CN104516144B - The capacitance detecting device and its detection method of a kind of touch sensing - Google Patents
The capacitance detecting device and its detection method of a kind of touch sensing Download PDFInfo
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- CN104516144B CN104516144B CN201410810972.7A CN201410810972A CN104516144B CN 104516144 B CN104516144 B CN 104516144B CN 201410810972 A CN201410810972 A CN 201410810972A CN 104516144 B CN104516144 B CN 104516144B
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Abstract
本发明提供一种触控传感器的电容检测装置及其检测方法，包括触控传感器，触控传感器具有行ITO图形和列ITO图形、与行ITO图形连接的行IC、以及与列ITO图形连接的列IC，本检测装置还包括位于ITO图形上方的液晶显示面板，该液晶显示面板包括上基板、位于上基板底部的ITO电极、下基板、以及夹设上基板和下基板之间的液晶，一第一电源的一端连接于ITO电极、第一电源的另一端连接于行IC；一第二电源的一端连接于ITO电极，第二电源的另一端连接于列IC。本发明不仅可以在每道ITO制程结束后就可提早检测出ITO图形缺陷的具体位置，也可以直接检测出每块区域电容值的变化，从而可以检测整块触控传感器电容的均匀性。
The invention provides a capacitance detection device and a detection method of a touch sensor, including a touch sensor, the touch sensor has a row ITO pattern and a column ITO pattern, a row IC connected with the row ITO pattern, and a row IC connected with the column ITO pattern IC, the detection device also includes a liquid crystal display panel located above the ITO pattern, the liquid crystal display panel includes an upper substrate, an ITO electrode located at the bottom of the upper substrate, a lower substrate, and a liquid crystal sandwiched between the upper substrate and the lower substrate. One end of the first power supply is connected to the ITO electrode, and the other end of the first power supply is connected to the row IC; one end of the second power supply is connected to the ITO electrode, and the other end of the second power supply is connected to the column IC. The present invention can not only detect the specific position of the ITO pattern defect in advance after each ITO process is completed, but also directly detect the change of the capacitance value of each area, so as to detect the uniformity of the capacitance of the entire touch sensor.
Description
技术领域technical field
本发明涉及一种用于触控传感器的电容检测装置及其检测方法。The invention relates to a capacitance detection device for a touch sensor and a detection method thereof.
背景技术Background technique
触控传感器(Touch Sensor)一般都是指镀上ITO导电层的触控导电玻璃(ITOGlass)，或是触控导电薄膜(ITO Film)。触控传感器(Touch Sensor)常见的材料包括玻璃以及塑料薄膜PET，触控技术中，包括电阻式以及电容式都是透过ITO Glass或是ITO Film等导电介质进行触控感应，其中触控导电玻璃(ITO Glass)，或是触控导电薄膜(ITO Film)都称为TIO图形，因此被称为触控传感器(Touch Sensor)。A touch sensor (Touch Sensor) generally refers to a touch conductive glass (ITO Glass) coated with an ITO conductive layer, or a touch conductive film (ITO Film). Common materials for touch sensors include glass and plastic film PET. In touch technology, including resistive and capacitive, touch sensing is performed through conductive media such as ITO Glass or ITO Film. Glass (ITO Glass) or touch conductive film (ITO Film) are called TIO patterns, so they are called touch sensors (Touch Sensor).
现有触控传感器(Touch Sensor)的检测是在全部制程结束后给IC通电，根据输出的波形判断缺陷的位置。The detection of the existing touch sensor (Touch Sensor) is to energize the IC after all the manufacturing processes are completed, and judge the position of the defect according to the output waveform.
