CN109470896A - Detector board test platform - Google Patents
Detector board test platform Download PDFInfo
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- CN109470896A CN109470896A CN201811279548.9A CN201811279548A CN109470896A CN 109470896 A CN109470896 A CN 109470896A CN 201811279548 A CN201811279548 A CN 201811279548A CN 109470896 A CN109470896 A CN 109470896A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention relates to a kind of detector board test platforms, the platform, comprising: test platform pedestal, the first isolation buffer pad, detector signal analog board, probe clamp, probe groups, unitunder test, the second isolation buffer pad, counterweight element, positioning guide bar and location hole；Detector signal analog board, for generating the pulse signal for meeting testing requirement；Probe groups, for transmitting signal and electric energy.Detector signal analog board replaces high pressure generator, detector module, is protected from light equipment in detector board test platform of the invention, output detector analog signal, plate interface is simulated by detector signal, probe is transmitted to tested object, probe clamp, probe groups, counterweight element and positioning guide bar guarantee the reliability of signal and electric energy transmission, detector board test platform of the invention simplifies the complexity of test platform, cost is greatly lowered, it is easy to operate, safety, integrated level are high, the risk that the technology of avoiding is divulged a secret.
Description
Technical Field
The invention relates to the technical field of nuclear medicine, in particular to a detector board card test platform.
Background
PET (Positron Emission Tomography) is used as a technique for imaging examination, diagnosis of cancer and tumor and evaluation of therapeutic effect, and it uses a detector to capture radiation photons to realize functional imaging of physiological tissues and organs.
At present, detectors in a PET system need to provide high voltage to generate excitation signals to perform function test and confirmation on thousands of signal links of each board card, so that the test is relatively comprehensive, but when some links have faults, the system needs to be repeatedly disassembled and installed, the production efficiency is low, and manpower, time and resources are wasted.
The current measures are to build a high-voltage system before system assembly, connect the wiring harness of the detector module and the board card, and perform functional test on a single detector board and a signal board card. However, the operation difficulty is high, the test system is complex, the human resource and time cost are high due to the fact that a plurality of wire harnesses are needed and the required plugging force is large, and certain safety risks exist in high-voltage electrification. If the test system is delivered to a third party, the cost is high, and the technical disclosure and the operation safety risk exist.
Disclosure of Invention
Technical problem to be solved
In order to ensure the safety of the test platform, the invention provides a detector board card test platform.
(II) technical scheme
In order to achieve the purpose, the invention adopts the main technical scheme that:
a probe card test platform, comprising: the device comprises a test platform base (1), a first isolation cushion pad (2), a detector signal simulation board (3), a probe clamp (4), a probe group (5), a unit to be tested (6), a second isolation cushion pad (9), a counterweight unit (10), a positioning guide rod (11) and a positioning hole (12);
the test platform base (1), the first isolation cushion (2), the detector signal simulation board (3) and the positioning guide rod (11) are mutually fixed and used for supporting the detector board card test platform and ensuring the relative positions of all parts on the detector board card test platform;
the first isolation buffer cushion (2) is positioned between the detector signal simulation board (3) and the test platform base (1) and is used for electrical isolation, heat conduction and pressure equalization buffering, and uniform stress of the detector signal simulation board (3) is guaranteed;
the detector signal simulation board (3) is used for generating pulse signals meeting the test requirements so as to provide excitation signals for each signal link through an interface;
the probe clamp (4) is used for positioning, supporting and fixing the probe group (5), and is matched with the positioning guide rod (11) through the positioning hole (12) to realize free sliding up and down;
the probe group (5) is embedded and fixed in the probe clamp, a probe point at the bottom of the probe group (5) is in contact with the detector signal simulation board (3), and a probe point at the top of the probe group (5) is in contact with a tested object and is used for transmitting signals and electric energy;
the tested unit (6) is connected and fixed with the counterweight unit (10) through the mounting hole;
the second isolation buffer cushion (9) is positioned between the tested object and the counterweight unit (10) and used for electrical isolation, heat conduction and buffer pressure equalization, and when the upper end and the lower end of the probe group (5) are reliably contacted, the damage of components caused by overlarge local stress of the tested object is prevented;
the counterweight unit (10) is fixed with the second isolation cushion pad (9) into a whole, is matched with the positioning guide rod (11), and is used for transmitting the gravity of the second isolation cushion pad (9) to the probe group (5) so as to deform the probe group (5) under stress, ensure the reliable contact of a bottom probe point and a top probe point of the probe group (5) and realize the transmission of signals and electric energy;
the positioning guide rod (11) is fixed with the testing platform base (1) into a whole and used for positioning and guiding the probe clamp (4) so as to realize the up-and-down free sliding of the probe clamp (4) and ensure the reliable contact of the probe points at the bottom and the top of the probe set (5).
