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JP2000298512A - Control of operation of plant by near infrared analysis - Google Patents

Control of operation of plant by near infrared analysis

Info

Publication number
JP2000298512A
JP2000298512A JP10709899A JP10709899A JP2000298512A JP 2000298512 A JP2000298512 A JP 2000298512A JP 10709899 A JP10709899 A JP 10709899A JP 10709899 A JP10709899 A JP 10709899A JP 2000298512 A JP2000298512 A JP 2000298512A
Authority
JP
Japan
Prior art keywords
value
analysis
calibration curve
measured
measured value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10709899A
Other languages
Japanese (ja)
Other versions
JP3959887B2 (en
Inventor
Toshiharu Mitani
敏治 三谷
Yasuo Miyoshi
保男 三好
Masami Tsuruoka
正己 鶴岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui Chemicals Inc
Original Assignee
Mitsui Chemicals Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Chemicals Inc filed Critical Mitsui Chemicals Inc
Priority to JP10709899A priority Critical patent/JP3959887B2/en
Publication of JP2000298512A publication Critical patent/JP2000298512A/en
Application granted granted Critical
Publication of JP3959887B2 publication Critical patent/JP3959887B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

PROBLEM TO BE SOLVED: To omit useless interpolating work in the case of controlling the operation of a plant on the basis of values measured by a near infrared analytical method, to execute routine analysis while efficiently interpolating/evaluating an analytical curve when the interpolation of the analytical curve is required and to control the plant on the basis of the measured values. SOLUTION: In the method for controlling the operation of the plant on the basis of measured values obtained by the near infrared analysis of the plant, the near infrared analysis of the sample is executed on the basis of a previously prepared analytical curve, and when a measured value other than an allowable range is obtained, a measured value obtained by a general analytical method is compared with the allowable range. When the measured value by the general analytical method is included within the allowable range, past near infrared analytical data are inputted to obtain a predicted value, and when the predicted value exceeds the allowable range, the analytical curve is interpolated and the operation of the plant is controlled by near infrared analysis.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は近赤外分析(近赤外
線分光分析)によるプラントの運転制御方法、特に検量
線の評価・補完を行いながらプラントの運転制御を行う
方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for controlling plant operation by near-infrared analysis (near-infrared spectroscopy), and more particularly to a method for controlling plant operation while evaluating and complementing a calibration curve.

【0002】[0002]

【従来の技術】化学工業の分野において、化学品の製造
を制御する際、原料、溶媒、水分、中間品、製品、副生
物等を近赤外分析により分析し、その測定値に基づいて
製造運転の制御を行うことが提案されている。この方法
では、得られる製品が一定の品質を維持するために、上
記の測定値が一定の規格値からはみ出さないようにプラ
ントの運転制御が行われる。近赤外分析では特定の領域
の近赤外線スペクトルを測定し、このスペクトルに含ま
れる特定の波長の吸光度の組合せから、予め作成した検
量線に基づいて目的とする成分値が算出され、測定値
(予測値)が得られる。
2. Description of the Related Art In the field of the chemical industry, when controlling the production of chemical products, raw materials, solvents, moisture, intermediate products, products, by-products, etc. are analyzed by near-infrared analysis, and production is performed based on the measured values. It has been proposed to control the operation. In this method, the operation of the plant is controlled so that the measured value does not exceed a certain standard value so that the obtained product maintains a certain quality. In the near-infrared analysis, a near-infrared spectrum of a specific region is measured, and a target component value is calculated based on a calibration curve created in advance from a combination of absorbances of a specific wavelength included in the spectrum, and the measured value ( Predicted value).

【0003】近赤外分析の測定値によるプラントの運転
制御では、通常上記規格値の内側に一定幅の管理値を設
け、近赤外分析により得られる測定値が管理値を外れた
ときにプラントの運転条件を変え、測定値が管理値に復
帰するように制御装置により制御信号を出してプラント
の制御を行い、これにより測定値が規格値外にはみ出さ
ないようにしている。この場合、近赤外分析は間欠的ま
たは連続的に試料を採取して分析を行い、管理値を外れ
る異常値が得られた段階で条件変更等の制御アクション
がとられている。
[0003] In plant operation control based on measured values of near-infrared analysis, a control value having a certain width is usually provided inside the above-mentioned standard value, and when the measured value obtained by near-infrared analysis deviates from the control value, the plant is controlled. Is changed, and the control device issues a control signal to control the plant so that the measured value returns to the control value, thereby preventing the measured value from exceeding the specified value. In this case, in the near-infrared analysis, a sample is intermittently or continuously sampled and analyzed, and a control action such as a condition change is taken when an abnormal value outside the control value is obtained.

【0004】ところで近赤外スペクトルは複数の成分情
報が含まれていて試料中に含まれる他の成分、水、濃
度、温度、粒度などの複数の要因が複雑に組合わされス
ペクトルが形成されており、これらの要因が変化する
と、ピークの位置や高さが変化するため、線形重回帰分
析法(Multiple Linear Regression…MLR)や部分最
小二乗法(Partial Least Squares…PLS)等の統計
的手法により検量線が作成されている。
The near-infrared spectrum contains information on a plurality of components, and a plurality of factors such as other components, water, concentration, temperature, and particle size contained in the sample are complexly combined to form a spectrum. When these factors change, the position and height of the peak change. Therefore, calibration is performed by a statistical method such as a linear multiple regression (MLR) or a partial least squares (PLS). A line has been created.

【0005】上記の検量線の作成は複数の試料につい
て、クロマトグラフィ等の一般分析法による分析と近赤
外分析の両方法の分析を行い、近赤外分析で得られるス
ペクトルから目的成分ごとに決められる複数のピークの
吸光度のデータを選び、これらのデータと一般分析法の
測定値とを用いて上記の統計的手法によるキャリブレー
ションを行い、検量線が作成される。この場合、成分ご
とに同様の操作を行って別々の検量線が作成される。
[0005] The above-mentioned calibration curve is prepared by analyzing a plurality of samples by both a general analysis method such as chromatography and a near-infrared analysis, and determining each target component from a spectrum obtained by the near-infrared analysis. The data of the absorbances of a plurality of peaks to be obtained are selected, and the calibration is performed by the above-described statistical method using these data and the measured values of the general analysis method, and a calibration curve is created. In this case, a separate calibration curve is created by performing the same operation for each component.