如图1所示，触控传感器(Touch Sensor)包括行ITO图形11、列TIO图形12、与行ITO图形11连接的行IC 20、以及与列ITO图形12连接的列IC 30，通过对行IC 10和列IC 20通电，检测触控传感器中行ITO图形11和列ITO图形12的波形断缺陷的位置，但此方法不利于及早发现问题，而且当触控传感器的图案为单层ITO结构时，无法准确定位缺陷出现的具体位置。As shown in Figure 1, a touch sensor (Touch Sensor) includes a row ITO pattern 11, a column TIO pattern 12, a row IC 20 connected with the row ITO pattern 11, and a column IC 30 connected with the column ITO pattern 12, by IC 10 and column IC 20 are energized to detect the position of the waveform break defect of row ITO pattern 11 and column ITO pattern 12 in the touch sensor, but this method is not conducive to early detection of problems, and when the pattern of the touch sensor is a single-layer ITO structure , it is impossible to accurately locate the specific location of the defect.
发明内容Contents of the invention
本发明提的目的检测整块触控传感器电容的均匀性的检测装置和检测方法。The purpose of the present invention is to detect a detection device and a detection method for detecting the uniformity of the capacitance of the entire touch sensor.
本发明提供一种触控传感器的电容检测装置，包括触控传感器，触控传感器具有行ITO图形和列ITO图形、与行ITO图形连接的行IC、以及与列ITO图形连接的列IC，本检测装置还包括位于ITO图形上方的液晶显示面板，该液晶显示面板包括上基板、位于上基板底部的ITO电极、下基板、以及夹设上基板和下基板之间的液晶，一第一电源的一端连接于ITO电极、第一电源的另一端连接于行IC；一第二电源的一端连接于ITO电极，第二电源的另一端连接于列IC。The invention provides a capacitance detection device for a touch sensor, including a touch sensor, the touch sensor has a row ITO pattern and a column ITO pattern, a row IC connected to the row ITO pattern, and a column IC connected to the column ITO pattern. The detection device also includes a liquid crystal display panel positioned above the ITO pattern, the liquid crystal display panel includes an upper substrate, an ITO electrode positioned at the bottom of the upper substrate, a lower substrate, and a liquid crystal sandwiched between the upper substrate and the lower substrate, a first power supply One end of the first power supply is connected to the ITO electrode, and the other end of the first power supply is connected to the row IC; one end of the second power supply is connected to the ITO electrode, and the other end of the second power supply is connected to the column IC.
本发明又提供一种触控传感器的电容检测装置，包括触控传感器，触控传感器具有单层ITO图形、以及与ITO图形连接的IC，本检测装置还包括位于ITO图形上方的液晶显示面板，该液晶显示面板包括上基板、位于上基板底部的ITO电极、下基板、以及夹设上基板和下基板之间的液晶，一电源的一端连接于ITO电极、电源的另一端连接于IC。The present invention also provides a capacitance detection device for a touch sensor, including a touch sensor, the touch sensor has a single-layer ITO pattern and an IC connected to the ITO pattern, and the detection device also includes a liquid crystal display panel positioned above the ITO pattern, The liquid crystal display panel includes an upper substrate, an ITO electrode at the bottom of the upper substrate, a lower substrate, and a liquid crystal sandwiched between the upper substrate and the lower substrate. One end of a power supply is connected to the ITO electrode, and the other end of the power supply is connected to the IC.
本发明又提供一种检测方法，包括如下步骤：The present invention provides a kind of detection method again, comprises the steps:
给ITO电极和行IC通电，检测行ITO图形各个区域电容值的变化，当行ITO图形上某处有缺陷，液晶显示面板显示对应缺陷的行ITO图形的光学异常；Power on the ITO electrode and the row IC to detect the change of the capacitance value of each area of the row ITO pattern. When there is a defect somewhere on the row ITO pattern, the liquid crystal display panel will display the optical abnormality of the row ITO pattern corresponding to the defect;
给ITO电极和列IC通电，检测列ITO图形各个区域电容值的变化，当列ITO图形上某处有缺陷，液晶显示面板显示对应缺陷的列ITO图形的光学异常；Power up the ITO electrodes and column ICs to detect the change of the capacitance value of each area of the column ITO pattern. When there is a defect somewhere on the column ITO pattern, the liquid crystal display panel will display the optical abnormality of the column ITO pattern corresponding to the defect;
同时给行IC和列IC通电，当行IC和列IC给予不同的电压时，当行ITO图形和列ITO图形之间有异物，造成行ITO图形和列ITO图形串联时，导致缺陷处的一整行或列电压因串联发生变化，液晶显示面板显示对应缺陷的行ITO和列ITO图形的光学异常。Power up the row IC and column IC at the same time, when the row IC and column IC are given different voltages, when there is a foreign object between the row ITO pattern and the column ITO pattern, causing the row ITO pattern and the column ITO pattern to be connected in series, resulting in a whole row at the defect Or the column voltage changes due to series connection, and the liquid crystal display panel displays the optical abnormality of the row ITO and column ITO patterns corresponding to the defect.
