CN115190408A - Method, device and equipment for testing active noise reduction and bottom noise of earphone - Google Patents

Abstract

The embodiment of the application provides a method, a device and equipment for testing active noise reduction and bottom noise of an earphone, wherein the method comprises the following steps: the method comprises the steps of comparing frequency domain noise data of a target earphone with first preset threshold noise data, comparing the frequency domain noise data with second preset threshold noise data if the frequency domain noise data are higher than the first preset threshold noise data, and judging whether frequency points with preset bad characteristics exist in the frequency domain noise data or not if the frequency points are lower than or equal to the second preset threshold noise data so as to judge whether the target earphone is good or not.

Description

Headphone active noise reduction noise floor test method, device and equipment

technical field

The embodiments of the present application relate to the technical field of earphones, and in particular, to a method, device, and equipment for testing the noise floor of active noise reduction of earphones.

Background technique

With the development of True Wireless Stereo (TWS) earphones, in-ear earphones and semi-in-ear earphones occupy most of the earphone market. In-ear headphones are not suitable for all users due to the stethoscope effect and the obvious foreign body sensation when they are worn continuously, while semi-in-ear headphones do not have these problems and are more comfortable to wear. Active Noise Cancellation (ANC) is a noise reduction technology that generates reverse sound waves equal to the external noise through the noise reduction system to neutralize the noise, thereby achieving the effect of noise reduction. The ANC noise floor is the noise generated by the structure of the ANC earphone itself, the delay of the Bluetooth itself, the current sound from the internal electrical components such as the circuit board, and the improper setting of the filter in the chip algorithm when the ANC is turned on. The earphones need to be tested for ANC noise floor before leaving the factory. The earphones that meet the test standards are good products before they are allowed to leave the factory. Since the semi-in-ear headphone ANC noise floor test is a small signal test, the quietness of the test environment is very high.

In the current state of the art, the ANC noise floor test for semi-in-ear headphones is mainly performed in an anechoic room or a shielding box with a very good isolation effect (ordinary shielding boxes cannot meet the requirements).

However, the inventor found that the prior art has at least the following technical problems: setting up an anechoic chamber in an earphone production line, or modifying the isolation effect of a common shielding box, will increase the test cost.

SUMMARY OF THE INVENTION

Embodiments of the present application provide a method, device, and device for testing the noise floor of active noise reduction of earphones, so as to overcome the problem that the reply content is irrelevant to the user's query statement, and the user experience is poor.

In a first aspect, an embodiment of the present application provides a method for testing the noise floor of active noise reduction of headphones, including:

Obtain the frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency domain noise data is the corresponding relationship between the frequency value and the noise value;

If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, determine that the target earphone is a good product and output the first test result;

If the frequency-domain noise data of the target earphone is higher than the first preset threshold noise data, compare the frequency-domain noise data of the target earphone with the second preset threshold noise data, wherein the second preset threshold noise data is higher than the first threshold noise data Preset threshold noise data;

If the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determine that the target earphone is a non-good product and output the second test result;

If the frequency-domain noise data of the target earphone is lower than or equal to the second preset threshold noise data, determine whether there is a frequency point with a preset bad feature in the frequency-domain noise data of the target earphone;

If it exists, determine that the target earphone is a non-good product and output the second test result;

If it does not exist, determine that the target earphone is a good product and output the first test result.

In a possible implementation manner, after judging whether there is a frequency point with a preset bad feature in the frequency domain noise data of the target earphone, the method further includes: if there is no frequency point with a preset bad feature, judging the frequency domain of the target earphone. Whether the number of frequency points in the noise data that exceeds the first preset threshold noise data exceeds the preset condition; if it exceeds the preset condition, it is determined that the target earphone is a non-good product and the second test result is output; if it does not exceed the preset condition, then Determine that the target earphone is a good product and output the first test result.

In a possible implementation manner, the frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone is obtained, wherein the frequency domain noise data is the corresponding relationship between the frequency point and the noise value, including: obtaining the target earphone in the test equipment The original noise data for the ANC noise floor test; the original noise data is preprocessed to obtain the frequency domain noise data of the target earphone.

