+

US20020113634A1 - Cmos output driver with slew rate control - Google Patents

Cmos output driver with slew rate control Download PDF

Info

Publication number
US20020113634A1
US20020113634A1 US09/789,212 US78921201A US2002113634A1 US 20020113634 A1 US20020113634 A1 US 20020113634A1 US 78921201 A US78921201 A US 78921201A US 2002113634 A1 US2002113634 A1 US 2002113634A1
Authority
US
United States
Prior art keywords
transistor
output
pull
terminal
changes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US09/789,212
Other versions
US6441653B1 (en
Inventor
James Spurlin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to US09/789,212 priority Critical patent/US6441653B1/en
Assigned to TEXAS INSTRUMENTS INCORPORATED reassignment TEXAS INSTRUMENTS INCORPORATED ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SPURLIN, JAMES C.
Publication of US20020113634A1 publication Critical patent/US20020113634A1/en
Application granted granted Critical
Publication of US6441653B1 publication Critical patent/US6441653B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • H03K17/161Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/165Modifications for eliminating interference voltages or currents in field-effect transistor switches by feedback from the output circuit to the control circuit
    • H03K17/166Soft switching

Definitions

  • This invention relates generally to bus driver circuits, and more particularly to a CMOS output driver with slew rate control to ensure good signal integrity in a high-speed printed circuit board (PCB) system by reducing self-induced switching noise, transmission line effects generally attributable to PCB traces, and electromagnetic interference.
  • PCB printed circuit board
  • FIG. 1 is a schematic diagram illustrating a simple standard CMOS output driver circuit without slew rate control 100 that is well known to those skilled in the art.
  • the output transistors 102 , 104 are designed for high drive current capability and, as such, turn on with very fast slew rates.
  • slew rate control circuits have been proposed and implemented in the art. These well-known slew rate control circuits employ complex architectures such as delay lines, RC time constants, one-shots, multi-segmented output transistors, threshold-critical buffers, bias generators, and the like.
  • One slew rate control circuit is disclosed in U.S. Pat. No. 5,877,647 to Vajapey et al., entitled CMOS Output Buffer With Slew Rate Control, issued Mar. 2, 1999.
  • the slew rate control circuit disclosed in the '647 patent employs multiple (or segmented) output transistors in which slew rate is controlled by relative sizing of the multiple output transistors.
  • the slew rate control circuit disclosed in the '647 patent is controlled by timing the turn-on sequence of multiple output transistors by setting the threshold of feedback NAND or NOR gates. These gates have a large gain and result in an abrupt output impedance change when the threshold is crossed. These feedback NAND and NOR gates also have thresholds that are dependent upon the ratio of Pchannel to Nchannel drive strengths.
  • CMOS output driver with slew rate control that employs a single output transistor rather than multiple or segmented output transistors to control each output signal transition.
  • the present invention provides an improved CMOS output driver having a DC feedback circuit that changes the output impedance of the driving transistors as the output voltage transition progresses.
  • the output voltage slew rate is then controlled by limiting the gate voltages (node of Ng and Pg) of the output driver transistors during the transition.
  • a CMOS output driver with slew rate control employs a single output transistor, rather than multiple output transistors, to control slew rate during an output voltage transition.
  • a CMOS output driver with slew rate control employs a source follower feedback scheme to provide a smooth transition on the output transistor gate as the output signal transitions, resulting in low switching noise and reduced EMI.
  • CMOS output driver with slew rate control integrates process compensation in gate driver transistors to minimize transmission line reflections and ripple.
  • a CMOS output driver with slew rate control employs a resistor divider using matched resistors to limit and control output transistor gate drive during output signal transitions to reduce self-induced Ldi/dt noise.
  • FIG. 1 is a schematic diagram illustrating a conventional CMOS output driver without slew rate control that is known in the prior art
  • FIG. 2 is a schematic diagram illustrating a CMOS output driver with slew rate control according to one embodiment of the present invention
  • FIG. 3 is a graph that compares the output DC V-I characteristics of the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1;
  • FIG. 4 is a graph that compares switching noise characteristics of the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1;
  • FIG. 5 is a graph that compares transmission line reflection and ringing characteristics at the front end (driver output) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1; and
  • FIG. 6 is a graph that compares transmission line reflection and ringing characteristics at the end (receiver input) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1.
  • FIG. 1 is a schematic diagram illustrating a conventional CMOS output driver 100 without slew rate control that is well known in the prior art.
  • the output transistors 102 , 104 are designed for high drive current capability and, as such, turn on with very fast slew rates.
  • FIG. 2 is a schematic diagram illustrating a CMOS output driver 200 with slew rate control according to one embodiment of the present invention.
  • the CMOS output driver 200 advantageously controls the slew rate to reduce self-induced Ldi/dt switching noise, reduce transmission line effects of printed circuit board traces, and reduce electromagnetic interference, as stated herein before. It can be seen that a DC feedback circuit 201 , 203 has been added between the common output 202 and the gate node 204 , 206 of each respective output transistor 102 , 104 to implement the present output driver 200 with slew rate control.