本发明又提供一种检测方法，包括如下步骤：The present invention provides a kind of detection method again, comprises the steps:
给ITO电极和IC通电，检测ITO图形各个区域电容值的变化，当ITO图形上某处有缺陷，液晶显示面板显示对应缺陷的ITO图形的光学异常。Power up the ITO electrodes and IC to detect the change of the capacitance value of each area of the ITO pattern. When there is a defect somewhere on the ITO pattern, the liquid crystal display panel will display the optical abnormality of the ITO pattern corresponding to the defect.
本发明不仅可以在每道ITO制程结束后就可提早检测出ITO图形缺陷的具体位置，也可以直接检测出每块区域电容值的变化，从而可以检测整块触控传感器电容的均匀性。The present invention can not only detect the specific position of the ITO pattern defect in advance after each ITO process is completed, but also directly detect the change of the capacitance value of each area, so as to detect the uniformity of the capacitance of the entire touch sensor.
附图说明Description of drawings
图1所示为现有触控传感器的结构示意图；FIG. 1 is a schematic structural diagram of an existing touch sensor;
图2为本发明触控传感器的电容检测装置的结构示意图；2 is a schematic structural view of a capacitance detection device of a touch sensor of the present invention;
图3为本发明电容检测装置的行方向通电的结构示意图；Fig. 3 is a structural schematic diagram of the row direction electrification of the capacitance detection device of the present invention;
图4为本发明电容检测装置的列方向通电的结构示意图；Fig. 4 is a structural schematic diagram of the column direction electrification of the capacitance detection device of the present invention;
图5为本发明电容检测装置的行和列方向通电的结构示意图。FIG. 5 is a schematic diagram of the structure of the capacitance detection device of the present invention that conducts electricity in the row and column directions.
具体实施方式detailed description
下面结合附图和具体实施例，进一步阐明本发明，应理解这些实施例仅用于说明本发明而不用于限制本发明的范围，在阅读了本发明之后，本领域技术人员对本发明的各种等价形式的修改均落于本申请所附权利要求所限定的范围。Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these embodiments are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention Modifications in equivalent forms all fall within the scope defined by the appended claims of this application.
液晶显示技术是一种电光转换技术，即根据加在液晶两侧的电场大小，改变液晶的排列状态，从而改变经过液晶层的光路方向，最终改变液晶显示装置的出光效果。液晶显示技术可以直接把不同大小的电信号转变成不同亮度的光信号，从而显示成图案。从液晶显示技术的电光特性反推，可以根据不同亮度的光信号，判断加在液晶两侧的电场大小。利用这个特点，可以用液晶显示装置测试触控传感器(Touch Sensor)的ITO图形缺陷的具体位置。Liquid crystal display technology is an electro-optical conversion technology, that is, according to the magnitude of the electric field applied to both sides of the liquid crystal, the alignment state of the liquid crystal is changed, thereby changing the direction of the light path passing through the liquid crystal layer, and finally changing the light output effect of the liquid crystal display device. Liquid crystal display technology can directly convert electrical signals of different sizes into optical signals of different brightness, thereby displaying patterns. Inversely deduced from the electro-optic characteristics of liquid crystal display technology, the magnitude of the electric field applied to both sides of the liquid crystal can be judged according to the optical signals of different brightness. Utilizing this feature, the liquid crystal display device can be used to test the specific position of the ITO pattern defect of the touch sensor (Touch Sensor).