【0006】ところがこのようにして作成される検量線
は、キャリブレーションに使用された試料の数が限られ
ているため、またキャリブレーションの過程における説
明変数や目的変数の選択等が適切でない場合があること
などにより、一般性のある式が得られているとは限らな
い。このため作成した検量線の評価、確認を行い、より
一般性の高い検量線を作成してルーチン分析に供すこと
が行われる。
However, since the number of samples used for calibration is limited in the calibration curve created in this way, there are cases where the selection of explanatory variables or objective variables in the calibration process is not appropriate. For some reasons, general formulas are not always obtained. For this reason, the created calibration curve is evaluated and confirmed, and a more general calibration curve is created and used for routine analysis.

【0007】それにもかかわらず、近赤外スペクトルの
複雑性から、季節、環境その他の製造条件に影響を与え
る状況の変化に伴い、すでに作成した検量線により得た
測定値が一般分析法による測定値と一致しなくなること
があり、検量線の補完が必要になる。ところが検量線の
補完には相当の時間と労力を要するので、無駄な補完作
業はなくし、必要なときに効率よく補完を行うことが要
求される。
Nevertheless, due to the complexity of the near-infrared spectrum, with changes in the conditions affecting the seasons, the environment, and other manufacturing conditions, the measured values obtained by the calibration curve already prepared are measured by the general analysis method. In some cases, the values may not match, and the calibration curve needs to be complemented. However, complementation of the calibration curve requires a considerable amount of time and effort, and therefore, it is necessary to eliminate useless complementation work and to carry out complementation efficiently when necessary.

【0008】[0008]

【発明が解決しようとする課題】本発明の課題は、近赤
外分析法による測定値に基づいて製造運転を制御する
際、無駄な補完作業を省略し、検量線の補完が必要にな
った時点において効率よく検量線を補完しながらルーチ
ン分析を行い、その測定値に基づいてプラントを制御す
ることが可能な近赤外分析によるプラントの運転制御方
法を提案することである。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for controlling a production operation based on a measurement value obtained by a near-infrared analysis method. An object of the present invention is to propose a plant operation control method based on near-infrared analysis that can perform routine analysis while efficiently complementing a calibration curve at a point in time and control the plant based on the measured values.

【0009】[0009]

【課題を解決するための手段】本発明は次の近赤外分析
によるプラントの運転制御方法である。 (1) 試料を近赤外分析して得た測定値に基づいてプ
ラントの運転制御を行う方法であって、予め作成した検
量線に基づいて試料を近赤外分析し、近赤外分析法の測
定値を許容値と比較し、許容値外の測定値が得られたと
き一般分析法により分析を行い、一般分析法による測定
値を許容値と比較し、一般分析法の測定値が許容値内の
場合は過去の近赤外分析のデータを入力して予測値を求
め、予測値が許容値外の場合は近赤外分析装置の点検を
行い、予測値が許容値内の場合は検量線の補完・評価を
行うことを特徴とする近赤外分析によるプラントの運転
制御方法。 (2) 一般分析法の測定値が許容値外の場合はプラン
ト点検を行う上記(1)記載の方法。 (3) 試料の近赤外分析により許容値外の測定値が得
られたとき、近赤外分析を再度行い、再分析により許容
値外の測定値が得られたときに、一般分析法による測定
値を許容値と比較するようにした上記(1)または
(2)記載の方法。 (4) 検量線補完後、異常発生時の測定値と対比して
検量線の評価、確認を行う上記(1)ないし(3)のい
ずれかに記載の方法。 (5) 検量線補完後、過去の近赤外分析のデータを入
力して検量線の評価・確認を行う上記(1)ないし
(4)のいずれかに記載の方法。 (6) 定期的に一般分析法による測定値を近赤外分析
法の測定値と比較し、差が出たときに検量線の補完・評
価を行う上記(1)ないし(5)のいずれかに記載の方
法。 (7) 定期的に一般分析法による測定値を近赤外分析
法の測定値と比較し、差が出たときにプロダクトのパタ
ーンを定性的に比較確認を行い、差がない場合に検量線
の確認を行う上記(6)記載の方法。 (8) 試料の近赤外分析により許容値内の測定値が得
られたときに、測定値を管理値と比較し、測定値が管理
値外の場合には制御アクションを行い、管理値内の場合
は制御アクションを行わない上記(1)ないし(7)の
いずれかに記載の方法。
SUMMARY OF THE INVENTION The present invention is a plant operation control method based on the following near-infrared analysis. (1) A method for controlling the operation of a plant based on measured values obtained by analyzing a sample by near-infrared analysis, wherein the sample is subjected to near-infrared analysis based on a calibration curve created in advance, and a near-infrared analysis method is provided. The measured value of the general analysis method is compared with the allowable value.If the measured value outside the allowable value is obtained, the analysis is performed by the general analysis method. If the predicted value is out of the allowable value, check the near-infrared analyzer if the predicted value is outside the allowable value. A plant operation control method using near-infrared analysis, which performs complementation and evaluation of a calibration curve. (2) The method according to (1) above, wherein the plant inspection is performed when the measured value of the general analysis method is out of the allowable value. (3) When a measured value outside the permissible value is obtained by the near-infrared analysis of the sample, the near-infrared analysis is performed again. The method according to the above (1) or (2), wherein the measured value is compared with an allowable value. (4) The method according to any one of (1) to (3), wherein after the calibration curve is complemented, the calibration curve is evaluated and confirmed by comparing the measured value at the time of occurrence of an abnormality. (5) The method according to any one of the above (1) to (4), wherein after the calibration curve is complemented, the past near-infrared analysis data is input and the calibration curve is evaluated and confirmed. (6) One of the above (1) to (5), in which the value measured by the general analysis method is periodically compared with the value measured by the near-infrared analysis method, and when a difference is found, the calibration curve is complemented / evaluated. The method described in. (7) Regularly compare the measured value of the general analysis method with the measured value of the near-infrared analysis method, qualitatively compare and confirm the product pattern when there is a difference, and if there is no difference, a calibration curve The method according to the above (6), wherein the confirmation is made. (8) When the measured value within the allowable value is obtained by the near-infrared analysis of the sample, the measured value is compared with the control value. The method according to any one of (1) to (7), wherein no control action is performed in the case of (1).