  • Each DC feedback circuit 201 , 203 functions to change the output impedance of its respective driving transistor 208 , 210 as the output voltage transition at the common output 202 progresses.
  • the output voltage slew rate is then controlled by limiting the gate voltages at the gate nodes 204 , 206 of the output driver transistors 102 , 104 during the transition.
  • the falling output voltage transition is controlled by the bottom half of the CMOS output driver circuit 200 . Since operation is similar for the rising output voltage transition that is controlled by the top half of the CMOS output driver circuit 200 , only the bottom half operation will be described herein to preserve clarity and brevity.
  • the input 212 goes low, it turns on transistor P 4 ( 207 ).
  • transistor N 2 acts as a source follower to turn transistor N 4 ( 210 ) on.
  • Transistor N 4 ( 210 ) further adds some degree of process compensation. Making the output transistor 104 strong, for example, would cause it to switch faster; but since transistor N 4 ( 210 ) is also strong, transistor N 4 ( 210 ) reduces the gate 206 voltage of output transistor 104 to compensate.
  • the present inventor found silicide-blocked polysilicon resistors to be most preferable to implement the present CMOS output driver circuit 200 due to their reasonable sheet resistance, low temperature coefficient, and low voltage dependency characteristics.
  • FIG. 3 is a graph 300 that compares the output DC V-I characteristics of the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and a typical CMOS output driver control circuit 100 shown in FIG. 1. Specifically, the V-I characteristics are compared for the LOW state, i.e., when the lower output transistor 104 is turned ON. At high voltage, i.e., greater than 1.1 volts, the standard driver output is saturated (constant current mode). When the output voltage starts a high-to-low transition, the current will quickly increase to that saturation value, resulting in large Ldi/dt noise. With slew rate control however, the current increases to a lower level, reducing the Ldi/dt noise. As the output voltage falls, i.e., below 1.1 volts, the drive current of CMOS output driver circuit 200 can be seen to approach that of a standard driver 100 , providing full DC drive capability.
  • the output voltage falls, i.e., below 1.1 volts
  • FIG. 4 is a graph 400 that compares switching noise characteristics (out_slew vs. out_std) of the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and a standard CMOS output driver control circuit 100 shown in FIG. 1.
  • a logic device driving a lumped load and having 27 switching outputs and a single quiescent output was implemented using each driver 100 , 200 .
  • the standard CMOS output driver circuit 100 produced 770 mV of switching noise on the quiescent output as seen from waveform 402 , while the CMOS output driver circuit 200 produced only 300 mV, as seen from waveform 404 .
  • the output slew rate was reduced from 10.7V/ns for the standard CMOS output driver circuit 100 to only 3.2V/ns for the CMOS output driver circuit 200 , as seen from waveforms 406 and 408 respectively.
  • FIG. 5 is a graph 500 that compares transmission line reflection and ringing characteristics (Out_Std vs. Out_Slew) at the front end (driver output) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and the standard CMOS output driver control circuit 100 shown in FIG. 1.
  • the Out_Slew waveform 502 was generated by the CMOS output driver circuit 200 while the Out_Std waveform 504 was generated by the standard CMOS output driver circuit 100 . It can be seen that transmission line reflections and ringing are suppressed at the front end of the transmission line to a greater extent with the CMOS output driver circuit 200 .
  • FIG. 6 is a graph 600 that compares transmission line reflection and ringing characteristics (Out_Std vs. Out_Slew) at the end (receiver input) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and the standard CMOS output driver control circuit 100 shown in FIG. 1.
  • the Out_Slew waveform 602 was generated by the CMOS output driver circuit 200 while the Out_Std waveform 604 was generated by the standard CMOS output driver circuit 100 .
  • the results are similar in that the transmission line reflections and ringing are suppressed at the receiver end of the transmission line to a greater extent with the CMOS output driver circuit 200 .
  • a CMOS output driver circuit 200 employs a simple DC feedback scheme, rather than a more well-known complex scheme such as use of delay lines, RC time constants, one-shots, multi-segmented output transistors, threshold-critical buffers, bias generators, and the like, to provide effective slew rate control using standard output transistor geometries and processes.
  • the DC feedback scheme changes the output impedance of the driving transistors 208 , 210 as the output voltage transition progresses such that the output voltage slew rate is controlled by limiting the gate voltages of the output driver transistors 102 , 104 during the transition.
  • the present invention presents a significant advancement in the art of CMOS output driver circuit technology. Further, this invention has been described in considerable detail in order to provide those skilled in the data communication art with the information needed to apply the novel principles and to construct and use such specialized components as are required. In view of the foregoing descriptions, it should further be apparent that the present invention represents a significant departure from the prior art in construction and operation. However, while particular embodiments of the present invention have been described herein in detail, it is to be understood that various alterations, modifications and substitutions can be made therein without departing in any way from the spirit and scope of the present invention, as defined in the claims which follow.

