US20010019744A1 - Process for plating metal coatings - Google Patents
Process for plating metal coatings Download PDFInfo
- Publication number
- US20010019744A1 US20010019744A1 US09/840,367 US84036701A US2001019744A1 US 20010019744 A1 US20010019744 A1 US 20010019744A1 US 84036701 A US84036701 A US 84036701A US 2001019744 A1 US2001019744 A1 US 2001019744A1
- Authority
- US
- United States
- Prior art keywords
- metal
- oxygen
- polyimide
- metal coating
- deposition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 128
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 119
- 239000002184 metal Substances 0.000 title claims abstract description 119
- 238000000034 method Methods 0.000 title claims abstract description 96
- 230000008569 process Effects 0.000 title claims abstract description 64
- 238000007747 plating Methods 0.000 title description 4
- 239000011248 coating agent Substances 0.000 claims abstract description 69
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims abstract description 64
- 229920001721 polyimide Polymers 0.000 claims abstract description 61
- 239000001301 oxygen Substances 0.000 claims abstract description 55
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 55
- 239000004642 Polyimide Substances 0.000 claims abstract description 51
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 51
- 239000000758 substrate Substances 0.000 claims abstract description 49
- 238000000151 deposition Methods 0.000 claims abstract description 43
- 239000010949 copper Substances 0.000 claims abstract description 35
- 230000008021 deposition Effects 0.000 claims abstract description 35
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 34
- 229910052802 copper Inorganic materials 0.000 claims abstract description 33
- 239000000203 mixture Substances 0.000 claims abstract description 32
- 229910052763 palladium Inorganic materials 0.000 claims abstract description 30
- 150000001875 compounds Chemical class 0.000 claims abstract description 25
- 238000004519 manufacturing process Methods 0.000 claims abstract description 17
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 14
- 238000001465 metallisation Methods 0.000 claims abstract description 14
- 239000011261 inert gas Substances 0.000 claims abstract description 13
- 238000000354 decomposition reaction Methods 0.000 claims abstract description 11
- 230000002378 acidificating effect Effects 0.000 claims abstract description 10
- 239000012670 alkaline solution Substances 0.000 claims abstract description 9
- 230000007935 neutral effect Effects 0.000 claims abstract description 8
- 239000007789 gas Substances 0.000 claims description 47
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 42
- 239000004020 conductor Substances 0.000 claims description 35
- 238000005530 etching Methods 0.000 claims description 25
- 150000002736 metal compounds Chemical class 0.000 claims description 15
- 229910052759 nickel Inorganic materials 0.000 claims description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- 238000002203 pretreatment Methods 0.000 claims description 10
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 8
- 229910052698 phosphorus Inorganic materials 0.000 claims description 8
- 239000011574 phosphorus Substances 0.000 claims description 8
- 229910000990 Ni alloy Inorganic materials 0.000 claims description 6
- 150000002739 metals Chemical class 0.000 claims description 6
- 239000010941 cobalt Substances 0.000 claims description 5
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- 229910000521 B alloy Inorganic materials 0.000 claims description 4
- 229910001096 P alloy Inorganic materials 0.000 claims description 4
- 229910017052 cobalt Inorganic materials 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 3
- 150000002941 palladium compounds Chemical class 0.000 claims 1
- 239000000243 solution Substances 0.000 abstract description 25
- 150000002902 organometallic compounds Chemical group 0.000 abstract description 18
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract description 10
- 239000000126 substance Substances 0.000 abstract description 10
- 230000003197 catalytic effect Effects 0.000 abstract description 5
- 230000001771 impaired effect Effects 0.000 abstract description 3
- 239000012298 atmosphere Substances 0.000 abstract description 2
- 230000009467 reduction Effects 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 49
- 239000000463 material Substances 0.000 description 18
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 12
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 12
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 12
- 239000003638 chemical reducing agent Substances 0.000 description 10
- 229920002120 photoresistant polymer Polymers 0.000 description 10
- MWUXSHHQAYIFBG-UHFFFAOYSA-N nitrogen oxide Inorganic materials O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 9
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 8
- YPTUAQWMBNZZRN-UHFFFAOYSA-N dimethylaminoboron Chemical compound [B]N(C)C YPTUAQWMBNZZRN-UHFFFAOYSA-N 0.000 description 8
- 239000000654 additive Substances 0.000 description 7
- 239000012159 carrier gas Substances 0.000 description 7
- 238000011161 development Methods 0.000 description 7
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 6
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 6
- 238000000137 annealing Methods 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 6
- 229910052796 boron Inorganic materials 0.000 description 6
- 235000019253 formic acid Nutrition 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 239000003446 ligand Substances 0.000 description 5
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 5
- 230000008646 thermal stress Effects 0.000 description 5
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- JVTAAEKCZFNVCJ-REOHCLBHSA-N L-lactic acid Chemical compound C[C@H](O)C(O)=O JVTAAEKCZFNVCJ-REOHCLBHSA-N 0.000 description 4
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 4
- 229910052728 basic metal Inorganic materials 0.000 description 4
- 150000003818 basic metals Chemical class 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000000454 electroless metal deposition Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- ACVYVLVWPXVTIT-UHFFFAOYSA-M phosphinate Chemical compound [O-][PH2]=O ACVYVLVWPXVTIT-UHFFFAOYSA-M 0.000 description 4
- 229910000029 sodium carbonate Inorganic materials 0.000 description 4
- KDYFGRWQOYBRFD-UHFFFAOYSA-N succinic acid Chemical compound OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 4
- 238000007669 thermal treatment Methods 0.000 description 4
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 3
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 239000000969 carrier Substances 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910017604 nitric acid Inorganic materials 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 2
- 229910000531 Co alloy Inorganic materials 0.000 description 2
- 229910021592 Copper(II) chloride Inorganic materials 0.000 description 2
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical compound NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 description 2
- PMZURENOXWZQFD-UHFFFAOYSA-L Sodium Sulfate Chemical compound [Na+].[Na+].[O-]S([O-])(=O)=O PMZURENOXWZQFD-UHFFFAOYSA-L 0.000 description 2
- 229920001646 UPILEX Polymers 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- LHIJANUOQQMGNT-UHFFFAOYSA-N aminoethylethanolamine Chemical compound NCCNCCO LHIJANUOQQMGNT-UHFFFAOYSA-N 0.000 description 2
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 150000001868 cobalt Chemical class 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 230000002349 favourable effect Effects 0.000 description 2
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- -1 hydroxyl ions Chemical class 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- VUZPPFZMUPKLLV-UHFFFAOYSA-N methane;hydrate Chemical compound C.O VUZPPFZMUPKLLV-UHFFFAOYSA-N 0.000 description 2
- 229910000510 noble metal Inorganic materials 0.000 description 2
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 2
- YJVFFLUZDVXJQI-UHFFFAOYSA-L palladium(ii) acetate Chemical compound [Pd+2].CC([O-])=O.CC([O-])=O YJVFFLUZDVXJQI-UHFFFAOYSA-L 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229920006254 polymer film Polymers 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000011780 sodium chloride Substances 0.000 description 2
- 239000001509 sodium citrate Substances 0.000 description 2
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 description 2
- HLBBKKJFGFRGMU-UHFFFAOYSA-M sodium formate Chemical compound [Na+].[O-]C=O HLBBKKJFGFRGMU-UHFFFAOYSA-M 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 239000001384 succinic acid Substances 0.000 description 2
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 2
- RXFCIXRFAJRBSG-UHFFFAOYSA-N 3,2,3-tetramine Chemical compound NCCCNCCNCCCN RXFCIXRFAJRBSG-UHFFFAOYSA-N 0.000 description 1
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910021202 NaH2PO2.H2O Inorganic materials 0.000 description 1
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- QCGGXGCODUUTLZ-UHFFFAOYSA-N [Na].[Na].[Na].[Na] Chemical compound [Na].[Na].[Na].[Na] QCGGXGCODUUTLZ-UHFFFAOYSA-N 0.000 description 1
- MQRWBMAEBQOWAF-UHFFFAOYSA-N acetic acid;nickel Chemical compound [Ni].CC(O)=O.CC(O)=O MQRWBMAEBQOWAF-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 229940045985 antineoplastic platinum compound Drugs 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- QDWJUBJKEHXSMT-UHFFFAOYSA-N boranylidynenickel Chemical compound [Ni]#B QDWJUBJKEHXSMT-UHFFFAOYSA-N 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 125000003636 chemical group Chemical group 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 239000013065 commercial product Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 239000007859 condensation product Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- MPTQRFCYZCXJFQ-UHFFFAOYSA-L copper(II) chloride dihydrate Chemical compound O.O.[Cl-].[Cl-].[Cu+2] MPTQRFCYZCXJFQ-UHFFFAOYSA-L 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- JZCCFEFSEZPSOG-UHFFFAOYSA-L copper(II) sulfate pentahydrate Chemical compound O.O.O.O.O.[Cu+2].[O-]S([O-])(=O)=O JZCCFEFSEZPSOG-UHFFFAOYSA-L 0.000 description 1
