US20040032931A1 - X-ray alignment system for fabricaing electronic chips - Google Patents
X-ray alignment system for fabricaing electronic chips Download PDFInfo
- Publication number
- US20040032931A1 US20040032931A1 US10/217,920 US21792002A US2004032931A1 US 20040032931 A1 US20040032931 A1 US 20040032931A1 US 21792002 A US21792002 A US 21792002A US 2004032931 A1 US2004032931 A1 US 2004032931A1
- Authority
- US
- United States
- Prior art keywords
- pads
- substrate
- accordance
- receptor
- printing screen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41M—PRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES; COLOUR PRINTING
- B41M1/00—Inking and printing with a printer's forme
- B41M1/12—Stencil printing; Silk-screen printing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1216—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/166—Alignment or registration; Control of registration
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0008—Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board
Definitions
- This invention relates to the fabrication of electronic chips and, more particularly, to an x-ray lithography and metrology system that aligns the stencil mask to the part to be printed upon the electronic chip.
- a method is provided to perform a screen printing of very fine pitch dimensions upon a chip substrate.
- the fine pitch dimensions and low light contrast of the ceramics used for the substrate prevents the use of fiducials to align the printing stencil.
- the invention is able to align the gold plated receptor pads of the low light contrast substrates with the screen printing stencil having very small apertures of less than 125 microns.
- the method comprises the steps of:
- step (a) b) aligning a printing screen with the receptor pads of the substrate in accordance with step (a) using the x-rays of step (a).
- FIG. 1 illustrates perspective and detail views of the Vision Probe assembly of the prior art
- FIG. 2 depicts a plan view of a substrate having pads of 5 mils or less;
- FIG. 3 shows a plan view of a fine pitch stencil;
- FIG. 4 illustrates a plan view of the stencil of FIG. 3 aligned with the pads depicted in FIG. 2, in accordance with this invention.
- FIG. 5 depicts a block diagram of an x-ray system that replaces the vision camera of FIG. 1, in accordance with this invention.
- the invention features a method of using an x-ray alignment method by replacing a Vision Camera with a commercial x-ray sub-assembly in a chip fabricating assembly.
- the invention aligns the gold plated receptor pads of five mils or less disposed upon a low light contrast ceramic (9011 alumina) substrate, with a screen printing stencil having very small apertures of less than 125 microns.
- FIG. 1 a prior art Vision Camera system 10 is shown for aligning a work piece with a stencil.
- the present invention proposes to replace the Vision Camera 15 , shown in the detail 12 of FIG. 1, with a commercially available x-ray unit.
- the new x-ray assembly will be used to align the gold plated receptor pads 16 of the low light contrast substrate 18 shown in FIG. 2, with the screen printing stencil 20 having very small apertures 22 of less than 125 microns, as illustrated in FIG. 3.
- FIG. 4 a plan view of the stencil of FIG. 3 is shown aligned with the pads 16 depicted in FIG. 2, in accordance with this invention.
- FIG. 5 a block diagram is illustrated showing the x-ray sub-assembly system 50 that replaces the vision camera 15 depicted in FIG. 1.
- the sub-assembly system comprises an x-ray gun 52 that projects high speed electrons at a metal target 54 to produce an x-ray beam 56 .
- the electrons are released from a heated filament (not shown).
- the high voltage generator 58 supplies the x-ray gun 52 with a high voltage, causing the electrons to accelerate.
- An SR 2 controller 66 controls the voltage generation.
- the system is operated under a high vacuum.
- the high vacuum is achieved by the use of a two stage pumping system comprising a backing pump 60 , and a turbo pump 62 .
- the electron stream is focused on the target 54 using a magnetic lens (not shown).
- Coils X and Y (not shown), which are fed by the XY deflection cable 64 , direct the electrons to the target 54 .
Landscapes
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Wire Bonding (AREA)
- Screen Printers (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
A method of using an x-ray alignment method by replacing a Vision Camera with a commercial x-ray sub-assembly in a chip fabricating assembly. The invention aligns the gold plated receptor pads of five mils or less, disposed upon a low light contrast ceramic (9011 alumina) substrate, with a screen printing stencil having very small apertures of less than 125 microns.
Description
- The screen printing of very fine pitch dimensions for electronic (Flip) chips is becoming more common in the art. Chip site fiducials are commonly used for alignment of the stencil mask to the actual part to be printed. Recently, the densities of these chips has increased dramatically such that these fiducials cannot be added to the design because they utilize too much space on the substrate. This has resulted in the use of the Flip Chip pads for alignment purposes. However, this procedure presents problems with sizing and lighting. Screen printers now use a Vision System camera for aligning the stencil to the pad. The Vision System camera, however, is limited to approximately twenty mils minimum for feature size. Therefore, C4 pads whose size is 5 mils or less, cannot be used as alignment targets. This problem is further complicated by the fact that ceramic substrates present very little contrast with the pads. Therefore, screen printing is limited to high contrast, large feature substrate applications.
