CN103457151A - High-temperature hard solder quasi-continuous semiconductor laser bar stack encapsulating method - Google Patents
High-temperature hard solder quasi-continuous semiconductor laser bar stack encapsulating method Download PDFInfo
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Abstract
本发明公开了一种高温硬焊料准连续半导体激光器巴条叠阵封装方法,利用特殊工装夹具,采用高温硬焊料将n个巴条、n+1个导电散热隔块和n+1个电绝缘散热片交替堆叠、一次回流焊接成激光器巴条叠阵单元,然后采用温度相对较低的软焊料将激光器巴条叠阵单元与热沉再次回流焊接成型。该方法能够显著降低高温硬焊料准连续半导体激光器巴条叠阵封装时的焊接应力,提高器件的寿命、产出率和光电性能。
The invention discloses a high-temperature hard-solder quasi-continuous semiconductor laser bar stacking packaging method, using special fixtures and high-temperature hard solder to insulate n bars, n+1 conductive and heat-dissipating spacers and n+1 electrical insulation The heat sinks are alternately stacked and reflow-welded once to form a laser bar stacked array unit, and then the laser bar stacked array unit and the heat sink are reflow-welded again to form a laser bar stacked array unit with a relatively low temperature soft solder. The method can significantly reduce the welding stress when the high-temperature hard solder quasi-continuous semiconductor laser is packaged in bar stacks, and improve the lifespan, output rate and photoelectric performance of the device.
Description
技术领域 technical field
本发明涉及激光技术领域,具体涉及的是一种高温硬焊料准连续半导体激光器巴条叠阵封装方法。 The invention relates to the field of laser technology, in particular to a bar-stack packaging method for high-temperature hard solder quasi-continuous semiconductor lasers. the
背景技术 Background technique
半导体激光器由于其体积小、重量轻、电光转换效率高等优点,广泛应用于工业、医疗、通讯、军事国防等领域。应用市场上对高功率、尤其是准连续输出时的峰值功率要求越来越高,多巴条组装的高功率垂直叠阵及面阵得以迅速发展。 Due to its small size, light weight, and high electro-optical conversion efficiency, semiconductor lasers are widely used in industries, medical care, communications, military defense and other fields. The application market has higher and higher requirements for high power, especially the peak power of quasi-continuous output, and the high-power vertical stack and area array assembled by multiple bars have developed rapidly. the
目前,多巴条组装的高功率垂直叠阵主要是以微通道热沉封装的单巴条半导体激光器堆叠而成。微通道热沉利用去离子水及时的将激光器产生的热量从巴条中带走,散热效率较高。但是,运用这种方式散热的微通道热沉需要特殊设计,设计和制作成本很高;其次,使用这种封装方式的半导体激光器阵列相对传导冷却半导体激光器阵列的体积要大很多,并且需要配备水冷机才能正常工作;再次,这种封装方式在对激光器有效散热的同时,需要尽量减少对热沉材料的腐蚀和磨损,一般要求使用去离子水,一旦微通道内部被腐蚀、或者有金属碎屑剥落、又或者冷却水中有颗粒杂物等,微通道的冷却能力下降,从而引起器件性能急剧下降,光谱发生红移等现象,对工作条件的需求非常苛刻。 At present, the high-power vertical stacks assembled by multiple bars are mainly stacked with single-bar semiconductor lasers packaged in micro-channel heat sinks. The micro-channel heat sink uses deionized water to remove the heat generated by the laser from the bar in time, and the heat dissipation efficiency is high. However, the microchannel heat sink using this method of heat dissipation requires a special design, and the design and production costs are very high; secondly, the volume of the semiconductor laser array using this packaging method is much larger than that of the conduction cooling semiconductor laser array, and it needs to be equipped with water cooling. The machine can work normally; again, this packaging method needs to minimize the corrosion and wear of the heat sink material while effectively dissipating heat from the laser. Generally, it is required to use deionized water. Once the inside of the microchannel is corroded or there are metal debris Peeling, or particles in the cooling water, etc., the cooling capacity of the microchannel will decrease, resulting in a sharp decline in device performance, red shift in the spectrum, etc., and the requirements for working conditions are very harsh. the