- UGWKCNDTYUOTQZ-UHFFFAOYSA-N copper;sulfuric acid Chemical compound [Cu].OS(O)(=O)=O UGWKCNDTYUOTQZ-UHFFFAOYSA-N 0.000 description 1
- 230000006735 deficit Effects 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000001493 electron microscopy Methods 0.000 description 1
- 125000004494 ethyl ester group Chemical group 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 229960002449 glycine Drugs 0.000 description 1
- 235000013905 glycine and its sodium salt Nutrition 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000013067 intermediate product Substances 0.000 description 1
- 229940046892 lead acetate Drugs 0.000 description 1
- 229910001338 liquidmetal Inorganic materials 0.000 description 1
- 238000001883 metal evaporation Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000005078 molybdenum compound Substances 0.000 description 1
- 150000002752 molybdenum compounds Chemical class 0.000 description 1
- 229910000402 monopotassium phosphate Inorganic materials 0.000 description 1
- 235000019796 monopotassium phosphate Nutrition 0.000 description 1
- UDGSVBYJWHOHNN-UHFFFAOYSA-N n',n'-diethylethane-1,2-diamine Chemical compound CCN(CC)CCN UDGSVBYJWHOHNN-UHFFFAOYSA-N 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 150000002815 nickel Chemical class 0.000 description 1
- 229940078494 nickel acetate Drugs 0.000 description 1
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- HBEQXAKJSGXAIQ-UHFFFAOYSA-N oxopalladium Chemical compound [Pd]=O HBEQXAKJSGXAIQ-UHFFFAOYSA-N 0.000 description 1
- 230000036284 oxygen consumption Effects 0.000 description 1
- 150000002940 palladium Chemical class 0.000 description 1
- 229910003445 palladium oxide Inorganic materials 0.000 description 1
- PJNZPQUBCPKICU-UHFFFAOYSA-N phosphoric acid;potassium Chemical compound [K].OP(O)(O)=O PJNZPQUBCPKICU-UHFFFAOYSA-N 0.000 description 1
- 238000005334 plasma enhanced chemical vapour deposition Methods 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 1
- 150000003058 platinum compounds Chemical class 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 1
- 229940074404 sodium succinate Drugs 0.000 description 1
- ZDQYSKICYIVCPN-UHFFFAOYSA-L sodium succinate (anhydrous) Chemical compound [Na+].[Na+].[O-]C(=O)CCC([O-])=O ZDQYSKICYIVCPN-UHFFFAOYSA-L 0.000 description 1
- 229910052938 sodium sulfate Inorganic materials 0.000 description 1
- 235000011152 sodium sulphate Nutrition 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000012798 spherical particle Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- UVZICZIVKIMRNE-UHFFFAOYSA-N thiodiacetic acid Chemical compound OC(=O)CSCC(O)=O UVZICZIVKIMRNE-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000004627 transmission electron microscopy Methods 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/18—Pretreatment of the material to be coated
- C23C18/20—Pretreatment of the material to be coated of organic surfaces, e.g. resins
- C23C18/28—Sensitising or activating
- C23C18/30—Activating or accelerating or sensitising with palladium or other noble metal
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/388—Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer
Definitions
- the invention relates to a process for depositing metal coatings on polyimide surfaces, and to a process for producing an electrical circuit base, which may be made by using said process.
- Polyimide is used in the electronics industry as a substrate material for producing printed circuit boards, hybrid circuits, semi-conductor carriers (chip carriers, multi-chip modules) and other components. This material has advantages compared to previous material such for example as epoxy resins.
- semi-finished products of the polyimide can be applied to an appropriate carrier by a spin-coating process in a thin layer and subsequently converted to polyimide. It is possible in a simple and reproducible way to etch micro-fine holes in the coatings thus formed, these holes serving to connect a plurality of metallisation planes.
- Polyimide films lined with copper films are usually used in the production of polyimide laminates, for example for the manufacture of printed circuit boards.
- the conductor tracks are usually produced from the copper coatings by etching processes.
- process techniques are used which have been described at many points in the literature (for example in Handbuch der Porterplattentechnik,ed.:. G. Herrmann, Vol. 2, Eugen G. Leuze Verlag, Saulgau 1991).
- Such processes are basically suitable for the manufacture of printed circuit boards, yet the width of the finest conductor tracks which may be reproducibly manufactured by such techniques lies in a range of roughly 75-100 ⁇ m.
- the copper films are connected in a previously known way by adhesion with the polyimide surfaces.
- the adhesive coating softens under thermal stress, for example when the printed circuit boards are soldered, and is also insufficiently resistant to the chemical baths used for metallising holes in polyimide laminates.
- Finer conductor tracks may however still be produced, when no laminates provided with copper films on the surface are used as initial materials.
- the conductor tracks are formed directly on the surfaces by metal coating.
- Adhesive-free polyimide substrates produced by sputtering or metal evaporation or by means of chemical methods have not for some time become established in the manufacture of printed circuit boards. For example, it is necessary in order to produce a sufficient adhesion of the metal coatings on polyimide firstly to apply a thin chromium layer, upon which the copper coatings are then deposited, for example pre-drilled material in a grid pattern of the company Sheldahl.
- the metal coating contains an excessive carbon content due to insufficient decomposition of the metal compounds in the glow discharge, or due to insufficient desorption of the only partially decomposed ligand compounds from the substrate surfaces, the conductivity of the deposited metal coatings is relatively low and in addition its catalytic activity is insufficient to start an electroless metal deposition on the surfaces, so that metal coatings slightly contaminated with oxides are formed in an electroless manner, or deposition is totally absent.
- the problem underlying the present invention is to avoid the disadvantages of prior art and to find a process by means of which extremely pure metal coatings may be deposited in an electroless manner on polyimide surfaces, in order to produce micro-fine conductor track structures, the adhesion of the metal coatings on the surfaces not being impaired by contact after deposition with aqueous-alkaline solutions, and a process by means of which also micro-fine conductor track structures securely adhering to the polyimide surfaces can be produced in order to manufacture electrical circuit bases with polyimide surfaces.
- Metal coatings preserving such adhesion on substrates with polyimide surfaces can be produced in a process with the following essential process steps:
- the first metal coating deposited by glow discharge has unusual properties: when appropriate deposition parameters are selected, it is smooth and brilliant. By friction on the surface of these coatings, however, a proportion of the metal film may easily be removed. This proportion of the coating has a lower adhesion with respect to the substrate material. By means of highly-resolved electron microscopy (scanning electron microscopy, transmission electron microscopy) it was discovered that the deposited coating has a relatively compact structure of spherical particles which clearly have only restricted bond strength to one another.
- the first metal coating By forming the first metal coating by means of a glow discharge process in the presence of oxygen or oxygen-containing compounds, catalytically highly-active metal coatings can be obtained, so that extremely pure metal coatings may be deposited in an electroless manner thereon.
- Oxygen (O 2 ) is preferably used as an oxygen-containing compound.
- nitrogen oxides (N 2 O/NO x ) can be used, which during the glow discharge form at least intermediately atomic oxygen as well as the inert gas nitrogen.
- the oxidising gas mixture also contains inert gases, for example nitrogen or rare gases.
- inert gases for example nitrogen or rare gases.
- argon is usually used as a rare gas.
- the substrate surfaces Due to the oxidation capacity of the oxygen-containing compounds in the gas mixture on metal deposition, the substrate surfaces, after any cleaning and functionalising of the surfaces, are also further cleaned during metal deposition, in this case of the organic fragments of the organometallic compounds arising due to glow discharge, so that increased adhesion of the metal coatings is rendered possible.
- a gas mixture which in addition contains inert carrier gases, the formation of metal oxide layers can also be extensively prevented, as their electrical conductivity and catalytic activity would not be sufficiently high for electroless metal coating.
- the organometallic compounds are prevented from decomposing before their introduction into the glow discharge zone, as pure oxygen is not used as carrier gases for the compounds, but a gas mixture with the inert gases, which is passed over the normally liquid metal compounds.
- the ratio of the partial pressure of the oxygen-containing compounds to that of the inert gases in the gas mixture is set to a value of between 2:1 and 1:8, preferably between 1:3 and 1:4.
- the ligands in the organometallic compounds are oxidised by oxygen to form carbon dioxide and water
- a partial pressure ratio of 1:3 to 1:4 is set, a value lying beneath the theoretical (stoichiometric) consumption of oxygen is set.
- the overall pressure of the gas mixture in the reaction vessel, in which decomposition of the metal compounds takes place preferably lies between 1 Pa and 50 Pa.
- Palladium has proved particularly advantageous as it may be easily removed by etching, and thereupon a further metal coating may be deposited in an electroless manner from a copper bath without difficulty. If metals other than palladium, which are not catalytically active, are used in order to deposit the first metal coating, the substrate is dipped in an activating solution, for example a palladium chloride solution, before the electroless metallisation.