Landscapes

  • Logic Circuits (AREA)
  • Electronic Switches (AREA)

Abstract

A CMOS output driver with a DC feedback circuit architecture that changes the output impedance of the driving transistors as the output voltage transition progresses. The output voltage slew rate is then controlled by limiting the gate voltages (node of Ng and Pg) of the output driver transistors during the transition.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0001]
  • This invention relates generally to bus driver circuits, and more particularly to a CMOS output driver with slew rate control to ensure good signal integrity in a high-speed printed circuit board (PCB) system by reducing self-induced switching noise, transmission line effects generally attributable to PCB traces, and electromagnetic interference. [0002]
  • 2. Description of the Prior Art [0003]
  • In modern high-speed PCB systems, fast bus drivers must have controlled output slew rates to ensure good signal integrity. Controlling the slew rate provides three advantages: 1) The self-induced Ldi/dt switching noise of the IC is reduced, 2) transmission line effects of the printed circuit board traces are reduced, and 3) electromagnetic interference is reduced. [0004]
  • FIG. 1 is a schematic diagram illustrating a simple standard CMOS output driver circuit without [0005] slew rate control 100 that is well known to those skilled in the art. The output transistors 102, 104 are designed for high drive current capability and, as such, turn on with very fast slew rates.
  • Many slew rate control circuits have been proposed and implemented in the art. These well-known slew rate control circuits employ complex architectures such as delay lines, RC time constants, one-shots, multi-segmented output transistors, threshold-critical buffers, bias generators, and the like. One slew rate control circuit is disclosed in U.S. Pat. No. 5,877,647 to Vajapey et al., entitled CMOS Output Buffer With Slew Rate Control, issued Mar. 2, 1999. The slew rate control circuit disclosed in the '647 patent employs multiple (or segmented) output transistors in which slew rate is controlled by relative sizing of the multiple output transistors. Further the slew rate control circuit disclosed in the '647 patent is controlled by timing the turn-on sequence of multiple output transistors by setting the threshold of feedback NAND or NOR gates. These gates have a large gain and result in an abrupt output impedance change when the threshold is crossed. These feedback NAND and NOR gates also have thresholds that are dependent upon the ratio of Pchannel to Nchannel drive strengths. [0006]
  • In view of the foregoing, a need exists for CMOS output driver with slew rate control that employs a single output transistor rather than multiple or segmented output transistors to control each output signal transition. [0007]
  • SUMMARY OF THE INVENTION
  • To meet the above and other objectives, the present invention provides an improved CMOS output driver having a DC feedback circuit that changes the output impedance of the driving transistors as the output voltage transition progresses. The output voltage slew rate is then controlled by limiting the gate voltages (node of Ng and Pg) of the output driver transistors during the transition. [0008]
  • In one aspect of the invention, a CMOS output driver with slew rate control employs a single output transistor, rather than multiple output transistors, to control slew rate during an output voltage transition. [0009]
  • In another aspect of the invention, a CMOS output driver with slew rate control employs a source follower feedback scheme to provide a smooth transition on the output transistor gate as the output signal transitions, resulting in low switching noise and reduced EMI. [0010]
  • In yet another aspect of the invention, a CMOS output driver with slew rate control integrates process compensation in gate driver transistors to minimize transmission line reflections and ripple. [0011]
  • In still another aspect of the invention, a CMOS output driver with slew rate control employs a resistor divider using matched resistors to limit and control output transistor gate drive during output signal transitions to reduce self-induced Ldi/dt noise. [0012]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • Other aspects and features of the present invention, and many of the attendant advantages of the present invention, will be readily appreciated as the same become better understood by reference to the following detailed description when considered in connection with the accompanying drawings in which like reference numerals designate like parts throughout the figures thereof and wherein: [0013]
  • FIG. 1 is a schematic diagram illustrating a conventional CMOS output driver without slew rate control that is known in the prior art; [0014]
  • FIG. 2 is a schematic diagram illustrating a CMOS output driver with slew rate control according to one embodiment of the present invention; [0015]
  • FIG. 3 is a graph that compares the output DC V-I characteristics of the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1; [0016]
  • FIG. 4 is a graph that compares switching noise characteristics of the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1; [0017]
  • FIG. 5 is a graph that compares transmission line reflection and ringing characteristics at the front end (driver output) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1; and [0018]
  • FIG. 6 is a graph that compares transmission line reflection and ringing characteristics at the end (receiver input) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver control circuit shown in FIG. 2 and the CMOS output driver control circuit shown in FIG. 1. [0019]
  • While the above-identified drawing figures set forth particular embodiments, other embodiments of the present invention are also contemplated, as noted in the discussion. In all cases, this disclosure presents illustrated embodiments of the present invention by way of representation and not limitation. Numerous other modifications and embodiments can be devised by those skilled in the art which fall within the scope and spirit of the principles of this invention. [0020]
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • FIG. 1 is a schematic diagram illustrating a conventional [0021] CMOS output driver 100 without slew rate control that is well known in the prior art. The output transistors 102, 104 are designed for high drive current capability and, as such, turn on with very fast slew rates.
  • FIG. 2 is a schematic diagram illustrating a [0022] CMOS output driver 200 with slew rate control according to one embodiment of the present invention. The CMOS output driver 200 advantageously controls the slew rate to reduce self-induced Ldi/dt switching noise, reduce transmission line effects of printed circuit board traces, and reduce electromagnetic interference, as stated herein before. It can be seen that a DC feedback circuit 201, 203 has been added between the common output 202 and the gate node 204, 206 of each respective output transistor 102, 104 to implement the present output driver 200 with slew rate control. Each DC feedback circuit 201, 203 functions to change the output impedance of its respective driving transistor 208, 210 as the output voltage transition at the common output 202 progresses. The output voltage slew rate is then controlled by limiting the gate voltages at the gate nodes 204, 206 of the output driver transistors 102, 104 during the transition.