如图2所示为本发明触控传感器的电容检测装置的结构示意图，通过将一液晶显示面板1悬挂在触控传感器2的上方，液晶显示面板1上方设有影像机(CCD)5，该影像机5连接器电脑6，该影像机5可以阅读液晶显示面板1上的数据信息。As shown in Figure 2, it is a schematic structural view of the capacitance detection device of the touch sensor of the present invention. By suspending a liquid crystal display panel 1 above the touch sensor 2, a video camera (CCD) 5 is arranged above the liquid crystal display panel 1. The video machine 5 is connected to the computer 6 , and the video machine 5 can read the data information on the liquid crystal display panel 1 .
其中，液晶显示面板1包括玻璃状的上基板11、位于上基板11底部的ITO电极12、下基板14、以及夹设在上基板11和下基板14之间的盘状液晶层13，其中下基板14为具有绝缘作用的下基板，下基板14对应触控传感器1的ITO图形21、22。Wherein, the liquid crystal display panel 1 includes a glass-like upper substrate 11, an ITO electrode 12 located at the bottom of the upper substrate 11, a lower substrate 14, and a discotic liquid crystal layer 13 interposed between the upper substrate 11 and the lower substrate 14, wherein the lower substrate The substrate 14 is a lower substrate with insulation function, and the lower substrate 14 corresponds to the ITO patterns 21 and 22 of the touch sensor 1 .
本发明检测装置通过施加第一电源31和第二电源32，其中第一电源31的一端与液晶显示面板1的ITO电极12连接，第一电源31的另一端与触控传感器1的行IC 23连接，第二电源32的一端也与液晶显示面板1的ITO电极12连接，第二电源32的另一端与触控传感器1的行IC 24连接，并在第一电源31与行IC 22之间设有第一开关41、第二电源32与列IC 24之间设有第二开关42。The detection device of the present invention applies a first power supply 31 and a second power supply 32, wherein one end of the first power supply 31 is connected to the ITO electrode 12 of the liquid crystal display panel 1, and the other end of the first power supply 31 is connected to the row IC 23 of the touch sensor 1. One end of the second power supply 32 is also connected to the ITO electrode 12 of the liquid crystal display panel 1, the other end of the second power supply 32 is connected to the row IC 24 of the touch sensor 1, and is between the first power supply 31 and the row IC 22 A first switch 41 is provided, and a second switch 42 is provided between the second power source 32 and the column IC 24 .
液晶显示面板1作为本发明的ITO上电极，触控传感器2的ITO图形21、22作为下电极，通过在液晶显示面板的上基板11的ITO电极12和触控传感器1的ITO图形对应的IC上施加电压产生电场，使ITO图形21、22上方对应的液晶13的状态发生改变，根据液晶显示面板1的显示效果可以有效判断触控传感器1的ITO图形21、22是否存在异常以及整个电容屏电容值的均匀性。The liquid crystal display panel 1 is used as the ITO upper electrode of the present invention, and the ITO patterns 21 and 22 of the touch sensor 2 are used as the lower electrodes. Applying a voltage to generate an electric field changes the state of the corresponding liquid crystal 13 above the ITO graphics 21 and 22. According to the display effect of the liquid crystal display panel 1, it can be effectively judged whether the ITO graphics 21 and 22 of the touch sensor 1 are abnormal and whether the entire capacitive screen is abnormal. Uniformity of capacitance value.
本检测装置与现有的触控传感器相比，通过用液晶显示装置检测电路基板的电学特性，更加直观形象，且没有外加的机械力不会造成线路板的表面损伤。Compared with the existing touch sensor, the detection device detects the electrical characteristics of the circuit board with a liquid crystal display device, which is more intuitive and visual, and does not cause damage to the surface of the circuit board without external mechanical force.