In a possible implementation manner, preprocessing the original noise data to obtain the frequency domain noise data of the target earphone includes: performing Fourier transform processing on the original noise data of the target earphone to convert the time of the original noise data into The corresponding relationship with the noise value is converted into the corresponding relationship between the frequency value and the noise value, so as to obtain the frequency domain noise data of the target earphone.

In a possible implementation manner, judging whether there are frequency points with preset bad characteristics in the frequency-domain noise data of the target earphone includes: judging that the frequency-domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data Whether there is a preset number of frequency points whose frequency values have an arithmetic relationship among all the frequency points of the threshold noise data; if so, it is determined that there are frequency points with preset bad characteristics in the frequency-domain noise data of the target earphone; if not If there is, it is determined that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone.

In a possible implementation manner, the process of setting the first preset threshold noise data and the second preset threshold noise data is as follows: perform an ANC noise floor test on a preset number of headphones; The frequency domain noise data is averaged to obtain the average frequency domain noise data; the noise values at different frequencies of the average frequency domain noise data are added to the first noise value to obtain the first preset threshold noise data; Noise values of different frequencies are added to the second noise value to obtain second preset threshold noise data, wherein the second noise value is greater than the first noise value.

In a second aspect, an embodiment of the present application provides a headphone active noise reduction noise floor test device, including:

The acquisition module is used to acquire the frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency domain noise data is the corresponding relationship between the frequency value and the noise value;

a first output module, configured to determine that the target earphone is a good product and output the first test result if the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data;

The first comparison module is configured to compare the frequency domain noise data of the target earphone with the second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, wherein the second preset threshold noise data is compared. The threshold noise data is higher than the first preset threshold noise data;

The second output module, if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determine that the target earphone is a non-good product and output the second test result;

a first judging module, configured to judge whether the frequency-domain noise data of the target earphone has a preset bad characteristic frequency if the frequency-domain noise data of the target earphone is lower than or equal to the second preset threshold noise data;

The third output module is used to determine that the target earphone is a non-good product and output the second test result if it exists;

The fourth output module is used for determining that the target earphone is a good product and outputting the first test result if it does not exist.

In a possible implementation manner, the second judgment module is specifically configured to: if there is no frequency point with a preset bad feature, determine the frequency point of the noise data in the frequency domain of the target earphone that exceeds the first preset threshold noise data Whether the number exceeds the preset condition; if it exceeds the preset condition, the target earphone is determined to be a non-good product and the second test result is output; if it does not exceed the preset condition, the target earphone is determined to be a good product and the first test result is output.

In a possible implementation manner, the acquisition module is specifically configured to acquire the original noise data of the target earphone for the ANC noise floor test in the test equipment; and preprocess the original noise data to obtain the frequency domain noise data of the target earphone.

In a possible implementation manner, the original noise data in the acquisition module is the corresponding relationship between time and noise value; the acquisition module is also specifically used to perform Fourier transform processing on the original noise data of the target earphone, so as to convert the original noise data into The corresponding relationship between the time and the noise value is converted into the corresponding relationship between the frequency value and the noise value, so as to obtain the frequency domain noise data of the target earphone.

In a possible implementation manner, the first judgment module is specifically configured to judge whether the frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data in all frequency points whether there is a frequency If there is a preset number of frequency points whose value exists in an arithmetic sequence relationship; if there is, determine the frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, determine the frequency point of the target earphone. Frequency bins with preset bad features do not exist in the frequency-domain noise data.

In a possible implementation manner, the setting module is specifically configured to perform an ANC noise floor test on a preset number of earphones, and average the obtained first preset number of frequency-domain noise data to obtain average frequency-domain noise data; Adding the noise values of different frequencies of the average frequency domain noise data to the first noise value to obtain the first preset threshold noise data; adding the noise values of different frequencies of the average frequency domain noise data to the second noise value to obtain the second preset threshold noise data; wherein the second noise value is greater than the first noise value.

In a third aspect, an embodiment of the present application provides a headphone active noise reduction noise floor test device, including: at least one processor and a memory;

memory stores computer-executed instructions;

The at least one processor executes the computer-executed instructions stored in the memory, so that the at least one processor executes the headphone active noise cancellation noise floor testing method according to the first aspect and various possible designs of the first aspect.