Optionally, the first isolation buffer pad (2) is a thermal silicone pad;
the second isolation buffer cushion (9) is a thermal silica gel cushion.
Optionally, the detector signal simulation board (3) is externally connected with a power supply; or,
the detector signal simulation board (3) obtains electric energy through the probe group (5).
Optionally, the detector signal simulation board (3) generates a pulse signal meeting the test requirement in a low-voltage and low-power consumption mode through rectangular pulse differentiation, edge extraction, frequency modulation and amplitude modulation.
Optionally, the detector signal simulation board (3) comprises a detector signal simulation board interface (8);
the pulse signals meeting the test requirements generated by the detector signal simulation board (3) are transmitted to the tested object through the detector signal simulation board interface (8) and the probe group (5).
Optionally, the probe group (5) is provided with a telescopic feature, the top probe point of the probe group (5) is provided with stroke flexibility, and the bottom probe point of the probe group (5) is provided with stroke flexibility.
Optionally, the material of the weight unit (10) is an acrylic plate, or a resin plate, or a metal plate.
Optionally, the tested object is fixed at a preset position with the counterweight unit (10) through a second isolation cushion (9) and is integrated.
Optionally, the counterweight unit (10) slides up and down through the gravity of the positioning guide rod (11) and the counterweight unit (10), the second isolation cushion pad (9) and the tested object are squeezed, pressure is transmitted to two ends of the probe group (5), reliable contact between the detector signal simulation board (3) and each link of the tested object is achieved, and transmission of signals is guaranteed.
Optionally, the platform further comprises: a power and data port (13);
the power supply and data port (13) is used for supplying power and receiving and feeding back data information.
(III) advantageous effects
The detector signal simulation board in the detector board test platform replaces a high-voltage generator, a detector module and a light-shading device, a detector simulation signal is output and transmitted to a tested object through the detector signal simulation board interface and the probe, and the probe clamp, the probe group, the counterweight unit and the positioning guide rod ensure the reliability of signal and electric energy transmission.
Drawings
Fig. 1(a) is a schematic structural diagram of a probe card testing platform according to an embodiment of the present invention;
fig. 1(b) is a schematic structural diagram of a probe card testing platform according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a detector signal simulation according to an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating a principle of a probe card testing platform according to an embodiment of the present invention.
Detailed Description
When testing each signal board card and system key parameters, in order to reduce operation difficulty, simplify test system complexity, reduce labor time cost, improve system assembly efficiency, improve safety and improve technical confidentiality, it is necessary to invent a detector board card test platform to achieve the purpose of simple, quick, safe and reliable test.
The invention provides a detector board card test platform, which comprises: the device comprises a test platform base 1, a first isolation cushion pad 2, a detector signal simulation board 3, a probe clamp 4, a probe group 5, a unit to be tested 6, a second isolation cushion pad 9, a counterweight unit 10, a positioning guide rod 11 and a positioning hole 12.
Wherein:
1. test platform base
The test platform base 1 is mutually fixed with the first isolation cushion 2, the detector signal simulation board 3 and the positioning guide rod 11 and used for supporting the detector board card test platform and ensuring the relative positions of all parts on the detector board card test platform.
During specific implementation, the test platform base is used as a support of the test platform, and the relative positions of all parts on the test platform are guaranteed. It is fixed together with isolation buffer pad, detector signal simulation board and positioning guide rod.
2. First isolation buffer
First isolation blotter 2 is located between detector signal simulation board 3 and test platform base 1 for electrical isolation, heat conduction to and balanced buffer pressure guarantee that detector signal simulation board 3 atress is even.
The material of the first isolation cushion 2 includes but is not limited to: a hot silicone pad.
During concrete implementation, first isolation blotter is located between detector signal simulation board and the base, both plays the electrical isolation effect, guarantees not take place phenomenons such as short circuit, still plays the effect of atress buffering, and each integrated circuit board atress of protection does not mutate, and its material includes but is not limited to heat conduction silica gel pad.