  • The falling output voltage transition is controlled by the bottom half of the CMOS [0023] output driver circuit 200. Since operation is similar for the rising output voltage transition that is controlled by the top half of the CMOS output driver circuit 200, only the bottom half operation will be described herein to preserve clarity and brevity. With continued reference now to FIG. 2, when the input 212 goes low, it turns on transistor P4 (207). At the same time, since the output 202 is high, transistor N2 (209) acts as a source follower to turn transistor N4 (210) on. This sets up a resistor voltage divider with resistor R4 (211) and resistor R5 (213) to limit the gate 206 voltage of the output transistor 104, which then slows down the initial turn-on of the output transistor 104. The foregoing process therefore reduces the self-induced Ldi/dt noise of an associated IC by limiting the rate of change of switching current through the package parasitic inductances. As the output voltage falls, the resistance of transistor N4 (210) increases, allowing the gate 206 voltage of output transistor 104 to rise. When the output voltage falls below two Vtn, transistor N4 (210) will cut off completely, allowing full rail voltage to drive the gate 206 of output transistor 104 to provide maximum DC drive capability. The net effect of the foregoing process upon the output voltage waveform is to slow down the slew rate. Transistor N4 (210) further adds some degree of process compensation. Making the output transistor 104 strong, for example, would cause it to switch faster; but since transistor N4 (210) is also strong, transistor N4 (210) reduces the gate 206 voltage of output transistor 104 to compensate. The present inventor found silicide-blocked polysilicon resistors to be most preferable to implement the present CMOS output driver circuit 200 due to their reasonable sheet resistance, low temperature coefficient, and low voltage dependency characteristics.
  • FIG. 3 is a graph [0024] 300 that compares the output DC V-I characteristics of the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and a typical CMOS output driver control circuit 100 shown in FIG. 1. Specifically, the V-I characteristics are compared for the LOW state, i.e., when the lower output transistor 104 is turned ON. At high voltage, i.e., greater than 1.1 volts, the standard driver output is saturated (constant current mode). When the output voltage starts a high-to-low transition, the current will quickly increase to that saturation value, resulting in large Ldi/dt noise. With slew rate control however, the current increases to a lower level, reducing the Ldi/dt noise. As the output voltage falls, i.e., below 1.1 volts, the drive current of CMOS output driver circuit 200 can be seen to approach that of a standard driver 100, providing full DC drive capability.
  • FIG. 4 is a [0025] graph 400 that compares switching noise characteristics (out_slew vs. out_std) of the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and a standard CMOS output driver control circuit 100 shown in FIG. 1. Specifically, a logic device driving a lumped load and having 27 switching outputs and a single quiescent output was implemented using each driver 100, 200. The standard CMOS output driver circuit 100 produced 770 mV of switching noise on the quiescent output as seen from waveform 402, while the CMOS output driver circuit 200 produced only 300 mV, as seen from waveform 404. Further, the output slew rate was reduced from 10.7V/ns for the standard CMOS output driver circuit 100 to only 3.2V/ns for the CMOS output driver circuit 200, as seen from waveforms 406 and 408 respectively.
  • FIG. 5 is a [0026] graph 500 that compares transmission line reflection and ringing characteristics (Out_Std vs. Out_Slew) at the front end (driver output) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and the standard CMOS output driver control circuit 100 shown in FIG. 1. The Out_Slew waveform 502 was generated by the CMOS output driver circuit 200 while the Out_Std waveform 504 was generated by the standard CMOS output driver circuit 100. It can be seen that transmission line reflections and ringing are suppressed at the front end of the transmission line to a greater extent with the CMOS output driver circuit 200.
  • FIG. 6 is a [0027] graph 600 that compares transmission line reflection and ringing characteristics (Out_Std vs. Out_Slew) at the end (receiver input) of a 50 Ohm transmission line that is 2-inches long and terminated by 50 Ohms and 3 pF for the CMOS output driver circuit 200 with slew rate control shown in FIG. 2 and the standard CMOS output driver control circuit 100 shown in FIG. 1. Again, the Out_Slew waveform 602 was generated by the CMOS output driver circuit 200 while the Out_Std waveform 604 was generated by the standard CMOS output driver circuit 100. The results are similar in that the transmission line reflections and ringing are suppressed at the receiver end of the transmission line to a greater extent with the CMOS output driver circuit 200.
  • In summary explanation, a CMOS [0028] output driver circuit 200 employs a simple DC feedback scheme, rather than a more well-known complex scheme such as use of delay lines, RC time constants, one-shots, multi-segmented output transistors, threshold-critical buffers, bias generators, and the like, to provide effective slew rate control using standard output transistor geometries and processes. The DC feedback scheme changes the output impedance of the driving transistors 208, 210 as the output voltage transition progresses such that the output voltage slew rate is controlled by limiting the gate voltages of the output driver transistors 102, 104 during the transition.
  • In view of the above, it can be seen the present invention presents a significant advancement in the art of CMOS output driver circuit technology. Further, this invention has been described in considerable detail in order to provide those skilled in the data communication art with the information needed to apply the novel principles and to construct and use such specialized components as are required. In view of the foregoing descriptions, it should further be apparent that the present invention represents a significant departure from the prior art in construction and operation. However, while particular embodiments of the present invention have been described herein in detail, it is to be understood that various alterations, modifications and substitutions can be made therein without departing in any way from the spirit and scope of the present invention, as defined in the claims which follow. For example, although various embodiments have been presented herein with reference to particular transistor types, the present inventive structures and characteristics are not necessarily limited to particular transistor types or sets of characteristics as used herein. It shall be understood the embodiments described herein above can easily be implemented using many diverse transistor types so long as the combinations achieve an output driver with slew rate control according to the inventive principles set forth herein above. [0029]