In a fourth aspect, embodiments of the present application provide a computer-readable storage medium, where computer-executable instructions are stored in the computer-readable storage medium, and when the processor executes the computer-executable instructions, the first aspect and various possibilities of the first aspect are implemented. The designed headphone active noise reduction noise floor test method.

In a fifth aspect, an embodiment of the present application provides a computer program product, including a computer program. When the computer program is executed by a processor, the first aspect above and various possible designs of the first aspect are implemented. The headphone active noise reduction noise floor testing method. .

The embodiments of the present application provide an active noise reduction noise floor testing method, device, and device for earphones. The method compares the frequency-domain noise data of the target earphone with the first preset threshold noise data, and if the noise is higher than the first preset threshold noise If it is lower than or equal to the second preset threshold noise data, then it is judged whether there is a frequency point with preset bad characteristics in the frequency domain noise data, so as to judge whether the target earphone is a Good products, this method improves the accuracy of testing in ordinary shielding boxes, does not need to set up an anechoic room or transform ordinary shielding boxes, and avoids the problem of increased test costs.

Description of drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the accompanying drawings used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are some embodiments of the present application, and for those of ordinary skill in the art, other drawings can also be obtained from these drawings without any creative effort.

1 is a schematic structural diagram of a headphone active noise reduction noise floor test system provided by an embodiment of the present application;

FIG. 2 is a schematic flowchart 1 of a method for testing the noise floor of active noise reduction of headphones according to an embodiment of the present application;

3 is a second schematic flowchart of a method for testing the noise floor of active noise reduction of headphones according to an embodiment of the present application;

FIG. 4 is a schematic flowchart three of the method for testing the noise floor of active noise reduction of headphones according to an embodiment of the present application;

5 is a schematic structural diagram of a headphone active noise reduction noise floor test device provided by an embodiment of the application;

FIG. 6 is a schematic diagram of a hardware structure of a headphone active noise reduction noise floor test device provided by an embodiment of the present application.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application.

For semi-in-ear earphones, setting up an anechoic chamber in the earphone production line in the prior art, or modifying the isolation effect of a common shielding box, will all cause the problem of increased testing costs. The embodiments of the present disclosure propose the following technical ideas:

Based on the noise data of the semi-in-ear headphone ANC noise floor test in the ordinary shielding box, by setting multiple thresholds and judgment conditions, the accuracy of determining the good and non-good products is improved, and there is no need to add an anechoic room or modify the shielding box. Reduced testing costs.

FIG. 1 is a schematic structural diagram of a headphone active noise reduction noise floor test system provided by an embodiment of the present application. As shown in FIG. 1 , the system provided in this embodiment includes: a server 101 , a testing device 102 , and an artificial ear 103 .

Among them, the test equipment 101 is used to place the earphone to be tested to isolate the ambient noise. Wherein, the testing equipment 101 may be a common shielding box.

The artificial ear 102 is installed in the testing device 101 and is used to wear the earphone to be tested and collect the noise data of the ANC noise floor test of the earphone to be tested.

The server 103 can be connected to the artificial ear through wireless communication or wired communication, and is used to receive the noise data of the ANC noise floor test of the earphone to be tested, and analyze the noise data to determine whether the earphone to be tested is a good product.

The technical solutions of the present application and how the technical solutions of the present application solve the above-mentioned technical problems will be described in detail below with specific examples. The following specific embodiments may be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below with reference to the accompanying drawings.

2 is a schematic flow chart 1 of a method for testing the noise floor of headphone active noise reduction provided by an embodiment of the present application. The execution subject of this embodiment may be the server in the embodiment shown in FIG. 1, or may be other computing and processing equipment, This embodiment is not particularly limited here. As shown in Figure 2, the method includes:

S201: Acquire frequency-domain noise data of an ANC noise floor test of a target earphone, where the frequency-domain noise data is a corresponding relationship between a frequency value and a noise value.

In this embodiment, S201 specifically includes S2011 to S2012, as follows:

S2011: Obtain the original noise data of the target earphone for the ANC noise floor test in the test equipment.

In this embodiment, the testing equipment may be a common shielding box.

Among them, the ANC noise floor test is a test of the noise floor generated when the headphone ANC function is turned on.