3. Detector signal simulation board
And the detector signal simulation board 3 is used for generating a pulse signal meeting the test requirement so as to provide an excitation signal for each signal link through an interface.
The detector signal simulation board 3 can be externally connected with a power supply, and the detector signal simulation board 3 can also obtain electric energy through the probe group 5.
The detector signal simulation board 3 generates a pulse signal meeting the test requirement in a low-voltage and low-power consumption mode through rectangular pulse differentiation, edge extraction, frequency modulation and amplitude modulation.
The detector signal simulation board 3 is connected with a detector signal simulation board interface 8; the pulse signals meeting the test requirements generated by the detector signal simulation board 3 are transmitted to the tested object through the detector signal simulation board interface 8 and the probe group 5.
During specific implementation, the detector signal simulation board generates pulse signals meeting the test requirements by adopting a low-voltage and low-power consumption mode through forming, frequency and amplitude adjustment, distributes the pulse signals to each data interface end and provides excitation signals for each signal link. The data port can also be used for testing the time performance by an external cable. The unit can be externally connected with a power supply and can also obtain electric energy through the probe set; the unit replaces a high-voltage power supply, a high-voltage cable, a detector module and light-shading equipment, simplifies a test system, enhances safety, and reduces cost and operation complexity.
4. Probe clamp
And the probe clamp 4 is used for positioning, supporting and fixing the probe group 5, and is matched with the positioning guide rod 11 through the positioning hole 12 to realize free up-and-down sliding.
A plurality of positioning holes 12 are arranged in the system, and part of the positioning holes 12 are used for matching the probe clamp 4 with the positioning guide rod 11 to realize free up-and-down sliding.
And part of the positioning holes 12 are used for fixing the detector signal simulation board 3 and the test platform base 1.
During concrete implementation, the probe clamp positions and supports all probe sets required by testing, and can freely slide up and down through the matching of the guide holes and the positioning guide rods, and the operation is simple and convenient.
5. Probe set
And the probe group 5 is embedded and fixed in the probe clamp, the probe point at the bottom of the probe group 5 is contacted with the detector signal simulation board 3, and the probe point at the top of the probe group 5 is contacted with the tested object and is used for transmitting signals and electric energy.
The probe group 5 has a telescopic feature, the top probe point of the probe group 5 has stroke flexibility, and the bottom probe point of the probe group 5 has stroke flexibility.
During concrete realization, the probe group closely cooperates with the probe clamp, and each probe point in all probe group bottoms contacts with the data interface of detector signal simulation board, and each probe point in its top contacts with each data port of the object under test, guarantees the conveying of signal and electric energy, has avoided the frequent operation of inserting of each pencil like this, has improved the convenient degree of efficiency of software testing and operation.
6. Tested unit
The unit under test 6 is connected and fixed to the weight unit 10 through the mounting hole.
During specific implementation, the unit to be measured is connected and fixed with the counterweight module through the mounting hole.
7. Second isolation cushion
And the second isolation buffer cushion 9 is positioned between the tested object and the counterweight unit 10, is used for electrical isolation, heat conduction and balance buffer pressure, and prevents the damage of components caused by the overlarge local stress of the tested object when the upper end and the lower end of the probe group 5 are reliably contacted.
The second isolation buffer pad 9 may be a thermal silicone pad.
The object to be tested is fixed at a predetermined position by the second isolation cushion 9 and the weight unit 10, and is integrated.
In specific implementation, the second isolation buffer cushion is positioned between the tested object and the counterweight unit; the electric isolation function is achieved, the phenomena of short circuit and the like are avoided, the stress buffering function is achieved, and the board cards are protected from sudden change of stress; simultaneously, still exert the effect of balanced pressure, when avoiding the reliable contact of the upper and lower extreme of probe group, the too big component damage that causes of integrated circuit board local atress, its material includes but is not limited to heat conduction silica gel pad.
8. Counterweight unit
The counter weight unit 10 is fixed in an organic whole with second isolation cushion 9, with the cooperation of location guide bar 11 for the gravity transmission to probe group 5 with second isolation cushion 9, so that probe group 5 atress warp, the contact of the probe point of guarantee probe group 5 bottom and top probe point is reliable, realizes the transmission of signal and electric energy.
Materials of the weight unit 10 include, but are not limited to: acrylic sheet, resin sheet, metal sheet. That is, the material of the weight unit 10 is an acrylic plate, or the material of the weight unit 10 is a resin plate, or the material of the weight unit 10 is a metal plate.