此外,以微通道热沉封装的单巴条半导体激光器所用的焊料主要是高纯铟。高纯铟是一种软焊料,具有良好的延展性,可以在器件封装(尤其是降温冷却阶段)时和器件工作状态下很好的补偿热沉材料和巴条材料的热膨胀系数失配,且与半导体激光器巴条p面镀金层焊接面的润湿性也非常好。铟焊料的缺点是当在铟界面发生机械和热循环时,塑性变形速率很高,易产生蠕变。铟焊料在烧结焊接过程中易氧化,在其表面形成熔点高、润湿性差、具有抗焊行的氧化膜,使器件焊接性能降低。并且易产生铟须,易导致巴条的P、N结短路和巴条腔面污染。在器件工作时,铟焊料在高电流下易产生电迁移和电热迁移,使器件稳定性下降,易出现突然退化现象,铟焊料封装的器件寿命远小于金锡焊料封装的器件。 In addition, the solder used for single-bar semiconductor lasers packaged with microchannel heat sinks is mainly high-purity indium. High-purity indium is a kind of soft solder with good ductility, which can well compensate the thermal expansion coefficient mismatch between heat sink material and bar material during device packaging (especially in the cooling stage) and device working state, and The wettability of the welding surface with the p-side gold-plated layer of the semiconductor laser bar is also very good. The disadvantage of indium solder is that when mechanical and thermal cycles occur at the indium interface, the plastic deformation rate is high and creep is easy to occur. Indium solder is easily oxidized during sintering and welding, and an oxide film with high melting point, poor wettability, and solder resistance is formed on its surface, which reduces the soldering performance of the device. And it is easy to produce indium whiskers, which can easily lead to the short circuit of the P and N junctions of the bar and the pollution of the cavity surface of the bar. When the device is working, indium solder is prone to electromigration and electrothermal migration under high current, which reduces the stability of the device and is prone to sudden degradation. The life of the device packaged with indium solder is much shorter than that of the device packaged with gold-tin solder. the
因此高温硬焊料准连续半导体激光器巴条叠阵封装技术应用而生。美国专利No.5,040,187 和 5,284,790 披露的方法是在电绝缘导热衬底切出多个间隔、平行的分开矩形槽。在这些平行分开的凹槽的壁到相邻的凹槽的壁上实现金属化的电导通。槽的宽度选择略小于单个激光巴条的厚度。导热衬底在外力作用下可以向另一方向弯曲,使得凹槽间距分开的更大,半导体激光器巴条可以插入其中。当去除外力后,衬底回到正常的位置时,激光器巴条被牢固地压缩固定在衬底的凹槽内,实现多个在凹槽内激光器巴条和金属化衬底表面之间的电传导连接。这种方法为了避免封装时应力使巴条开裂,选择软焊料,如铟。此外这种方法很不利于激光器巴条前端对齐,封装过程中巴条很容易在凹槽平移或旋转。 Therefore, the application of high-temperature hard-solder quasi-continuous semiconductor laser bar-stack packaging technology was born. The methods disclosed in U.S. Patent Nos. 5,040,187 and 5,284,790 are to cut out a plurality of spaced, parallel and separated rectangular grooves in the electrically insulating and heat-conducting substrate. An electrical connection of the metallization takes place from the walls of these parallel separated grooves to the walls of the adjacent grooves. The width of the groove is chosen to be slightly smaller than the thickness of a single laser bar. The thermally conductive substrate can be bent in another direction under the action of external force, so that the distance between the grooves is larger, and the semiconductor laser bar can be inserted into it. When the external force is removed and the substrate returns to its normal position, the laser bar is firmly compressed and fixed in the groove of the substrate, realizing multiple electrical connections between the laser bar in the groove and the surface of the metallized substrate. conductive connection. In this method, in order to avoid cracking of the bars due to stress during packaging, soft solder, such as indium, is selected. In addition, this method is not conducive to the alignment of the front end of the laser bar, and the bar is easy to translate or rotate in the groove during the packaging process. the