- In lithography, visible light is employed to perform measurements in alignment systems. However, when finer measurements are to be made, x-ray technology can be employed. Because of their small wavelengths, x-rays can provide optical performance beyond the limits of conventional optical parameters.
- 1. Field of the Invention
- This invention relates to the fabrication of electronic chips and, more particularly, to an x-ray lithography and metrology system that aligns the stencil mask to the part to be printed upon the electronic chip.
- 2. Discussion of Related Art
- In U.S. Pat. No. 4,016,416 issued to Shepherd et al for “Phase Compensated Zone Plate Photodetector,” a zone plate with a photodetector mounted on the opposite face is illustrated.
- In U.S. Pat. No. 3,984,680 issued to Smith for “Soft X-Ray Mask Alignment System,” an x-ray mask alignment system is illustrated featuring x-ray fluorescence detectors mounted upon the mask. The x-ray detectors measure the x-ray fluorescent signal, which provides a low intensity output as compared with an electron flux.
- In U.S. Pat. No. 4,614,433 issued to Feldman for “Mask-to-Wafer Alignment Utilizing Zone Plates,” a mask-to-wafer alignment using zone plates illuminated by light during alignment is illustrated.
- In U.S. Pat. No. 6,272,202 issued to Chiba et al on Aug. 7, 2001 for “Exposure Method and X-Ray Mask Structure for Use With the Same,” an exposure method for printing circuitry onto a silicon wafer is illustrated.
- In U.S. Pat. No. 6,237,218 issued to Ogawa et al on May 29, 2001 for “Method and Apparatus for Manufacturing Multilayered Wiring Board and Multi-Layered Wiring Board,” a method of using alignment marks during the lamination steps and a specialized x-ray vision and mechanical alignment machine are illustrated for fabricating printed wire boards.
- In U.S. Pat. No. 5,168,513 issued to Maldonado et al on Dec. 1, 1992 for “X-Ray Metrology and Alignment Detection System,” a process for aligning an x-ray mask and a work piece with an alignment mark is depicted. The apparatus generates and uses Kev x-rays, whereas the current invention uses Mev generated x-rays.
- In Japanese Disclosure Document No. JP05-315215 issued to Koji in 1993 for “A Semiconductor Manufacturing Apparatus,” an alignment method using x-ray radiation through an aperture is shown.
- In Japanese Disclosure Document No. JP62144325 issued to Shinichi on Jun. 27, 1987 for “Positioning Method,” the alignment of a wafer is shown using a fluorescent screen and a metal shielding x-ray pattern.
- In accordance with the present invention, a method is provided to perform a screen printing of very fine pitch dimensions upon a chip substrate. The fine pitch dimensions and low light contrast of the ceramics used for the substrate prevents the use of fiducials to align the printing stencil. Using an x-ray alignment method, by replacing the Vision Camera with a commercially available x-ray sub-assembly, the invention is able to align the gold plated receptor pads of the low light contrast substrates with the screen printing stencil having very small apertures of less than 125 microns. The method comprises the steps of:
- a) beaming x-rays at receptor pads disposed upon a substrate; and
- b) aligning a printing screen with the receptor pads of the substrate in accordance with step (a) using the x-rays of step (a).
- It is an object of the present invention to provide an improved method and apparatus for aligning a low contrast substrate with a fine pitch printing screen having apertures of less than 125 microns.
- It is another object of this invention to provide an x-ray lithography system for aligning a work piece with a fine pitch mask.
- A complete understanding of the present invention may be obtained by reference to the accompanying drawings, when considered in conjunction with the subsequent detailed description, in which:
- FIG. 1 illustrates perspective and detail views of the Vision Probe assembly of the prior art;
- FIG. 2 depicts a plan view of a substrate having pads of 5 mils or less; FIG. 3 shows a plan view of a fine pitch stencil;
- FIG. 4 illustrates a plan view of the stencil of FIG. 3 aligned with the pads depicted in FIG. 2, in accordance with this invention; and
- FIG. 5 depicts a block diagram of an x-ray system that replaces the vision camera of FIG. 1, in accordance with this invention.
- For purposes of brevity and clarity, like components and elements of the apparatus of this invention will bear the same designations or numbering throughout the figures.
- Generally speaking, the invention features a method of using an x-ray alignment method by replacing a Vision Camera with a commercial x-ray sub-assembly in a chip fabricating assembly. The invention aligns the gold plated receptor pads of five mils or less disposed upon a low light contrast ceramic (9011 alumina) substrate, with a screen printing stencil having very small apertures of less than 125 microns.