- an activating solution for example a palladium chloride solution
- Layers with a thickness of preferably 0.01 ⁇ m to 0.1 ⁇ m are preferably deposited.
- the chemical attack of the chemical solutions of subsequent treatment steps on the polyimide surfaces is reinforced, so that sufficient adhesion can no longer be achieved.
- Deposition of excessively thick metal coatings entails no advantages. In addition to long process times and high costs, problems can arise particularly in the formation of micro-fine conductor track structures. In addition, thicker palladium layers in particular are difficult to etch.
- Metallising baths with a pH value between 2 and 8, preferably between 2 and 7, have proved most favourable for electroless metallisation.
- baths of nickel, copper, cobalt, palladium or their alloys are considered in this respect.
- Particularly suitable as a second metal coating is a nickel-boron alloy coating, as this can easily be etched in order to produce the metal structures from the metal coating over the entire surface.
- an extremely thin palladium layer or a nickel/phosphorus alloy layer with a phosphorus content between 3 and 5% by weight of phosphorus is deposited in an electroless manner as a second metal coating.
- micro-fine holes must first be formed in the non-conductive substrates with polyimide surfaces, usually in the form of a laminate.
- a process is preferably used with the following essential process steps:
- a) application of a metal coating to at least one substrate surface for example by deposition of a metal coating, for example of aluminium, as a temporary etching mask, for example by evaporatin,
- the photo-masking layer is again removed from a substrate before process step c) or between process steps c) and d).
- Conductor tracks preferably with track widths and spacings of less than 100 ⁇ m, and metal surfaces on the aperture walls are then formed according to the following process scheme:
- polyimide substrates in addition to polyimide films as such, these may also be used in a laminated layer, compressed together with other carrier materials such for example as FR-4 material (epoxy resin/glass fibres) and copper films.
- carrier materials such for example as FR-4 material (epoxy resin/glass fibres) and copper films.
- plate-shaped polyimide substrates as well as spin-coating layers can be metallised by the process according to the invention.
- polyimide such material as is produced from dissolved and/or post-hardened polyimide.
- polyimides with different chemical structures can be used.
- the metal coating which is applied in order to produce the etching mask (perforation mask) for producing the holes on the polyimide surfaces is only applied temporarily to the surfaces, i.e. before production of the conductor tracks it is removed from the polyimide again and does not serve as a basic metal coating for producing the conductor tracks.
- the metals also suitable for production of conductor tracks can also be deposited. As the etching mask is again removed from the perforated substrate and a new metal coating is deposited in order to form the conductor tracks, any possible impairment of the bond between the etching mask and the substrate surface during etching of the holes cannot have a disadvantageous effect on the secure adhesion of the conductor tracks produced later.
- the perforated masks formed in order to produce the holes on the substrate surfaces are produced in a photochemical way with photo-masks.
- a positive photoresist as a photo-mask, a considerably higher optical resolution and thus finer structures are achieved, as thinner coatings may be produced (5-10 ⁇ m thickness) with a photoresist, than for example with dry films (30-50 ⁇ m thickness of the photoresist layers), so that the light impinging on the layer during exposure is scattered to a lesser degree. Due to the smaller thickness of the photoresist layers, this also adheres better to the foundation.
- a positive image overlay can be used when exposing the resist layer, so that exposure errors have a less severe effect. Electrophoretically depositable resists can also be used.
- the holes in the substrate are produced in a dry etching process; the glow discharge process has proved particularly favourable.
- the substrate with the perforated masks located thereon is treated in a suitable device with a gas, for example oxygen, preferably with a mixture of oxygen and tetrafluoromethane (CF 4 ).
- a gas for example oxygen, preferably with a mixture of oxygen and tetrafluoromethane (CF 4 ).
- the metallic etching mask is again removed. Thereafter the perforated substrate is cleaned, for example with an aqueous solution containing a wetting agent.
- the surfaces to be coated can be pre-treated by means of a glow discharge process.
- the surfaces are initially etched, cleaned and/or functionalised with reactive groups, the gases reacting with the chemical groups on the polyimide surface.
- the substrate is introduced into a normal plasma reactor, for example a parallel plate reactor, which is in the form of a tube or tunnel reactor.
- Glow discharge for pre-treatment may be produced both with direct current or with alternating currents (high frequency in the kHz or MHz range).
- the surfaces are preferably initially etched in oxygen, an oxygen-containing compound such as a nitrogen oxide (N 2 O/NO x ), in an oxygen/argon or oxygen/nitrogen mix.
- the first metal coating which is also catalytically active and has an adhesion-promoting action, is applied on the surfaces thus pre-treated by decomposition of volatile metal compounds.
- an inert carrier gas is passed through a supply container, which contains the organometallic compounds.
- the inert gas contains oxygen- containing compounds, preferably oxygen (O 2 ) or nitrogen oxides (N 2 O/NO x ). If for transfer of the vapour of the metal compound from the supply container the oxygen-containing compound is not mixed with the carrier gas, said oxygen-containing compound is introduced separately into the plasma reactor and in this way passes into the glow discharge zone.
- the flow of the oxidising carrier gas mixture can be subdivided into two partial flows, which flow on the one hand through the supply container and on the other directly into the plasma reactor. Direct introduction of the vapour of the organometallic compound into the plasma reactor without carrier gas is also possible. The oxidising gas mixture is then passed directly into the plasma reactor.
- the carbon and oxygen content of the metal coatings deposited by glow discharge can be determined for example by means of ESCA (Electron Spectroscopy for Chemical Application).
- ESCA Electrode Spectroscopy for Chemical Application
- the coated substrate is introduced into an ultra-high vacuum chamber and illuminated with x-rays (Al—K ⁇ - or Mg—K ⁇ -line).
- x-rays Al—K ⁇ - or Mg—K ⁇ -line.
- the uppermost atom layers of the metal coating are energised and ionised by the energy-rich radiation, so that electrons emerge from the material. Their energy is measured, so that an element-specific quantitative analysis of the composition of the metal coating is possible.
- the conditions for metallising substantially correspond to those in pre-treatment by means of glow discharge.
- the pressure in the treatment chamber generally comes to 1 Pa to 50 Pa.
- a temperature on the substrate close to ambient temperature or slightly above is used, by variation in the electrical power of the glow discharge. Heating of the substrate carrier is also advantageous.
- the second metal coating for example a palladium layer, a nickel/boron alloy layer or a nickel/phosphorus alloy layer, can be applied to this basic metal coating by electroless metallisation from an acidic or neutral bath.
- metals gold and cobalt and their alloys as well as pure nickel or alloys of cobalt can also be considered.
- palladium is preferably deposited in an electroless manner, as the metal quality of the weakly-acidic chemically-reductive copper baths known at present is insufficient for all technical requirements.
- palladium is applied as a second metal coating in order to produce the conductor tracks according to a procedure other than additive technique, such for example as the semi-additive process, care must be taken that this palladium layer is only deposited in a low layer thickness. This is necessary as palladium is more difficult to etch than for example a nickel/boron alloy layer, and therefore can only be simply removed from the surfaces when the etching agent can penetrate the layer through pores, and the palladium layer can be raised off from below.
- aqueous electroless metallising baths are preferably used for the process according to the invention:
- Electroless nickel bath with hypophosphite as a reducing agent for producing nickel/phosphorus coatings Nickel sulphate (NiSO 4 .5H 2 O) 25-30 g/l Sodium hypophosphite 30 g/l Citric acid 2 g/l Acetic acid 5 g/l Aminoacetic acid 10 g/l Lead as lead acetate 2 mg/l pH value 6.2 Temperature 8-84° C.
- the nickel/phosphorus layer contains about 4% by weight phosphorus.
- cobalt salts can also be used for deposition of cobalt/phosphorus alloy layers or a mixture of nickel with cobalt salts for depositing nickel/cobalt/phosphorus layers.
- Electroless nickel baths with dimethylaminoborane as a reducing agent for producing nickel/boron layers 2a. Nickel sulphate (NiSO 4 .5H 2 O) 25 g/l Dimethylaminoborane 4 g/l Sodium succinate 25 g/l Sodium sulphate 15 g/l pH value 5.0 Temperature 60° C. 2b. Nickel sulphate (NiSO 4 .5H 2 O) 40 g/l Dimethylaminoborane 1-6 g/l Sodium citrate 20 g/l Lactic acid (85% by weight) 10 g/l pH value 7.0 Temperature 40° C 2c.
- Electroless palladium baths with formic acid or its derivate as a reducing agent 3a. Palladium acetate 0.05 Mol/l Ethylenediamine 0.1 Mol/l Sodium formiate 0.2 Mol/l Succinic acid 0.15 Mol/l pH value (set with formic acid) 5.5 Temperature 67° C. 3b. Palladium chloride 0.5 Mol/l 2-diethylaminoethylamine 0.6 Mol/l Methane acid ethyl ester 0.3 Mol/l Potassium dihydrogen phosphate 0.2 Mol/l pH value (set with formic acid) 6.0 Temperature 70° C. 3c.