【0010】近赤外分析は一般に波長400〜2500
nm、好ましくは800〜2500nm、さらに好まし
くは1000〜2000nmの近赤外線を試料に照射し
て透過光または反射光を検出し、その吸収スペクトルか
ら予め作成した検量線により、試料の物性、成分等の分
析を行う方法である。本発明の制御方法では試料を前処
理することなく、製造工程において採取したものをその
まま試料として分析を行い、その測定値に基づいて制御
を行う。制御はコンピュータ等の制御装置を用い、近赤
外分析による測定値が規格値の範囲内となるように制御
する。
The near-infrared analysis generally has a wavelength of 400 to 2500.
nm, preferably 800 to 2500 nm, more preferably 1000 to 2000 nm, the sample is irradiated with near-infrared rays to detect transmitted light or reflected light, and a calibration curve prepared in advance from the absorption spectrum is used to determine the properties, components, etc. of the sample. It is a method of performing analysis. In the control method of the present invention, the sample collected in the manufacturing process is analyzed as it is without pre-processing the sample, and control is performed based on the measured value. The control is performed using a control device such as a computer so that the measured value by the near-infrared analysis falls within the range of the standard value.

【0011】この方法に用いる近赤外分光分析装置は、
ノイズレベルが30×10-6Abs以下、好ましくは2
0×10-6Abs以下、波長の再現性が±0.3nm以
下、好ましくは±0.01nm以下の高精度のものが使
用できる。ノイズレベルおよび波長再現性の測定方法は
次の通りである。
The near-infrared spectrometer used in this method is
The noise level is 30 × 10 −6 Abs or less, preferably 2 × 10 −6 Abs.
A high-precision material having a wavelength of 0 × 10 −6 Abs or less and a wavelength reproducibility of ± 0.3 nm or less, preferably ± 0.01 nm or less can be used. The measuring method of the noise level and the wavelength reproducibility is as follows.

【0012】ノイズレベルの測定方法 測定方法が反射式であればセラミック板を、透過式であ
れば空気中で2回測定し、前後の吸光度を2nm毎に2
0組測定する。1回目の測定値と2回目の測定値の差
(実効値)の標準偏差をノイズレベルとしている。
Measurement method of noise level If the measurement method is a reflection type, the ceramic plate is measured twice, and if it is a transmission type, the measurement is made twice in the air.
Measure 0 sets. The standard deviation of the difference (effective value) between the first measurement value and the second measurement value is defined as the noise level.

【0013】波長再現性の測定方法 JIS K0117−1979赤外分光分析通則を用
い、標準ポリスチレンフィルムを光路に入れ測定する。
この時、基準の近赤外吸収波長は1143.6330n
m、1684.2700nm、2166.4000nm
及び2305.9300nmの各4つである。10回の
標準偏差が波長再現性の値である。
Measurement method of wavelength reproducibility A standard polystyrene film is put in the optical path and measured according to JIS K0117-1979 rules of infrared spectroscopy.
At this time, the reference near-infrared absorption wavelength is 1143.6330 n.
m, 1684.2700 nm, 2166.4000 nm
And 2305.9300 nm. Ten standard deviations are the values of the wavelength reproducibility.

【0014】近赤外分析の測定対象となるのは、製造工
程に用いられる原料、溶媒、水分、中間品、製品、副生
物など、プラントの制御に用いられるすべてのものを含
む。近赤外線は紫外線に比べるとエネルギーが小さいの
で試料成分を変化させることがない。また可視光の場合
とは異なり吸収スペクトルによる分析であるため、試料
の透明性その他の形態による影響を受けないので、膜厚
等の調整が不要となる。
The objects to be measured by the near-infrared analysis include everything used for controlling the plant, such as raw materials, solvents, moisture, intermediate products, products, and by-products used in the production process. Near-infrared rays have less energy than ultraviolet rays and do not change sample components. Also, unlike the case of visible light, the analysis is based on the absorption spectrum, and is not affected by the transparency or other form of the sample, so that adjustment of the film thickness or the like is not required.

【0015】このような試料について近赤外分析装置で
分光分析を行うことにより、近赤外スペクトルを得る。
このスペクトルは前述の通り複数の情報が含まれてお
り、予め作成した検量線により、特定のピークのデータ
の組合せから目的とする測定成分の測定値(予測値)を
算出する。この場合、同じスペクトルから複数の測定成
分の測定値を得ることができる。
A near-infrared spectrum is obtained by subjecting such a sample to spectroscopic analysis using a near-infrared analyzer.
This spectrum contains a plurality of pieces of information as described above, and a measured value (predicted value) of a target measured component is calculated from a combination of data of specific peaks using a calibration curve created in advance. In this case, measurement values of a plurality of measurement components can be obtained from the same spectrum.

【0016】検量線(Calibration equation)はスペク
トルデータと測定成分の分析値との間の数学的関係式で
あり、前述のように複数の試料について、クロマトグラ
フィ等の一般分析法による分析と近赤外分析の両方法の
分析を行い、近赤外分析で得られるスペクトルから目的
成分ごとに決められる複数のピークの吸光度のデータを
選び、これらのデータと一般分析法の測定値とを用いて
前述のMLR法やPLS法等の統計的手法により作成さ
れる。
The calibration equation is a mathematical relationship between the spectrum data and the analysis value of the measured component. As described above, the analysis of a plurality of samples by a general analysis method such as chromatography and the near infrared Analyze both methods of analysis, select the data of the absorbance of multiple peaks determined for each target component from the spectrum obtained in the near-infrared analysis, using these data and the measured values of the general analysis method described above It is created by a statistical method such as the MLR method or the PLS method.

【0017】この場合、測定成分ごとに同様の操作を行
って別々の検量線を作成することができる。このような
キャリブレーションに用いる統計的手法は測定成分、そ
の精度等により任意に決められるが、MLR法およびP
LS法が好ましい。また一般分析法としては比色分析、
ガスクロマトグラフィーのような従来から用いられてい
る測定成分の分析法が含まれる。
In this case, a separate calibration curve can be prepared by performing the same operation for each measurement component. The statistical method used for such calibration is arbitrarily determined depending on the measurement components, the accuracy thereof, and the like.
The LS method is preferred. In addition, colorimetric analysis,
A conventionally used method for analyzing a measurement component such as gas chromatography is included.

【0018】本発明のプラントの運転制御方法は、目的
とする製品の製造を行いながら、ルーチン分析において
近赤外分析により制御に用いる測定成分を分析しなが
ら、異常値が発生したときに効率よく検量線の補完・評
価を行い、このような補完された検量線を用いて測定を
行い、その測定値により運転制御を行う。本発明におい
て制御の対象となるものは化学品、食料品など、近赤外
分析により測定が可能なものの製造運転であるが、化学
品、特にポリエステル、フェノール類の製造運転に適し
ている。
The method for controlling operation of a plant according to the present invention efficiently analyzes a measurement component used for control by near-infrared analysis in a routine analysis while manufacturing a target product, and efficiently detects abnormal values. The calibration curve is complemented / evaluated, measurement is performed using the complemented calibration curve, and operation control is performed based on the measured value. In the present invention, the object to be controlled is a production operation of a chemical product, a food product, or the like that can be measured by near-infrared analysis, but is suitable for a production operation of a chemical product, particularly, a polyester or a phenol.

