnO, MnS, MnSe and ReS, compounds of Group 6 and Group 16 elements, such as Cr2S3, Cr2Se3 and MoS2, compounds of Group 5 and Group 16 elements, such as VS, VSe, and NbS, compounds of Group 4 and Group 16 elements, such as TiO2, TiS2, and ZrS2, compounds of Group 2 and Group 16 elements, such as BeO, MgS, and CaSe, and chalcogen spinnels, barium titanates (BaTiO3).
- 7. Core-Shell Structures
- The crystals that form the main body of the nanoparticles of the present invention can be the so-called core-shell structure in which the crystals comprise inner-core and outer-shell for modification of their physical and chemical properties. Such shells are preferably metal, semiconductor, or insulator. As for semiconductor, examples of preferred materials are compounds of Group 13 and Group 15 elements, such as ME (where M=B, Al, Ga, In and E=N, P, As, Sb) and compounds of
Group 12 andGroup 16 elements, such as MA (where M=Zn, Cd, Hg and A=O, S, Se, Te) and compounds of Group 2 andGroup 16 elements, such as TA (where T=Be, Mg, Ca Sr, Ba and A=O, S, Se, Te). Examples of more preferred materials for the shells are III-V compound semiconductors, such as BN, BAs, or GaN, II-VI compound semiconductors, such as ZnO, ZnS, ZnSe, CdS, compounds ofGroup 12 andGroup 16 elements, such as MgS, or MgSe. - 8. Doping of Nanoparticles
- In the compositions described above in sections 5 and 6, minute amounts of additives can be intentionally doped for modification of the physical and chemical properties of the nanoparticles. Examples of such doping materials are Al, Mn, Cu, Zn, Ag, Cl, Ce, Eu, Th, Er, or Tm.
- 9. Organic Compounds Present at the Nanoparticle Surface
- The nanoparticles synthesized by the method described in the present invention can have organic compounds attached to their surface. The attachment of organic compounds to the surface is defined as the state in which the organic compound is chemically bonded to the surface. While there is no limitation in the form of bonding between the organic compound and the nanoparticle surface, examples are coordination bond, covalent bond, relatively strong bonds such as ionic bond, or through relatively weak interaction such as van der Waals force, hydrogen bond, hydrophobic-hydrophobic interaction, or entanglement of molecular chains. The organic compounds can be a single species or a mixture of two or more.
- In general, in order to attach to the nanoparticle surface, organic compounds consist of the following coordinating functional groups that form bonds to the nanoparticle surface. Typically, coordinating functional groups that comprise Group 15 or
Group 16 elements constitute the above mentioned organic compounds. Examples of such functional groups are, primary amines, secondary amines, tertiary amines, radicals containing nitrogen multiple bonds, such as nitryl, or isocyanate, nitrogen containing radicals such as nitric aromatics, such as pyridine or triazine, functional groups containing Group 15 element such as phosphorus containing radicals, such as primary phosphine, secondary phosphine, tertiary phosphine, primary phosphine oxide, secondary phosphine oxide, tertiary phosphine oxide, primary phosphine selenide, secondary phosphine selenide, tertiary phosphine selenide, or phosphonic acid, oxygen containing radicals, such as hydroxyl, ether, or carboxyl, sulfur containing radicals, such as thiol, methylsulfide, ethylsulfide, phenylsulfide, methyldisulphide, phenyldisulfide, thioacid, dithioacid, xanthogenic acid, xanthete, isothiocyanate, thiocarbamate, sulfonic, sulfoxide, or thiophene rings, functional groups containing Group 16 element such as selenium containing radicals, such as —SeH, —SeCH3, —SeC6H5, or tellurium containing radicals, such as —TeH, —TeCH3, —TeC6H5. Among these examples, functional groups containing nitrogen such as pyridine rings, functional groups containing Group 15 elements such as phosphorus, such as primary amine, tertiary phosphine, tertiary phosphine oxide, tertiary phosphine selenide, or phosphonic acid, functional groups containing oxygen, such as hydroxyl, ether, or carboxyl, or functional groups containing Group 16 elements such as sulfur, such as thiol or methylsulfide, are used preferably. More precisely, trialkylphosphines, trialkylphosphine oxides, alkane sulfonic acids, alkane phosphonic acids, alkyl amines, dialkylsulfoxides, dialkylether, and alkylcarboxyl acids are such examples. - While the detailed coordination chemistry of these organic compounds on the nanoparticle surface is not totally understood, in the present invention, as long as the nanoparticle surface is covered with these organic compounds, the functional groups may either retain their original structure or be modified.