美国专利No.5,128,951显示在上述方法基础上进行改进,是一种更加简易的激光巴条阵列制作方法。热沉基板由两层组成,上部为导电导热层,下部电绝缘导热层,两层可以通过焊接等方式连接在一起。上层切出凹槽阵列后可以置入激光器巴条,再通过回流焊接在一起。但还是没有提供更好的激光器巴条前端对齐的方法。 US Patent No. 5,128,951 shows an improvement on the basis of the above method, which is a simpler method for manufacturing a laser bar array. The heat sink substrate is composed of two layers, the upper part is a conductive and heat-conducting layer, and the lower part is an electrically insulating and heat-conducting layer. The two layers can be connected together by welding or other means. After cutting out the groove array on the upper layer, laser bars can be placed, and then welded together by reflow. However, there is still no way to provide a better front-end alignment of the laser bars. the
美国专利No. 5,305,344披露将半导体激光器巴条热沉,而不是激光器巴条本身插入到一个基体的顶部面上的凹槽里。这个热沉包括一个激光器巴条、氧化铝垫块及钨铜合金散热片。用金箔片把位于钨铜散热片前端的巴条和金属化的氧化铝垫块上表面连接起来。垫块位于散热片的中部。将软焊料贴到基体上平行等间距分布的凹槽内壁上。钨铜合金散热片的后端插入凹槽内。叠阵中激光巴条之间的电连接是通过在散热片和氧化铝垫块顶部之间加上铜垫片来实现的。不幸的是,这样连接封装带来的失效模式,如激光器巴条性能退化、焊料蠕动到巴条表面等污染出现的几率很高。 US Patent No. 5,305,344 discloses inserting a semiconductor laser bar heat sink, rather than the laser bar itself, into a groove on the top surface of a substrate. The heat sink consists of a laser bar, alumina spacers, and tungsten-copper alloy heat sinks. The bar at the front end of the tungsten-copper heat sink is connected with the upper surface of the metallized alumina pad with gold foil. The spacer is located in the middle of the heat sink. Paste the soft solder on the inner walls of the grooves distributed in parallel and equally spaced on the substrate. The rear end of the tungsten-copper alloy heat sink is inserted into the groove. The electrical connections between the laser bars in the stack are made by adding copper spacers between the heat sink and the top of the alumina spacer. Unfortunately, failure modes such as laser bar performance degradation, solder creeping onto the bar surface, etc. have a high chance of occurring with failure modes such as joining the package. the
美国专利 No. 6,636,538 and 7,060,515, 以及 5,898,211披露了不同的叠阵组装方法来解决上述问题,即提供单个激光器巴条模块(包括热沉垫块、 激光器巴条和电绝缘基片)组合成叠阵。每个单独的激光器模块可以进行测试,以确保它将参数与叠阵所需的操作参数一致。激光器巴条暴露另一个表面(即N面)包括一个焊料层,以便可以两个或更多的模块在这个特殊焊料熔化温度上回流后焊接组合成多巴条叠阵。美国专利No.6,424,667 披露一个类似的方法,即使用热膨胀系数匹配的两个热沉垫块将激光器巴条夹在当中焊接在一起,然后在这个热沉垫块垂直于巴条焊接面的另一个面上贴上一个电绝缘热导材料基片,形成激光器巴条的子模块。稍后将多个子模块贴在一起焊接到一个大的散热体上,形成激光器巴条叠阵。这项发明极大改进了对激光器巴条叠阵对热循环疲劳的抵抗能力。然而,上述这些方法都需要许多不同焊料 (不同熔点) 多次回流组装过程,而使工序繁琐且效率低下。另外,叠阵中激光器巴条周期有一定的限制,不能足够小以满足很多实际要求及应用。 U.S. Patent Nos. 6,636,538 and 7,060,515, and 5,898,211 disclose different stack assembly methods to solve the above problems, that is, to provide a single laser bar module (including heat sink spacer, laser bar and electrical insulation substrate) combined into a stack . Each individual laser module can be tested to ensure that it matches the required operating parameters of the stack. The other exposed surface of the laser bar (i.e. the N side) includes a solder layer so that two or more modules can be reflowed at this special solder melting temperature and combined into a multi-bar stack. U.S. Patent No. 6,424,667 discloses a similar method, that is, two heat sink pads with matching thermal expansion coefficients are used to sandwich the laser bars and weld them together, and then the heat sink pads are