【0019】本発明において規格値とは、製品の品質上
必要とされる値であり、この規格値外のものは不合格と
される。本発明において管理値とは、規格値からはみ出
さないようにするために、制御を開始する値であって規
格値の内側に設定されこの管理値内では制御アクション
を行わず、管理値外では制御アクションを行う。本発明
において許容値とは検量線が許容される値であって、こ
の許容値外では検量線の補完を行うために、管理値の外
側に設定される値であり、一般的には規格値付近の値が
好ましいが、他の値でもよい。規格値の中心値(平均
値)を目標値mとすると、管理値はm±σ(σは標準偏
差)、許容値はm±3σに設けるのが好ましい。
In the present invention, the standard value is a value required in terms of product quality, and a value outside the standard value is rejected. In the present invention, the management value is a value at which control is started and is set inside the specification value so as not to exceed the standard value. Perform control actions. In the present invention, the permissible value is a value at which the calibration curve is permissible. If the permissible value is outside the permissible value, the value is set outside the control value in order to complement the calibration curve. A value in the vicinity is preferable, but another value may be used. Assuming that the center value (average value) of the standard values is the target value m, it is preferable that the management value is set to m ± σ (σ is a standard deviation) and the allowable value is set to m ± 3σ.

【0020】本発明では、ルーチン分析において、予め
作成した検量線に基づいて試料を近赤外分析し、許容値
外の測定値が得られたとき、一般分析法による分析を行
って測定値を許容値と比較し、一般分析法の測定値が許
容値外の場合はプラント点検を行い、装置の調整や設定
の変更等を行うことができる。一般分析法の測定値が許
容値内の場合は過去の近赤外分析のデータを入力して予
測値を求め、予測値が許容値外の場合は近赤外分析装置
の点検を行う。予測値が許容値内の場合は検量線の補完
作業を行う。検量線の補完は、異常のデータを検量線作
成用データに加えて、前記MLR法、PLS法等の統計
的手法により再度検量線を作成、評価を行う。
In the present invention, in a routine analysis, a sample is subjected to near-infrared analysis based on a calibration curve prepared in advance, and when a measured value outside a permissible value is obtained, analysis is performed by a general analysis method to obtain a measured value. If the measured value of the general analysis method is out of the permissible value as compared with the permissible value, the plant inspection is performed, and the equipment can be adjusted or the setting can be changed. If the measured value of the general analysis method is within the allowable value, the data of the past near-infrared analysis is input to obtain the predicted value, and if the predicted value is out of the allowable value, the near-infrared analyzer is inspected. When the predicted value is within the allowable value, the calibration curve is supplemented. The complementation of the calibration curve is performed by adding the abnormal data to the data for preparing the calibration curve, and again preparing and evaluating the calibration curve by a statistical method such as the MLR method or the PLS method.

【0021】上記の場合、試料の近赤外分析により許容
値外の測定値が得られたときは近赤外分析を再度行い、
再分析により許容値外の測定値が得られたときに、一般
分析法による測定値を許容値と比較することにより突発
的なデータ異常による無駄な検量線の作成を避けること
ができる。
In the above case, when a measured value outside the permissible value is obtained by the near infrared analysis of the sample, the near infrared analysis is performed again,
When a measured value outside the permissible value is obtained by the re-analysis, the measurement value obtained by the general analysis method is compared with the permissible value, thereby avoiding the generation of a useless calibration curve due to a sudden data abnormality.

【0022】ルーチン分析において近赤外分析の測定値
が許容値内のときは、その測定値を管理値と比較し、管
理値外の場合はプラントに対して制御アクションを行
い、管理値内の場合は制御アクションを行わない。
In the routine analysis, when the measured value of the near-infrared analysis is within the allowable value, the measured value is compared with the control value. If no control action is taken.

【0023】検量線補完後、異常発生時の近赤外分析法
の測定値と対比して検量線の評価、確認を行うことによ
り、正確な補完検量線を得ることができる。また検量線
補完後、過去の近赤外分析のデータを入力して検量線の
評価・確認を行うことにより、不適切な補完を避けるこ
とができる。
After the calibration curve is complemented, an accurate complementation calibration curve can be obtained by evaluating and confirming the calibration curve in comparison with the measured value of the near-infrared analysis method when an abnormality occurs. In addition, after the calibration curve is complemented, inappropriate complementation can be avoided by inputting past near-infrared analysis data and evaluating and confirming the calibration curve.

【0024】このようなルーチン分析による検量線の補
完に加えて、定期的に一般分析法による測定値を近赤外
分析法の測定値と比較し、差が出たときに検量線の補完
を行うことにより、検量線が不適切となる事態を早く認
識し、これに対応して検量線の補完を行い、制御を適正
に行うことができる。この場合、定期的に一般分析法に
よる測定値を近赤外分析法の測定値と比較し、差が出た
ときにプロダクトのパターンを定性的に比較確認を行
い、差がない場合に検量線の確認を行うことにより、突
発的な異常による検量線の作成を避けることが可能にな
る。
In addition to the calibration curve by the routine analysis, the measured value of the general analysis method is periodically compared with the measured value of the near-infrared analysis method, and when a difference is found, the calibration curve is complemented. By doing so, it is possible to quickly recognize the situation where the calibration curve becomes inappropriate, to complement the calibration curve in response to this, and to perform the control properly. In this case, the measured value of the general analysis method is regularly compared with the measured value of the near-infrared analysis method, and when there is a difference, the product pattern is qualitatively compared and confirmed. It is possible to avoid creating a calibration curve due to a sudden abnormality by confirming the above.

【0025】[0025]

【発明の効果】本発明によれば、近赤外分析による測定
値に異常値が出た場合に一般分析法による測定値を、管
理値の外側に設定される許容値と比較してその結果によ
り検量線を補完するようにしたので、近赤外分析法によ
る測定値に基づいてプラントの運転制御を行う際、無駄
な補完作業を省略し、検量線の補完が必要になった時点
において効率よく検量線を補完しながらルーチン分析を
行い、その測定値に基づいてプラントを制御することが
可能である。
According to the present invention, when an abnormal value appears in a measured value obtained by near-infrared analysis, the measured value obtained by the general analysis method is compared with an allowable value set outside the control value, and the result is determined. Is used to supplement the calibration curve, so when performing plant operation control based on the measured values obtained by near-infrared analysis, wasteful supplementary work is omitted, and the efficiency is improved when the calibration curve needs to be supplemented. Routine analysis can be performed while supplementing the calibration curve well, and the plant can be controlled based on the measured values.