- Now referring to FIG. 1, a prior art Vision
Camera system 10 is shown for aligning a work piece with a stencil. The present invention proposes to replace the Vision Camera 15, shown in thedetail 12 of FIG. 1, with a commercially available x-ray unit. The new x-ray assembly will be used to align the gold platedreceptor pads 16 of the lowlight contrast substrate 18 shown in FIG. 2, with thescreen printing stencil 20 having verysmall apertures 22 of less than 125 microns, as illustrated in FIG. 3. - Referring to FIG. 4, a plan view of the stencil of FIG. 3 is shown aligned with the
pads 16 depicted in FIG. 2, in accordance with this invention. - Referring to FIG. 5, a block diagram is illustrated showing the
x-ray sub-assembly system 50 that replaces thevision camera 15 depicted in FIG. 1. The sub-assembly system comprises anx-ray gun 52 that projects high speed electrons at ametal target 54 to produce anx-ray beam 56. The electrons are released from a heated filament (not shown). Thehigh voltage generator 58 supplies thex-ray gun 52 with a high voltage, causing the electrons to accelerate. AnSR2 controller 66 controls the voltage generation. - In normal air, under ambient air pressure, the electrons would collide with air molecules and would not reach the high velocities required to produce x-rays. Therefore, the system is operated under a high vacuum. The high vacuum is achieved by the use of a two stage pumping system comprising a
backing pump 60, and aturbo pump 62. The electron stream is focused on thetarget 54 using a magnetic lens (not shown). Coils X and Y (not shown), which are fed by theXY deflection cable 64, direct the electrons to thetarget 54. - Since other modifications and changes varied to fit particular operating requirements and environments will be apparent to those skilled in the art, the invention is not considered limited to the example chosen for purposes of disclosure, and covers all changes and modifications which do not constitute departures from the true spirit and scope of this invention. Having thus described the invention, what is desired to be protected by Letters Patent is presented in the subsequently appended claims.
Claims (14)
1. A method of aligning receptor pads of a low light contrast substrate with a fine pitch printing screen, comprising the steps of:
a) beaming x-rays at receptor pads disposed upon a substrate; and
b) aligning a printing screen with the receptor pads of the substrate in accordance with step (a), using the x-rays of step (a).
2. The method in accordance with claim 1 , wherein said printing screen is a fine pitch printing screen comprising apertures of less than approximately 125 mils.
3. The method in accordance with claim 1 , wherein said receptor pads comprise flip chip pads.
4. The method in accordance with claim 1 , wherein said receptor pads are gold plated.
5. The method in accordance with claim 1 , wherein said substrate is low contrast.
6. A method of aligning receptor pads spaced no more than approximately 5 mils from one another, disposed upon a substrate, with a fine pitch printing screen having apertures of less than approximately 125 mils, comprising the steps of:
a) beaming x-rays at receptor pads disposed upon a substrate; and
b) aligning a printing screen with the receptor pads of the substrate in accordance with step (a), using the x-rays of step (a).
7. The method in accordance with claim 6 , wherein said receptor pads comprise flip chip pads.
8. The method in accordance with claim 6 , wherein said receptor pads are gold plated.
9. The method in accordance with claim 6 , wherein said substrate is low contrast.
10. Apparatus for aligning receptor pads disposed upon a substrate, with a fine pitch printing screen, comprising:
receptor pads disposed upon a low light contrast substrate;
a fine pitch printing screen disposed adjacent said receptor pads;
aligning means for aligning said receptor pads of a low light contrast substrate with said fine pitch printing screen, said aligning means comprising an x-ray system for producing x-rays that are beamed toward said fine pitch printing screen and said receptor pads.
11. The apparatus in accordance with claim 10 , wherein said printing screen is a fine pitch printing screen comprising apertures of less than approximately 125 mils.