- 10. The Amount of Organic Compounds at the Nanoparticle Surface
- In the present invention, the amount of organic compounds present at the surface depends on the kind of nanoparticles and their surface area, such as their size, after proper separation, among the total weight of the nanoparticles and the organic compounds, is typically 1 to 90% of the weight, and for chemical stability and in order to disperse them into organic matrices such as solvents or resin binders that are practically important preferably. 5˜80%, more preferably, 10˜70%, and most preferably 15˜60%. The above mentioned organic composition can be determined, for example, by the various elemental analyses or thermogravimetric analysis (TGA). Furthermore, information regarding the chemical species and environment can be obtained by infrared (IR) spectroscopy or nuclear magnetic resonance (NMR).
- 11. Precursors
- When the nanoparticles synthesize by the method described in the present invention are semiconductor, cationic materials that can be chosen from elements in Group 2˜15 and anionic materials that can be chosen from elements in Group 15˜17 can be used as precursors. When more than one material is used, they may be mixed prior to the synthetic reaction or may be separately introduced into the reaction system.
- Examples of the precursors for semiconductors that contain cationic elements are, dialkylated compounds of Group 2 elements, such as diethyl magnesium, or di-n-butyl magnesium; alkyl halides of Group 2 elements, such as methyl magnesium chloride, methyl magnesium bromide, methyl magnesium iodide, ethynyl magnesium chloride; dihalides, such as magnesium iodide; halides of Group 4 elements, such as titanium (IV) tetrachloride, titanium (IV) tetrabromide, or titanium (IV) tetraiodide; halides of Group 5 elements, such as vanadium (II) dichloride, vanadium (IV) tetrachloride, vanadium (II) dibromide, vanadium (IV) tetrabromide, vanadium (II) diiodide, vanadium (IV) tetraiodide, tantalum (V) pentachloride, tantalum (V) pentabromide, and tantalum (V) pentaiodide; halides of Group 6 elements, such as chromium (III) tribromide, chromium (III) triiodide, molybdenum (IV) tetrachloride, molybdenum (IV) tetrabromide, molybdenum (IV) tetraiodide, tungsten (IV) tetrachloride, tungsten (IV) tetrabromide, and tungsten (IV) tetraiodide; halides of Group 7 elements, such as manganese (II) dichloride, manganese (II) dibromide, and manganese (III) diiodide; halides of Group 8 elements, such as iron (II) dichloride, iron (III) trichloride, iron (II) dibromide, iron (III) tribromide, iron (II) diiodide, and iron (III) triiodide; halides of Group 9 elements, such as cobalt (II) dichloride, cobalt (II) dibromide, and cobalt (II) diiodide; halides of Group 10 elements, such as nickel (II) dichloride, nickel (II) dibromide, and nickel (II) diiodide; halides of Group 11 elements, such as copper (I) iodide; dialkylated compounds of Group 12 elements, such as dimethyl zinc, diethyl zinc, di-n-propyl zinc, diisopropyl zinc, di-n-butyl zinc, diisobutyl zinc, di-n-hexyl zinc, dicyclohexyl zinc, dimethyl cadmium, diethyl cadmium, dimethyl mercury (II), diethyl mercury (II), and dibenzyl mercury (II); alkyl halides of Group 12 elements, such as methyl zinc chloride, methyl zinc chloride, methyl zinc iodide, ethyl zinc iodide, methyl cadmium chloride, and methyl mercury (II) chloride; dihalides of Group 12 elements, such as zinc chloride, zinc bromide, zinc iodide, cadmium chloride, cadmium bromide, cadmium iodide, mercury (II) chloride, zinc chloride iodide, cadmium chloride iodide, mercury (II) chloride iodide, zinc bromide iodide, cadmium bromide iodide, and mercury (II) bromide iodide; carboxylic acid salt of Group 12 elements, such as zinc acetate, cadmium acetate, and 2-ethyl hexanoic acid cadmium; oxides of Group 12 elements, such as cadmium oxide and zinc oxide; trialkylated compounds of Group 13 elements, such as trimethyl boron, tri-n-propyl boron, triisopropyl boron, trimethyl aluminum, trimethyl aluminum, triethyl aluminum, tri-n-butyl aluminum, tri-n-hexyl aluminum, trioctyl aluminum, tri-n-butyl gallium (III), trimethyl indium (III), triethyl indium (III), and tri-n-butyl indium (III); dialkyl monohalides