【0026】またさらに定期的に一般分析法による測定
値を近赤外分析法の測定値と比較し、差が出たときに検
量線の補完を行うことにより、検量線が不適切となる事
態を早く認識し、これに対応して検量線の補完を行い、
制御を適正に行うことができる。
Furthermore, the measured value obtained by the general analysis method is periodically compared with the measured value obtained by the near-infrared analysis method, and when a difference is found, the calibration curve is complemented, thereby making the calibration curve inappropriate. Is quickly recognized, and the calibration curve is complemented accordingly,
Control can be performed properly.

【0027】[0027]

【発明の実施の形態】以下、本発明の発明の実施の形態
を図面により説明する。図1は実施形態の製造装置を示
すフロー図、図2は制御方法を示すフロー図、図3は各
値の関係を示す分布図である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a flow chart showing the manufacturing apparatus of the embodiment, FIG. 2 is a flow chart showing a control method, and FIG. 3 is a distribution chart showing a relationship between respective values.

【0028】図1において、1はプラントであって、原
料2を供給して製品3を製造するように構成されてい
る。4は制御装置、5は近赤外分析装置、6は一般分析
装置である。制御装置4はプラント1からの検出信号1
aを受け、制御信号4aをプラントに送って反応条件等
を制御するように構成されている。近赤外分析装置5は
制御装置4からの制御信号4bにより近赤外分析を行い
測定信号5aを制御装置4に送るように構成されてい
る。一般分析装置6はクロマトグラフィ等からなり、制
御装置4からの制御信号4cにより分析を行い、測定信
号6aを制御装置4に送るように構成されている。
In FIG. 1, reference numeral 1 denotes a plant, which is configured to supply a raw material 2 to produce a product 3. 4 is a control device, 5 is a near-infrared analyzer, and 6 is a general analyzer. The control device 4 detects the detection signal 1 from the plant 1
a, the control signal 4a is sent to the plant to control the reaction conditions and the like. The near-infrared analyzer 5 is configured to perform near-infrared analysis based on a control signal 4 b from the controller 4 and send a measurement signal 5 a to the controller 4. The general analyzer 6 is constituted by chromatography or the like, performs analysis by a control signal 4c from the controller 4, and sends a measurement signal 6a to the controller 4.

【0029】上記の装置による製造運転方法は、制御装
置4の制御信号4aによりプラント1に原料2を供給し
て製品3を製造する。この間プラント1から検出信号1
aを制御装置4に送る。一定のインターバルで制御装置
4からの制御信号4bにより近赤外分析装置5がプラン
ト1からサンプリングして近赤外分析を行い、その測定
信号5aを制御装置4に送る。制御装置4では予め作成
された検量線から測定値を演算し、その結果に基づいて
制御信号4aをプラント1に送ってプラント1の製造条
件を制御する。また制御信号4cにより一般分析装置6
により分析を行い、その結果を制御装置4に送る。制御
装置4ではその結果により検量線の補完を行う。
In the manufacturing operation method using the above apparatus, the raw material 2 is supplied to the plant 1 by the control signal 4a of the control device 4 to manufacture the product 3. During this time, the detection signal 1
a is sent to the control device 4. At a certain interval, the near-infrared analyzer 5 samples the plant 1 to perform near-infrared analysis based on the control signal 4 b from the controller 4, and sends a measurement signal 5 a to the controller 4. The control device 4 calculates a measured value from a calibration curve created in advance, and sends a control signal 4a to the plant 1 based on the result to control the manufacturing conditions of the plant 1. Also, the general analyzer 6 is controlled by the control signal 4c.
And sends the result to the control device 4. The controller 4 complements the calibration curve based on the result.

【0030】上記の制御方法を図2により詳細に説明す
るが、各値の関係は図3に示されている。すなわちaは
規格値であり、その中心値(平均値)を目標値mとする
と、m±3σの位置に許容値bが設定され、m±σの位
置に管理値cが設定されている。許容値bおよび管理値
cはm±σの位置dその他の位置に設定してもよいが、
許容値bは規格値aの内側、管理値cは許容値bの内側
に設定する。
The above control method will be described in detail with reference to FIG. 2, and the relationship between the values is shown in FIG. That is, a is a standard value, and assuming that the center value (average value) is the target value m, the allowable value b is set at the position of m ± 3σ, and the management value c is set at the position of m ± σ. The allowable value b and the management value c may be set at a position d of m ± σ or another position,
The allowable value b is set inside the standard value a, and the management value c is set inside the allowable value b.

【0031】図2においてまずS101において近赤外
分析装置の点検を行い、S102で近赤外分析装置の診
断を行う。診断は前記ノイズレベルおよび波長再現性を
測定し、波長再現性が±0.3nm以内、ノイズレベル
が30×10-6abs以下であれば正常と判定する。S
103において診断結果を判定し、正常であればS10
4の標品の測定を行い、正常でなければS101に戻り
装置の点検、診断を繰り返す。S104の標品の測定
は、標品について近赤外分析と一般分析法による測定値
を比較し、近赤外分析法の測定値が一般分析法の測定値
の±3σ以内であれば合格とする。S105において合
否を判定し、合格であればS106のルーチン分析およ
びS131の定期的に一般法と比較するステップに移
る。不合格であればS101以下のステップを繰り返
す。
In FIG. 2, first, the near-infrared analyzer is inspected in S101, and the near-infrared analyzer is diagnosed in S102. In the diagnosis, the noise level and the wavelength reproducibility are measured, and if the wavelength reproducibility is within ± 0.3 nm and the noise level is 30 × 10 −6 abs or less, it is determined to be normal. S
At 103, the diagnosis result is determined.
The sample of No. 4 is measured, and if it is not normal, the process returns to S101 and the inspection and diagnosis of the device are repeated. The measurement of the sample in S104 compares the measurement value of the sample with the near-infrared analysis and the general analysis method, and if the measurement value of the near-infrared analysis method is within ± 3σ of the measurement value of the general analysis method, the test is passed. I do. In S105, pass / fail is determined, and if it passes, the process proceeds to the routine analysis in S106 and the step of periodically comparing with the general method in S131. If not, the steps from S101 are repeated.