12. The apparatus in accordance with claim 10 , wherein said receptor pads comprise flip chip pads.
13. The apparatus in accordance with claim 10 , wherein said receptor pads are gold plated.
14. The apparatus in accordance with claim 10 , wherein said receptor pads are disposed no more than approximately 5 mils from one another.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/217,920 US20040032931A1 (en) | 2002-08-13 | 2002-08-13 | X-ray alignment system for fabricaing electronic chips |
JP2003271680A JP3980532B2 (en) | 2002-08-13 | 2003-07-08 | Alignment method and apparatus |
US11/124,653 US7270478B2 (en) | 2002-08-13 | 2005-05-09 | X-ray alignment system for fabricating electronic chips |
US11/758,961 US20080043909A1 (en) | 2002-08-13 | 2007-06-06 | X-Ray Alignment System For Fabricating Electronic Chips |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/217,920 US20040032931A1 (en) | 2002-08-13 | 2002-08-13 | X-ray alignment system for fabricaing electronic chips |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/124,653 Continuation-In-Part US7270478B2 (en) | 2002-08-13 | 2005-05-09 | X-ray alignment system for fabricating electronic chips |
Publications (1)
Publication Number | Publication Date |
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US20040032931A1 true US20040032931A1 (en) | 2004-02-19 |
Family
ID=31714459
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/217,920 Abandoned US20040032931A1 (en) | 2002-08-13 | 2002-08-13 | X-ray alignment system for fabricaing electronic chips |
US11/124,653 Expired - Fee Related US7270478B2 (en) | 2002-08-13 | 2005-05-09 | X-ray alignment system for fabricating electronic chips |
US11/758,961 Abandoned US20080043909A1 (en) | 2002-08-13 | 2007-06-06 | X-Ray Alignment System For Fabricating Electronic Chips |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/124,653 Expired - Fee Related US7270478B2 (en) | 2002-08-13 | 2005-05-09 | X-ray alignment system for fabricating electronic chips |
US11/758,961 Abandoned US20080043909A1 (en) | 2002-08-13 | 2007-06-06 | X-Ray Alignment System For Fabricating Electronic Chips |
Country Status (2)
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US (3) | US20040032931A1 (en) |
JP (1) | JP3980532B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060007993A1 (en) * | 2004-07-01 | 2006-01-12 | Broadcom Corporation | Threshold setting using piecewise linear approximation for channel diagnostic systems |
US20080043909A1 (en) * | 2002-08-13 | 2008-02-21 | International Business Machines Corporation | X-Ray Alignment System For Fabricating Electronic Chips |
EP2290420A1 (en) * | 2009-08-28 | 2011-03-02 | European Space Agency | Method for assembling a mirror plate stack |
CN117329990A (en) * | 2023-09-26 | 2024-01-02 | 常州市三洋精密制版有限公司 | Screen plate making silk screen angle measuring device |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8694183B1 (en) | 2011-12-06 | 2014-04-08 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Partial automated alignment and integration system |
US9739727B2 (en) | 2015-01-21 | 2017-08-22 | The Boeing Company | Systems and methods for aligning an aperture |
EP3986718A4 (en) * | 2019-06-24 | 2022-09-14 | Magic Leap, Inc. | Polymer patterned disk stack manufacturing |
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US4614433A (en) * | 1984-07-09 | 1986-09-30 | At&T Bell Laboratories | Mask-to-wafer alignment utilizing zone plates |
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US6237218B1 (en) * | 1997-01-29 | 2001-05-29 | Kabushiki Kaisha Toshiba | Method and apparatus for manufacturing multilayered wiring board and multi-layered wiring board |
US6272202B1 (en) * | 1998-10-29 | 2001-08-07 | Canon Kabushiki Kaisha | Exposure method and X-ray mask structure for use with the same |
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- 2002-08-13 US US10/217,920 patent/US20040032931A1/en not_active Abandoned
-
2003
- 2003-07-08 JP JP2003271680A patent/JP3980532B2/en not_active Expired - Fee Related
-
2005
- 2005-05-09 US US11/124,653 patent/US7270478B2/en not_active Expired - Fee Related
-
2007
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US4614433A (en) * | 1984-07-09 | 1986-09-30 | At&T Bell Laboratories | Mask-to-wafer alignment utilizing zone plates |
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Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080043909A1 (en) * | 2002-08-13 | 2008-02-21 | International Business Machines Corporation | X-Ray Alignment System For Fabricating Electronic Chips |
US20060007993A1 (en) * | 2004-07-01 | 2006-01-12 | Broadcom Corporation | Threshold setting using piecewise linear approximation for channel diagnostic systems |
US7627026B2 (en) * | 2004-07-01 | 2009-12-01 | Broadcom Corporation | Threshold setting using piecewise linear approximation for channel diagnostic systems |
EP2290420A1 (en) * | 2009-08-28 | 2011-03-02 | European Space Agency | Method for assembling a mirror plate stack |
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EP2348347A3 (en) * | 2009-08-28 | 2012-07-04 | European Space Agency | Method for assembling two or more mirror plate stacks into a rigid unit |
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US8746903B2 (en) | 2009-08-28 | 2014-06-10 | European Space Agency | Method for assembling a mirror plate stack |
CN117329990A (en) * | 2023-09-26 | 2024-01-02 | 常州市三洋精密制版有限公司 | Screen plate making silk screen angle measuring device |
Also Published As
Publication number | Publication date |
---|---|
JP2004078201A (en) | 2004-03-11 |
JP3980532B2 (en) | 2007-09-26 |
US7270478B2 (en) | 2007-09-18 |
US20080043909A1 (en) | 2008-02-21 |
US20050194427A1 (en) | 2005-09-08 |
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Owner name: INTERNATIONAL BUSINESS MACHINES CORPORATION, NEW Y Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:JIMAREZ, MIGUEL ANGEL;REEL/FRAME:013199/0039 Effective date: 20020812 |
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STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |