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Mahmut Yilmaz

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Ke Peng

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Publications

2014
[p2]
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  - books/crc/14/PengYT14
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Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor:
Circuit Path Grading Considering Layout, Process Variations, and Cross Talk. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2014: 95-118
2013
[j4]
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  - journals/et/BaoPYCWT13
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Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor:
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. 29(1): 35-48 (2013)
[j3]
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  - journals/tvlsi/PengYCT13
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Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. IEEE Trans. Very Large Scale Integr. Syst. 21(6): 1129-1142 (2013)
2011
[c14]
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  - conf/ets/BaoPYCWT11
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Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor:
Critical Fault-Based Pattern Generation for Screening SDDs. ETS 2011: 177-182
2010
[c13]
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  - conf/ats/GoelCYPT10
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Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor:
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Asian Test Symposium 2010: 307-312
[c12]
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  - conf/ats/PengYCT10
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Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection. Asian Test Symposium 2010: 331-336
[c11]
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  - conf/date/PengYTC10
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Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty:
High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. DATE 2010: 1426-1431
[c8]
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  - conf/vts/PengTYCT10
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Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor:
A novel hybrid method for SDD pattern grading and selection. VTS 2010: 45-50

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