【0032】上記により近赤外分析装置が正常であるこ
とを確認した状態で、S106のルーチン分析に移る。
このステップでは近赤外分析装置で近赤外スペクトルを
測定し、その結果を制御装置に入力し、ここで予めML
R法、PLS法等の統計的手法により作成された検量線
により測定成分の測定値(予測値)を演算し、これをS
107の結果として出力する。そしてS108において
その測定値がm±3σの一定幅の許容値b内かどうかを
判定する。この許容値bは各製品の品質ごとに定められ
た検量線の許容範囲の値であり、この許容値内であれば
S109のように管理値cと比較し、管理値c内であれ
ばS111のようにプラント制御ノーアクション、すな
わち制御アクションを行わないが、管理値c外であれば
管理値c内に復帰させるためにS112のように制御ア
クションを行う。プラント制御アクションは原料供給
量、濃度、反応温度、圧力、時間等の反応条件を変え、
測定値が管理値内に戻るように制御を行う。このような
制御アクションを行い、次回の測定において測定値が管
理値内に入ったときは、変更された反応条件をそのまま
継続し、次回の測定値が管理値外となったときはさらに
制御アクションが行われる。
After confirming that the near-infrared analyzer is normal as described above, the routine proceeds to the routine analysis of S106.
In this step, the near-infrared spectrum is measured by the near-infrared analyzer, and the result is input to the controller, where the ML is set in advance.
A measured value (predicted value) of a measured component is calculated from a calibration curve created by a statistical method such as the R method and the PLS method, and this is calculated by S
107 is output. Then, in S108, it is determined whether or not the measured value is within an allowable value b having a constant width of m ± 3σ. The permissible value b is a value within the permissible range of the calibration curve defined for each product quality. If the permissible value b is within the permissible value, it is compared with the control value c as in S109. No control action is performed as in (1), but no control action is performed, but if the control value is outside the control value c, a control action is performed as in step S112 to return the control value to the control value c. The plant control action changes the reaction conditions such as raw material supply amount, concentration, reaction temperature, pressure, time, etc.
Control is performed so that the measured value returns to the control value. When such control action is performed and the measured value falls within the control value in the next measurement, the changed reaction condition is continued as it is, and when the next measured value is out of the control value, further control action is performed. Is performed.

【0033】S108で測定値が許容値外と判定した場
合は、S115に移り近赤外分析装置により再測定を行
う。これは異常値が突発的な誤動作等によるものでな
く、継続的なものであることを確認し、無駄な検量線の
補完作業を省略するために行う。S115の測定の結果
はS116で許容値内かどうかを判定し、許容値内であ
ればS109以下の操作に移る。
If it is determined in step S108 that the measured value is outside the allowable range, the process proceeds to step S115, where the measurement is performed again by the near-infrared analyzer. This is performed to confirm that the abnormal value is not caused by a sudden malfunction or the like but is continuous, and to omit useless work of supplementing the calibration curve. It is determined in S116 whether the result of the measurement in S115 is within the allowable value, and if it is within the allowable value, the operation proceeds to S109 and subsequent steps.

【0034】S116で再測定結果が許容値外と判定さ
れたときは、S117においてガスクロマトグラフィ等
の一般分析法による測定が行われ、その測定値がS11
8で管理値内かどうか判定される。ここで管理値外と判
定されたときは、異常の発生が近赤外分析法と一般分析
法で二重に確認されたことになるので、S119に示す
ようにプラント点検を行う。これは近赤外分析および一
般分析法の両方の結果とも許容値外のときはプラントを
点検して調製および設定を行う必要があるためである。
If it is determined in S116 that the re-measurement result is outside the allowable range, measurement is performed in S117 by a general analysis method such as gas chromatography, and the measured value is stored in S11.
In step 8, it is determined whether the value is within the control value. Here, if it is determined that the value is outside the control value, it means that the occurrence of the abnormality has been confirmed twice by the near-infrared analysis method and the general analysis method, and the plant is inspected as shown in S119. This is because when the results of both the near-infrared analysis and the general analysis method are out of the allowable values, it is necessary to inspect and prepare and set the plant.

【0035】S118で許容値内と判定されたときは、
S120において過去の近赤外分析のデータを入力して
近赤外分析装置を正常であるかどうかを判断する。過去
のデータはすでに許容値内であることが確認されたもの
であるから、S121で許容値外の判定が出たときは近
赤外分析装置の誤動作の可能性があり、S101、S1
02に戻って装置の点検、診断を行い、故障部分を修理
する。このような操作によって無駄な検量線補完・評価
の作業が省略される。
If it is determined in step S118 that the value is within the allowable range,
In S120, the data of the past near-infrared analysis is input to determine whether or not the near-infrared analyzer is normal. Since the past data has already been confirmed to be within the allowable value, if a judgment outside the allowable value is made in S121, there is a possibility that the near-infrared analyzer malfunctions, and S101 and S1
Returning to step 02, the device is inspected and diagnosed, and the failed part is repaired. By such an operation, useless calibration curve complement / evaluation work is omitted.

【0036】S121において許容値内の判定があった
ときは、一般法による測定値および過去のデータが許容
値内であるにもかかわらず、近赤外分析の測定値が許容
値外となっているから、S122において検量線の補完
を行う。検量線の補完は最初に検量線を作成したときと
同じ手法、例えばMLR法、PLS法等の統計的手法に
より検量線を作りなおす。最初の検量線作成は、複数の
試料についての近赤外分析法の測定値と一般分析法の測
定値を説明変数として多変量解析法により行われるが、
検量線の補完は最初の検量線作成時に使用した試料の測
定値に加えて、今回異常値が出た試料について近赤外分
析および一般法で分析した測定値を新たに説明変数とし
て、検量線を作成する。
If it is determined in step S121 that the measured value by the general method and the past data are within the allowable value, the measured value of the near-infrared analysis is out of the allowable value. Therefore, the calibration curve is complemented in S122. The calibration curve is supplemented by the same technique as when the calibration curve was first created, for example, a statistical technique such as the MLR method or the PLS method. The first calibration curve is created by multivariate analysis using the measured values of the near-infrared analysis method and the measured values of the general analysis method for multiple samples as explanatory variables.
The calibration curve is complemented by adding the measured values of the sample with abnormal values in this study, which were analyzed by near-infrared analysis and the general method, as new explanatory variables, in addition to the measured values of the sample used when the first calibration curve was created. Create