- baths or baths for depositing other metals can be used, if these are acidic or neutral, i.e. have a pH value below about 8, preferably between 2 and 7.
- the electroless metallising baths should have the smallest possible temperature and/or the highest possible deposition speed, as in this way the secure adhesion of the metal coating can be further increased.
- Further metal coatings may be precipitated from electroless or electrolytic metallising baths on the second metal coating. If the second metal coating already has a sufficient layer thickness so that it is free of pores, the metal coatings deposited thereon may also be produced with alkaline metallising baths. All depositable metals can be considered here. The conventional electroless and electrolytic baths are used.
- the substrates are brought into contact with the aqueous treatment baths, for example during electroless or electrolytic metallising, by dipping in the treatment solutions, but also in so-called horizontal treatment systems, in which the treatment solutions are applied to the substrates by splashing.
- reactor type parallel plate reactor, high-frequency voltage on the substrate electrode, frequency: 13.56 MHz, substrate temperature 35° C.:
- Treatment time 90 seconds
- Treatment Time 90 seconds
- organometallic compound ⁇ -allyl- ⁇ -cyclopentadienyl-palladium-(II),
- the basic metal coatings on the photo-masking areas are selected to be so thin, for example 0.1 ⁇ m, that their removal together with the photo-mask lying thereunder is easily perpormed i.e. without individual points of the polymer films remaining behind on the substrate surfaces.
- Conventional chemical solutions are used for removing the polymer films.
- Treatment Time 90 seconds
- organometallic compound ⁇ -allyl- ⁇ -cyclopentadienyl-palladium-(II),
- the second metal coating may be applied electrolytically in the resist channel.
- Treatment Time 90 seconds
- Cupracid BL Company Atotech GmbH, Berlin, Germany
- Etching solution CuCl 2 /HCl with 120 g/l Cu in all, 1.5% by weight HCl, NaCl saturated 40° C.
- Treatment time 15 seconds
- Example 5 (semi-additive technique/pattern plating with nickel/boron or copper layer as second metallic coating):
- Treatment Time 90 seconds
- Metal resist layer deposited for example tin
- Etching solution CuCl 2 /HCl with 120 g/l Cu in all, 1.5% by weight HCl, NaCl saturated, 40° C.
- the secure adhesion of the metal coatings on the substrate surface is in particular increased by heat treatment after deposition of the metal coatings which are deposited in an electroless and electrolytic manner (for example annealing at 120° C.).
- Polyimide films with conductor tracks in the form of films, and manufactured according to the process in the invention can be glued together to form stacks in a suitable process.
- a double-sided or four-layer circuit can be glued or laminated on to an optionally rigid carrier, for example a ceramic or FR4 plate (for example also a printed circuit board) or a silicon carrier.
- Two, four or more multi-layer circuits produced according to the method in the invention can be glued one on the other using an uncoated polyimide intermediate layer, and the intermediate product can if necessary be mechanically drilled and through-contacted in a wet-chemical manner in a previously known way.
- the conductor tracks in the individual conductor track planes are then, after drilling of holes through the stack, electrically interconnected in a previously known way by electroless metallisation of the aperture walls.
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Abstract
Description
- The invention relates to a process for depositing metal coatings on polyimide surfaces, and to a process for producing an electrical circuit base, which may be made by using said process.
- Polyimide is used in the electronics industry as a substrate material for producing printed circuit boards, hybrid circuits, semi-conductor carriers (chip carriers, multi-chip modules) and other components. This material has advantages compared to previous material such for example as epoxy resins.
- For example its thermal resistance is higher, so that the longitudinal expansion of the material under thermal stress is less than with previous materials. Polyimide substrates also have better electrical insulating values.
- For use as a substrate material in semi-conductor carriers, semi-finished products of the polyimide can be applied to an appropriate carrier by a spin-coating process in a thin layer and subsequently converted to polyimide. It is possible in a simple and reproducible way to etch micro-fine holes in the coatings thus formed, these holes serving to connect a plurality of metallisation planes.
- Polyimide films lined with copper films are usually used in the production of polyimide laminates, for example for the manufacture of printed circuit boards. The conductor tracks are usually produced from the copper coatings by etching processes. For this purpose process techniques are used which have been described at many points in the literature (for example in Handbuch der Leiterplattentechnik,ed.:. G. Herrmann, Vol. 2, Eugen G. Leuze Verlag, Saulgau 1991). Such processes are basically suitable for the manufacture of printed circuit boards, yet the width of the finest conductor tracks which may be reproducibly manufactured by such techniques lies in a range of roughly 75-100 μm.
- The copper films are connected in a previously known way by adhesion with the polyimide surfaces. However, the adhesive coating softens under thermal stress, for example when the printed circuit boards are soldered, and is also insufficiently resistant to the chemical baths used for metallising holes in polyimide laminates.
- In order to avoid the adhesive coatings, there was developed the “cast-on” technique well known to the person skilled in the art, for manufacturing adhesive-free polyimide laminates, in which liquid polyamide acid solution is poured on to a copper film before dehydration and cyclisation to form the polyimide. After formation of the polyimide on the copper film, there results in this way a securely adhering polymer/metal bond. This process also has the disadvantage that only relatively thick copper films, for example 17 μm thick, can be used. In addition, this material is extremely expensive, for example the commercial product Espanex® of Nippon Steel Chemical Co. Ltd., Tokyo.
- Polyimide laminates coated with thin copper films were in fact manufactured. However the outlay for manufacturing these laminates is extraordinarily high, so that the material costs are also considerable. Handling of the laminates coated with thin copper films is also problematic, as the copper films are extremely sensitive to mechanical influences. In the case of the “cast-on” technique, such thin copper films cannot be used, as the laminate would be severely distorted, among other things, during manufacture.
- Finer conductor tracks may however still be produced, when no laminates provided with copper films on the surface are used as initial materials. In this case the conductor tracks are formed directly on the surfaces by metal coating. Adhesive-free polyimide substrates produced by sputtering or metal evaporation or by means of chemical methods have not for some time become established in the manufacture of printed circuit boards. For example, it is necessary in order to produce a sufficient adhesion of the metal coatings on polyimide firstly to apply a thin chromium layer, upon which the copper coatings are then deposited, for example pre-drilled material in a grid pattern of the company Sheldahl. However, chromium gives rise to problems in etching, so for example an additional etching process is necessary, for which reason the use of chromium coatings is avoided where possible. From a technical standpoint it would therefore be extremely desirable to manufacture circuit bases from uncoated polyimide material. It has not in practice yet been possible to realise this technically. The following are the reasons for this:
- Particularly when chemical metal coating methods are used, the disadvantage emerges of the greater water capacity of polyimide compared to other polymers. It has for example become apparent that the adhesion of copper coatings deposited in an electroless and electrolytic manner on the entire surface of polyimide films on the polyimide surface, is considerably reduced under thermal stress, for example during soldering, or is in fact entirely removed. In order to avoid the occurrence of bubble-shaped raised portions in thermal treatment, it is generally proposed to anneal the coated polyimide films after coating. The annealing treatment alone however is insufficient to prevent the occurrence of bubbles, when polyimide films provided on the entire surface with copper coatings on both sides are exposed to thermal treatment. In this case the enclosed moisture originating from the chemical metallising process can no longer escape during the annealing treatment, so that water emerges explosively from the polyimide film during thermal treatment and detaches the copper coating from the polyimide surface.
- For the abovenamed reasons, other processes for securely adhesive metallising of polyimide substrates have been developed. Due to the requirements to obtain sufficiently secure adhesion of the deposited metal coatings both during and after thermal stress on the substrates, vacuum processes for metallising have been used. Metal coating by the decomposition of volatile metal compounds by means of glow discharge represents a superior procedure in this respect. In DE 35 10 982 A1 there is disclosed such a process for manufacturing electrically conductive structures on non-conductors, for example polyimide films by the deposition of metallic films on the non-conducting surfaces by decomposition of organometallic compounds in a glow discharge zone. The deposited metal films preferably serve as catalytically active nucleus layers for the subsequent electroless metallisation of the surfaces.
- There is also described in DE 38 06 587 A1 a process for manufacturing metallic structures on polyimide by means of the decomposition of organometallic compounds in a glow discharge.
- Further metallising processes by means of glow discharge and organometallic compounds are disclosed in the documents DE 37 16 235 A1, DE 37 44 062 A and DE 38 28 211 C2.