Specifically, the raw noise data sent by the artificial ear for the ANC noise floor test of the target earphone in the test device is received.

S2012: Preprocess the original noise data to obtain frequency-domain noise data of the target earphone.

Among them, the original noise data is the corresponding relationship between time and noise value.

Specifically, Fourier transform processing is performed on the original noise data of the target earphone, so as to convert the corresponding relationship between the time and the noise value of the original noise data into the corresponding relationship between the frequency value and the noise value, so as to obtain the frequency domain noise data of the target earphone. .

The corresponding relationship between the frequency value and the noise value may be a curve, and the corresponding relationship between each frequency value and the noise value is recorded as a frequency point.

S202: Compare the frequency domain noise data of the target earphone with the first preset threshold noise data. If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, execute S203; if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, execute S204.

The first preset threshold noise data is determined according to pre-statistical average frequency-domain noise data of the earphones. The first preset threshold noise data is the corresponding relationship between each frequency value and the first noise threshold value.

Specifically, the noise value of each frequency point in the frequency domain noise data of the target earphone is compared with the first noise threshold value corresponding to the frequency point. If the noise values of all frequency points are less than or equal to the first noise threshold value, determine that the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data; otherwise, determine the frequency domain noise of the target earphone The data is higher than the first preset threshold noise data.

S203: Determine that the target earphone is a good product and output the first test result.

Among them, the first test result shows that the test is successful, and the target headset is allowed to leave the factory.

S204: Compare the frequency domain noise data of the target earphone with the second preset threshold noise data. The test standard of the second preset threshold noise data is lower than the first preset threshold noise data; if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, then execute S205; if the frequency domain noise of the target earphone If the data is lower than or equal to the second preset threshold noise data, S206 is executed.

The second preset threshold noise data is determined according to pre-statistic average frequency-domain noise data of a preset number of earphones. The second preset threshold noise data is the corresponding relationship between each frequency value and the second noise threshold value.

Specifically, the noise value of each frequency point in the frequency domain noise data of the target earphone is compared with the second noise threshold value corresponding to the frequency point. If the noise value of any frequency point is greater than the second noise threshold value, it is determined that the frequency domain noise data of the target earphone is higher than the second preset threshold noise data; otherwise, it is determined that the frequency domain noise data of the target earphone is lower than or equal to The second preset threshold noise data.

S205: Determine the target earphone as a non-good product and output the test result.

Among them, the second test result indicates that the test fails, and the target headset is not allowed to leave the factory.

S206: Determine whether there are frequency points with preset bad features in the frequency domain noise data of the target earphone. If yes, execute S205; if not, execute S203.

The preset frequency points of bad features refer to the presence of preset frequency points with specific regular characteristics during certain specific ANC noise floor tests.

For example, the preset frequency points of the bad feature are that the noise values of different frequency points have a specific numerical or mathematical relationship, or the frequency values of different frequency points have a specific numerical or mathematical relationship.

The numerical relationship or mathematical relationship may be an arithmetic sequence relationship or a proportional sequence relationship.

To sum up, by comparing the frequency domain noise data of the target earphone with the first preset threshold noise data, if it is higher than the first preset threshold noise data, compare it with the second preset threshold noise data, if it is lower than or equal to the second preset threshold noise data, then determine whether there are frequency points with preset bad characteristics in the frequency domain noise data, so as to determine whether the target earphone is a good product. Setting up an anechoic chamber or transforming a common shielding box avoids the problem of increased testing costs.

FIG. 3 is a second schematic flowchart of a method for testing the noise floor of active noise reduction of headphones according to an embodiment of the present application. Based on the embodiment of FIG. 2 , this embodiment includes determining whether there is a preset bad feature in the frequency-domain noise data of the target headphones. The processing process after the frequency point of , is detailed as follows:

If there is no frequency point with a preset bad feature, it is determined whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition. If yes, execute S205; if not, execute S203.

In this embodiment, the preset condition may be a preset number or a preset ratio.

In one embodiment of the present application, judging whether the number of frequency points in the frequency-domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition is to determine whether the frequency-domain noise data of the target earphone exceeds a preset threshold. number.