【0037】こうして新たな検量線を作成した後、S1
23において新検量線の評価・確認を行う。この評価、
確認は通常検量線作成時に行われる操作に加えて、異常
発生時に分析した測定値で検量線の補完に使用しなかっ
た測定値を使用して、これが正当な値に算出されるかど
うかをS124で判定する。ここで不合格の場合はS1
22に戻って再度検量線の補完を行う。S124で合格
の場合は、S125において過去のデータを入力し評
価、確認を行う。過去のデータはすでに管理値内と判定
されているので、新検量線によっても同じ結果が出る
と、S126で合格と判定され、S127で補完検量線
を新検量線として供用し、以後のルーチン分析を新検量
線で行う。不合格の場合はS122に戻って検量線の補
完を再度行う。
After creating a new calibration curve in this way, S1
At 23, the new calibration curve is evaluated and confirmed. This rating,
The confirmation is performed in addition to the operation performed when the normal calibration curve is created, and whether the measured value analyzed at the time of occurrence of the abnormality is not used for complementing the calibration curve is used to determine whether the calculated value is a valid value in S124. Is determined. Here, S1 if rejected
Returning to step 22, the calibration curve is complemented again. If the result is S124, the past data is input, evaluated and confirmed in S125. Since the past data has already been determined to be within the control value, if the same result is obtained even with the new calibration curve, it is determined to be acceptable in S126, and the complementary calibration curve is used as a new calibration curve in S127, and the subsequent routine analysis is performed. Is performed with a new calibration curve. If not, the process returns to S122 and the calibration curve is complemented again.

【0038】上記のようなルーチン分析において異常が
発生したときに異常の対応策として検量線の補完を行う
と、一般分析法による測定を常に行っていなくてもよい
上、異常に対する対応を迅速に行うことができる。近赤
外分析の測定値が許容値内であっても、一般分析法によ
る測定値が許容値を外れる場合があり得るが、このよう
な場合は許容値を適切な幅に設定することにより近赤外
法の測定値も許容値外になるので、容易に異常を発見す
ることができる。
If a calibration curve is supplemented as a measure against the abnormality when an abnormality occurs in the routine analysis as described above, the measurement by the general analysis method need not always be performed, and the response to the abnormality can be quickly performed. It can be carried out. Even if the measured value of the near-infrared analysis is within the allowable value, the measured value by the general analysis method may deviate from the allowable value.In such a case, by setting the allowable value to an appropriate width, the near value can be obtained. Since the measured value of the infrared method also falls outside the allowable value, an abnormality can be easily found.

【0039】上記のような近赤外法の測定値が許容値内
にもかかわらず、一般法の測定値が許容値を外れる事態
が生じるのを防止するためには、S131以下の一般分
析法との比較を定期的に行うのが好ましい。この操作は
S106以下のルーチン分析と並行して行うものであ
り、ルーチン分析の頻度より少ない例えば1週間に1〜
2回程度の頻度で一般分析を行い、S131においてそ
の測定値を近赤外分析法の測定値と比較し、許容値以上
の差があるかどうかを判定する。
In order to prevent a situation in which the measured value of the general method deviates from the allowable value even though the measured value of the near-infrared method is within the allowable value, the general analysis method of S131 and subsequent steps is performed. It is preferable to make a comparison periodically with. This operation is performed in parallel with the routine analysis of S106 and subsequent steps.
A general analysis is performed about twice, and in S131, the measured value is compared with the measured value of the near-infrared analysis method to determine whether there is a difference equal to or larger than an allowable value.

【0040】S132において許容値以上の差がないと
判定したときはS106以下のルーチン分析を続行す
る。許容値以上の差があると判定したときは、S133
においてプロダクト定性的比較、確認を行う。これはデ
ータベースから対応する製品のデータを入力して定期的
に比較し、得られた測定値がその製品のパターンを有し
ているかどうかを定性的に判定し、突発的な異常データ
かどうかを判定する。
If it is determined in S132 that there is no difference larger than the allowable value, the routine analysis from S106 is continued. When it is determined that there is a difference equal to or larger than the allowable value, S133
Perform qualitative comparison and confirmation of products. This is done by inputting the data of the corresponding product from the database and comparing it periodically, qualitatively determining whether the obtained measured value has the pattern of the product, and determining whether it is sudden abnormal data. judge.

【0041】S134において従来品と同等であると判
定された場合は検量線が不適切になっていることを示す
から、S122以下の検量線補完の操作に入る。またS
134において従来品と同等でないと判定されたときは
S115以下の操作に移り、一般法により再測定を行
い、検量線補完・評価の必要性を検討する。
If it is determined in step S134 that the standard product is equivalent to the conventional product, it indicates that the calibration curve is inappropriate, and the operation for calibration curve complementing in step S122 and thereafter is started. Also S
If it is determined in step 134 that the product is not equivalent to the conventional product, the operation proceeds to step S115 and subsequent steps.

【0042】このようにS106以下のルーチン分析に
よる検量線の補完を行いながら、S131以下の定期的
な一般法との比較を行うことにより、検量線が不適切に
なった事態を早急に検知して対応することができ、これ
により制御の精度は高くなる。また一般法による分析は
長時間を必要とするため、S131以下の操作を頻繁に
行うのは困難であるが、これらの操作を組合せて行うこ
とにより一般法による分析の頻度を少なくして効率よく
検量線の補完を行うことができる。
As described above, while the calibration curve is complemented by the routine analysis of step S106 and subsequent steps, and the comparison with the periodic general method of step S131 and subsequent steps is performed, the situation where the calibration curve becomes inappropriate can be quickly detected. , Thereby increasing the accuracy of the control. In addition, since the analysis by the general method requires a long time, it is difficult to frequently perform the operations of S131 and below. However, by performing these operations in combination, the frequency of the analysis by the general method is reduced and the efficiency is reduced. The calibration curve can be complemented.

【図面の簡単な説明】[Brief description of the drawings]

【図1】実施形態の製造装置のフロー図である。FIG. 1 is a flowchart of a manufacturing apparatus according to an embodiment.

【図2】実施形態の制御方法を示すフロー図である。FIG. 2 is a flowchart illustrating a control method according to the embodiment.

【図3】各値の関係を示す分布図である。FIG. 3 is a distribution diagram showing a relationship between values.