perpendicular to the other side of the bar welding surface. An electrically insulating and thermally conductive material substrate is pasted on the surface to form a sub-module of the laser bar. Later, multiple sub-modules are pasted together and welded to a large heat sink to form a stack of laser bars. This invention greatly improves the resistance of laser bar stacks to thermal cycle fatigue. However, these methods above all require multiple reflow assembly processes with many different solders (different melting points), which makes the process cumbersome and inefficient. In addition, the period of the laser bars in the stack has certain limitations, which cannot be small enough to meet many practical requirements and applications. the
美国专利No.6,295,307 和 6,352,873 披露装配半导体激光器巴条叠阵的一种方法。即把第一个导电垫块合金放好,贴上第一个焊料片,将巴条放置第一个焊料片上,再贴上第二个焊料片,放置第二个导电垫块合金后,用夹具把垫块、巴条、垫块压缩一起固定好,加热到高于其焊料熔点的温度回流,冷却变硬。此夹心式的制作流程可以扩展到多个激光器巴条叠阵制作过程中去。导电散热垫块-巴条复合组件粘接到非导电热沉基片上是这样实现的:非导电热沉基片上表面实现金属化或涂有导电材料,切出多个槽穿过的基片导电层。槽间距对应巴条排列周期,导电散热垫块焊接到非导电热沉基片的导电层上,而激光器巴条恰好位于凹槽的上方。然后基片的下表面再焊接到含有冷却剂的导热基体上。导热基体、非导电热沉基片、和导电散热垫块-巴条复合组件全都焊接在一块,起到良好的导热功效。美国专利No.7,864,825提供的一种激光器巴条叠阵封装方法,改变不同组件回流焊接的先后次序:金属化非导电热沉基片首先焊接到更大的导热基体上,切割出的多元平行的沟槽穿过非导电热沉基片形成平行街道式多元散热片,激光器巴条叠阵组成的多元的激光器巴条和导电散热垫块焊接到通过凹槽电绝缘的表面上,其中巴条恰好位于凹槽上方而非导电热沉基片与导电散热垫块焊接。在这种组装条件下,独立的热沉基片可自由移动随热沉的扩张移动。然而,在使用高温硬焊料回流时,由于不同材料热膨胀系数不一致带来的应力,仍有可能导致叠阵中激光器巴条性能退化,甚至激光器巴条劈裂,尤其是叠阵中巴条排列的周期较大的情况下。 U.S. Patent Nos. 6,295,307 and 6,352,873 disclose a method of assembling semiconductor laser bar stacks. That is, put the first conductive pad alloy, paste the first solder sheet, place the bar on the first solder sheet, then paste the second solder sheet, place the second conductive pad alloy, and use The jig compresses and fixes the block, bar, and block together, heats them to a temperature higher than the melting point of the solder for reflow, and cools to harden. This sandwich-type production process can be extended to the production process of multiple laser bar stacks. The conductive heat sink block-bar composite assembly is bonded to the non-conductive heat sink substrate in this way: the upper surface of the non-conductive heat sink substrate is metallized or coated with conductive material, and a plurality of grooves are cut out to pass through the substrate to conduct electricity. layer. The groove spacing corresponds to the arrangement period of the bars, the conductive heat dissipation pads are welded to the conductive layer of the non-conductive heat sink substrate, and the laser bars are just located above the grooves. The lower surface of the substrate is then soldered to a thermally conductive substrate containing a coolant. The heat conduction matrix, the non-conductive heat sink substrate, and the conduction heat dissipation pad-bar composite assembly are all welded together to have a good heat conduction effect. U.S. Patent No. 7,864,825 provides a laser bar stack packaging method, which changes the sequence of reflow soldering of different components: the metallized non-conductive heat sink substrate is first welded to a larger heat-conducting substrate, and the cut multi-element parallel The groove passes through the non-conductive heat sink substrate to form a parallel street-type multi-element heat sink. The multi-element laser bars and conductive heat dissipation pads composed of laser bars are welded to the surface electrically insulated through the grooves, and the bars are just right The non-conductive heat