Claims (23)

What is claimed is:
1. A CMOS output driver circuit comprising:
a single pull up output transistor connected between a first supply terminal and an output terminal, the pull up output transistor having a control terminal;
a single pull down output transistor connected between a second supply terminal and the output terminal, the pull down output transistor having a control terminal; and
an input terminal for receiving an input signal and connected to a pull up slew rate control circuit and to a pull down slew rate control circuit;
the pull up slew rate control circuit forming a DC feedback path between the output terminal and the pull up output transistor control terminal and operative to generate and provide a variable control voltage to the pull up output transistor control terminal;
the pull down slew rate control circuit forming a DC feedback path between the output terminal and the pull down output transistor control terminal and operative to generate and provide a variable control voltage to the pull down output transistor control terminal.
2. The CMOS output driver circuit according to claim 1 wherein the pull up slew rate control circuit comprises a transistor/resistor voltage divider, the transistor/resistor voltage divider responsive to changes in output terminal voltage such that the variable control voltage to the pull up output transistor control terminal changes with resistance changes associated with the transistor/resistor voltage divider.
3. The CMOS output driver circuit according to claim 1 wherein the pull down slew rate control circuit comprises a transistor/resistor voltage divider, the transistor/resistor voltage divider responsive to changes in output terminal voltage such that the variable control voltage to the pull down output transistor control terminal changes with resistance changes associated with the transistor/resistor voltage divider.
4. The CMOS output driver circuit according to claim 1 wherein the pull up slew rate control circuit comprises a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that its resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the variable control voltage to the pull up output transistor control terminal changes with the changes in the resistance ratio.
5. The CMOS output driver circuit according to claim 4 wherein the resistance of the CMOS transistor is configured to increase in response to increases in the output terminal voltage.
6. The CMOS output driver circuit according to claim 1 wherein the pull down slew rate control circuit comprises a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that its resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the variable control voltage to the pull down output transistor control terminal changes with the changes in the resistance ratio.
7. The CMOS output driver circuit according to claim 6 wherein the resistance of the CMOS transistor is configured to increase in response to decreases in the output terminal voltage.
8. An output driver circuit comprising:
a single pull up output transistor connected between a first supply terminal and an output terminal, the pull up output transistor having a control terminal;
a single pull down output transistor connected between a second supply terminal and the output terminal, the pull down output transistor having a control terminal;
an input terminal for receiving an input signal;
a pull up slew rate control circuit responsive to an input signal to process a signal generated at the output terminal and generate a pull up output transistor control terminal signal therefrom;
a pull down slew rate control circuit responsive to the input signal to process a signal generated at the output terminal and generate a pull down output transistor control terminal signal therefrom.
9. The output driver circuit according to claim 8 wherein the pull up slew rate control circuit comprises a transistor/resistor voltage divider, the transistor/resistor voltage divider responsive to changes in output terminal voltage to change a voltage divider resistor ratio such that the control signal to the pull up output transistor control terminal varies with the changes associated with the transistor/resistor voltage divider ratio.
10. The output driver circuit according to claim 8 wherein the pull down slew rate control circuit comprises a transistor/resistor voltage divider, the transistor/resistor voltage divider responsive to changes in output terminal voltage to change a voltage divider resistor ratio such that the control signal to the pull down output transistor control terminal varies with the changes associated with the transistor/resistor voltage divider resistor ratio.
11. The output driver circuit according to claim 8 wherein the pull up slew rate control circuit comprises a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that its resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the control signal to the pull up output transistor control terminal changes with the changes in the resistance ratio.
12. The output driver circuit according to claim 11 wherein the resistance of the CMOS transistor is configured to increase in response to increases in the output terminal voltage.