在图2中，液晶显示面板1的下基板14作为绝缘层，会消弱加载到液晶上的电场强度。所以，下基板14必须做到微米级的厚度，这么薄的基板频繁接触到电路基板就容易被电路基板磨损，因此液晶显示面板需要与触控传感器保持一定的距离，该距离为1um至3mm，这个距离的存在也会消弱加载到液晶上的电场强度。In FIG. 2 , the lower substrate 14 of the liquid crystal display panel 1 serves as an insulating layer, which weakens the electric field strength applied to the liquid crystal. Therefore, the lower substrate 14 must have a micron-level thickness. Such a thin substrate is easily worn by the circuit substrate when it frequently contacts the circuit substrate. Therefore, the liquid crystal display panel needs to maintain a certain distance from the touch sensor, and the distance is 1um to 3mm. The existence of this distance will also weaken the electric field strength loaded on the liquid crystal.
图3所示为本电容检测装置的第一开关合并的工作示意图，当通过第一电源31给行IC 23通电后，行ITO图形21作为液晶的下电极，在触控传感器1中，有ITO图形和无ITO图形处的感应电荷不同，因此其电容也不同，可以检测行ITO图形21各个区域电容值的变化。当行ITO图形21上某处有缺陷，则其缺陷对应处的电容发生异常，液晶显示面板1上对应处的光学也异常。Fig. 3 shows the working schematic diagram of the combination of the first switch of the capacitive detection device. After the row IC 23 is energized by the first power supply 31, the row ITO pattern 21 is used as the lower electrode of the liquid crystal. In the touch sensor 1, there is an ITO The induced charges at the pattern and the non-ITO pattern are different, so the capacitance is also different, and the change of the capacitance value of each area of the row ITO pattern 21 can be detected. When there is a defect somewhere on the row ITO pattern 21 , the capacitance at the corresponding position of the defect will be abnormal, and the optics at the corresponding position on the liquid crystal display panel 1 will also be abnormal.
液晶显示面板1上的数据通过影像机(CCD)5捕捉后传输至电脑6，可以准确定位行ITO图形缺陷的具体位置。The data on the liquid crystal display panel 1 is captured by the video camera (CCD) 5 and then transmitted to the computer 6, so that the specific position of the line ITO pattern defect can be accurately located.
图4所示为本电容检测装置的第二开关合并的工作示意图，当通过第二电源32给列IC 24通电后，列ITO图形22作为液晶的下电极，在触控传感器1中，有ITO图形和无ITO图形处的感应电荷不同，因此其电容也不同，可以检测列ITO图形22各个区域电容值的变化。当列ITO图形22上某处有缺陷，则其缺陷对应处的电容发生异常，液晶显示面板1上对应处的光学也异常。Fig. 4 shows the combined working schematic diagram of the second switch of the capacitive detection device. After the second power supply 32 is used to energize the column IC 24, the column ITO pattern 22 is used as the lower electrode of the liquid crystal. In the touch sensor 1, there is an ITO The induced charges at the pattern and the non-ITO pattern are different, so the capacitance is also different, and the change of the capacitance value of each area of the column ITO pattern 22 can be detected. When there is a defect somewhere on the column ITO pattern 22, the capacitance at the corresponding position of the defect will be abnormal, and the optics at the corresponding position on the liquid crystal display panel 1 will also be abnormal.
液晶显示面板1上的数据通过影像机(CCD)5捕捉后传输至电脑6，可以准确定位列ITO图形缺陷的具体位置。The data on the liquid crystal display panel 1 is captured by the video camera (CCD) 5 and then transmitted to the computer 6, so that the specific position of the column ITO pattern defect can be accurately located.