The counterweight unit 10 slides up and down through the gravity of the positioning guide rod 11 and the counterweight unit 10, the second isolation cushion pad 9 and the tested object are extruded, the pressure is transmitted to the two ends of the probe group 5, the reliable contact between the detector signal simulation board 3 and each link of the tested object is realized, and the transmission of signals is ensured.
During concrete implementation, the counterweight unit is matched with the isolation cushion and the positioning guide rod, so that the upper end and the lower end of the probe set are reliably contacted, and the transmission of signals and electric energy is realized. The module replaces a complex mechanical structure, and is simple and convenient to operate and low in cost.
9. Positioning guide rod
The positioning guide rod 11 is fixed with the testing platform base 1 into a whole and used for positioning and guiding the probe clamp 4 to realize the up-and-down free sliding of the probe clamp 4 and ensure the reliable contact of the bottom probe point and the top probe point of the probe set 5.
In addition, the platform further comprises: a power and data port 13;
the power and data port 13 is used for supplying power and receiving and feeding back data information.
The working principle of the detector signal simulation forming of the detector board card test platform provided by the invention is shown in combination with fig. 2 and 3: the controller receives the information of the parameter configuration port, outputs the PWM pulse group according to the frequency parameter, and carries out pulse shaping after the pulse passes through the buffer, and the method mainly comprises the following steps: the method comprises the steps of differential forming, full-wave shaping, integral forming and amplitude shaping, wherein digital signals are converted into analog signals meeting test requirements, and the analog signals are sent to each data port to be output after being buffered. The frequency is adjusted, and pressure tests of various data rates can be performed; the amplitude adjustment function mainly simulates amplitude characteristics of output signals of the detector, and various amplitude combinations required by each pixel are generated in a traversing manner, so that complete image pixel points are ensured to be obtained.
In a specific implementation, a probe card testing platform provided by the present invention can be shown in fig. 1(a) and fig. 1(b) (fig. 1(a) is a front view of the probe card testing platform, fig. 1(b) is a top view of the probe card testing platform), in fig. 1(a) and fig. 1(b), 1 is a testing platform base, 2 is a first isolation cushion, 3 is a probe signal simulation board, 4 is a probe clamp, 5 is a probe set, 6 is a tested unit, 7 is a tested object, 8 is a probe signal simulation board interface, 9 is a second isolation cushion, 10 is a counterweight unit, 11 is a positioning guide rod, 12 is a positioning hole, and 13 is a power supply and data port.
As shown in fig. 1(a) and 1(b), the testing platform base 1, the first isolation cushion 2, the detector signal simulation board 3 and the positioning guide rod 11 are fixed to each other to provide a reference and support for the testing platform.
First isolation blotter 2 is located between detector signal simulation board 3 and test platform base 1, does the electrical isolation and prevents the short circuit, and the pressure on buffering test platform upper portion guarantees that detector signal simulation board 3 atress is even simultaneously, avoids the local too big impact of bearing.
The detector signal simulation board 3 is fixed on the test platform base 1 through the positioning hole 12, and exchanges signals and electric energy with the probe group 5 through the detector signal simulation board interface 8 to replace an original high-voltage power supply, a high-voltage cable, an expensive detector module and light-shading equipment, so that the complexity of the test platform is simplified, and the cost is greatly reduced; meanwhile, insulation and protection work caused by high voltage is avoided, the safety of other equipment and operators is improved, and the portability is enhanced; meanwhile, the technology disclosure risk caused by the fact that the test platform is delivered to a supplier is avoided.
The probe group 5 is tightly matched with the probe clamp 4, so that the probe can reliably realize the information and energy exchange between the tested unit 6 and the detector signal simulation board interface 8. The reliability of contact is guaranteed through the elasticity stroke range of probe group 5, and when exogenic action was at probe group 5 both ends, the probe both ends were compressed, formed outside tension, guaranteed the reliability of both ends contact, can resist certain vibration moreover.
The tested object 7 (such as a tested detector board card) is fixed at a preset position through the second isolation cushion pad 9 and the counterweight unit 10 to form a whole, the counterweight unit 10 slides up and down at a relatively fixed position through the positioning guide rod 11 and the gravity of the counterweight unit, the second isolation cushion pad 9 and the tested object 7 are extruded, pressure is transmitted to two ends of the probe group 5, reliable contact of each link of the detector signal simulation board 3 and the tested object 7 is realized, transmission of signals is guaranteed, and the second isolation cushion pad 9 is also used for electrical isolation and buffer protection.