- In order to reduce the purest possible metal coatings by the glow discharge method, i.e. metal coatings without any appreciable admixtures of carbon and oxygen, it is proposed to heat the substrate up to the highest possible temperature during the metal deposition. The carbon-containing admixtures originate from the organic components of the volatile organometallic compounds usually used in deposition. The influence of the substrate temperature on the carbon content of the metal coatings deposited by the glow discharge method is for example disclosed in E. Feurer and H. Suhr, “Thin palladium films prepared by metal-organic plasma-enhanced chemical vapour deposition”, Thin Solid Films 157 (1988), pages 81, 84. According to this, the carbon content reduces as the substrate temperature rises. It can also be seen from this document that the palladium coatings contain scarcely 30% by weight of carbon at ambient temperature.
- If the metal coating contains an excessive carbon content due to insufficient decomposition of the metal compounds in the glow discharge, or due to insufficient desorption of the only partially decomposed ligand compounds from the substrate surfaces, the conductivity of the deposited metal coatings is relatively low and in addition its catalytic activity is insufficient to start an electroless metal deposition on the surfaces, so that metal coatings slightly contaminated with oxides are formed in an electroless manner, or deposition is totally absent.
- Heating of the substrate is undesirable for many applications. Therefore attempts were made to reduce the carbon content of the metal coatings in another way. For example, in the above named publication by E. Feurer and H. Suhr it is proposed to provide post-treatment of the deposited metal coatings with an oxygen plasma. According to experiments by these authors, a further alternative resides in replacing the argon, which is conventionally used as a carrier gas in metal coating, totally by oxygen.
- Thus instead of palladium, palladium oxide is deposited, which can again be reduced to form metallic palladium by means of a subsequent treatment in a hydrogen plasma. This procedure is however extremely complicated and expensive. Moreover, the organometallic compounds already decompose when the oxygen is passed through the supply container containing these compounds, so that only a small proportion reaches the glow discharge zone.
- It is in fact possible to produce secure adhering metal coatings on polyimide surfaces by the metal deposition process by means of a glow discharge process, if further metal coatings from electroless and electrolytic metallising baths are deposited on this metal coating. It has however become apparent that sufficiently secure adhesion of the deposited metal coatings on the polyimide surface does not occur if the coated substrate comes into contact with aqueous-alkaline solutions after the necessary annealing treatment and before or during the test for determining the adhesion. Considered as aqueous-alkaline solutions for example are the developer and strip solutions in the structuring processes with photoresists, in order to form conductor structures from the metal coatings deposited on the entire surface. Subsequent annealing treatment cannot reverse the reduction in adhesion caused by contact with the aqueous-alkaline solution.
- Thus the problem underlying the present invention is to avoid the disadvantages of prior art and to find a process by means of which extremely pure metal coatings may be deposited in an electroless manner on polyimide surfaces, in order to produce micro-fine conductor track structures, the adhesion of the metal coatings on the surfaces not being impaired by contact after deposition with aqueous-alkaline solutions, and a process by means of which also micro-fine conductor track structures securely adhering to the polyimide surfaces can be produced in order to manufacture electrical circuit bases with polyimide surfaces.
- This problem is solved by claims1 and 11. Preferred embodiments are given in the sub-claims.
- Metal coatings preserving such adhesion on substrates with polyimide surfaces can be produced in a process with the following essential process steps:
- a) deposition of a first low-carbon and low-oxygen metal coating on the polyimide surfaces by decomposition of volatile metal compounds by means of a glow discharge process in the presence of a gas mixture containing inert gases and oxygen or oxygen-containing compounds,
- b) electroless deposition of a second metal coating on the first metal coating, from a metallising bath which is set to an acidic or neutral level.
- The first metal coating deposited by glow discharge has unusual properties: when appropriate deposition parameters are selected, it is smooth and brilliant. By friction on the surface of these coatings, however, a proportion of the metal film may easily be removed. This proportion of the coating has a lower adhesion with respect to the substrate material. By means of highly-resolved electron microscopy (scanning electron microscopy, transmission electron microscopy) it was discovered that the deposited coating has a relatively compact structure of spherical particles which clearly have only restricted bond strength to one another.
- By means of depositing the first metal coating in a gas atmosphere containing the oxygen-containing compounds, and deposition of the second metal coating from an acidic or neutral electroless metallising solution, this upper looser proportion of the first metal coating can be consolidated. In this way an adhesive bond is produced between the metal coatings and the polyimide surface, which is no longer impaired even upon contact with aqueous-alkaline solutions. In addition, the polyimide metallised in this manner absorbs considerably less moisture during the chemical deposition than in known processes, so that after the treatment, fewer hydroxyl ions remain behind in the material, which could weaken the adhesive bond by hydrolysis particularly when the substrate is subject to thermal stress.
- In the manufacture of micro-fine conductor tracks, special demands are made on the secure adhesion of the conductor tracks on the laminate surface. This is due to the fact that adhesion on the laminate surface can only be achieved over an extremely small contact surface of the conductor tracks. Therefore the degree of adhesion in this case must be extremely high under various operating conditions. Treatment with corrosive solutions or gaseous materials, which attack this bond from the side, can for example easily lead to a situation in which the underside edges of the conductor tracks lift off in a wedge configuration from the laminate surface. Contrary to wide conductor tracks, such wedge shaped delaminations have a more severe effect on the adhesion of fine conductor tracks than on the wider conductor tracks.
- By forming the first metal coating by means of a glow discharge process in the presence of oxygen or oxygen-containing compounds, catalytically highly-active metal coatings can be obtained, so that extremely pure metal coatings may be deposited in an electroless manner thereon. Oxygen (O2) is preferably used as an oxygen-containing compound. Instead of oxygen, however, nitrogen oxides (N2O/NOx) can be used, which during the glow discharge form at least intermediately atomic oxygen as well as the inert gas nitrogen.
- In addition to the volatile metal compounds and the oxygen-containing compounds, the oxidising gas mixture also contains inert gases, for example nitrogen or rare gases. For reasons of cost, argon is usually used as a rare gas.
- Due to the oxidation capacity of the oxygen-containing compounds in the gas mixture on metal deposition, the substrate surfaces, after any cleaning and functionalising of the surfaces, are also further cleaned during metal deposition, in this case of the organic fragments of the organometallic compounds arising due to glow discharge, so that increased adhesion of the metal coatings is rendered possible. By using a gas mixture which in addition contains inert carrier gases, the formation of metal oxide layers can also be extensively prevented, as their electrical conductivity and catalytic activity would not be sufficiently high for electroless metal coating. Also, the organometallic compounds are prevented from decomposing before their introduction into the glow discharge zone, as pure oxygen is not used as carrier gases for the compounds, but a gas mixture with the inert gases, which is passed over the normally liquid metal compounds.
- In a particularly suitable gas mixture forming extensively carbon-free and oxygen-free metal coatings, the ratio of the partial pressure of the oxygen-containing compounds to that of the inert gases in the gas mixture is set to a value of between 2:1 and 1:8, preferably between 1:3 and 1:4. Assuming that the ligands in the organometallic compounds are oxidised by oxygen to form carbon dioxide and water, when a partial pressure ratio of 1:3 to 1:4 is set, a value lying beneath the theoretical (stoichiometric) consumption of oxygen is set. For example, when setting the ratio of 1:3 during the evaporation of π-allyl-π-cyclopentadienyl-palladium (II) at 45° C., about 15% to 75% of the stoichiometric quantity of oxygen is consumed for total oxidation of the ligands in the compound. Surprisingly, despite the relatively high oxygen content in the gas mixture, low-oxygen metal coatings are produced. This is ascribed to the mentioned oxidation of the ligands and the oxygen consumption of this reaction.
- The overall pressure of the gas mixture in the reaction vessel, in which decomposition of the metal compounds takes place, preferably lies between 1 Pa and 50 Pa.
- Compounds known in prior art, for example palladium, copper, gold or platinum compounds or their mixtures are used as volatile metal compounds. Other metal compounds are likewise also basically usable, when the metal coating formed is catalytic for the subsequent electroless metallisation. The following compounds have proved particularly suitable, particularly dimethyl-π-cyclopentadienyl-platinum, dimethyl-gold-acetylacetonate and in particular π-allyl-π-cyclopentadienyl-palladium (II). The coating conditions indicated in the documents already mentioned may be correspondingly transferred to production of the metal coatings according to the process according to the invention.
- Palladium has proved particularly advantageous as it may be easily removed by etching, and thereupon a further metal coating may be deposited in an electroless manner from a copper bath without difficulty. If metals other than palladium, which are not catalytically active, are used in order to deposit the first metal coating, the substrate is dipped in an activating solution, for example a palladium chloride solution, before the electroless metallisation.
- By producing a thin layer of palladium, there results for the subsequent electroless metal deposition catalytically-acting metal coatings, so that further activation of these metal coatings, for example with solutions containing noble metals, is not necessary. By means of the process according to the invention low-carbon and low-oxygen metal coatings are formed by the glow discharge process in one process step. No further treatment, for example in a glow discharge in the presence of reducing gases such as hydrogen, is necessary.