of Group 13 elements, such as dimethyl aluminum chloride, diethyl aluminum chloride, di-n-butyl aluminum chloride, di-ethyl aluminum bromide, di-ethyl aluminum iodide, di-n-butyl gallium (III) chloride, or di-n-butyl indium (III) chloride; monoalkyl dihalides of Group 13 elements, such as methyl aluminum dichloride, ethyl aluminum dichloride, ethyl aluminum dibromide, ethyl aluminum diiodide, n-butyl aluminum dichloride, n-butyl gallium (III) dichloride, and n-butyl indium (III) dichloride; tri-halides of Group 13 elements, such as boron trichloride, boron tribromide, boron triiodide, aluminum trichloride, aluminum tribromide, aluminum triiodide, gallium (III) trichloride, gallium (III) tribromide, gallium (III) triiodide, indium (III) trichloride, indium (III) tribromide, indium (III) triiodide, gallium (III) dichloride bromide, gallium (III) dichloride iodide, gallium (III) chloride diiodide, and indium (III) dichloride iodide; carboxylic acid salt of Group 13 elements, such as indium (III) acetate and gallium (III) acetate; halides of Group 14 elements, such as germanium (IV) tetrachloride, germanium (IV) tetrabromide, germanium (IV) tetraiodide, tin (II) dichloride, tin (IV) tetrachloride, tin (II) dibromide, tin (IV) tetrabromide, tin (II) diiodide, tin (IV) tetraiodide, tin (IV) dichloride diiodide, tin (IV) tetraiodide, lead (II) dichloride, lead (II) dibromide, and lead (II) diiodide; hydrates of Group 14 elements, such as diphenyl silane; trialkyls of Group 15 elements, such as trimethyl antimony (III), triethyl antimony (III), tri-n-butyl antimony (III), trimethyl bismuth (III), triethyl bismuth (III), and tri-n-butyl bismuth (III); monoalkyl halides of Group 15 elements, such as methyl antimony (III) dichloride, methyl antimony (III) dibromide, methyl antimony (III) diiodide, ethyl antimony (III) diiodide, methyl bismuth (III) dichloride, and ethyl bismuth (III) diiodide; trihalides of Group 15 elements, such as arsenic (III) trichloride, arsenic (III) tribromide, arsenic (III) triiodide, antimony (III) trichloride, antimony (III) tribromide, antimony (III) triiodide, bismuth (III) trichloride, bismuth (III) tribromide, and bismuth (III) triiodide; etc.
- For synthesis of nanoparticles of
Group 14 elemental semiconductors such as Si, Ge, or Sn, halides ofGroup 14 elements, such as germanium (IV) tetrachloride, germanium (IV) tetrabromide, germanium (IV) tetraibdide, tin (II) dichloride, tin (IV) tetrachloride, tin (II) dibromide, tin (IV) tetrabromide, tin (II) diiodide, tin (IV) diiodide, tin (IV) dichloride diiodide, tin (IV) tetraiodide, lead (II) dichloride, lead (II) dibromide, and lead (II) diiodide; or hydrides and/or alkylated compounds ofGroup 14 elements, such as diphenyl silane, can be used as precursors. - Examples of anionic compounds that can be used as precursors for semiconductors are, elements of Groups 15˜17, such as N, P, As, Sb, Bi, O, S, Se, Te, F, Cl, Br, and I; hydrides of Group 15 elements, such as ammonia, phosphine (PH3), arsine (AsH3), and stibine (SbH3); silylated compounds of elements of Group 15 of the periodic table, such as tris(trimethylsilyl) amine, tris(trimethylsilyl) phosphine, and tris(trimethylsilyl) arsine; hydrides of
Group 16 elements, such as hydrogen sulfide, hydrogen selenide, and hydrogen telluride; silylated compounds ofGroup 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide, alkaline metal salts ofGroup 16 elements, such as sodium sulfide and sodium selenide; trialkylphosphine chalcogenides, such as tributylphosphine sulfide, trihexylphosphine sulfide, trioctylphosphine sulfide, tributylphosine selenide, trihexylphosphine selenide, and trioctylphosphine selenide, hydrides of Group 17 elements, such as hydrogen fluoride, hydrogen chloride, hydrogen bromide, and hydrogen iodide; and silylated compounds of Group 17 elements, such as trimethylsilyl chloride, trimethylsilyl bromide, and trimethylsilyl iodide; etc. Among these, from the stand points of reactivity, stability, and handling, the preferred materials are, elemental materials in Groups 15˜17, such as phosphorus, arsenic, antimony, bismuth, sulfur, selenium, tellurium, and iodine; silylated compounds of Group 15 elements, such as