The power supply and data port 13 provides power for the test platform and receives and feeds back data information.
The detector board card test platform is simple to operate, good in moving portability and low in cost, avoids repeated operation of pulling and plugging a wiring harness by adopting a probe mode, improves test efficiency and saves labor, time and cost.
In particular, the method comprises the following steps of,
the detector board card test platform is simple and low in cost, high-voltage power supplies, high-voltage wiring harnesses, electrical safety insulation measures, high-cost detector modules and light-shielding equipment required by the test are avoided, the detector signal simulation board can replace the related equipment and devices, and the system complexity and success are greatly reduced.
The safety is enhanced: high voltage is avoided, insulation and isolation measures are not needed for equipment, a tested object and an operator, and safety is improved.
The integrated level is high, portable and removal: after the test platform is miniaturized and highly integrated, the test platform is portable and convenient.
Simple operation, efficiency of software testing is high: the test operation is simple, no complex mechanical device is provided, the requirement on operators is low, the test efficiency is high, and the labor time cost is reduced.
Technical secrecy and security enhancement: the test tool is delivered to a third party to be used as a common test tool, so that the risk of disclosure of relevant core technologies of products is avoided, and the safety of third-party operators and equipment is guaranteed.
The detector signal simulation board in the detector board test platform provided by the embodiment replaces a high-voltage generator, a detector module and a light-shading device, a detector simulation signal is output and is transmitted to a tested object through a detector signal simulation board interface and a probe, and the probe clamp, the probe set, the counterweight unit and the positioning guide rod ensure the reliability of signal and electric energy transmission.
It should be noted that: the above-mentioned embodiments are only used for illustrating the technical solution of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The utility model provides a detector integrated circuit board test platform which characterized in that, the platform includes: the device comprises a test platform base (1), a first isolation cushion pad (2), a detector signal simulation board (3), a probe clamp (4), a probe group (5), a unit to be tested (6), a second isolation cushion pad (9), a counterweight unit (10), a positioning guide rod (11) and a positioning hole (12);
the test platform base (1), the first isolation cushion (2), the detector signal simulation board (3) and the positioning guide rod (11) are mutually fixed and used for supporting the detector board card test platform and ensuring the relative positions of all parts on the detector board card test platform;
the first isolation buffer cushion (2) is positioned between the detector signal simulation board (3) and the test platform base (1) and is used for electrical isolation, heat conduction and pressure equalization buffering, and uniform stress of the detector signal simulation board (3) is guaranteed;
the detector signal simulation board (3) is used for generating pulse signals meeting the test requirements so as to provide excitation signals for each signal link through an interface;
the probe clamp (4) is used for positioning, supporting and fixing the probe group (5), and is matched with the positioning guide rod (11) through the positioning hole (12) to realize free sliding up and down;
the probe group (5) is embedded and fixed in the probe clamp, a probe point at the bottom of the probe group (5) is in contact with the detector signal simulation board (3), and a probe point at the top of the probe group (5) is in contact with a tested object and is used for transmitting signals and electric energy;
the tested unit (6) is connected and fixed with the counterweight unit (10) through the mounting hole;
the second isolation buffer cushion (9) is positioned between the tested object and the counterweight unit (10) and used for electrical isolation, heat conduction and buffer pressure equalization, and when the upper end and the lower end of the probe group (5) are reliably contacted, the damage of components caused by overlarge local stress of the tested object is prevented;
the counterweight unit (10) is fixed with the second isolation cushion pad (9) into a whole, is matched with the positioning guide rod (11), and is used for transmitting the gravity of the second isolation cushion pad (9) to the probe group (5) so as to deform the probe group (5) under stress, ensure the reliable contact of a bottom probe point and a top probe point of the probe group (5) and realize the transmission of signals and electric energy;
the positioning guide rod (11) is fixed with the testing platform base (1) into a whole and used for positioning and guiding the probe clamp (4) so as to realize the up-and-down free sliding of the probe clamp (4) and ensure the reliable contact of the probe points at the bottom and the top of the probe set (5).
2. Platform according to claim 1, characterized in that said first insulating and cushioning pad (2) is a thermal silicone pad;
the second isolation buffer cushion (9) is a thermal silica gel cushion.