sink substrate located above the groove is soldered to the conductive heat dissipation pad. In this assembled condition, the individual heat sink substrates are free to move as the heat sink expands. However, when reflowing with high-temperature hard solder, due to the stress caused by the inconsistent thermal expansion coefficients of different materials, the performance of the laser bars in the stack may still be degraded, and even the laser bars may be split, especially the bars arranged in the stack. In the case of large cycles. the
采用无氧铜热沉进行传导冷却散热,无需去离子水等冷却介质。激光器巴条与导电散热隔块之间焊接采用的是高温硬焊料连接,形成稳定的合金相,焊接强度高,可以在-40℃~85℃等极端恶劣条件下工作。但是高温硬焊料易使巴条产生较大的应变,较大的焊接应力使巴条易开裂,导致激光器失效。因而急需一种采用高温硬焊料焊接、低应力的准连续半导体激光器巴条叠阵的封装方法。 The oxygen-free copper heat sink is used for conduction cooling and heat dissipation, and no cooling medium such as deionized water is required. The welding between the laser bar and the conductive heat dissipation spacer is connected by high-temperature hard solder to form a stable alloy phase with high welding strength and can work under extremely harsh conditions such as -40°C to 85°C. However, the high-temperature hard solder is easy to cause a large strain on the bar, and the large welding stress makes the bar easy to crack, resulting in failure of the laser. Therefore, there is an urgent need for a packaging method for stacking arrays of quasi-continuous semiconductor lasers that adopts high-temperature hard solder welding and low stress. the
发明内容 Contents of the invention
本发明的目的在于克服现有技术存在的以上问题,提供一种高温硬焊料准连续半导体激光器巴条叠阵封装方法,显著降低高温硬焊料准连续半导体激光器巴条叠阵封装时的焊接应力。 The object of the present invention is to overcome the above problems in the prior art, provide a high-temperature hard solder quasi-continuous semiconductor laser bar-stack packaging method, and significantly reduce the welding stress during the high-temperature hard-solder quasi-continuous semiconductor laser bar stack packaging. the
为实现上述技术目的,达到上述技术效果,本发明通过以下技术方案实现: In order to achieve the above-mentioned technical purpose and achieve the above-mentioned technical effect, the present invention is realized through the following technical solutions:
一种高温硬焊料准连续半导体激光器巴条叠阵封装方法,包括以下步骤: A high-temperature hard solder quasi-continuous semiconductor laser bar stack packaging method, comprising the following steps:
步骤1)在第一工装夹具底面放置超平氧化铝,在所述第一工装夹具的底面先放置一个超平氧化铝,然后从一端开始再放置一个超平氧化铝、若干个导电散热隔块,所述导电散热隔块之间通过激光器巴条、高温硬焊料等间距地隔开,在所述第一工装夹具的另一端放置弹簧销或螺钉将所述激光器巴条、高温硬焊料、导电散热隔块固定住;或者所述导电散热隔块两焊接面镀有高温硬焊料,以取代预成型的单独放置的高温硬焊料片; Step 1) Place super-flat alumina on the bottom surface of the first fixture, first place a super-flat alumina on the bottom surface of the first fixture, and then place another super-flat alumina and several conductive and heat-dissipating spacers from one end , the conductive and heat-dissipating spacers are equally spaced apart by laser bars and high-temperature hard solder, and spring pins or screws are placed at the other end of the first tooling fixture to connect the laser bars, high-temperature hard solder, and conductive The heat dissipation spacer is fixed; or the two welding surfaces of the conductive heat dissipation spacer are plated with high-temperature hard solder to replace the preformed separately placed high-temperature hard solder sheet;