tris(trimethylsilyl) phospine and tri(trimethylsilyl) arsine; hydrides ofGroup 16 elements, such as hydrogen sulfide, hydrogen selenide and hydrogen telluride; silylated compounds ofGroup 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide; alkaline metal salts ofGroup 16 elements, such as sodium sulfide and sodium selenide; trialkylphosphine chalcogenides such as, tributylphosphine sulfide, trihexylphosphine sulfide, trioctylphosphine sulfide, tributylphosphine selenide, trihexylphosphine selenide, and trioctylphosphine selenide; silylated compounds of Group 17 elements, such as trimethylsilyl chloride, trimethylsilyl bromide, and trimethysilyl iodide; etc. Among the above, more preferably used materials are, elemental materials inGroups 15 and 16, such as phosphorus, arsenic, antimony, sulfur, and selenium; silylated compounds of Group 15 elements, such as tris(trimethylsilyl) phospine and tri(trimethylsilyl) arsine; silylated compounds ofGroup 16 elements, such as bis(trimethylsilyl) sulfide and bis(trimethylsilyl) selenide; alkaline metal salts ofGroup 16 elements, such as sodium sulfide and sodium selenide; trialkylphosphine chalcogenides such as, tributylphosphine sulfide, trioctylphosphine sulfide, tributylphosphine selenide, and trioctylphosphine selenide; etc. - Examples of precursors for metal nanoparticles for group 4 through 13 including Au, Ag, Fe, Ni, Co, Pt, Pd, Cu, Hg, In, NiPt, FePt, FeCo are: Gold: auric acid, chlorocarbonyl gold (I, and gold (I) chloride; Silver: silver (I) acetate, silver (I) nitrate, silver (I) chloride, silver (I) bromide, silver (I) iodide, and silver sulfate; Iron (either as II or III oxidation state): iron chloride, iron bromide, iron iodide, iron (0) carbonyl, iron acetate, iron acetyl acetonate, iron hexapyridine, iron hexamine, iron sterate, iron palmitate, iron sulfonate, iron nitrate, iron dithiocarbamate, iron dodecylsulfate, and iron tetrafluroborate; Nickel: nickel (II) nitrate, nickel (II) chloride, nickel (II) bromide, nickel (II) iodide, nickel (II) carbonyl, nickel (II) acetate, nickel (II) acetyl acetonate, nickel (II) hexapyridine, nickel (II) hexamine, nickel (II) sterate, nickel (II) palmitate, nickel (II) sulfonate, nickel (II) nitrate, nickel (II) dithiocarbamate, nickel (II) dodecylsulfate, and nickel (II) tetrafluroborate; Cobalt: cobalt (II) nitrate, cobalt (II) chloride, cobalt (II) bromide, cobalt (II) iodide, cobalt (II) carbonyl, cobalt (II) acetate, cobalt (II) acetyl acetonate, cobalt (II) acetyl acetonate cobalt (II) hexapyridine, cobalt (II) hexamine, cobalt (II) sterate, cobalt (III) palmitate, cobalt (II) sulfonate, cobalt (II) nitrate, cobalt (II) dithiocarbamate, cobalt (II) dodecylsulfate, and cobalt (II) tetrafluroborate; Platinum: platinum (II) nitrate, platinum (II) chloride, platinum (II) bromide, platinum (II) iodide, platinum carbonyl, platinum (II) acetate, platinum (II) acetyl acetonate, platinum (II) hexapyridine, platinum (II) hexamine, platinum (II) sterate, platinum (II) palmitate, platinum (II) sulfonate, platinum (II) nitrate, platinum (II) dithiocarbamate, platinum (II) dodecylsulfate, and platinum (II) tetrafluroborate; Palladium: palladium (II) nitrate, palladium (II) chloride, palladium (II) bromide, palladium (II) iodide, palladium carbonyl, palladium (II) acetate, palladium (II) acetyl acetonate, palladium (II) hexapyridine, palladium (II) hexamine, palladium (II) sterate, palladium (II) palmitate, palladium (II) sulfonate, palladium (II) nitrate, palladium (II) dithiocarbamate, palladium (II) dodecylsulfate, and palladium (II) tetrafluroborate; Copper (I or II oxidation state): copper nitrate, copper chloride, copper bromide, copper iodide, copper carbonyl, copper acetate, copper acetyl acetonate, copper hexapyridine, copper hexamine, copper sterate, copper palmitate, copper sulfonate, copper nitrate, copper dithiocarbamate, copper dodecylsulfate, and copper tetrafluroborate; Mercury:, dimethyl mercury (0), diphenyl mercury (0), mercury (II) acetate, mercury (II) bromide, mercury (II) chloride, mercury (II) iodide, and mercury (II) nitrate; Indium: trimethyl indium (III), indium (III) dichloride, indium (III) trichloride, indium (II) tribromide, and indium (III) triiodide.