13. The output driver circuit according to claim 8 wherein the pull down slew rate control circuit comprises a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that its resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the control signal to the pull up output transistor control terminal changes with the changes in the resistance ratio.
14. The output driver circuit according to claim 13 wherein the resistance of the CMOS transistor is configured to increase in response to decreases in the output terminal voltage.
15. A method for reducing switching transients in a buffer circuit for driving a load having at least capacitive characteristics, comprising the steps of:
providing the buffer circuit with a single pull down transistor, a single pull up transistor, a first DC feedback circuit associated with the single pull down transistor, and a second DC feedback circuit associated with the single pull up transistor; and
turning on the pull down transistor in response to a first transition of an input signal to begin generating a first output voltage transition at an output terminal at a rate controlled by the first DC feedback circuit such that as the output voltage falls, the first DC feedback circuit will operate to cause the pull down transistor to turn-on more quickly.
16. The method according to claim 15 wherein the step of turning on the pull down transistor further comprises causing the pull down transistor to turn-on at its maximum rate when the first DC feedback circuit senses a predetermined threshold voltage.
17. The method according to claim 15 further comprising the step of turning on the pull up transistor in response to a second transition of an input signal to begin generating a second output voltage transition at the output terminal at a rate controlled by the second DC feedback circuit such that as the output voltage increases, the second DC feedback circuit will operate to cause the pull up transistor to turn-on more quickly.
18. The method according to claim 17 wherein the step of turning on the pull up transistor further comprises causing the pull up transistor to turn-on at its maximum rate when the second DC feedback circuit senses a predetermined threshold voltage.
19. A CMOS output driver circuit comprising:
a single pull up output transistor connected between a first supply terminal and an output terminal, the pull up output transistor having a control terminal;
a single pull down output transistor connected between a second supply terminal and the output terminal, the pull down output transistor having a control terminal; and
an input terminal for receiving an input signal and connected to a means for generating and providing a variable control voltage to the pull up output transistor control terminal and further connected to a means for generating and providing a variable control voltage to the pull down output transistor control terminal;
the means for generating and providing a variable control voltage to the pull up output transistor control terminal being responsive to a first transition of the input signal such that pull up output transistor turn-on time decreases with increases in output signal level at the output terminal;
the means for generating and providing a variable control voltage to the pull down output transistor control terminal being responsive to a second transition of the input signal such that pull down output transistor turn-on time decreases with decreases in output signal level at the output terminal.
20. The CMOS output driver circuit according to claim 19 wherein the means for generating and providing a variable control voltage to the pull up output transistor control terminal comprises a pull up slew rate control circuit including a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that CMOS transistor resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the control voltage to the pull up output transistor control terminal changes with the changes in the resistance ratio.
21. The CMOS output driver circuit according to claim 20 wherein the resistance of the CMOS transistor is configured to increase in response to increases in the output terminal voltage.
22. The CMOS output driver circuit according to claim 19 wherein the means for generating and providing a variable control voltage to the pull down output transistor control terminal comprises a pull down slew rate control circuit including a CMOS transistor and a resistor voltage divider, the CMOS transistor responsive to changes in output terminal voltage such that CMOS transistor resistance changes to vary a resistance ratio associated with the resistor voltage divider and such that the control voltage to the pull up output transistor control terminal changes with the changes in the resistance ratio.
23. The CMOS output driver circuit according to claim 22 wherein the resistance of the CMOS transistor is configured to increase in response to decreases in the output terminal voltage.
US09/789,212 2001-02-20 2001-02-20 CMOS output driver with slew rate control Expired - Lifetime US6441653B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US09/789,212 US6441653B1 (en) 2001-02-20 2001-02-20 CMOS output driver with slew rate control