The preset number may be 100.

Here, if the target earphone is a non-good product, its corresponding frequency domain noise data exceeding the first threshold noise data will show the characteristics of lifting and bulging, so the noise data exceeding the first preset threshold in the frequency domain noise data can be passed through. Whether the number of frequency points exceeds the preset condition determines whether the target earphone is a good product.

In another embodiment of the present application, determining whether the number of frequency points in the frequency-domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition is to determine whether the frequency-domain noise data of the target earphone exceeds a predetermined threshold. Set the ratio.

Wherein, the preset ratio may be 10%.

To sum up, after determining that there are no frequency points with preset bad characteristics in the frequency-domain noise data of the target earphone, it is determined whether the number of frequency points exceeding the first preset threshold noise data in the frequency-domain noise data of the target earphone exceeds the predetermined number. Set the conditions to determine whether the first threshold noise data has the characteristics of lifting and bulging, thereby improving the efficiency and accuracy of the noise floor measurement of the active noise reduction of headphones.

In an optional embodiment of the present application, on the basis of the embodiment in FIG. 2 , this embodiment performs the specific implementation process of determining whether there are frequency points with preset bad features in the frequency domain noise data of the target earphone in this embodiment. detailed instructions. The method includes:

S301: Determine whether there is a preset number of frequency points whose frequency values have an arithmetic relationship among all the frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data.

S302: If so, determine that frequency points with preset bad characteristics exist in the frequency domain noise data of the target earphone.

S303: If it does not exist, determine that there is no frequency point with a preset bad feature in the frequency domain noise data of the target earphone.

In this embodiment, the preset number of frequency points is at least three frequency points, and may also be more frequency points, which is not limited in this application.

Among them, the arithmetic sequence relationship is due to some bad characteristics of the ANC noise floor. In the frequency domain noise data, based on a frequency point, the frequency value appears in the form of 2 times, 3 times and so on.

To sum up, by judging whether all the frequency points have a preset number of frequency points whose frequency values have an arithmetic relationship, it is possible to quickly and simply determine whether there are frequency points with preset bad characteristics in the frequency-domain noise data of the target earphone. The frequency points of bad features can be recognized in an efficient manner, and the recognition results are more accurate, thereby improving the efficiency and accuracy of the noise floor measurement of the active noise reduction of headphones.

FIG. 4 is a schematic flowchart diagram 3 of the noise floor testing method for headphone active noise reduction provided by an embodiment of the present application. On the basis of the embodiment in FIG. 2 , this embodiment further includes a first preset threshold noise data and a second preset threshold The setting process of noise data is detailed as follows:

S401: Perform an ANC noise floor test on a first preset number of earphones, and average the obtained first preset number of frequency-domain noise data to obtain average frequency-domain noise data.

Specifically, the ANC noise floor test is performed on a first preset number of headphones, and a first preset number of frequency-domain noise data is obtained, wherein each frequency-domain noise data is a corresponding relationship curve between different frequency values and noise values; according to The corresponding relationship curve between each frequency value and the noise value is averaged for the noise value of each frequency to obtain the average noise value corresponding to each frequency, and the corresponding relationship curve between each frequency and the average noise value is determined as the average frequency domain noise data.

Exemplarily, the first preset number is 100. The ANC noise floor test was performed on 100 earphones, and the obtained 100 sets of frequency-domain noise data were averaged, and the average frequency-domain noise value for a frequency point with a frequency of 1000 Hz was 5dB.

S402: Add the noise values of different frequencies of the average frequency domain noise data to the first noise value to obtain first preset threshold noise data.

The first noise value is 5dB.

Exemplarily, the noise value corresponding to the frequency of 1000Hz in the average frequency domain noise data is 5dB, and the first noise value is 5dB, then the noise value corresponding to the frequency of 1000Hz in the first preset threshold noise data is 10dB.

S403: Add the second noise value to the noise values of different frequencies of the average frequency domain noise data to obtain second preset threshold noise data, wherein the second noise value is greater than the first noise value.

Among them, the second noise value is 15dB.

Exemplarily, the noise value corresponding to the frequency of 1000Hz in the average frequency domain noise data is 5dB, and the second noise value is 15dB, then the noise value corresponding to the frequency of 1000Hz in the second preset threshold noise data is 20dB.