步骤2)制作电绝缘散热片,将未加工的电绝缘散热片金属化,焊接面的最外层镀上一层金,再制作出与所述导电散热隔块尺寸匹配的电绝缘散热片,所述电绝缘散热片的焊接面之间保持绝缘; Step 2) Making an electrical insulating heat sink, metallizing the unprocessed electrical insulating heat sink, coating the outermost layer of the welding surface with a layer of gold, and then manufacturing an electrical insulating heat sink matching the size of the conductive heat dissipation spacer, Insulation is maintained between the welding surfaces of the electrically insulating heat sink;
步骤3)利用精密机械加工或微纳加工技术制作第二工装夹具,在第二工装夹具上制作出n个槽,槽的宽度略小于巴条的宽度,再将绝缘物体镶嵌入槽内; Step 3) Use precision machining or micro-nano processing technology to make the second fixture, make n grooves on the second fixture, the width of the groove is slightly smaller than the width of the bar, and then insert the insulating object into the groove;
步骤4)在每两个所述绝缘物体中间放置所述电绝缘散热片,在所述电绝缘散热片上放置所述高温硬焊料; Step 4) placing the electrically insulating heat sink between each two insulating objects, and placing the high-temperature hard solder on the electrically insulating heat sink;
步骤5)将特制夹具的两部分装配成一个整体,把步骤1的单元模块倒扣在步骤4的单元模块上,使得所述导电散热隔块与所述电绝缘散热片相对应,镶嵌的绝缘物体对应在相邻的两个导电散热隔块之间的激光器巴条上,利用工装夹具上的特制的精密定位、对位系统,使得所述巴条、所述导电散热隔块和所述电绝缘散热片之间实现精密对位,保证焊接后的对位精度,然后进行回流焊接,一次成型后去除特制夹具,得到巴条叠阵模块单元;
Step 5) Assemble the two parts of the special fixture into a whole, buckle the unit module in step 1 upside down on the unit module in
步骤6)将巴条叠阵模块单元通过熔点相对较低的软焊料与底座大热沉焊接成型,再焊接上电极,从而得到高温硬焊料准连续半导体激光器巴条叠阵。 Step 6) The bar stack module unit is welded with relatively low melting point soft solder and the large heat sink of the base, and then welded with electrodes, so as to obtain a high temperature hard solder quasi-continuous semiconductor laser bar stack.
进一步的,所述高温硬焊料可以是预成型的焊料片或者是经过电镀或蒸镀的硬焊料层,厚度为5um~50um其成分可以是金锡或金锗。 Further, the high-temperature hard solder can be a preformed solder sheet or a plated or evaporated hard solder layer with a thickness of 5um-50um and its composition can be gold tin or gold germanium. the
进一步的,所述激光器巴条个数大于等于1个,相邻两激光器巴条之间的间隔周期可以是0.4mm~2mm。 Further, the number of the laser bars is greater than or equal to 1, and the interval period between two adjacent laser bars may be 0.4 mm to 2 mm. the
进一步的,所述导电散热隔块的热膨胀系数须与激光器巴条的热膨胀系数相匹配。 Further, the thermal expansion coefficient of the conductive heat dissipation spacer must match the thermal expansion coefficient of the laser bar. the
进一步的,所述激光器巴条的尺寸小于所述导电散热隔块的尺寸。 Further, the size of the laser bar is smaller than the size of the conductive heat dissipation spacer. the
进一步的,所述电绝缘散热片两焊接面经过金属化后,切割成型,彼此分开、独立与相对应的导电散热隔块相对应焊接成型。 Further, after metallization, the two welding surfaces of the electrical insulating fins are cut and formed, separated from each other, and independently welded and formed with the corresponding conductive and heat dissipating spacers. the
进一步的,所述第一工装夹具、第二工装夹具和槽的装配面的平整度、粗糙度在10μm以内,所述槽的加工精度在5μm以内,所述超平氧化铝的粗糙度和平整度在5μm以内。 Further, the flatness and roughness of the assembly surfaces of the first fixture, the second fixture and the groove are within 10 μm, the machining accuracy of the groove is within 5 μm, and the roughness and smoothness of the super-flat alumina The degree is within 5 μm. the
本发明的有益效果是: The beneficial effects of the present invention are:
本发明能够保证在传导冷却散热模式下实现半导体激光器巴条叠阵的各半导体巴条前端对齐、低应力、大功率、高亮度、窄光谱、巴条焊接部无铟化、周期小等优点,提高器件的寿命、产出率和光电性能。 The present invention can guarantee the realization of the front-end alignment of each semiconductor bar of the semiconductor laser bar stack in the mode of conduction cooling and heat dissipation, low stress, high power, high brightness, narrow spectrum, no indiumization at the welding part of the bar, and small cycle, etc. Improve device lifetime, yield, and optoelectronic performance.