- 12. Solvents
- The solvent effect for nanoparticle formation under dielectric heating is twofold: (1) it provides the matrix for which the reactants form products; and (2) they have the ability to absorb microwaves to intrinsically heat the reaction matrix. The matrix effect can be noncoordinating or coordinating in nature. Noncoordinating implies that the solvent does not form bonds to the precursor molecules or intermediate complexes during nanoparticle formation (it usually does not have functional groups). Coordinating implies the solvent forms bonds to the precursor molecules and intermediates during nanoparticle formation.
- Noncoordinating solvents used for nanoparticle formation usually consist of long chain, high boiling alkanes and alkenes such as hexadecane, octadecane, eicosane, 1-hexadecene, 1-octadecene and 1-eicosene. Typical coordinating solvents consist of long chain (backbone of 6 to 20 carbons) alkyl amines (primary, secondary and tertiary), carboxylic acids, sulfonic acids phosphonic acids, phosphines and phosphine oxides.
- The ability for a solvent to absorb microwaves is highly dependant on its dipole moment. The dipole moment is defined as the product of the distance between two charges and the magnitude of the charge; hence, when a coordinating solvent is used as the solvent, it has a higher propencity of heating the bulk solution faster than a noncoordinating solvent that has a lower dipole moment by definition. When comparing the heating rates of trioctylphosphineoxide (760° C./min) to 1-aminohexadecane (30° C./min), trioctylphosphineoxide converts electric energy to heat more efficiently. Comparing these to the heating rate of tetradecene (12° C./min) shows that the choice of solvents has a substantial influence on the rate at which the heat is transferred to the bulk solution.
- One way to slow down the rate of heating for a solvent that absorbs microwave strongly, like trioctylphosphineoxide, is to reduce the incident microwave power. This will allow the ramp rate to be tailored to suite a particular nanoparticle formation.
- Technical grade solvent dielectric heating rates for nanoparticle synthesis will depend on several factors: the dielectric constant, the volume of solvent, and its boiling point. For nonpolar solvents such as C6-C20 straight chain alkanes, the heating rates are slow for 5 ml of solvent at 300 W of incident power.
- For example, super-heated noncoordinating technical grade octane plateaus at 147° C. after 15 minutes of heating at 300 W with 10 atm of pressure. However, in the presence of Cd and Se monomers (57 mM), super-heating octane can reach nanoparicle formation temperatures as high as 250° C. in 6 minutes with 15 atm of pressure with 300 W of incident microwave power.
- The lower boiling point alkanes will have a lower plateau temperature in terms of the maximum sustained temperature at high pressure. The higher boiling alkanes can achieve higher temperatures in a shorter period of time when compared to alkanes. When 5 ml of technical grade tetradecene is dielectrically heated at 300 W, it can reach 250° C. in 13 min.
- Coordinating solvents typically heat faster at lower pressure due to their higher boiling points and functional groups. For example, 5 ml of technical grade hexadecylamine can be dielectrically heated at 300 W to 280° C. in 11 minutes with 1 atm of pressure. In the same manner, trioctylphosphine oxide can be dielectrically heated to 280° C. in 15 seconds with 1 atm of pressure.