【符号の説明】[Explanation of symbols]

1 プラント 2 原料 3 製品 4 制御装置 5 近赤外分析装置 6 一般分析装置 DESCRIPTION OF SYMBOLS 1 Plant 2 Raw material 3 Product 4 Controller 5 Near-infrared analyzer 6 General analyzer

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) G01N 21/35 G01N 21/35 Z (72)発明者 鶴岡 正己 山口県玖珂郡和木町和木六丁目1番2号 三井化学株式会社内 Fターム(参考) 2G020 AA03 BA02 CA02 CB42 CD04 CD13 CD22 2G059 AA01 BB11 BB20 CC09 CC12 DD20 EE01 EE12 FF04 FF08 HH01 KK01 MM02 MM05 MM12 4H006 AA05 AC90 BD80 5H223 AA01 AA15 EE06 9A001 BB02 GG05 KK37 KK54 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification FI FI Theme Court ゛ (Reference) G01N 21/35 G01N 21/35 Z (72) Inventor Masami Tsuruoka 6-1, Waki, Wakimachi, Kuga-gun, Yamaguchi Prefecture No. 2 Mitsui Chemicals Co., Ltd. F-term (reference) 2G020 AA03 BA02 CA02 CB42 CD04 CD13 CD22 2G059 AA01 BB11 BB20 CC09 CC12 DD20 EE01 EE12 FF04 FF08 HH01 KK01 MM02 MM05 MM12 4H006 AA05 AC90 BD80 5H223 AE9

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 試料を近赤外分析して得た測定値に基づ
いてプラントの運転制御を行う方法であって、 予め作成した検量線に基づいて試料を近赤外分析し、 近赤外分析法の測定値を許容値と比較し、 許容値外の測定値が得られたとき一般分析法により分析
を行い、 一般分析法による測定値を許容値と比較し、 一般分析法の測定値が許容値内の場合は過去の近赤外分
析のデータを入力して予測値を求め、 予測値が許容値外の場合は近赤外分析装置の点検を行
い、 予測値が許容値内の場合は検量線の補完・評価を行うこ
とを特徴とする近赤外分析によるプラントの運転制御方
法。
1. A method for controlling the operation of a plant based on a measurement value obtained by performing near-infrared analysis on a sample, the method comprising: performing near-infrared analysis on the sample based on a calibration curve created in advance; The measured value of the analytical method is compared with the permissible value, and when the measured value outside the permissible value is obtained, analysis is performed by the general analytical method.The measured value of the general analytical method is compared with the permissible value, and the measured value of the general analytical method is measured. If the predicted value is within the allowable value, enter the past NIR data and calculate the predicted value.If the predicted value is out of the allowable value, check the near-infrared analyzer and check if the predicted value is within the allowable value. A method for controlling plant operation by near-infrared analysis, in which a calibration curve is complemented / evaluated in some cases.
【請求項2】 一般分析法の測定値が許容値外の場合は
プラント点検を行う請求項1記載の方法。
2. The method according to claim 1, wherein the plant inspection is performed when the measured value of the general analysis method is out of the allowable value.
【請求項3】 試料の近赤外分析により許容値外の測定
値が得られたとき、近赤外分析を再度行い、再分析によ
り許容値外の測定値が得られたときに、一般分析法によ
る測定値を許容値と比較するようにした請求項1または
2記載の方法。
3. When the measured value out of the permissible value is obtained by the near-infrared analysis of the sample, the near-infrared analysis is performed again, and when the measured value out of the permissible value is obtained by the re-analysis, the general analysis is performed. 3. The method according to claim 1, wherein the measured value is compared with an allowable value.
【請求項4】 検量線補完後、異常発生時の測定値と対
比して検量線の評価、確認を行う請求項1ないし3のい
ずれかに記載の方法。
4. The method according to claim 1, wherein after complementing the calibration curve, the calibration curve is evaluated and confirmed by comparing the measured value when an abnormality occurs.
【請求項5】 検量線補完後、過去の近赤外分析のデー
タを入力して検量線の評価・確認を行う請求項1ないし
4のいずれかに記載の方法。
5. The method according to claim 1, wherein after the calibration curve is complemented, data of past near-infrared analysis is inputted to evaluate and confirm the calibration curve.
【請求項6】 定期的に一般分析法による測定値を近赤
外分析法の測定値と比較し、差が出たときに検量線の補
完・評価を行う請求項1ないし5のいずれかに記載の方
法。
6. The method according to claim 1, wherein a value measured by the general analysis method is periodically compared with a value measured by the near-infrared analysis method, and when a difference is found, the calibration curve is complemented / evaluated. The described method.
【請求項7】 定期的に一般分析法による測定値を近赤
外分析法の測定値と比較し、差が出たときにプロダクト
のパターンを定性的に比較確認を行い、差がない場合に
検量線の確認を行う請求項6記載の方法。
7. The measured value of the general analysis method is periodically compared with the measured value of the near-infrared analysis method, and when a difference is found, the pattern of the product is qualitatively compared and confirmed. The method according to claim 6, wherein the calibration curve is confirmed.
【請求項8】 試料の近赤外分析により許容値内の測定
値が得られたときに、測定値を管理値と比較し、測定値
が管理値外の場合には制御アクションを行い、管理値内
の場合は制御アクションを行わない請求項1ないし7の
いずれかに記載の方法。
8. When a measured value within a tolerance is obtained by near-infrared analysis of a sample, the measured value is compared with a control value, and if the measured value is out of the control value, a control action is performed and 8. The method according to claim 1, wherein no control action is taken if the value is within the value.
JP10709899A 1999-04-14 1999-04-14 Plant operation control method by near infrared analysis Expired - Lifetime JP3959887B2 (en)

Priority Applications (1)

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Country Status (1)

Country Link
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7662634B2 (en) 2003-05-19 2010-02-16 Bayer Materialscience Ag Method and device for determining the isomer composition in isocyanate production processes
EP3711852A1 (en) 2019-03-21 2020-09-23 Covestro Deutschland AG Method and apparatus for quantitative monitoring of the composition of a oligomer/monomer mixture
CN113624717A (en) * 2021-09-14 2021-11-09 四川启睿克科技有限公司 Model establishment and use method for predicting sample components based on near infrared spectrum data

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7662634B2 (en) 2003-05-19 2010-02-16 Bayer Materialscience Ag Method and device for determining the isomer composition in isocyanate production processes
EP3711852A1 (en) 2019-03-21 2020-09-23 Covestro Deutschland AG Method and apparatus for quantitative monitoring of the composition of a oligomer/monomer mixture
WO2020188116A1 (en) 2019-03-21 2020-09-24 Covestro Intellectual Property Gmbh & Co. Kg Process and apparatus for quantitative monitoring of the composition of an oligomer/monomer mixture
CN113624717A (en) * 2021-09-14 2021-11-09 四川启睿克科技有限公司 Model establishment and use method for predicting sample components based on near infrared spectrum data

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