3. Platform according to claim 1, characterized in that the detector signal simulation board (3) is externally connected with a power supply; or,
the detector signal simulation board (3) obtains electric energy through the probe group (5).
4. Platform according to claim 1, characterized in that the detector signal simulation board (3) generates pulse signals meeting the test requirements by means of rectangular pulse differentiation, edge extraction, frequency modulation and amplitude modulation in a low-voltage and low-power consumption mode.
5. The platform of claim 4, wherein the detector signal simulation board (3) is connected with a detector signal simulation board interface (8);
the pulse signals meeting the test requirements generated by the detector signal simulation board (3) are transmitted to the tested object through the detector signal simulation board interface (8) and the probe group (5).
6. Platform according to claim 1, characterized in that the probe group (5) is provided with telescopic features, the top probe point of the probe group (5) is provided with stroke flexibility, and the bottom probe point of the probe group (5) is provided with stroke flexibility.
7. Platform according to claim 1, characterized in that the material of the counterweight unit (10) is acrylic plate, or resin plate, or metal plate.
8. The platform of claim 1, wherein the object to be tested is fixed at a predetermined position by the second isolation cushion (9) and integrated with the weight unit (10).
9. The platform of claim 8, wherein the counterweight unit (10) slides up and down by the gravity of the positioning guide rods (11) and the counterweight unit (10), presses the second isolation cushion pad (9) and the tested object, and transmits pressure to two ends of the probe group (5), so that reliable contact between the detector signal simulation board (3) and each link of the tested object is realized, and signal transmission is ensured.
10. The platform of any one of claims 1-9, further comprising: a power and data port (13);
the power supply and data port (13) is used for supplying power and receiving and feeding back data information.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811279548.9A CN109470896A (en) | 2018-10-30 | 2018-10-30 | Detector board test platform |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811279548.9A CN109470896A (en) | 2018-10-30 | 2018-10-30 | Detector board test platform |
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| CN109470896A true CN109470896A (en) | 2019-03-15 |
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| CN201811279548.9A Pending CN109470896A (en) | 2018-10-30 | 2018-10-30 | Detector board test platform |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115128389A (en) * | 2022-08-31 | 2022-09-30 | 皇虎测试科技(深圳)有限公司 | ATE test interface device and equipment |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202994944U (en) * | 2012-12-29 | 2013-06-12 | 北京德天泉机电设备有限公司 | A probe bed tool used for detecting circuit boards |
| CN103576666A (en) * | 2012-07-24 | 2014-02-12 | 北京大基康明医疗设备有限公司 | Device and method for testing control panel in PET equipment |
| CN205594131U (en) * | 2016-01-23 | 2016-09-21 | 深圳加都佳电子科技有限公司 | General switching tool |
| TW201643440A (en) * | 2015-06-05 | 2016-12-16 | Mpi Corp | Probe module with feedback test function |
| CN107450013A (en) * | 2017-09-15 | 2017-12-08 | 北京锐视康科技发展有限公司 | A kind of circuit board functional completeness test platform and method of testing |
-
2018
- 2018-10-30 CN CN201811279548.9A patent/CN109470896A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576666A (en) * | 2012-07-24 | 2014-02-12 | 北京大基康明医疗设备有限公司 | Device and method for testing control panel in PET equipment |
| CN202994944U (en) * | 2012-12-29 | 2013-06-12 | 北京德天泉机电设备有限公司 | A probe bed tool used for detecting circuit boards |
| TW201643440A (en) * | 2015-06-05 | 2016-12-16 | Mpi Corp | Probe module with feedback test function |
| CN205594131U (en) * | 2016-01-23 | 2016-09-21 | 深圳加都佳电子科技有限公司 | General switching tool |
| CN107450013A (en) * | 2017-09-15 | 2017-12-08 | 北京锐视康科技发展有限公司 | A kind of circuit board functional completeness test platform and method of testing |
Non-Patent Citations (1)
| Title |
|---|
| 邝忠华等: "《一种基于晶体间光分享原理的深度测量PET探测器》", 《中国电子学会核电子学与核探测技术分会》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115128389A (en) * | 2022-08-31 | 2022-09-30 | 皇虎测试科技(深圳)有限公司 | ATE test interface device and equipment |
| CN115128389B (en) * | 2022-08-31 | 2022-12-02 | 皇虎测试科技(深圳)有限公司 | ATE test interface device and equipment |
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Application publication date: 20190315 |