- As provided hereunder, embodiments of the present invention will be illustrated in more detail by ways of examples, although the present invention is not limited to these examples provided that the outcome is within the gist of the present invention.
- With regard to the material reagents, commercially available reagents were used without purification unless otherwise stated.
- Instrument Setup, Conditions, etc., for Measurement
-
- (1) Microwave assisted synthesis setup:
- a. DISCOVER system, CEM Corporation, NC, U.S.A.
- b. MILESTONE ETHOS system (continuous and pulsed power supply), Milestone Corporation, Monroe, Conn., U.S.A.
- (2) UV/v is absorption spectroscopy: CARY 50BIO WIN UV Spectrometer.
- (3) Photoluminescence spectroscopy: CARY ECLIPSE Fluorescence Spectrometer.
- (4) X-ray diffractometry: SCINTAG X2 powder diffractometer.
- (5) Transmission electron microscopy: JEOL 2010 Transmission Electron Microscope
- (1) Microwave assisted synthesis setup:
- General Procedure
- The duration of nanoparticle reactions have been optimized to 15 minutes at a maximum temperature of 280° C. It is shown that under the influence of microwave radiation, the crystallinity becomes dependant on the power of the radiation in concert with the temperature of the reaction. The microwave reactor allows the precursors to be prepared at or near room temperature (RT) and loaded into a reaction vessel prior to its introduction into an RT chamber of the microwave reactor. The reaction vessel is then heated to temperatures between 200° C. and 300° C. with active cooling. The microwave reactor operates at 2.45 GHz and can be adapted to a continuous flow or autosampler system. Incorporation of integrated absorption and fluorescent detectors allow the reaction stream to be continuously monitored for applications where high throughput, high volume preparation of colloidal semiconductor nanoparticles is desired.
- In a typical small scale synthesis (5 ml or less), the reactants are mixed in a high-pressure reaction vessel and placed in the RT chamber of the microwave reactor. The reaction is controlled by a predetermined program that controls and monitors reaction time, temperature, pressure, and microwave power (wattage) in real time. These reaction parameters control material size, purity, crystallinity, and dispersity. The synthetic protocol allows reproducible production of materials. The isolation and storage of the materials can be done directly inside the high-pressure reaction vessel, thereby eliminating the step of material transfer that potentially exposes the materials to contaminants such as oxygen and water. The Teflon liner in the chamber of the microwave reactor was re-designed from typical commercial specifications in order to tolerate high temperatures for extended periods of time. The reaction vessel comprises a 5 ml vial with a high-pressure aluminum crimp top with Teflon septa. All glassware was dried prior to use. All reagents were manipulated by standard airless techniques.
- In a typical large scale reaction (5 ml or greater), the reactants are placed in a standard round bottom flask (Kirmax, Pyrex or Chemglass) and placed in a RT chamber and irradiated with continuous or pulsed power with dual magnetrons until the desired temperature is reached.
- It has been shown by Cumberland et al. in [7] that a novel single source precursor based upon Li4[Cd10Se4(SPh)16] in the presence of mild coordinating alkyl amine solvent can yield CdSe quantum dots in the size range of 2-9 nm with a reaction time of 720 minutes on average. Using this single source precursor in the presence of hexadecylamine (HDA) microwave irradiation yields nanoparticles in a fraction of the time.
