TWI366195B - A memory testing system and memory module thereof - Google Patents

A memory testing system and memory module thereof

Info

Publication number: TWI366195B
Authority: TW; Taiwan
Prior art keywords: memory; testing system; memory module; module; memory testing
Prior art date: 2008-05-05

Application number

TW097116493A

Other languages

English (en)

Other versions

TW200947447A (en

Inventor

Jen Shou Hsu

Kuo Cheng Ting

Original Assignee

Etron Technology Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2008-05-05

Filing date

2008-05-05

Publication date

2012-06-11

2008-05-05 Application filed by Etron Technology Inc filed Critical Etron Technology Inc

2008-05-05 Priority to TW097116493A priority Critical patent/TWI366195B/zh

2008-11-13 Priority to US12/269,891 priority patent/US7817485B2/en

2009-11-16 Publication of TW200947447A publication Critical patent/TW200947447A/zh

2012-06-11 Application granted granted Critical

2012-06-11 Publication of TWI366195B publication Critical patent/TWI366195B/zh

Links

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/40—Response verification devices using compression techniques
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry

TW097116493A 2008-05-05 2008-05-05 A memory testing system and memory module thereof TWI366195B (en)

Priority Applications (2)

Application Number	Priority Date	Filing Date	Title
TW097116493A TWI366195B (en)	2008-05-05	2008-05-05	A memory testing system and memory module thereof
US12/269,891 US7817485B2 (en)	2008-05-05	2008-11-13	Memory testing system and memory module thereof

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
TW097116493A TWI366195B (en)	2008-05-05	2008-05-05	A memory testing system and memory module thereof

Publications (2)

Publication Number	Publication Date
TW200947447A TW200947447A (en)	2009-11-16
TWI366195B true TWI366195B (en)	2012-06-11

Family

ID=41256991

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW097116493A TWI366195B (en)	2008-05-05	2008-05-05	A memory testing system and memory module thereof

Country Status (2)

Country	Link
US (1)	US7817485B2 (zh)
TW (1)	TWI366195B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US8456926B2 (en) *	2010-11-18	2013-06-04	Grandis, Inc.	Memory write error correction circuit
JP5952072B2 (ja) *	2012-04-26	2016-07-13	ルネサスエレクトロニクス株式会社	符号化装置、復号化装置及び伝送システム
TWI864499B (zh) *	2022-11-22	2024-12-01	南亞科技股份有限公司	測試系統

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5640353A (en) *	1995-12-27	1997-06-17	Act Corporation	External compensation apparatus and method for fail bit dynamic random access memory
US5828593A (en) *	1996-07-11	1998-10-27	Northern Telecom Limited	Large-capacity content addressable memory
US7099221B2 (en) *	2004-05-06	2006-08-29	Micron Technology, Inc.	Memory controller method and system compensating for memory cell data losses

2008
- 2008-05-05 TW TW097116493A patent/TWI366195B/zh not_active IP Right Cessation
- 2008-11-13 US US12/269,891 patent/US7817485B2/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
US7817485B2 (en)	2010-10-19
TW200947447A (en)	2009-11-16
US20090273996A1 (en)	2009-11-05

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Legal Events

Date	Code	Title	Description
2020-03-11	MM4A	Annulment or lapse of patent due to non-payment of fees