- Layers with a thickness of preferably 0.01 μm to 0.1 μm are preferably deposited. When thinner layers are deposited, the chemical attack of the chemical solutions of subsequent treatment steps on the polyimide surfaces is reinforced, so that sufficient adhesion can no longer be achieved. Deposition of excessively thick metal coatings entails no advantages. In addition to long process times and high costs, problems can arise particularly in the formation of micro-fine conductor track structures. In addition, thicker palladium layers in particular are difficult to etch.
- If during metal coating by means of glow discharge metal coats with sufficiently high electrical conductivity for directly subsequent electrolytic metallising are formed, it is also possible to use other metal compounds for depositing the first metal coat, for example molybdenum compounds.
- Metallising baths with a pH value between 2 and 8, preferably between 2 and 7, have proved most favourable for electroless metallisation. In particular baths of nickel, copper, cobalt, palladium or their alloys are considered in this respect.
- Particularly suitable as a second metal coating is a nickel-boron alloy coating, as this can easily be etched in order to produce the metal structures from the metal coating over the entire surface.
- In another preferred embodiment, an extremely thin palladium layer or a nickel/phosphorus alloy layer with a phosphorus content between 3 and 5% by weight of phosphorus is deposited in an electroless manner as a second metal coating.
- In order to produce highly-integrated electrical circuit bases with extremely fine conductor track structures, micro-fine holes must first be formed in the non-conductive substrates with polyimide surfaces, usually in the form of a laminate. For this purpose a process is preferably used with the following essential process steps:
- a) application of a metal coating to at least one substrate surface, for example by deposition of a metal coating, for example of aluminium, as a temporary etching mask, for example by evaporatin,
- b) structuring of the metal coating with a photo-masking technique by means of the following process steps:
- ba) covering the metal coating of the photo-mask, preferably with a liquid positive photoresist,
- bb) exposure and development of the photo-mask, the photo-mask during development being removed from these areas in which holes are provided in the substrate,
- bc) etching of the holes in the metal coating
- c) etching of the holes in the substrate and
- d) removal of the metal coating
- The photo-masking layer is again removed from a substrate before process step c) or between process steps c) and d).
- It has proved that, when using thin aluminium layers and a plasma etching mask, etching of the holes in the metal coating can be effected simultaneously during development of the photoresist. The use of thinly applied liquid resists enables simultaneous stripping of this resist during plasma etching as a further simplification of the process.
- Conductor tracks, preferably with track widths and spacings of less than 100 μm, and metal surfaces on the aperture walls are then formed according to the following process scheme:
- e) pre-treatment of the surfaces and aperture walls by means of a glow discharge process with an oxidising gas mixture containing an oxygen-containing compound and if necessary inert gases,
- f) deposition of a first metal coating by decomposition of volatile metal compounds by means of a glow discharge process in the presence of a gas mixture containing inert gases and oxygen-containing compounds, and of a second metal coating by means of electroless metal deposition from an acidic or neutral metallising solution, and if necessary further metal coatings deposited in an electroless and/or electrolytic manner,
- g) structuring of individual metal coatings by means of a photo-masking technique, preferably using a positive photoresist layer.
- Embodiments of the invention given by way of example are described in the following:
- Various materials are considered as polyimide substrates: in addition to polyimide films as such, these may also be used in a laminated layer, compressed together with other carrier materials such for example as FR-4 material (epoxy resin/glass fibres) and copper films. Further, plate-shaped polyimide substrates as well as spin-coating layers can be metallised by the process according to the invention. In this case there is also to be understood by polyimide such material as is produced from dissolved and/or post-hardened polyimide. In addition, polyimides with different chemical structures can be used. In the case of KAPTON H, Trade Mark of the Company DuPont de Nemours, Inc., Wilmington, Del., USA, there is for example known a condensation polymerisation product of pyromellitic acid dianhydride (PMDA) with diaminodiphenylether (DDE). UPILEX Trade Mark of UBE Industries, Tokyo, Japan is on the other hand produced from the condensation product from 3,4,3′,4′-biphenyltetracarboxylic acid dianhydride (BPDA) with DDE (UPILEX-R), or with p-phenylene-diamine (PPD) (UPILEX-S).
- Before deposition of the first metal coating by glow discharge, if necessary holes are stamped, drilled or preferably etched in the polyimide substrate.
- The metal coating which is applied in order to produce the etching mask (perforation mask) for producing the holes on the polyimide surfaces, is only applied temporarily to the surfaces, i.e. before production of the conductor tracks it is removed from the polyimide again and does not serve as a basic metal coating for producing the conductor tracks. The metals also suitable for production of conductor tracks can also be deposited. As the etching mask is again removed from the perforated substrate and a new metal coating is deposited in order to form the conductor tracks, any possible impairment of the bond between the etching mask and the substrate surface during etching of the holes cannot have a disadvantageous effect on the secure adhesion of the conductor tracks produced later.
- The perforated masks formed in order to produce the holes on the substrate surfaces are produced in a photochemical way with photo-masks. By a preferred use of a positive photoresist as a photo-mask, a considerably higher optical resolution and thus finer structures are achieved, as thinner coatings may be produced (5-10 μm thickness) with a photoresist, than for example with dry films (30-50 μm thickness of the photoresist layers), so that the light impinging on the layer during exposure is scattered to a lesser degree. Due to the smaller thickness of the photoresist layers, this also adheres better to the foundation. Further, by using positive resists, a positive image overlay can be used when exposing the resist layer, so that exposure errors have a less severe effect. Electrophoretically depositable resists can also be used.
- Thereafter the holes in the substrate are produced in a dry etching process; the glow discharge process has proved particularly favourable. For this purpose the substrate with the perforated masks located thereon is treated in a suitable device with a gas, for example oxygen, preferably with a mixture of oxygen and tetrafluoromethane (CF4).
- By means of optimising the treatment parameters, e.g. the gas composition, the gas pressure and glow discharge power, treatment temperature and time, sufficiently steep aperture walls result without back-etched undercuttings beneath the perforated mask, so that extremely fine holes can be produced even in thicker substrates.
- After formation of the holes, the metallic etching mask is again removed. Thereafter the perforated substrate is cleaned, for example with an aqueous solution containing a wetting agent.
- Thereafter the surfaces to be coated can be pre-treated by means of a glow discharge process. For example the surfaces are initially etched, cleaned and/or functionalised with reactive groups, the gases reacting with the chemical groups on the polyimide surface.
- For pre-treatment the substrate is introduced into a normal plasma reactor, for example a parallel plate reactor, which is in the form of a tube or tunnel reactor. Glow discharge for pre-treatment may be produced both with direct current or with alternating currents (high frequency in the kHz or MHz range). The surfaces are preferably initially etched in oxygen, an oxygen-containing compound such as a nitrogen oxide (N2O/NOx), in an oxygen/argon or oxygen/nitrogen mix.
- The first metal coating which is also catalytically active and has an adhesion-promoting action, is applied on the surfaces thus pre-treated by decomposition of volatile metal compounds. For this purpose an inert carrier gas is passed through a supply container, which contains the organometallic compounds. In addition the inert gas contains oxygen- containing compounds, preferably oxygen (O2) or nitrogen oxides (N2O/NOx). If for transfer of the vapour of the metal compound from the supply container the oxygen-containing compound is not mixed with the carrier gas, said oxygen-containing compound is introduced separately into the plasma reactor and in this way passes into the glow discharge zone. Furthermore, the flow of the oxidising carrier gas mixture can be subdivided into two partial flows, which flow on the one hand through the supply container and on the other directly into the plasma reactor. Direct introduction of the vapour of the organometallic compound into the plasma reactor without carrier gas is also possible. The oxidising gas mixture is then passed directly into the plasma reactor.
- The carbon and oxygen content of the metal coatings deposited by glow discharge can be determined for example by means of ESCA (Electron Spectroscopy for Chemical Application). For this purpose the coated substrate is introduced into an ultra-high vacuum chamber and illuminated with x-rays (Al—Kα- or Mg—Kα-line). The uppermost atom layers of the metal coating are energised and ionised by the energy-rich radiation, so that electrons emerge from the material. Their energy is measured, so that an element-specific quantitative analysis of the composition of the metal coating is possible.
- Palladium has proved particularly advantageous for coating. In this way there result for the subsequent electroless metal deposition catalytically active metal coatings, so that further activation of these metal coatings, for example with solutions containing noble metals, is usually not necessary.
- The conditions for metallising substantially correspond to those in pre-treatment by means of glow discharge. The pressure in the treatment chamber generally comes to 1 Pa to 50 Pa. Usually a temperature on the substrate close to ambient temperature or slightly above is used, by variation in the electrical power of the glow discharge. Heating of the substrate carrier is also advantageous.
- The second metal coating, for example a palladium layer, a nickel/boron alloy layer or a nickel/phosphorus alloy layer, can be applied to this basic metal coating by electroless metallisation from an acidic or neutral bath.
- However the metals gold and cobalt and their alloys as well as pure nickel or alloys of cobalt can also be considered. For fully-additive build-up of metal, palladium is preferably deposited in an electroless manner, as the metal quality of the weakly-acidic chemically-reductive copper baths known at present is insufficient for all technical requirements.