- 50 g of HDA was degassed under vacuum at 110° C. 80 mg of Li4[Cd10Se4(SPh)16] was placed in the reaction vessel and sealed with a high pressure crimp cap followed by the addition of 4 ml of molten, degassed HDA (at approximately 70° C.). The reaction vessel was placed in the chamber of the microwave reactor and irradiated with 300 Watts of power until it reached 230° C., at which time the power was decreased to 230 Watts. This power and temperature was held constant for 60 minutes. At 60 minutes, the power was turned off and the latent heat of the reaction vessel was quickly removed by passing compressed air across it. This produced monodisperse 4.5 nm to 5.5 nm CdSe nanoparticles. Smaller sizes can be isolated under these experimental parameters simply by quenching the reaction at shorter time intervals. Increasing the microwave power to 250 Watts for 60 minutes at 230° C. can yield sizes larger than 4.5 nm, e.g., 5.5 nm, as shown in
FIG. 1 , wherein traces 10 and 12 represent the absorption and photoluminescence, respectively, of 4.5 nm CdSe synthesized at 230° C. and 230W, whiletraces -
- High heating rate: 30° C./min
- Main constituent of the reactant (Dielectric constant): Hexadecylamine (2.71) [5]
- Stock solutions of Cd and Se were prepared separately. The cation solution was prepared by dissolving 435 mg of cadmium nitrate tetrahydrate in 9.6 ml of trioctylphosphine (TOP). This solution was heated to 100° C. under vacuum for 30 minutes. The reaction mixture was purged with Ar three times and then cooled to room temperature for later use. The anion solution was prepard by mixing 182 mg of 200 mesh Se powder in 2.8 ml TOP The coordinating solvent, trioctyphosphine oxide (TOPO), was degassed under vacuum at 110° C. three times and back filled with Ar over a two hour period. The Cd (0.5 ml) and Se (0.6 ml) were mixed in a teflon sealed reaction vial, and diluted with 3.9 ml molten TOPO (approximately 65° C.) to make a 5 ml solution. The reaction vessel was placed in the chamber of the microwave reactor at room temperature. 300 Watts were applied for several seconds, at which time the temperature spiked from 40° C. to 230° C. in 15 seconds. The power was reduced to 40 Watts to stabilize the temperature at 250° C. for 8 minutes. At 8 minutes, the power was turned off and the reaction was quenched. This resulted in a 4.6 nm CdSe nanoparticle, approximated by the excitonic peak position, as shown in
FIG. 2 , wherein traces 18 and 20 represent the absorption and photoluminescence, respectively, of CdSe grown from cadmium nitrate and trioctylphosphineselenide. Note that nanoparticle diameter can be tuned by reaction temperature. -
- High heating rate: 760° C./min
- Main constituent of the reactant (Dielectric constant): TOPO (<20)
- Ref: Dielectric constants of materials similar to TOPO [24, 25]
Dielectric Temp.(° C.) Const. Triethylphosphine oxide (C2H5)3P═O 323.2 35.5 Tributylphosphine oxide (C4H9)3P═O 323.2 26.4 Triheptylphosphine oxide (C7H15)3P═O 323.2 30.4 Trioctylphosphine oxide (C8H17)3P═O <TOPO> ˜19 Trinonylphosphine oxide (C9H19)3P═O 323.2 15.4 - The preparation of the stock precursor solutions was done according to literature methods, such as those in [9]. A solution of indium acetate and hexadecanoic acid was prepared in hexadecene. The mole ratio of In to hexadecanoic acid was adjusted to a 1 to 3. The salts were dissolved at 100° C. to make a 15.6 mM solution in In. The solution was degassed at this temperature for 1 hour and purged with Ar three times. A stock solution of tris(trimethylsilyl) phosphine at 86.1 mM was prepared in dry hexadecene.
- The In and P precursors were mixed at 50° C. in a 10 ml sealed reaction vessel in a 2:1 ratio to make a total volume of 5 ml precursor solution. The reaction vessel was irradiated with 300 watts of power until the solution reached a temperature of 280° C. The power was reduced to maintain 280 watts. This temperature and power was maintained for 15 minutes, at which time the reaction was rapidly quenched.
-
- High heating rate: 30° C./min
- Main constituent of the reactant (Dielectric constant): Hexadecene (2.1˜2.2)
- (Ref: Dielectric constant of 1-tridecene is 2.139)
- Ref: Dielectric constants of materials similar to hexadecane [24]
Temp.(° C.) Dielectric Const. 1-Hexene C6H12 294.0 2.007 1-Heptene C7H14 293.2 2.092 1-Octene C8H16 293.2 2.113 1-Nonene C9H18 293.2 2.180 1-Decene C10H20 293.2 2.136 1-Undecene C11H22 293.2 2.137 1-Dodecene C12H24 293.2 2.152 1-Tridecene C13H26 293.2 2.139 - The stock solution was prepared by a modification of literature methods [9]. Indium III acetate (0.700 mmol), gallium III 2,4-pentanedionate (0.070 mmol) and hexadecanoic acid (2.30 mmol) were mixed with 50 ml either octadecene or hexadecene. The mixture was heated to 160° C. until the solution turned clear. The temperature of the stock solution was reduced to 110° C. under vacuum and purged with Ar three times.