To sum up, the first preset threshold noise data and the second preset threshold noise data are obtained by performing the ANC noise floor test on a certain number of headphones, obtaining the average value of the frequency domain noise data, and adding different noise values. Increased accuracy in the judgment process.

FIG. 5 is a schematic structural diagram of a headphone active noise reduction noise floor testing device provided by an embodiment of the present application. As shown in FIG. 5 , based on the embodiment in FIG. 2 , the headphone active noise reduction noise floor testing device 50 in this embodiment includes: an acquisition module 501 , a first output module 502 , a first comparison module 503 , and a second output module 504 , a first judgment module 505 , a third output module 506 and a fourth output module 507 .

The acquiring module 501 is used for acquiring frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency domain noise data is the corresponding relationship between the frequency value and the noise value;

The first output module 502 is configured to determine that the target earphone is a good product and output the first test result if the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data;

The first comparison module 503 is configured to compare the frequency domain noise data of the target earphone with the second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, wherein the second preset threshold noise data is compared. Setting the threshold noise data higher than the first preset threshold noise data;

The second output module 504, if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determine that the target earphone is a non-good product and output the second test result;

The first judgment module 505 is used for judging whether the frequency-domain noise data of the target earphone has a preset bad characteristic frequency if the frequency-domain noise data of the target earphone is lower than or equal to the second preset threshold noise data;

The third output module 506 is used for determining that the target earphone is a non-good product and outputting the second test result if it exists;

The fourth output module 507 is configured to, if not present, determine that the target earphone is a good product and output the first test result.

In this embodiment, on the basis of the embodiment in FIG. 5 , the headphone active noise reduction noise floor testing device 50 further includes: a second judgment module 508, which is specifically used for: if there is no frequency point with a preset bad feature, judge the target headphone Whether the number of frequency points in the frequency domain noise data exceeding the first preset threshold noise data exceeds the preset condition; if it exceeds the preset condition, it is determined that the target earphone is a non-good product and the second test result is output; if it does not exceed the preset condition condition, the target earphone is determined to be a good product and the first test result is output.

In a possible implementation manner, the acquiring module 501 is specifically configured to acquire the original noise data of the target earphone for the ANC noise floor test in the test equipment; preprocess the original noise data to obtain the frequency domain noise data of the target earphone .

In a possible implementation manner, the original noise data is the corresponding relationship between time and noise value; the acquiring module 501 is further specifically configured to perform Fourier transform processing on the original noise data of the target earphone, so as to convert the original noise data into The corresponding relationship between the time and the noise value is converted into the corresponding relationship between the frequency value and the noise value, so as to obtain the frequency domain noise data of the target earphone.

In a possible implementation manner, the first determination module 505 is specifically configured to determine whether there is a frequency value in all frequency points where the frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data There is a preset number of frequency points in the arithmetic sequence relationship; if there is, it is determined that there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, it is determined that the frequency domain noise data of the target earphone is in the There are no frequency points with preset bad characteristics.

In this embodiment, on the basis of the embodiment in FIG. 5 , the headphone active noise reduction noise floor test device 50 further includes: a setting module 509, which is specifically used for: performing the ANC noise floor test on a preset number of headphones, and comparing the obtained first noise floor averaging a preset number of frequency-domain noise data to obtain average frequency-domain noise data; adding the noise values at different frequencies of the average frequency-domain noise data to the first noise value to obtain first preset threshold noise data; Noise values of different frequencies of the noise data are added to the second noise value to obtain second preset threshold noise data; wherein the second noise value is greater than the first noise value.

The apparatus provided in this embodiment can be used to implement the technical solutions of the foregoing method embodiments, and the implementation principles and technical effects thereof are similar, and details are not described herein again in this embodiment.

FIG. 6 is a schematic diagram of a hardware structure of a headphone active noise reduction noise floor test device provided by an embodiment of the present application. As shown in FIG. 6 , the headphone active noise reduction noise floor test device 60 in this embodiment includes: a processor 601 and a memory 602; wherein

a memory 602 for storing computer-executed instructions;

The processor 601 is configured to execute the computer-executed instructions stored in the memory, so as to implement each step executed by the server in the foregoing embodiment. For details, refer to the relevant descriptions in the foregoing method embodiments.