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/789,212 US6441653B1 (en) 2001-02-20 2001-02-20 CMOS output driver with slew rate control

Publications (2)

Publication Number Publication Date
US20020113634A1 true US20020113634A1 (en) 2002-08-22
US6441653B1 US6441653B1 (en) 2002-08-27

Family

ID=25146923

Family Applications (1)

Application Number Title Priority Date Filing Date
US09/789,212 Expired - Lifetime US6441653B1 (en) 2001-02-20 2001-02-20 CMOS output driver with slew rate control

Country Status (1)

Country Link
US (1) US6441653B1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2390496A (en) * 2002-01-22 2004-01-07 Agilent Technologies Inc An output driver circuit compatible with both open-drain and SSTL networks
US20060145735A1 (en) * 2003-07-14 2006-07-06 Kazuo Sakamoto Output buffer circuit eliminating high voltage insulated transistor and level shift circuit, and an interface circuit using the output buffer circuit
KR20160086047A (en) 2015-01-09 2016-07-19 삼성전기주식회사 Gate driver circuit
US11323031B2 (en) 2019-07-11 2022-05-03 Stmicroelectronics S.R.L. Half-bridge driver circuit with a switched capacitor supply voltage for high side drive signal generation
US11387735B2 (en) * 2019-12-12 2022-07-12 Stmicroelectronics S.R.L. Half-bridge circuit with slew rate control

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7010637B2 (en) * 2002-05-02 2006-03-07 Intel Corporation Single-ended memory interface system
US6600348B1 (en) * 2002-05-30 2003-07-29 Sun Microsystems, Inc. Input/output device having dynamic delay
US7053677B2 (en) * 2002-05-30 2006-05-30 Sun Microsystems, Inc. Input/output device having linearized output response
US6784690B2 (en) * 2002-09-04 2004-08-31 Sun Microsystems, Inc. Circuit and method for dynamically controlling the impedance of an input/output driver
JP3548170B1 (en) * 2003-01-17 2004-07-28 沖電気工業株式会社 Output circuit of semiconductor integrated circuit device
US7256617B2 (en) * 2003-03-13 2007-08-14 Sun Microsystems, Inc. Method and apparatus to linearize output buffer and on-chip termination
TWI229499B (en) * 2003-10-01 2005-03-11 Toppoly Optoelectronics Corp Voltage level shifting circuit
US7196546B2 (en) * 2003-12-30 2007-03-27 Intel Corporation Low-swing bus driver and receiver
US7034583B1 (en) * 2004-10-06 2006-04-25 Texas Instruments Incorporated Versatile system for output energy limiting circuitry
US7621463B2 (en) * 2005-01-12 2009-11-24 Flodesign, Inc. Fluid nozzle system using self-propelling toroidal vortices for long-range jet impact
US20060158224A1 (en) * 2005-01-14 2006-07-20 Elite Semiconductor Memory Technology, Inc. Output driver with feedback slew rate control
US7362084B2 (en) * 2005-03-14 2008-04-22 Silicon Storage Technology, Inc. Fast voltage regulators for charge pumps
US7737765B2 (en) * 2005-03-14 2010-06-15 Silicon Storage Technology, Inc. Fast start charge pump for voltage regulators
US7378878B2 (en) * 2005-04-27 2008-05-27 Broadcom Corporation Driver circuit having programmable slew rate
KR101207794B1 (en) * 2006-02-16 2012-12-05 에이저 시스템즈 엘엘시 Systems and methods for reduction of cross coupling in proximate signal lines
US7902885B2 (en) * 2006-12-28 2011-03-08 Stmicroelectronics Pvt. Ltd. Compensated output buffer for improving slew control rate
US7928774B2 (en) * 2008-09-29 2011-04-19 Infineon Technologies Ag Adaptive drive signal adjustment for bridge EMI control
KR101894470B1 (en) * 2012-05-21 2018-09-03 에스케이하이닉스 주식회사 Output driver circuit
JP2015015643A (en) * 2013-07-05 2015-01-22 ローム株式会社 Signal transmission circuit
WO2017150788A1 (en) * 2016-03-03 2017-09-08 전석주 Electronic block system for programming education
KR102656219B1 (en) 2016-11-07 2024-04-11 삼성전자주식회사 Memory device, memory system comprising that, and slew rate calibration method thereof
US9667234B1 (en) 2016-11-11 2017-05-30 Teledyne Scientific & Imaging, Llc Slew-rate enhanced energy efficient source follower circuit
US10784763B2 (en) 2017-03-07 2020-09-22 Mediatek Inc. Dynamic slew rate control
US10951208B2 (en) 2017-08-04 2021-03-16 RACYICS GmbH Slew-limited output driver circuit