- If palladium is applied as a second metal coating in order to produce the conductor tracks according to a procedure other than additive technique, such for example as the semi-additive process, care must be taken that this palladium layer is only deposited in a low layer thickness. This is necessary as palladium is more difficult to etch than for example a nickel/boron alloy layer, and therefore can only be simply removed from the surfaces when the etching agent can penetrate the layer through pores, and the palladium layer can be raised off from below.
- The following aqueous electroless metallising baths are preferably used for the process according to the invention:
- 1. Electroless nickel bath with hypophosphite as a reducing agent for producing nickel/phosphorus coatings:
Nickel sulphate (NiSO4.5H2O) 25-30 g/l Sodium hypophosphite 30 g/l Citric acid 2 g/l Acetic acid 5 g/l Aminoacetic acid 10 g/l Lead as lead acetate 2 mg/l pH value 6.2 Temperature 8-84° C. - The nickel/phosphorus layer contains about 4% by weight phosphorus.
- Instead of nickel salts, cobalt salts can also be used for deposition of cobalt/phosphorus alloy layers or a mixture of nickel with cobalt salts for depositing nickel/cobalt/phosphorus layers.
- 2. Electroless nickel baths with dimethylaminoborane as a reducing agent for producing nickel/boron layers:
2a. Nickel sulphate (NiSO4.5H2O) 25 g/l Dimethylaminoborane 4 g/l Sodium succinate 25 g/l Sodium sulphate 15 g/l pH value 5.0 Temperature 60° C. 2b. Nickel sulphate (NiSO4.5H2O) 40 g/l Dimethylaminoborane 1-6 g/l Sodium citrate 20 g/l Lactic acid (85% by weight) 10 g/l pH value 7.0 Temperature 40° C 2c. Nickel sulphate (NiSO4.5H2O) 50 g/l Dimethylaminoborane 2.5 g/l Sodium citrate 25 g/l Lactic acid (85% by weight) 25 g/l Thiodiglycolic acid 1.5 mg/l pH value 6-7 Temperature 40° C. - Baths with nickel chloride or nickel acetate instead of nickel sulphate may also be used. Dimethylaminoborane instead of dimethylaminoborane is also suitable as a reducing agent.
- 3. Electroless palladium baths with formic acid or its derivate as a reducing agent:
3a. Palladium acetate 0.05 Mol/l Ethylenediamine 0.1 Mol/l Sodium formiate 0.2 Mol/l Succinic acid 0.15 Mol/l pH value (set with formic acid) 5.5 Temperature 67° C. 3b. Palladium chloride 0.5 Mol/l 2-diethylaminoethylamine 0.6 Mol/l Methane acid ethyl ester 0.3 Mol/l Potassium dihydrogen phosphate 0.2 Mol/l pH value (set with formic acid) 6.0 Temperature 70° C. 3c. Palladium acetate 0.05 Mol/l 1,2-bis(3-aminopropylamino)-ethane 0.1 Mol/l Sodium formiate 0.3 Mol/l Succinic acid 0.1 Mol/l pH value (set with formic acid) 5.9 Temperature 59° C. 4. Electroless copper bath with hypophosphite as a reducing agent: 4a. Copper chloride (CuCl2.2H2O) 0.06 Mol/l N-(hydroxyethyl)-ethylene diamine triacetate 0.074 Mol/l trisodium salt sodium dihydrogen hypophosphite 0.34 Mol/l (NaH2PO2.H2O) pH value 6 Temperature 65° C. 4b. Copper sulphate (CuSO4.5H2O) 0.04 Mol/l N-(hydroxyethyl)-ethylene diamine - Apart from the named baths, other types of baths or baths for depositing other metals can be used, if these are acidic or neutral, i.e. have a pH value below about 8, preferably between 2 and 7.
- The electroless metallising baths should have the smallest possible temperature and/or the highest possible deposition speed, as in this way the secure adhesion of the metal coating can be further increased.
- Further metal coatings may be precipitated from electroless or electrolytic metallising baths on the second metal coating. If the second metal coating already has a sufficient layer thickness so that it is free of pores, the metal coatings deposited thereon may also be produced with alkaline metallising baths. All depositable metals can be considered here. The conventional electroless and electrolytic baths are used.
- The substrates are brought into contact with the aqueous treatment baths, for example during electroless or electrolytic metallising, by dipping in the treatment solutions, but also in so-called horizontal treatment systems, in which the treatment solutions are applied to the substrates by splashing.
- The invention is further explained in the following examples:
- The following conditions were observed in all examples: reactor type: parallel plate reactor, high-frequency voltage on the substrate electrode, frequency: 13.56 MHz, substrate temperature 35° C.:
- 1. Pre-treatment by means of glow discharge:
- Gas: oxygen
- Pressure: 25 Pa
- Gas flow: 100 standard-cm3/min,
- Power density: 0.8W/cm2
- Treatment time: 90 seconds
- 2. Pd deposition by means of glow discharge:
- Organometallic compound: π-allyl-π-cyclopentadienyl-palladium-(II),
- Gas: Ar/O2 in a mixture of 3:1 (volume ratio)
- Pressure: 10 Pa
- Gas flow: 25 standard-cm3/min
- Power density: 0.5W/cm2
- Evaporator Temperature: 45° C.
- 300 mg (+E,uns Δ 1.4 mMol) of organic metallic compounds were evaporated and transferred into the reactor. In this case in total 60 standard-cm3 oxygen were consumed in the argon/oxygen mixture. In a further experiment 240 standard-cm3 oxygen were consumed. In both cases largely carbon-free palladium layers were obtained. Assuming that the ligands of the organometallic compound are oxidised by oxygen to form carbon dioxide and water, in the present case 330 standard-cm3 of oxygen would be necessary.
- Various alternative processes may be used in order to produce the conductor tracks:
- 1. Coating a perforated KAPTON E film with liquid photoresist, exposure, development in 1% by weight Na2CO3 solution,
- 2. Pre-treatment by means of glow discharge:
- Gas: oxygen
- Pressure: 25 Pa,
- Gas Flow: 100 standard-cm3/min
- Power Density: 0.8W/cm2
- Treatment Time: 90 seconds
- 3. Pre-deposition by means of glow discharge:
- organometallic compound: π-allyl-π-cyclopentadienyl-palladium-(II),
- Gas: Ar/O2 or N2/O2, respectively in a mixture of 3:1,
- Pressure: 10 Pa
- Gas flow: 25 standard-cm3/min
- Power Density: 0.5W/cm2
- Evaporator Temperature: 45° C.
- Treatment Time: 10-15 minutes
- 4. If necessary, electroless deposition of palladium in a bath with formic acid as the reducing agent:
- Temperature: 70° C.
- pH value: 6.0
- Treatment Time: 5-8 minutes
- 5. Removal of photo-mask in acetone.
- 6. Build-up of conductor track with electroless palladium deposition as process step 4 until required layer thickness is achieved.
- The advantage of this procedure resides in the fact that at the points at which no conductor tracks are formed, only the metal used to produce the perforated mask is applied and later removed again. At these points however no metal coating used for producing conductor tracks is deposited by decomposition of the volatile metal compounds in the glow discharge. Therefore no metal contaminations can form on the substrate surface at these points, so that the insulation resistance between the conductor tracks is particularly high.
- The basic metal coatings on the photo-masking areas are selected to be so thin, for example 0.1 μm, that their removal together with the photo-mask lying thereunder is easily perpormed i.e. without individual points of the polymer films remaining behind on the substrate surfaces. Conventional chemical solutions are used for removing the polymer films.
- 1. Pre-treatment of a perforated UPILEX S film in the glow discharge:
- Gas: oxygen
- Pressure: 25 Pa
- Gas flow: 100 standard-cm3/min
- Power Density: 0.8W/cm2
- Treatment Time: 90 seconds
- 2. Pd deposition in glow discharge:
- organometallic compound: π-allyl-π-cyclopentadienyl-palladium-(II),
- Gas: Ar/O2 or N2/O2, respectively in a mixture of 3:1
- Pressure: 10 Pa
- Gas Flow: 25 standard-cm3/min
- Power Density: 0.5W/cm2
- Evaporator Temperature: 45° C.
- Treatment Time: 10-15 minutes
- 3. Coating of the film with dry film resist, exposure, development in 1% by weight of Na2CO3 solution.
- 4. Fully-additive electroless deposition in the resist channel of palladium in a bath with formic acid as a reducing agent:
- Temperature: 70° C.
- pH value: 6.0
- Treatment time depending on layer thickness required.
- 5. Removal of dry film resist in acetone.
- 6. Palladium differential etching with diluted HNO3/HCl solution.
- Should the basic metal coating already exhibit sufficient conductivity, the second metal coating may be applied electrolytically in the resist channel.