Optionally, the memory 602 may be independent or integrated with the processor 601 .

When the memory 602 is set independently, the headphone ANC noise floor testing device further includes a bus 603 for connecting the memory 602 and the processor 601 .

Embodiments of the present application further provide a computer-readable storage medium, where computer-executable instructions are stored in the computer-readable storage medium, and when the processor executes the computer-executable instructions, the above-mentioned method for testing the noise floor of active noise reduction of headphones is implemented.

Embodiments of the present application further provide a computer program product, including a computer program, when the computer program is executed by a processor, the above-mentioned method for testing the noise floor of active noise reduction of headphones is implemented.

In the several embodiments provided in this application, it should be understood that the disclosed apparatus and method may be implemented in other manners. For example, the device embodiments described above are only illustrative. For example, the division of modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules may be combined or integrated into another A system, or some feature, can be ignored, or not implemented. On the other hand, the shown or discussed mutual coupling or direct coupling or communication connection may be through some interfaces, indirect coupling or communication connection of devices or modules, and may be in electrical, mechanical or other forms.

Modules described as separate components may or may not be physically separated, and components shown as modules may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the modules may be selected according to actual needs to implement the solution of this embodiment.

In addition, each functional module in each embodiment of the present application may be integrated in one processing unit, or each module may exist physically alone, or two or more modules may be integrated in one unit. The units formed by the above modules can be implemented in the form of hardware, or can be implemented in the form of hardware plus software functional units.

The above-mentioned integrated modules implemented in the form of software functional modules can be stored in a computer-readable storage medium. The above-mentioned software function modules are stored in a storage medium, and include several instructions to cause a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor to execute some steps of the methods of various embodiments of the present application.

It should be understood that the above-mentioned processor may be a central processing unit (Central Processing Unit, CPU for short), or other general-purpose processors, digital signal processors (Digital Signal Processor, DSP for short), application specific integrated circuit (Application Specific Integrated Circuit, Referred to as ASIC) and so on. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in conjunction with the invention can be directly embodied as executed by a hardware processor, or executed by a combination of hardware and software modules in the processor.

The memory may include high-speed RAM memory, and may also include non-volatile storage NVM, such as at least one magnetic disk memory, and may also be a U disk, a removable hard disk, a read-only memory, a magnetic disk or an optical disk, and the like.

The bus may be an Industry Standard Architecture (ISA for short) bus, a Peripheral Component Interconnect (PCI for short) bus, an Extended Industry Standard Architecture (EISA for short) bus, or the like. The bus can be divided into address bus, data bus, control bus and so on. For convenience of representation, the buses in the drawings of the present application are not limited to only one bus or one type of bus.

The above-mentioned storage medium may be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read only memory (EEPROM), erasable Except programmable read only memory (EPROM), programmable read only memory (PROM), read only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. A storage medium can be any available medium that can be accessed by a general purpose or special purpose computer.

An exemplary storage medium is coupled to the processor, such that the processor can read information from, and write information to, the storage medium. Of course, the storage medium can also be an integral part of the processor. The processor and the storage medium may be located in application specific integrated circuits (Application Specific Integrated Circuits, ASIC for short). Of course, the processor and the storage medium may also exist in the electronic device or the host device as discrete components.

Those of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments may be completed by program instructions related to hardware. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, the steps including the above method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk and other media that can store program codes.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions described in the foregoing embodiments can still be modified, or some or all of the technical features thereof can be equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the technical solutions of the embodiments of the present application. scope.