附图说明 Description of drawings
图1整体结构示意图; The schematic diagram of the overall structure of Fig. 1;
图2为激光器巴条、导电散热隔块与焊料的组装示意图; Figure 2 is a schematic diagram of the assembly of the laser bar, the conductive heat dissipation spacer and the solder;
图3激光器叠阵单元装配示意图; Fig. 3 Assembly diagram of laser stack unit;
图4为激光器巴条叠阵模块单元。 Fig. 4 is a laser bar stacked module unit.
图中标号说明:1、高温硬焊料,2、激光器巴条,3、导电散热隔块,4、电绝缘散热片,5、软焊料,6、热沉,7、超平氧化铝,8、绝缘物体。 Explanation of symbols in the figure: 1. High temperature hard solder, 2. Laser bar, 3. Conductive heat dissipation spacer, 4. Electrically insulating heat sink, 5. Soft solder, 6. Heat sink, 7. Super flat alumina, 8. insulating object. the
具体实施方式 Detailed ways
下面将参考附图并结合实施例,来详细说明本发明。 The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments. the
参照图1、图2、图3、图4所示,一种高温硬焊料准连续半导体激光器巴条叠阵封装方法,包括以下步骤: Referring to Figure 1, Figure 2, Figure 3, and Figure 4, a high-temperature hard-solder quasi-continuous semiconductor laser bar stack packaging method includes the following steps:
步骤1)在第一工装夹具底面放置超平氧化铝7,在所述第一工装夹具的底面先放置一个超平氧化铝7,然后从一端开始再放置一个超平氧化铝7、若干个导电散热隔块3,所述导电散热隔块之间通过激光器巴条2、高温硬焊料1等间距地隔开,在所述第一工装夹具的另一端放置弹簧销或螺钉将所述激光器巴条2、高温硬焊料1、导电散热隔块3固定住;或者所述导电散热隔块3两焊接面镀有高温硬焊料1,以取代预成型的单独放置的高温硬焊料片;
Step 1) Place an ultra-flat alumina 7 on the bottom surface of the first fixture, first place an ultra-flat alumina 7 on the bottom surface of the first fixture, and then place another ultra-flat alumina 7 from one end, several conductive
步骤2)制作电绝缘散热片4,将未加工的电绝缘散热片金属化,焊接面的最外层镀上一层金,再制作出与所述导电散热隔块3尺寸匹配的电绝缘散热片4,所述电绝缘散热片的焊接面之间保持绝缘;
Step 2) Making the electrical
步骤3)利用精密机械加工或微纳加工技术制作第二工装夹具,在第二工装夹具上制作出n个槽,槽的宽度略小于巴条的宽度,再将绝缘物体8镶嵌入槽内;
Step 3) Using precision machining or micro-nano processing technology to make the second fixture, making n grooves on the second fixture, the width of the groove is slightly smaller than the width of the bar, and then inserting the insulating
步骤4)在每两个所述绝缘物体8中间放置所述电绝缘散热片4,在所述电绝缘散热片4上放置所述高温硬焊料1;
Step 4) placing the electrically insulating
步骤5)将特制夹具的两部分装配成一个整体,把步骤1的单元模块倒扣在步骤4的单元模块上,使得所述导电散热隔块3与所述电绝缘散热片4相对应,镶嵌的绝缘物体8对应在相邻的两个导电散热隔块3之间的激光器巴条2上,利用工装夹具上的特制的精密定位、对位系统,使得所述巴条2、所述导电散热隔块3和所述电绝缘散热片4之间实现精密对位,保证焊接后的对位精度,然后进行回流焊接,一次成型后去除特制夹具,得到巴条叠阵模块单元;
Step 5) Assemble the two parts of the special fixture into a whole, buckle the unit module in step 1 upside down on the unit module in
步骤6)将巴条叠阵模块单元通过熔点相对较低的软焊料5与底座大热沉6焊接成型,再焊接上电极,从而得到高温硬焊料准连续半导体激光器巴条叠阵。 Step 6) The bar stacking module unit is formed by welding the relatively low melting point soft solder 5 and the large heat sink 6 of the base, and then welding the electrodes, so as to obtain a high temperature hard solder quasi-continuous semiconductor laser bar stacking.