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612466A (en) * 1984-08-31 1986-09-16 Rca Corporation High-speed output driver
US4725747A (en) 1986-08-29 1988-02-16 Texas Instruments Incorporated Integrated circuit distributed geometry to reduce switching noise
US4818901A (en) * 1987-07-20 1989-04-04 Harris Corporation Controlled switching CMOS output buffer
US4952818A (en) * 1989-05-17 1990-08-28 International Business Machines Corporation Transmission line driver circuits
US5489862A (en) 1994-11-18 1996-02-06 Texas Instruments Incorporated Output driver with slew and skew rate control
US5877647A (en) 1995-10-16 1999-03-02 Texas Instruments Incorporated CMOS output buffer with slew rate control
JPH09205351A (en) * 1996-01-25 1997-08-05 Sony Corp Level shift circuit
JP3152204B2 (en) * 1998-06-02 2001-04-03 日本電気株式会社 Slew rate output circuit
JP2000134068A (en) * 1998-10-22 2000-05-12 Nec Ic Microcomput Syst Ltd Output buffer circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2390496A (en) * 2002-01-22 2004-01-07 Agilent Technologies Inc An output driver circuit compatible with both open-drain and SSTL networks
GB2390496B (en) * 2002-01-22 2005-07-06 Agilent Technologies Inc Output driver circuit
US20060145735A1 (en) * 2003-07-14 2006-07-06 Kazuo Sakamoto Output buffer circuit eliminating high voltage insulated transistor and level shift circuit, and an interface circuit using the output buffer circuit
US7579882B2 (en) * 2003-07-14 2009-08-25 Ricoh Company, Ltd. Output buffer circuit eliminating high voltage insulated transistor and level shift circuit, and an electronic device using the output buffer circuit
KR20160086047A (en) 2015-01-09 2016-07-19 삼성전기주식회사 Gate driver circuit
US11323031B2 (en) 2019-07-11 2022-05-03 Stmicroelectronics S.R.L. Half-bridge driver circuit with a switched capacitor supply voltage for high side drive signal generation
US11387735B2 (en) * 2019-12-12 2022-07-12 Stmicroelectronics S.R.L. Half-bridge circuit with slew rate control

Also Published As

Publication number Publication date
US6441653B1 (en) 2002-08-27

Similar Documents

Publication Publication Date Title
US6441653B1 (en) CMOS output driver with slew rate control
EP0329285B1 (en) Output buffer
JP2553779B2 (en) Driver for interfacing VLSI CMOS circuits to transmission lines
US5546016A (en) MOS termination for low power signaling
US5598119A (en) Method and apparatus for a load adaptive pad driver
US6281715B1 (en) Low voltage differential signaling driver with pre-emphasis circuit
US5036222A (en) Output buffer circuit with output voltage sensing for reducing switching induced noise
US6466063B2 (en) Push-pull output buffer with gate voltage feedback loop
US4797579A (en) CMOS VLSI output driver with controlled rise and fall times
EP0735676B1 (en) Predriver circuit for low-noise switching of high currents in a load
JP2915235B2 (en) Output buffer with output level control
JP2783183B2 (en) Output circuit
JPH0936673A (en) Compensated-off bias voltage feeding circuit
US4902914A (en) Logic circuit used in standard IC or CMOS logic level
US20040169973A1 (en) Driver circuit connected to a switched capacitor and method of operating same
US5489861A (en) High power, edge controlled output buffer
US6242942B1 (en) Integrated circuit output buffers having feedback switches therein for reducing simultaneous switching noise and improving impedance matching characteristics
US4782252A (en) Output current control circuit for reducing ground bounce noise
US6356102B1 (en) Integrated circuit output buffers having control circuits therein that utilize output signal feedback to control pull-up and pull-down time intervals
KR101099224B1 (en) Method of reducing the propagation delay and process and temperature effects on a buffer
US6225819B1 (en) Transmission line impedance matching output buffer
EP0347083B1 (en) TTL output driver gate configuration
JP4903340B2 (en) Load capacity compensation buffer, apparatus and method thereof
US20030231033A1 (en) Driver circuit connected to a switched capacitor and method of operating same
KR920007097B1 (en) Bus transmitter having controlled trapezoidal slew rate

Legal Events

Date Code Title Description
AS Assignment

Owner name: TEXAS INSTRUMENTS INCORPORATED, TEXAS

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SPURLIN, JAMES C.;REEL/FRAME:011617/0324

Effective date: 20010212

STCF Information on status: patent grant

Free format text: PATENTED CASE

FPAY Fee payment

Year of fee payment: 4

FPAY Fee payment

Year of fee payment: 8

FPAY Fee payment

Year of fee payment: 12

点击 这是indexloc提供的php浏览器服务,不要输入任何密码和下载