Claims (10)

1. a headphone active noise reduction noise floor testing method, is characterized in that, comprises: Obtain the frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency domain noise data is the corresponding relationship between the frequency value and the noise value; If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, determine that the target earphone is a good product and output the first test result; If the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, compare the frequency domain noise data of the target earphone with the second preset threshold noise data, wherein the second preset threshold noise data is compared. Setting the threshold noise data to be higher than the first preset threshold noise data; If the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determine that the target earphone is a non-good product and output a second test result; If the frequency-domain noise data of the target earphone is lower than or equal to the second preset threshold noise data, determining whether there is a frequency point with a preset bad feature in the frequency-domain noise data of the target earphone; If it exists, determine that the target earphone is a non-defective product and output the second test result; If it does not exist, it is determined that the target earphone is a good product and the first test result is output. 2. The method according to claim 1, wherein after judging whether there is a frequency point with a preset bad feature in the frequency domain noise data of the target earphone, the method further comprises: If there is no frequency point with a preset bad feature, determining whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition; If the preset condition is exceeded, determining that the target earphone is a non-good product and outputting a second test result; If the preset condition is not exceeded, it is determined that the target earphone is a good product and a first test result is output. 3. The method according to any one of claims 1 to 2, wherein the acquisition of the frequency domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency domain noise data is the frequency point and the frequency domain noise data. Correspondence of noise values, including: Acquiring the raw noise data of the target earphone performing the ANC noise floor test in the test equipment; The original noise data is preprocessed to obtain frequency domain noise data of the target earphone. 4. The method according to claim 3, wherein the original noise data is a correspondence between time and noise value; Correspondingly, the preprocessing of the original noise data to obtain the frequency domain noise data of the target earphone includes: Fourier transform processing is performed on the original noise data of the target earphone, so as to convert the corresponding relationship between the time and the noise value of the original noise data into the corresponding relationship between the frequency value and the noise value, so as to obtain the frequency value of the target earphone. Domain noise data. 5. The method according to any one of claims 1 to 2, wherein the judging whether there is a frequency point with a preset bad feature in the frequency domain noise data of the target earphone comprises: Judging whether the frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data in all frequency points whether there is a preset number of frequency points whose frequency values have an arithmetic relationship; If there is, determining that there is a frequency point with a preset bad feature in the frequency domain noise data of the target earphone; If it does not exist, it is determined that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone. 6. The method according to any one of claims 1 to 2, further comprising: a process of setting the first preset threshold noise data and the second preset threshold noise data as follows: The ANC noise floor test is performed on a preset number of earphones, and the obtained first preset number of frequency-domain noise data is averaged to obtain average frequency-domain noise data; adding the noise values of different frequencies of the average frequency domain noise data to the first noise value to obtain the first preset threshold noise data; Adding a second noise value to the noise values of different frequencies of the average frequency domain noise data to obtain the second preset threshold noise data; wherein the second noise value is greater than the first noise value. 7. A headphone active noise reduction noise floor test device, characterized in that, applied to a server, comprising: an acquisition module, configured to acquire frequency-domain noise data of the active noise reduction ANC noise floor test of the target earphone, wherein the frequency-domain noise data is a corresponding relationship between a frequency value and a noise value; a first output module, configured to determine that the target earphone is a good product and output a first test result if the frequency domain noise data of the target earphone is lower than or equal to a first preset threshold noise data; a first comparison module, configured to compare the frequency domain noise data of the target earphone with the second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data , wherein the second preset threshold noise data is higher than the first preset threshold noise data; a second output module, if the frequency-domain noise data of the target earphone is higher than the second preset threshold noise data, determine that the target earphone is a non-good product and output a second test result; A first judging module, configured to judge whether the frequency domain noise data of the target earphone has preset bad characteristics if the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data. Frequency; a third output module, configured to, if present, determine that the target earphone is a non-good product and output the second test result; The fourth output module is used for determining that the target earphone is a good product and outputting the first test result if it does not exist. 8. A headphone active noise reduction noise floor testing device, characterized in that, comprising: at least one processor and a memory; the memory stores computer-executable instructions; The at least one processor executes the computer-executable instructions stored in the memory, so that the at least one processor executes the headphone active noise reduction noise floor test method according to any one of claims 1 to 6. 9. A computer-readable storage medium, characterized in that, computer-executable instructions are stored in the computer-readable storage medium, and when a processor executes the computer-executable instructions, the computer-executable instructions as claimed in any one of claims 1 to 6 are implemented. The noise floor test method of active noise reduction of headphones described above. 10 . A computer program product, comprising a computer program, characterized in that, when the computer program is executed by a processor, the method for testing the noise floor of active noise reduction for headphones according to any one of claims 1 to 6 is implemented.

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