图5所示为本电容检测装置的第一开关和第二开关均合并的工作示意图，当给行IC 23和列IC 24同时通电时，根据需要，可以给同样的电压，也可以给不同的电压。当给不同的电压时，当行ITO图形21和列ITO图形22之间某处有异物，造成行ITO图形21和列ITO图形22串联，就会导致缺陷处的一整行或列电压因串联发生变化。对应处感应电荷发生变化，电容也由此发生变化，液晶显示面板1上对应处的光学也异常。Fig. 5 shows the working schematic diagram of the combination of the first switch and the second switch of the capacitance detection device. When the row IC 23 and the column IC 24 are powered on at the same time, the same voltage can be given or different voltages can be given as required. Voltage. When different voltages are given, when there is a foreign object somewhere between the row ITO pattern 21 and the column ITO pattern 22, the row ITO pattern 21 and the column ITO pattern 22 are connected in series, which will cause a whole row or column voltage at the defect to occur due to series connection Variety. The induced charge at the corresponding position changes, and the capacitance also changes accordingly, and the optics at the corresponding position on the liquid crystal display panel 1 is also abnormal.
液晶显示面板1上的数据通过影像机(CCD)5捕捉后传输至电脑6，可以准确定位行ITO图形21和列ITO图形22缺陷的具体位置。The data on the liquid crystal display panel 1 is captured by the video camera (CCD) 5 and then transmitted to the computer 6, so that the specific positions of the row ITO pattern 21 and column ITO pattern 22 defects can be accurately located.
本发明不仅可以在每道ITO制程结束后就可提早检测出ITO图形缺陷的具体位置，也可以直接检测出每块区域电容值的变化，从而可以检测整块触控传感器电容的均匀性。The present invention can not only detect the specific position of the ITO pattern defect in advance after each ITO process is completed, but also directly detect the change of the capacitance value of each area, so as to detect the uniformity of the capacitance of the entire touch sensor.
当触控传感器的图案为单层ITO图形时，此方法可以更简单和准确检测触控传感器的缺陷出现的具体位置。When the pattern of the touch sensor is a single-layer ITO pattern, this method can more simply and accurately detect the specific position of the defect of the touch sensor.
当触控传感器的图案为单层ITO图形时，触控传感器具有单层ITO图形、以及与ITO图形连接的IC，本检测装置还包括位于ITO图形上方的液晶显示面板，该液晶显示面板包括上基板、位于上基板底部的ITO电极、下基板、以及夹设上基板和下基板之间的液晶，一电源的一端连接于ITO电极、电源的另一端连接于IC。When the pattern of the touch sensor is a single-layer ITO pattern, the touch sensor has a single-layer ITO pattern and an IC connected to the ITO pattern. The detection device also includes a liquid crystal display panel located above the ITO pattern. The substrate, the ITO electrode at the bottom of the upper substrate, the lower substrate, and the liquid crystal sandwiched between the upper substrate and the lower substrate, one end of a power supply is connected to the ITO electrode, and the other end of the power supply is connected to the IC.
检测时，当通过电源给IC通电后，ITO图形作为液晶的下电极，在触控传感器中，有ITO图形和无ITO图形处的感应电荷不同，因此其电容也不同，可以检测行ITO图形各个区域电容值的变化。当ITO图形上某处有缺陷，则其缺陷对应处的电容发生异常，液晶显示面板上对应处的光学也异常。During detection, when the IC is energized by the power supply, the ITO pattern is used as the lower electrode of the liquid crystal. In the touch sensor, the induced charge at the place with the ITO pattern and the place without the ITO pattern are different, so the capacitance is also different, and each row of the ITO pattern can be detected. Changes in area capacitance. When there is a defect somewhere on the ITO pattern, the capacitance at the corresponding position of the defect will be abnormal, and the optics at the corresponding position on the liquid crystal display panel will also be abnormal.
液晶显示面板上的数据通过影像机(CCD)捕捉后传输至电脑，可以准确定位ITO图形缺陷的具体位置。The data on the liquid crystal display panel is captured by the video camera (CCD) and then transmitted to the computer, which can accurately locate the specific position of the ITO pattern defect.
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| KR102573208B1 (en) * | 2016-11-30 | 2023-08-30 | 엘지디스플레이 주식회사 | Display panel |
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