进一步的,所述高温硬焊料1可以是预成型的焊料片或者是经过电镀或蒸镀的硬焊料层,厚度为5um~50um其成分可以是金锡或金锗。 Further, the high temperature hard solder 1 can be a preformed solder sheet or a plated or evaporated hard solder layer with a thickness of 5um-50um and its composition can be gold tin or gold germanium. the
进一步的,所述激光器巴条2个数大于等于1个,相邻两激光器巴条2之间的间隔周期可以是0.4mm~2mm。
Further, the number of said laser bars 2 is greater than or equal to 1, and the interval period between two
进一步的,所述导电散热隔块3的热膨胀系数须与激光器巴条2的热膨胀系数相匹配。
Further, the thermal expansion coefficient of the conductive
进一步的,所述激光器巴条2的尺寸小于所述导电散热隔块3的尺寸。
Further, the size of the
进一步的,所述电绝缘散热片4两焊接面经过金属化后,切割成型,彼此分开、独立与相对应的导电散热隔块3相对应焊接成型。
Further, after the two welding surfaces of the electrical insulating
进一步的,所述第一工装夹具、第二工装夹具和槽的装配面的平整度、粗糙度在10μm以内,所述槽的加工精度在5μm以内,所述超平氧化铝7的粗糙度和平整度在5μm以内。 Further, the flatness and roughness of the assembly surfaces of the first fixture, the second fixture and the groove are within 10 μm, the processing accuracy of the groove is within 5 μm, and the roughness and roughness of the ultra-flat alumina 7 are within 10 μm. The flatness is within 5μm. the
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0954069A2 (en) * | 1998-04-30 | 1999-11-03 | Cutting Edge Optronics, Inc. | Laser diode packaging |
JP2000508841A (en) * | 1997-01-31 | 2000-07-11 | スター・メディカル・テクノロジーズ・インコーポレーテッド | Laser diode array packaging |
US20020181523A1 (en) * | 2001-05-29 | 2002-12-05 | Pinneo George G. | Low cost high integrity diode laser array |
US20080037602A1 (en) * | 2006-08-10 | 2008-02-14 | Prabhu Thiagarajan | Method and system for a laser diode bar array assembly |
CN101689744A (en) * | 2006-12-12 | 2010-03-31 | D-戴欧德有限责任公司 | Scalable thermally efficient pump diode systems |
-
2013
- 2013-08-08 CN CN201310342523.XA patent/CN103457151B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000508841A (en) * | 1997-01-31 | 2000-07-11 | スター・メディカル・テクノロジーズ・インコーポレーテッド | Laser diode array packaging |
EP0954069A2 (en) * | 1998-04-30 | 1999-11-03 | Cutting Edge Optronics, Inc. | Laser diode packaging |
US20020181523A1 (en) * | 2001-05-29 | 2002-12-05 | Pinneo George G. | Low cost high integrity diode laser array |
US20080037602A1 (en) * | 2006-08-10 | 2008-02-14 | Prabhu Thiagarajan | Method and system for a laser diode bar array assembly |
CN101689744A (en) * | 2006-12-12 | 2010-03-31 | D-戴欧德有限责任公司 | Scalable thermally efficient pump diode systems |
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