- 1. Pre-treatment of a perforated KAPTON H film by means of glow discharge:
- Gas: oxygen
- Pressure: 25 Pa
- Gas Flow: 100 standard-cm3/min
- Power Density: 0.8W/cm2
- Treatment Time: 90 seconds
- 2. Pd deposition by means of glow discharge:
- Organometallic compound: π-allyl-π-cyclopentadienyl-palladium-(II),
- Gas: Ar/O2 or N2/O2, respectively in a mixture of 3:1
- Pressure: 10 Pa
- Gas Flow: 25 standard-cm3/min
- Power Density: 0.5W/cm2
- Evaporator Temperature: 45° C.
- Treatment Time: 10-15 minutes
- 3. Deposition of nickel/boron from a weakly acidic bath in an electroless manner, with dimethylaminoborane as a reducing agent:
- Temperature: 40° C.
- Treatment Time: 2 minutes
- 4. Electrolytic deposition of copper in a sulphuric acid copper bath:
- Cupracid BL (Company Atotech Deutschland GmbH, Berlin, Germany)
- Current Density: 2/Adm2
- 11 Layer Thickness: 25 μm
- 5. Coating of film with dry film resist, exposure, development in 1% by weight Na2CO3 solution.
- 6. Etching off of copper and nickel/boron layer.
- Etching solution: CuCl2/HCl with 120 g/l Cu in all, 1.5% by weight HCl, NaCl saturated 40° C.
- 7. Etching off palladium layer
- Etching solution one part HNO3 concentrated; 3 parts HCl concentrated; 4 parts water
- Ambient Temperature
- Treatment time: 15 seconds
- 8. Removal of dry film resist in acetone.
- Example 5 (semi-additive technique/pattern plating with nickel/boron or copper layer as second metallic coating):
- 1. Pre-treatment of a perforated polyimide plate by means of glow discharge:
- Gas: oxygen
- Pressure: 25 Pa
- Gas Flow: 100 standard-cm3/min
- Power Density: 0.8W/cm2
- Treatment Time: 90 seconds
- 2. Pd deposition by means of glow discharge:
- Organometallic compound π-allyl-π-cyclopentadienyl-palladium-(II),
- Gas: Ar/O2or N2/O2 respectively in a mixture of 3:1
- Pressure: 10 Pa
- Gas Flow: 25 standard-cm3/min
- Power Density: 0.5W/cm2
- Evaporator Temperature: 45° C.
- Treatment Time: 10-15 minutes
- 3. Electroless deposition of nickel/boron from a bath with dimethylaminoborane as a reducing agent:
- Temperature: 40° C.
- Treatment Time: 2 minutes
- Alternatively: deposition of copper from a weakly acidic or neutral electroless copper bath with hypophosphite as reducing agent.
- 4. Coating of the film with dry film resist, exposure, development in 1% by weight Na2CO3 solution.
- 5. Build-up of conductor track by means of electrolytic copper deposition (layer thickness 25 μm).
- 6. Metal resist layer deposited (for example tin).
- 7. Etching off of copper or nickel/boron layer:
- Etching solution: CuCl2/HCl with 120 g/l Cu in all, 1.5% by weight HCl, NaCl saturated, 40° C.
- 8. Etching off palladium layer
- Etching solution one part HNO3 concentrated; 3 parts HCl concentrated; 4 parts water.
- Ambient Temperature
- Treatment time: 15 seconds
- 9. Removal of dry film resist in acetone.
- If instead of the oxidising gas mixture in the preceding example in process steps 2, respectively only inert gas mixtures without oxygen are used, for example pure nitrogen or pure argon, carbon-containing palladium layers result from deposition by glow discharge, yet with a smaller yield with respect to the organometallic compound used. In addition, the layers reveal a reduced catalytic activity and the security of adhesion to the substrate surface is not sufficiently resistant to the alkaline process steps.
- In examples 2 to 5 securely-adhering metal coatings are obtained without exception which retain their secure adhesion to the polyimide surface even after a thermal treatment, for example a soldering process, or after or during a treatment with aqueous-alkaline solutions such for example as a developer or strip solution for a photoresist film.
- The secure adhesion of the metal coatings on the substrate surface is in particular increased by heat treatment after deposition of the metal coatings which are deposited in an electroless and electrolytic manner (for example annealing at 120° C.).
- If on the other hand, for example in example 5 (semi-additive technique/pattern-plating), instead of the acidic electroless copper bath an alkaline electroless copper bath is used, then in fact after deposition and annealing treatment at 150° C. securely adhering copper layers are obtained on the polyimide film. The secure adhesion however drops to very low values (for example of from 1.2 N/mm to 0.4 N/mm in the peel test) if the polyimide foil provided with the copper structures is dipped in an aqueous-alkaline developing solution.
- In the abovenamed examples, another rare gas, for example neon, may be used instead of argon, the same test results being obtained.
- Polyimide films with conductor tracks in the form of films, and manufactured according to the process in the invention, can be glued together to form stacks in a suitable process. A double-sided or four-layer circuit can be glued or laminated on to an optionally rigid carrier, for example a ceramic or FR4 plate (for example also a printed circuit board) or a silicon carrier. Two, four or more multi-layer circuits produced according to the method in the invention can be glued one on the other using an uncoated polyimide intermediate layer, and the intermediate product can if necessary be mechanically drilled and through-contacted in a wet-chemical manner in a previously known way. The conductor tracks in the individual conductor track planes are then, after drilling of holes through the stack, electrically interconnected in a previously known way by electroless metallisation of the aperture walls.
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DE4438777A DE4438777A1 (en) | 1994-10-18 | 1994-10-18 | Process for the production of electrical circuit carriers |
DE19944438791 DE4438791C2 (en) | 1994-10-18 | 1994-10-18 | Substrate provided with metallized polyimide surfaces |
DE19538531A DE19538531A1 (en) | 1994-10-18 | 1995-10-09 | Process for the deposition of metal layers |
US08/817,337 US6221440B1 (en) | 1994-10-18 | 1995-10-18 | Process for plating metal coating |
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EP3261418A4 (en) * | 2015-07-29 | 2018-07-25 | Suzhou Weipeng Electrical Technology Co., Ltd. | Method for preparing adhesive-free, polyimide flexible printed circuit board |
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DE4330961C1 (en) * | 1993-09-09 | 1994-07-28 | Krone Ag | Producing structured metallised coatings on substrates |
CA2203024A1 (en) * | 1994-10-18 | 1996-04-25 | Heinrich Meyer | Process for plating metal coatings |
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- 1995-10-18 CA CA002203024A patent/CA2203024A1/en not_active Abandoned
- 1995-10-18 AT AT95935818T patent/ATE171225T1/en not_active IP Right Cessation
- 1995-10-18 JP JP51285696A patent/JP3210675B2/en not_active Expired - Fee Related
- 1995-10-18 US US08/817,337 patent/US6221440B1/en not_active Expired - Fee Related
- 1995-10-18 DE DE59503637T patent/DE59503637D1/en not_active Expired - Fee Related
- 1995-10-18 EP EP95935818A patent/EP0787224B1/en not_active Expired - Lifetime
- 1995-10-18 AU AU38003/95A patent/AU3800395A/en not_active Abandoned
- 1995-10-18 WO PCT/DE1995/001501 patent/WO1996012051A1/en active IP Right Grant
- 1995-10-18 DE DE19581161T patent/DE19581161D2/en not_active Expired - Fee Related
-
2001
- 2001-04-23 US US09/840,367 patent/US6403168B2/en not_active Expired - Fee Related
Cited By (4)
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US20080011981A1 (en) * | 2003-11-07 | 2008-01-17 | Mec Company, Ltd. | Etchant and replenishment solution therefor, and etching method and method for producing wiring board using the same |
US9121237B2 (en) | 2011-07-28 | 2015-09-01 | Baker Hughes Incorporated | Methods of coating wellbore tools and components having such coatings |
EP3261418A4 (en) * | 2015-07-29 | 2018-07-25 | Suzhou Weipeng Electrical Technology Co., Ltd. | Method for preparing adhesive-free, polyimide flexible printed circuit board |
EP3288352A4 (en) * | 2016-05-13 | 2019-03-13 | Suzhou Weipeng Electrical Technology Co., Ltd | Method for preparing printed circuit board of ultra-thin metal layer |
Also Published As
Publication number | Publication date |
---|---|
AU3800395A (en) | 1996-05-06 |
JP3210675B2 (en) | 2001-09-17 |
US6403168B2 (en) | 2002-06-11 |
US6221440B1 (en) | 2001-04-24 |
ATE171225T1 (en) | 1998-10-15 |
CA2203024A1 (en) | 1996-04-25 |
DE19581161D2 (en) | 1997-07-17 |
DE59503637D1 (en) | 1998-10-22 |
EP0787224A1 (en) | 1997-08-06 |
JPH10507228A (en) | 1998-07-14 |
EP0787224B1 (en) | 1998-09-16 |
WO1996012051A1 (en) | 1996-04-25 |
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