- For 4.8 nm quantum dots, the cation stock solution was prepared with octadecene and mixed with tris(trimethylsilyl)phosphine in the reaction vessel via syringe at 50° C. with a cation: anion mole ratio of 2:1. 5 ml of the stock solution was placed in a 10 ml sealed reactor vial (CEM). The 2.3 nm quantum dots were prepared in the same fashion, but the stock solution was prepared in hexadecene.
- Reactor temperature and pressures were monitored continuously to ensure safety, with pressures not exceeding 1.7 atm during the course of the reaction. The power level of the ramp was 300 watts. The hold temperature was 280° C. for 15 min., with a constant power level of 280 watts during the reaction. To ensure controlled dispersity, the reaction vessel was rapidly cooled, via a quenching Oswald Ripening process, from 280° C. to 95° C. over a period of 2 min using compressed air. Depending on the concentration of precursors, the ramp rate to achieve the hold temperature ranged from 4-6 minutes with the more dilute samples taking longer, due to the heating arising from direct dielectric heating of the precursors, rather then the thermal heating of the solvent. Size control for these materials was achieved by controlling the concentration of the constituent elements in the reactant.
-
- High heating rate: 32° C./min
- Main constituent of the reactant: octadecene (Dielectric constant estimated to be 2.1˜2.2)
- When hexadecene was used as the non-coordinating solvent, approximately 2.3 nm InGaP was grown. When octadecene was used as the non-coordinating solvent, 4.8 nm nanoparticles were grown. The size is determined by Scherrer broadening of the powder x-ray diffraction peaks, as shown in
FIGS. 3A and 3B . -
FIG. 3A illustrates the absorption andFIG. 3B illustrates the photoluminescence of InGaP nanoparticles synthesized at 280° C. for 15 minutes at 280 Watts.Traces - An important feature of the specific microwave effect on III-V ternary compound crystal growth is that the crystallinity (optical properties of the final product) is dependant on the microwave power. If the reaction time and temperature are held constant while the power is reduced, low energy defect emission begins to form, as shown in
FIG. 4 . -
FIG. 4 illustrates the absorption and photoluminescence of InGaP showing the dependence of crystallinity on power, whereintrace 30 represents the absorption for InGaP andtrace 32 represents the photoluminescence for InGaP that were synthesized with a constant power of 230 watts, whiletrace 34 represents the absorption for InGaP andtrace 36 represents the photoluminescence for InGaP that were synthesized at a constant power of 270 watts. - The defect emission can be attributed to surface vacancies or glide plane defects. It is clear that not only high temperature is important for high quality material, but high power is needed as well. The structural characterization of the material exhibits the zinc blende structure of bulk InP.
- 14. Processing Steps
-
FIG. 5 is a flowchart that illustrates the processing steps for synthesizing nanoparticles used in the preferred embodiment of the present invention. These steps are typically performed using a single reaction vessel, continuous flow reactor or stopped flow reactor. -
Block 38 represents the step of preparing one or more constituent elements at or near room temperature, wherein the room temperature is below 100° C. Preferably, a dielectric constant of a main one of the constituent elements is 20 or higher. -
Block 40 represents the step of heating the prepared constituent elements to an elevated temperature using high-rate heating, in order to create a reaction mixture. Preferably, the heating step is performed using microwave irradiation, and the high heating rate comprises a rate of 30° C./min or higher. -
Block 42 represents the step of stabilizing the reaction mixture at the elevated temperature. Preferably, the elevated temperature is greater than 240° C. -
Block 44 represents the step of cooling the stabilized reaction mixture to a reduced temperature using high-rate cooling. Preferably, the high cooling rate comprises a rate of 125° C./min or higher. -
FIG. 6 is an illustration of the processing steps for synthesizing nanoparticles used in the preferred embodiment of the present invention. As noted above, thereactor 46 typically comprises a single reaction vessel, continuous flow reactor or stopped flow reactor. Thereactant 48 includes the consituent elements, such as one ormore precursors solvents 56.Arrow 58 represents the heating/cooling process that creates thenanoparticles 60. - The following references are incorporated by reference herein:
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- This concludes the description of the preferred embodiment of the present invention. In summary, the present invention has shown that colloidal nanoparticles can be rapidly synthesized under high power microwave radiation to provide industrial scalability with no sacrifice to structural integrity or optical quality.
- The foregoing description of one or more embodiments of the invention has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. Many modifications and variations are possible in light of the above teaching. It is intended that the scope of the invention be limited not by this detailed description, but rather by the claims appended hereto.
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